Abstract: Data latch circuit and method of low power decision feedback equalization (DFE) system is disclosed. In one embodiment, the data latch circuit of the of a decision feedback equalization (DFE) system includes a first parallel n-channel metal-oxide-semiconductor field-effect transistor (NMOS) pair to input a differential input voltage. The data latch circuit also includes a second parallel NMOS pair coupled to the first parallel NMOS pair to input a decision feedback equalization (DFE) voltage. The data latch circuit further includes a cross-coupled PMOS pair to generate a positive feedback to the first parallel NMOS pair and/or the second parallel NMOS pair. In addition, the data latch circuit includes a cross-coupled NMOS pair to escalate the positive feedback. Furthermore the data latch circuit includes a latching circuit to generate a signal data based on the sinking of a current at an input of the latching circuit and/or the positive feedback.

Abstract: A sequential voltage output circuit is connected between a power supply and a number of loads. The voltage sequence output circuit includes a complex programmable logic device (CPLD) and a number of switching circuits. When the CPLD receives a power on signal, the CPLD outputs a number of control signals sequentially through a number of outputs. When a switching circuit receives a control signal from the CPLD, the switching circuit allows the power supply to supply power to a corresponding load.

Abstract: There is provided a hybrid cable that comprises a coaxial cable with an outer conductor and a hollow inner conductor that encloses an inner space. The hybrid cable according to an exemplary embodiment of the present invention may comprise a data line that is arranged in the inner space of the inner conductor.

Abstract: A programmable logic device includes a plurality of logic blocks and a plurality of routing networks. One of the plurality of routing networks includes a first selection circuit, a second selection circuit, and an auxiliary power connector circuit. The first selection circuit is connected to the second selection circuit via a signal line. The signal line is connected to a power supply line via the auxiliary power connector circuit.

Abstract: Sequential electronic circuit (10) reacting on a rising edge and a falling edge of a clock signal (CK), comprising a first (1) and a second (2) D-type flip-flop, a main multiplexer (3) coupled at input to the flip-flops (1 and 2), the circuit (10) comprising a first input receiving the clock signal (CK) and a second input receiving a control signal (TE) so as to control the circuit (10) according to a normal operating mode and a test operating mode making it possible to check the proper operation of the sequential electronic circuit (10). The clock signal (CK) used in the normal operating mode is used to gate the circuit (10) during the test operating mode.

Abstract: A method and apparatus are provided that allow exploitation of the common mode characteristics of a differential transmission network to provide an additional data signal. Signal represents either a binary signal or a multi-valued signal to allow signaling of one or more bits of information. The signaling occurs through the variation of the common mode voltage in transmitters and is detected using differential receiver. One embodiment is presented that achieves signaling of an extended run length data sequence to allow continued transmitter/receiver synchronization throughout the transmission of the sequence. In an alternate embodiment, a separate data path is provided to signal the extended run length sequence when a common mode signaling path is not available.

Abstract: A level converter circuit is provided for converting an input signal of a digital signal having a first signal level into an output signal having a second signal level higher than the first signal level. An amplifier circuit amplifies the input signal and outputs an amplified output signal, and a current generator circuit generates a control current corresponding to an operating current flowing through the amplifier circuit upon change of the signal level of the input signal. A current detector circuit detects the generated control current, and controls the operating current of the amplifier circuit to correspond to the detected control current. The current generator circuit includes series-connected first and second nMOS transistors as inserted between the current detector circuit and the ground. The first nMOS transistor operates responsive to the input signal, and the second nMOS transistor operates responsive to an inverted signal of the input signal.

Abstract: A multiple level integrated circuit uses an array of oppositely oriented individually enabled buffers between through-silicon vias (TSVs) and a clocked flip-flop, for each of multiple signal lines that include TSVs. Applying and/or reading logic levels to and from the TSVs and associated flip-flops produces values that a logic element compares to expected values characterizing nominal operation or detects open and short circuit defects. A process associated with testing the TSVs during assembly comprises testing for short circuits and then exposing and connecting the TSVs via a conductive layer to check for open circuits.

Abstract: Some embodiments provide an integrated circuit (‘IC’) that includes at least first and second circuits operating at a first voltage. The IC includes, between the first and second circuits, a direct connection comprising a third circuit for transmitting a signal from the first circuit to the second circuit at a second voltage that is lower than the first voltage. At least one of the first and second circuits is a configurable circuit for configurably performing operations.

Abstract: An information generating apparatus and an operation method thereof are provided. The information generating apparatus includes a first logic contact, a second logic contact, an information output contact and a plurality of switches SW(i,j), wherein SW(i,j) represents a jth switch in an ith layer, 1?i?L, and 1?j?2(i?1). The switch SW(i,j) has a first input terminal, a second input terminal and an output terminal, wherein the output terminal is selectively connected to the first or the second input terminal. The first and the second input terminals of the switches SW(Lj) in the Lth layer are respectively connected to the first logic contact and the second logic contact. The first and the second input terminals of the switch SW(i,j) in other layers are respectively connected to the output terminals of the switches SW(i+1,2j?1) and SW(i+1,2j). The output terminal of the switch SW(1,1) is connected to the information output contact.

Abstract: A configuration method performs a configuration of a FPGA circuit by setting configuration data from a configuration circuit to the FPGA circuit. The method counts, within the FPGA circuit, a number of times a configuration of the FPGA circuit fails. The method adjusts, within the FPGA circuit, the configuration data at a time when the configuration failed if the counted number exceeds an upper limit value, and re-executes the configuration based on the adjusted configuration data. The method sets the configuration data in which the configuration is succeeded from the FPGA circuit to the configuration circuit when the configuration is successful.

Abstract: Structures and methods are provided for performing non-destructive and secure disablement of integrated circuit (IC) functionality. A structure for enabling non-destructive and secure disablement and re-enablement of the IC includes a micro-electrical mechanical structure (MEMS) initially set to a chip enable state. The structure also includes an activation circuit operable to set the MEMS device to an error state based on a detected predetermined condition of the IC. The IC is disabled when the MEMS device is in the error state.

Abstract: Various embodiments of an on-die termination (ODT) signal generating circuit are disclosed. In one exemplary embodiment, the ODT signal generating circuit includes a latency unit and an ODT control signal generating unit. The latency unit is configured to receive a clock signal and an ODT signal. The latency unit is configured to delay the ODT signal by a predetermined time to generate a first ODT signal. The latency unit is also configured to delay the ODT signal by less than the predetermined time to generate a second ODT signal. The ODT control signal generating unit is configured to provide either one of the first and second ODT signals as an ODT control signal in response to a control signal.

Abstract: A voltage level shift circuit in which a difference in response characteristic depending on the signal level of an input signal is suppressed. The voltage level shift circuit generates an output signal VOUT having a voltage amplitude different from that of the input signal. An inverter INV2 generates a voltage V1 in the range of VSS to VDDI according to the input signal. An inverter INV3 generates a voltage V2 in the range of VSS to VPERI according to the input signal. An inverter INV4 generates the output signal VOUT according to V1 and V2.

Abstract: A system comprises a first signal processing logic module and at least one further signal processing logic module. The system further comprises mismatch handler logic module arranged to detect a mismatch between outputs of the first and at least one further signal processing logic module, the mismatch between outputs indicating a failed operation. The mismatch handler logic module further arranged, upon detection of a mismatch between outputs of the first and at least one further signal processing logic module, to analyze internal states of the first and at least one further signal processing logic module, determine whether the cause of the output mismatch is due to a transient fault, and upon determination that the cause of the output mismatch is due to a transient fault, to re-synchronize the first and at least one further signal processing logic module.

Abstract: An object is to apply a transistor using an oxide semiconductor to a logic circuit including an enhancement transistor. The logic circuit includes a depletion transistor 101 and an enhancement transistor 102. The transistors 101 and 102 each include a gate electrode, a gate insulating layer, a first oxide semiconductor layer, a second oxide semiconductor layer, a source electrode, and a drain electrode. The transistor 102 includes a reduction prevention layer provided over a region in the first oxide semiconductor layer between the source electrode and the drain electrode.

Abstract: Systems and methods for partial reconfiguration of reconfigurable application specific integrated circuit (ASIC) devices that may employ an interconnection template to allow partial reconfiguration (PR) blocks of an ASIC device to be selectively and dynamically interconnected and/or disconnected in standardized fashion from communication with a packet router within the same ASIC device.

Abstract: A semiconductor device according to a first aspect of the present invention includes: a first circuit that outputs a first output value having a majority of output values received from N (N is three or more odd numbers) pieces of data hold circuits receiving a same input value; and a second circuit that outputs a second output value which is less than the majority of output values received from the N pieces of the data hold circuits.

Abstract: A differential signal generating device includes a control circuit and a differential signal driver receiving a single-ended signal. The control circuit receives a source signal and generates a control signal corresponding to a first mode when the source signal conforms with a first pre-defined state, and corresponding to a second mode when the source signal conforms with a second pre-defined state. Variations of the source signal are related to signal content of the single-ended signal. The differential signal driver is coupled to the control unit for receiving the control signal therefrom. The differential signal driver outputs a differential signal output according to the single-ended signal when the control signal corresponds to the first mode. The differential signal driver outputs a non-differential signal output when the control signal corresponds to the second mode.

Abstract: An integrated circuit with a pulse clock unit having shared gating control includes one or more logic blocks, each including a clock distribution network configured to distribute a clock signal. The integrated circuit also includes a clock unit coupled to the one or more logic blocks and configured to generate a pulse clock signal formed using a chain of inverting logic gates. The clock unit may be further configured to provide the pulse clock signal to the clock distribution network. The clock unit may also include an enable input that is coupled to one input of one of the inverting logic gates. In addition, the clock unit may be configured to selectively enable and disable the pulse clock signal in response to an enable signal on the enable input.