Abstract: A position encoder for monitoring relative movement between a first object and a second object includes a grating that is coupled to the first object, and an image sensor assembly that is coupled to the second object. The image sensor includes a first image sensor; a second image sensor that is spaced apart from the first image sensor; an optical element that includes a first optical surface and a second optical surface that is spaced apart from the first optical surface; and an illumination system.

Abstract: An optical receiver is provided that includes an array of photoreceivers. Each photoreceiver may be configured to receive a respective portion of a speckle pattern generated by interaction between an object beam and a scattering medium and each photoreceiver may be configured to generate respective electrical detection signals for provision to processing circuitry for summing of the electrical detection signals. A photoreceiver may include a collector, first detector and second detectors, and first and second optical splitters. The photoreceiver may be configured to generate a first electrical detection signal and a second electrical detection signal based on a received portion of the speckle pattern.

Abstract: One or more fiber optic rotary joints (FORJ), free space beam combiners, OCT, SEE and/or fluorescence devices and systems for use therewith, methods of manufacturing same and storage mediums are provided. One or more embodiments of FORJs may be used with numerous applications in the optical field, including, but not limited to, OCT and fluorescence applications. Examples of such applications include imaging, evaluating and diagnosing biological objects, such as, but not limited to, for Gastro-intestinal, cardio and/or ophthalmic applications, and being obtained via one or more optical instruments.

Abstract: Disclosed is an optical probe system that is capable of high speed, high precision, and high resolution 3D digitalization of engineered objects. The 3D dimensional data of the engineered object is measured using a swept source optical coherence tomography system with improved speed, spatial resolutions, and depth range. Also disclosed is a type of coordinate measurement machine (CMM) that is capable of performing high speed, high resolution, and non-contact measurement of engineered objects. The mechanic stylus in the touch-trigger probe of a conventional CMM is replaced with an optical stylus with reconfigurable diameter and length. The distance from the center of the optical stylus to the measurement probe is optically adjusted to match the height of the object to be measured quickly, which eliminates one dimensional movement of the probe and greatly improves the productivity.

Abstract: An automatic calibration optical interferometer comprises: a light source; an optical interference assembly, which divides a low coherent light into a first and a second incident light; an optical sampling assembly, with a first end receiving the first incident light and a partially reflective window at the second end being configured to divide the first incident light into a first reflected light and a first penetrating light configured to be emitted to the test sample; an optical reference assembly, with a reference mirror and an actuator, wherein the optical sampling assembly emits the second incident light to the reference mirror to generate a second reflected light, and the actuator moves the reference mirror; a polychromator, which outputs a displacement signal according to an optical path difference variation between the first and second reflected lights; and a displacement controller, which controls the actuator according to the displacement signal.

Abstract: An ophthalmic apparatus that includes a light source of wavelength sweeping type; a measurement optical system; a reference optical system; a light receiving element that receives interference light; a sample clock signal generator that generates a sample clock signal from the light from the light source, the sample clock signal cyclically changing at equal frequency intervals; a signal processor that samples an interference signal based on the sample clock signal, the interference signal being outputted from the light receiving element when the light receiving element receives the interference light. The ophthalmic apparatus generates period data based on the sample clock signal, the period data indicating a relationship between a period of the sample clock signal and time; and determines a processing duration of the interference signal sampled at the signal processor based on the period data.

Abstract: To acquire both excellent spectrum and sample image reflecting actual conditions of a sample, and to increase convenience of measurement, provided is a display device for a photometric analyzer, which is configured to irradiate a sample with light to analyze the sample, the display device being configured to display a measurement result of the photometric analyzer, and including: a controller; and a display, which is configured to display an image based on measurement data processed by the controller. The measurement data at least contains a spectrum indicating an intensity of emitted light, which is emitted by the sample irradiated with the light, and a sample image of the sample, which is taken by an imaging device. The display is configured to display the spectrum and the sample image in an arrangement in the same screen.

Abstract: A method for adjusting a measuring device having an interferometer unit with an optical axis, an optical distance measuring device with a measuring axis and a support slide that is moveable along a slide axis. The measuring axis is first aligned parallel to the slide axis. An adjustment body with a first spherical reflection and/or diffraction surface and a retro reflector at the back side is arranged at the support slide. It is brought into a first confocal position, in which a first center point of the first spherical reflection/diffraction surface coincides with the focus of the spherical wavefront that is emitted from the interferometer unit. The retro reflector defines a vertex that is located close to the first center point, such that the measuring axis of the distance measuring device extends close to the focus of the emitted spherical wavefront. In doing so, Abbe-faults can be reduced or eliminated.

Abstract: A system for monitoring parameters of an object is described. The system comprising: a monitoring unit configured for performing one or more monitoring sessions on an object and collecting data from an inspection region on the object over time and generating monitored data indicative of the inspected region, a stimulation unit configured and operable for applying at least one selected external stimulation field on the object during said one or more monitoring sessions, and a control unit configured for receiving the monitored data from the monitoring unit and determining one or more selected parameters. The stimulation unit is configured for providing said at least one selected external stimulation field directed toward said inspection region from two or more different directions.

Abstract: A spectrometer engine and an adjustment method thereof are provided. The spectrometer engine includes a connector, a light sensor, a variable gain amplifier, a variable reference voltage generation circuit, an analog-to-digital converter and a control circuit. The light sensor senses a light to be measured coming from an object to be measured to generate a sensing signal. The variable gain amplifier amplifies the sensing signal according to a first setting parameter to generate an amplified signal. The variable reference voltage generation circuit provides a reference voltage according to a second setting parameter. The analog-to-digital converter converts the amplified signal to a digital signal according to the reference voltage. The control circuit reads the digital signal and adjusts at least one of the first to third setting parameters according to the digital signal for the spectrometer engine to measure the object to be measured again to generate another digital signal.

Abstract: An optical inspection apparatus, including: an optical metrology tool configured to measure structures, the optical metrology tool including: an electromagnetic (EM) radiation source configured to direct a beam of EM radiation along an EM radiation path; and an adaptive optical system disposed in a portion of the EM radiation path and configured to adjust a shape of a wave front of the beam of EM radiation, the adaptive optical system including: a first aspherical optical element; a second aspherical optical element adjacent the first aspherical optical element; and an actuator configured to cause relative movement between the first optical element and the second optical element in a direction different from a beam axis of the portion of the EM radiation path.

Abstract: The present disclosure relates to a non-contact type security inspection and method, the system including: a laser source for emitting probe light beams which penetrate through a container or a packaging and are irradiated onto an inspected object contained in the container or the packaging; an optical collection device for collecting an exciting light excited by the probe light beams on the inspected object; a spectrum analyzer for analyzing spectral characteristics of the exciting light collected by the optical collection device so as to determine characteristics of the inspected object; and a shielding apparatus for preventing at least part of the exciting light excited by the probe light beams on the container or the packaging from entering an induction area of the optical collection device.

Abstract: A high-speed interrogation system is provided for interferometric sensors, one example of which is an EFPI sensor, that operates based on spectral interference. The system uses a two mode operation that includes a lower speed, accurate absolute measurement mode and a higher speed, relative measurement mode. The system achieves greater overall measurement accuracy and speed than known sensor interrogation approaches.

Abstract: A measurement apparatus includes an interference image acquisition unit, a fluorescence image acquisition unit, an operation unit, and a timing control circuit. The operation unit generates an optical thickness image based on an interference image acquired by the interference image acquisition unit, generates a mask image showing a region in which pixel values in a fluorescence image acquired by the fluorescence image acquisition unit are larger than a threshold value, and determines an integrated value of an optical thickness in the region shown by the mask image in the optical thickness image.

Abstract: Image acquisition apparatuses, spectral apparatuses, methods and storage mediums for use with same are provided herein. At least one apparatus includes: a diffraction element irradiated by a light; a fiber for receiving reflected scattered light from a subject; a diffraction grating dispersing the transmitted light into light fluxes of wavelength bands again; an optical system imaging the split light fluxes; and an imaging device near the focal point of the optical system. An image is changed by rotating the diffraction grating, from which a two-dimensional image is acquired. The transmitted light may be branched into two or more, and input to a collimator lens and imaged as multiple spectral sequences by the optical system. At least one apparatus may form light fluxes traveling at different angles; and may acquire spectral information of the reflected and scattered light. Preferably, for the luminous fluxes, no gap exists in an image.

Abstract: An apparatus for analyzing spectral information includes a database configured to store spectral information of a plurality of materials analyzed by the apparatus, a spectroscopic unit configured to generate spectral information of a subject by filtering an optical signal received from the subject in units of wavelengths, and a controller configured to obtain correlations between spectral information of each of candidate materials from among the plurality of materials and the spectral information of the subject, and generate result information based on the correlations.

Abstract: The present invention aims to obtain a tomographic image free from image noise due to reflection on a container wall surface and having a good image quality by a simple configuration. In a FD-OCT imaging apparatus which images an imaging object stored in a container having an optical transparent wall part tomographically, when the focal depth is set such that a distance D from a first surface Sa of the wall part on the side of the imaging object to a focal point FP of the objective optical system is smaller than a predetermined threshold value smaller than a thickness T of the wall part, the distance between a second surface Sb of the wall part on a side opposite to the imaging object out of the wall surfaces and a reference plane which is perpendicular to the optical path of the illumination light and to which an optical path length is equal is set a value equal to the thickness of the wall part.

Abstract: A method of spatially measuring a plurality of nano-scale structures in a sample comprises the steps of: marking the individual structures at different locations with fluorescent markers, coupling the individual structures to individual positioning aids whose positions in the sample are known, exciting the fluorescent markers with excitation light for emission of fluorescence light, wherein an intensity distribution of the excitation light has a local minimum, arranging the local minimum at different positions in a close-up range around the position of respective positioning aid whose dimensions are not larger than the diffraction limit at the wavelength of the excitation light, registering the fluorescence light emitted out of the sample separately for the individual fluorescent markers and for the different positions of the minimum, and determining positions of the individual fluorescent markers in the sample from the intensities of the fluorescence light registered.

Abstract: A method and system for measuring a sample property (X) by means of photonic circuit (10). The photonic circuit (10) comprises at least two photonic sensors (11, 12) configured to modulate the light according to respective output signals (S1,S2) with periodically recurring signal values (V1, V2). The photonic sensors (11, 12) comprise a low range sensor (11) with a relatively low range or high sensitivity for measuring a change (?X) of the sample property (X) and a high range sensor (12) with a relatively high range or low sensitivity to measure the change (?X) of the sample property (X). The sample property (X) is calculated by combining the output signals (S1, S2) of the sensors (11, 12). Particularly, the second output signal (S2) of the high range sensor (12) is used to distinguish between recurring signal values (V1) in the first output signal (S1) of the low range sensor (11).

Abstract: An organic compound analyzer is provided which is capable of highly accurately determining a denaturation feature point on which a minute structural change of an organic compound is reflected. The organic compound analyzer includes an actual measured data storage section, an evaluation criterion vector setting section, a score calculation section, and a change feature point determination section. The actual measured data storage section is configured to store in pairs a plurality of actual measured spectra obtained through measurement of a sample containing an organic compound under a plurality of different external stimulus conditions, and external stimulus conditions under which spectra are respectively measured. The evaluation criterion vector setting section is configured to set a loading that indicates weighting to individual wavenumbers at which the spectra are measured.