Abstract: Measurement of the fluorescence of a layer of cells, disposed in a well, with supernatant liquid thereabove, is greatly enhanced in sensitivity by illuminating the cell layer with a beam of light incident thereupon at a first angle and detecting fluorescence emitted by the cells with a detector which views the illuminated cells at a second angle, wherein at least one of the first or second angles is oblique to the cell layer. By so controlling the geometry of the system, the contribution to background fluorescence by the supernatant liquid is greatly minimized. Sensitivity of the technique is further enhanced by restricting the portion of the illuminated cell layer which is viewed by the detector. The technique may be applied to an apparatus for rapidly scanning the fluorescence of a plurality of samples in a multiple well plate.

Abstract: A device for measuring the diameter of an object that is generally cylindrical such as, for example, an optical fiber, without contact.This device includes a laser (4) capable of emitting a luminous beam, optical means (6, 8, 10) provided to form first and second luminous beams from the luminous beams emitted by the laser and to illuminate the object (2) with these first and second luminous beams, so as to obtain two luminous beams reflected by the object which interfere with one another, and means (CCD, 14) of photo-detection and analysis of the interference between the two reflected beams, capable of determining the diameter of the object from the interference fringes.

Abstract: A method for measuring an anamorphic lens includes a first step of converging a light beam emitted by a light source towards a reference standard and adjusting the reference standard along the travel direction of the light beam so that the light beam reflected by the reference standard forms a point spread function image or a line spread function image on a focal plane. A second step of replacing the reference standard with an anamorphic lends to be measured and adjusting the same so that the light beam reflected by the anamorphic lens forms a line spread function image on the focal plane, and a third step of measuring the anamorphic by comparing the first step with the second step are provided.

Abstract: Straightness is measured with high accuracy through the use of two laser beams of different wavelengths to thereby eliminate any measurement error due to deflection caused by the turbulence of a medium through which the laser beams propagate. An exemplary apparatus for measuring straightness is characterized in that two laser beams of different wavelengths are received by a position sensor, respective measured values including the amounts of deflection created in the two laser beams are sent to a calculating portion, and in the calculating portion, a calculating process of offsetting the amounts of deflection created in the laser beams from the two measured values is carried out to thereby detect the position of a stage and measure straightness.

Abstract: A compact, high sensitive, multi-wavelength spectral analyzer capable of simultaneously obtaining a spectral distribution of extremely weak radiation such as bioluminescence, chemiluminescence, extremely weak fluorescence caused by excitation light, Raman scattered light, etc. with an extremely high luminosity and without wavelength scanning. The spectral analyzer comprises a spectroscope and a high sensitive one- or two-dimensional photodetector. The spectroscope includes an entrance slit, a collimator lens of high luminosity disposed such that a focal point of the collimator lens is coincident with the entrance slit to convert light emerging therefrom into parallel rays, a reflection diffraction grating that diffracts the parallel rays from the collimator lens to produce spectra, and an imaging lens that focuses the parallel rays diffracted by the reflection diffraction grating on an image plane thereof to form a spectral image. The photodetector is disposed on the image plane of the imaging lens.

Abstract: A method of measuring the density of light in a visible region reflected from a planar image recorded on an image-recording material. A reference calibration plate, having known reflection densities for types of wavelengths and exhibiting spectral absorption in the invisible region, is placed in a plane. Light in a predetermined invisible region is applied to the reference calibration plate, and a quantity of light in the predetermined invisible region reflected from the reference calibration plate is determined. The recording material is placed at the same position and a quantity of light in the predetermined invisible region reflected from the recording material is determined.

Abstract: An apparatus for monitoring trash in a sample of trash particles and fibers includes scales for determining the weight of the sample which is transmitted to a computer. The sample is presented to a sensing volume and an optical sensor produces an output signal corresponding at least to the presence of the trash particle in the sensing volume. In one embodiment, the output signal is the waveform corresponding to light extinction caused by the presence of the particle in the sensing volume. In a second embodiment, image analysis of trash particles in a sensing volume provide output signals corresponding to the size, shape or composition of the particles. The computer receives the weight data and the output signal from the optical sensor and produces output data in the form of a count of at least a portion of the trash particles per unit weight of sample.

Abstract: A spherical sample cell (FIG. 4A) bears an external inwardly specular laye defining a hollow imaging mirror 11D and an optical aperture 11E. The mirror acts as an integrator of both the exciting radiation for irradiating the sample and the resulting excited radiation to be analysed, the former entering and the latter exiting through the aperture 11E. Optical integration resulting from multiple internal reflections provides multifold increase in excited radiation compared with bare cells, which is of particular advantage in Raman spectrophotometry. Alternatively, the mirror may be provided in two complementary halves in a two-part cell-holder, in which case any conventional sample cell that fits within the mirror may be used. Spectrophotometers adapted for use with the sample cell or the cell holder as well as methods based on them are described.

Abstract: Apparatus and method for using the apparatus are provided, where the apparatus provides for a light beam of variable area in a narrow wavelength band, where the size of the beam incident on a sample and relative movement of the sample and light irradiation and collection means is carefully controlled, so as to vary the site of interrogation. A discrete element collector system is used to efficiently collect the emitted light from the sample and direct it to a focusing lens, filter pack and photodetector for collection of the light and transmitting signals to electronic circuitry for analysis.

Abstract: A sample injector (32) with an upwardly opened sample receiving hole is connected to an atomizer (36) of a flame type atomizing means and on a burner chamber (7) a flameless type atomizing means is mounted ahead of a burner head (9). For distribution of the sample by an auto-sampler (40) it is so arranged that the nozzle is movable to the sample bottle of the auto-sampler (40) and the sample injector (32) or a sample injection hole (30) of the atomizing means placed at the measuring position. This arrangement enables injection of the sample into the atomizing means of either type by means of a common auto-sampler, this facilitating switching between the flame system and the flameless system.

Abstract: A light intensity modulator with a predefined range of modulation wavelengths (preferably a narrow range) can be adjusted by a control signal. This modulator receives a light beam and retransmits a modulated light beam in which any wavelength within the modulation range is modulated. A light intensity detector receives this modulated beam and outputs an electrical signal which is a function of the luminous intensity detected. Such a device finds particular application as a spectrophotometer.

Abstract: A semiconductor chip position detector including a transparent film on which semiconductor chips are placed, a film table on which the film is placed, a light source, optical fiber cables provided in the vicinity of the film table, by which light beams from the light source are radiated onto the semiconductor chips through the film having the semiconductor chips placed thereon, and a position recognition device provided above the film for recognizing the positions of the semiconductor chips based on shadow shapes of the semiconductor chips generated by the radiated light.

Abstract: A high resolution fast imaging spectrograph is disclosed which provides 400 spatial channels and 100 spectral channels of information. A collimating mirror (10) and a focusing mirror (12) face a plane diffraction grating (14), which is positioned at an acute angle to the perpendicular to the optic axis. An elongated slot (16) is cut through approximately the center of the grating allowing the light source (18) to pass through the slot and onto the collimating mirror. A turning mirror (20), which is placed at the focus of the focusing mirror and adjacent to the slot, directs radiation to a camera mirror (22), which focuses a final image outside the instrument enclosure onto a detector (24). The light source to the instrument is provided by an optical fiber ribbon. The detector will commonly be a CCD or CID 2-D detector, permitting the simultaneous measurement of spectral distribution of a spatial profile.

Abstract: A dual beam spectrometer for conducting both turbidimetric and colormetric measurements includes a housing with a light source. The housing further includes source exit apertures that form light from the light source into a sample light beam and reference light beam. A sample cartridge for containing sample material to be measured is mounted in the housing in the path of the sample light beam. The spectrometer also includes a detector assembly for detecting the sample light beam and the reference light beam. The detector assembly includes a first detector that senses or detects sample light beam and a second detector that senses or detects the reference light beam. A sample light beam detection aperture tube is positioned in the housing between the sample cartridge and the first detector. Similarly, a reference light beam detection aperture tube is positioned between the sample cartridge and the second detector.

Abstract: A light transmitting source for a color sensor utilizes a plurality of light emitting diodes emitting light in a predetermined narrow range of wavelength whose emitted light strikes a surface of a lightpipe whereupon the light is reflected and refracted and directed to a common reflection point and where each emitted light is attenuated by the reflection and refraction a desired amount and directed to illuminate an object whose color is to be measured.

Abstract: A probe for use in situ analysis of light absorbing fluids wherein light emitted from a source is collimated by a lens and transmitted through a fluid onto and substantially perpendicular to a reflector. Light is reflected by the reflector back through the fluid and focused by the lens onto a reflected light collector for transmission to analyzing apparatus. The length of the path traversed by the emitted and reflected light is adjustable.

Abstract: A microscopic spectrometer having a separate optical path for masking light from a sample for spectrometric measurements. In the preferred embodiment, a beam splitter is disposed behind an object lens to form two branched optical paths. One of the optical paths is provided with masks at a point of focus along the path, allowing part of the image to be masked. The second optical path allows optical throughput and observation of the entire image. These two optical paths are rejoined, and a final image is obtained for visual inspection by synthesizing the two optical paths.

Abstract: An apparatus and method for aligning an irregularly shaped object with a contact mask is disclosed. The apparatus includes a means for holding the irregularly shaped object, a means for holding a contact mask, a means for keeping the object and contact mask apart during alignment, means for optically aligning the contact mask to the object, and a means to bring the cube and object together once aligned. A conventional mask alignment tool has been modified to support a clamping fixture which holds the object in a fixed position. It includes a wafer sized disk made of deformable material which permits the edges of the disk to be in contact with the mask, yet when deflected by vacuum pressure will keep the surface of the object away from the contact mask assembly. Upon proper alignment, the vacuum is released and the deformable disk allows the object to cone in contact with the contact mask.

Abstract: A focus state detection device comprising: a first optical conversional system for forming an optical flux in one of two symmetric regions with respect to an optical axis of an optical flux from a subject to be photographed; a second optical conversional system for forming an optical flux in the other of the two symmetric regions; and a third optical conversional system for forming an optical flux in a region including the optical axis. The device further comprises a first and a second photoelectric converters for generating electric signals in response to optical intensity distribution data of the fluxes formed by the first and second systems, respedtively; a third photoelectric converter for generating an electric signal in response to optical intensity distribution data of the flux formed by the third system; and a calculation unit for detecting a focus state of the subject on the basis of correlation between three electric signals output from the first, second and third converter means.

Abstract: A fiber-optic sensor device (210) for semiconductor device manufacturing process control measures polycrystalline film thickness as well as surface roughness and spectral emissivity of semiconductor wafer (124). The device (210) comprises a sensor arm (212) and an opto-electronic interface and measurement box (214), for directing coherent laser energy in the direction of semiconductor wafer (124). Opto-electronic interface/measurement unit (214) includes circuitry for measuring the amounts of laser power coherently reflected in the specular direction from the semiconductor wafer (124) surface, scatter reflected from the semiconductor wafer (124) surface, coherently transmitted in the specular direction through the semiconductor wafer (124), and scatter transmitted through the semiconductor wafer (124).