Abstract: A device for measurement of the spectral reflectance of a surface where the reflectance factor of light with a certain wavelength can be measured in a wide wavelength range, including the UV range, and in which a reference reflectance factor can be easily obtained. The device for measurement has a light source part with a xenon lamp; a fiber on the incidence side; a measurement head which emits the light transmitted by the fiber via a convergent lens and a diffuser onto the surface of the measuring object and which receives the light reflected by the surface; a fiber on the exit side; and a spectroradiometer which receives the light which has been transmitted by the fiber on the exit side.

Abstract: In an instrument generating images from the fluorescent emissions of a plurality of fluorescent dyes carried by objects in a flow stream, spectral dispersion is used to expand the images of the objects along one axis of a two-dimensional photosensor array according to emission wavelength. The dispersion is unable to completely separate the emissions of a plurality of dyes because the emission spectra of the dyes overlap in wavelength. The method of the present invention accomplishes accurate estimation of the intensity of the light received from each of a plurality of dyes by decomposing the two dimensional spectrally dispersed images into a set of characteristic parameters using either an iterative curve fitting optimization method or a linear algebraic method.

Abstract: The density of a spray plume generated by an aerosol delivery system (“ADS”) may be characterised by illuminating a face of the plume with light and then imaging the plume. The shape of the plume may be characterised by operating the ADS in a controlled manner to form a first spray plume. A face of the plume is illuminated and the plume imaged from a first side parallel to the spray axis of the plume. The ADS is then again operated in the controlled manner to form a second spray plume. A face of the second plume is illuminated and the second plume imaged from a second side which is parallel to the spray axis of the plume and perpendicular to the first side.

Abstract: A laser scanning microscope, preferably a confocal laser scanning microscope, having a laser light source for illuminating a specimen and a detector for detecting the light returning from the specimen, the specimen or parts thereof. The specimen is marked with markers that can be excited to emit. For the specific detection of preferably biological specimen structures, with high localization accuracy for the specimen structures, the laser light source emits exciting light substantially at one wavelength. Different markers emit light of different wavelengths, when irradiated with exciting light of substantially the same wavelength. The detector is embodied as a multi-band detector for the simultaneous detection of light at several wavelengths. A corresponding method for the detection of preferably biological specimens or specimen structures by laser scanning microscopy is described.

Abstract: In an optical spectrum analyzer, the respective wavelength bandwidths of the optical spectrum analyzer are determined at the wavelengths of the reference lines and used as calibration data for determining measurement tolerances by means of reference lines of known wavelength and known wavelength bandwidths from the known wavelength bandwidths of the reference lines and from the wavelength bandwidths of the reference lines measured with the optical spectrum analyzer

Abstract: The present invention provides a method for monitoring a reaction mixture using Raman spectroscopy. In a preferred embodiment, the invention provides a method for monitoring bulk and thin film melt polycarbonate polymerization reactions. In this method, the relative and absolute concentrations of the starting materials diphenylcarbonate (DPC) and bisphenol-A (BPA) are determined. Monitoring and maintenance of optimum stoichiometry in such a reaction is critical to ensuring desired polycarbonate product quality.

Abstract: In an inspection module for inspecting optical parts (12) for defects, especially contact lenses manufactured as injection-moulded parts, the optical parts (12) are illuminated from one side and are observed from the opposite side by means of an image-resolving sensor (34). The image data of the sensor (34) are forwarded to image-processing means for identification of defects. To obtain a high throughput with a simple construction, a chain (52) of liquid-filled vessels (10) circulating in an endless line is provided. The endless line is passed in an inspection station (72) between an illumination device (32) and the image-resolving sensor (34). Handling means in the form of grippers (56, 58) revolve with the vessels (10), by means of which optical parts (12) to be inspected can be introduced into the vessels (10) at a position of the line upstream of the inspection station (72) and the inspected parts can be taken out of the vessels (10) at another position of the line.

Abstract: A method and an apparatus system feature detecting faults in process conditions of a plasma-based semiconductor processing system by sensing the spectral emissions of the plasma. As a result, the method includes sensing optical energy produced by the plasma and identifying the fault in the process conditions as a function of one or more of the plurality of spectral bands. To that end, the apparatus includes a detector in optical communication with the processing chamber to sense optical energy generated by the plasma, and a spectrum analyzer, in electrical communication with the optical detector. The spectrum analyzer resolves the spectral bands and produces information corresponding thereto. A processor is in electrical communication with the spectrum analyzer, and a memory is in electrical communication with the processor. The memory includes a computer-readable medium having a computer-readable program embodied therein that controls the system to carry-out the method.

Abstract: In a spectrographic type spectrometry measuring apparatus employing a concave holographic diffraction grating or a replica thereof, a small-size and light-weight spectrometry measuring apparatus having a high reliability with a spectrum position does not move in a photo detector plane in spite of an occurrence of a temperature change. This measuring apparatus is composed of a light-condensing device, a concave holographic diffraction grating or a replica thereof, and a telecentric correction lens for condensing a diffracted light from the diffraction grating telecentrically on the spectrum condensing plane. In this constitution, the spectral ray enters vertically to the spectrum focusing plane, and if the photo detector is moved in the optical axis direction due to a temperature change, the spectrum is not moved on the photo detector surface, and it is not necessary to calibrate an optical element due to an ambient temperature change.

Abstract: A spectrometer has higher resolving power without enlarging a size of the apparatus. This spectrometer has a slit board, a mirror, a collimator lens, a holographic grating, an Echelle grating, a magnifier lens and a line sensor. The holographic grating is arranged to diffract parallel light incident from the collimator lens toward the Echelle grating. The Echelle grating is arranged to reflect the parallel light incident from the holographic grating toward the holographic grating.

Abstract: Process and apparatus for measuring optical, especially calorimetric, parameters on liquid, colored media, especially on wet lacquers, in which the liquid, colored medium is applied to a continuously moving, cylindrical support, a film of the liquid, colored medium forms on the continuously moving, cylindrical support, and optical, especially calorimetric, parameters are measured on the film of the liquid, colored medium.

Abstract: A device for monitoring wavelength division multiplexed optical signals for use in an optical network and in an optical performance monitor. A device has a structure for supporting components of the device. An optical component is supported at one end of the structure for transmitting the optical signals. A diffraction grating is supported at an opposing end of the structure for diffracting the optical signals from the optical component. An optical sensor is supported in relation to the diffraction grating by the structure for monitoring the optical signals. A telephoto lens assembly is supported by the structure and disposed between the optical sensor and the diffraction grating, the lens assembly having a focal length for focusing the optical signals in relation to the optical sensor. Thermal effects on the structure are balanced against thermal effects on the lens assembly. A prism is disposed between the lens assembly and diffraction grating.

Abstract: The invention concerns a method for determining the quality of meat, in particular beef, on the transformation site, comprising the following steps: a) collecting, on the transformation site, data on parameters pertaining to the group consisting of the animal's race, age, and category, and biological and/or physico-chemical parameters of the animal's carcass pertaining to the group consisting of weight, conformation, fleshing, the carcass pH and color, and the thickness of the hide; b) obtaining at least an optical spectrum of the meat at wavelengths pertaining to a spectral range from the visible to near-infrared; c) combining data obtained from steps a) and b), to determine the meat tenderness according to a predetermined law established with respect to a predetermined tenderness reference scale.

Abstract: A device for monitoring wavelength division multiplexed optical signals for use in an optical network and in an optical performance monitor. A device has a structure for supporting components of the device. An optical component is supported at one end of the structure for transmitting the optical signals. A diffraction grating is supported at an opposing end of the structure for diffracting the optical signals from the optical component. An optical sensor is supported in relation to the diffraction grating by the structure for monitoring the optical signals. A telephoto lens assembly is supported by the structure and disposed between the optical sensor and the diffraction grating, the lens assembly having a focal length for focusing the optical signals in relation to the optical sensor. Thermal effects on the structure are balanced against thermal effects on the lens assembly. A prism is disposed between the lens assembly and diffraction grating.

Abstract: A micro-Raman spectroscopy system capable of making effective use of the unique analyzing capabilities of Raman spectroscopy and still capable of employing information about foreign materials obtained by a separate foreign material inspection system. The micro-Raman spectroscopy system uses a sample stage having a function of reproducing an image of a foreign material on a wafer under an optical microscope, based on positional information previously obtained from foreign materials by the separate foreign material inspection system. Furthermore, the micro-Raman spectroscopy system has a function of searching a built-in database for the substance of the foreign material on the wafer, using a Raman spectrum presently obtained from the foreign material. The system includes a Raman analysis optical system and a Raman spectrometer that are connected by optical fiber.

Abstract: The invention relates to a method for testing the functionality of a spectrometer for faults comprising at least one radiation source, one filter arrangement for separating the radiation into different wavelength ranges, and one receiving arrangement. The invention also relates to a spectrometer comprising a fault recognition device. Reference values are generated at at least two different color temperatures of the radiation source and in the different wavelength ranges. Actual received signals at at least two color temperatures to be set are compared with the reference values in order to test the spectrometer. In the occurrence of variations, the type of variation is determined according to the wavelength ranges and the color temperatures, and definite faults are concluded from the type of variation.

Abstract: The optical system of this invention is an unique type of imaging spectrometer, i.e. an instrument that can determine the spectra of all points in a two-dimensional scene. The general type of imaging spectrometer under which this invention falls has been termed a computed-tomography imaging spectrometer (CTIS). CTIS's have the ability to perform spectral imaging of scenes containing rapidly moving objects or evolving features, hereafter referred to as transient scenes. This invention, a reflective CTIS with an unique two-dimensional reflective grating, can operate in any wavelength band from the ultraviolet through long-wave infrared. Although this spectrometer is especially useful for rapidly occurring events it is also useful for investigation of some slow moving phenomena as in the life sciences.