Patents Examined by Kara Geisel
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Patent number: 6897954Abstract: The present invention provides instruments for analyzing a multiplicity of fluorescent dyes using a multiplicity of amplifying photodetectors, methods for using the instruments, methods for setting the instrument parameters, and methods for resetting the instrument parameters following a changed in photodetector amplification. The present invention is particularly applicable in the field of flow cytometry.Type: GrantFiled: December 20, 2002Date of Patent: May 24, 2005Assignee: Becton, Dickinson and CompanyInventors: James E. Bishop, Sunil S. Dalal, Zhenxiang Gong, Michael D. Lock
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Patent number: 6897950Abstract: Methods and systems for studying microscopic particles are provided. An optical trap for a selected microscopic particle can be formed with a laser beam at a first power level. The laser beam can have a variable power level associated therewith. The variable power level can be increased to a second power level. The laser beam at the second power level can produce Raman scattering signals. The second power level can provide sufficient excitation energy to the selected microscopic particle to produce Raman scattering signals and the second power level is higher than the first power level. A Raman spectrum can be detected from the Raman scattering signals produced by the laser beam at the second power level.Type: GrantFiled: July 16, 2002Date of Patent: May 24, 2005Assignee: East Carolina UniversityInventors: Yong-Qing Li, Mumtaz A. Dinno
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Patent number: 6897958Abstract: In an inspection device, an inspection light projector and an auxiliary light emitter respectively project an inspection light and auxiliary light onto a position of a filmstrip. After transmitting the filmstrip, the inspection light is received by a defect detector. When receiving the inspection light, the defect detector generates a data signal and sends it to a controller. In the controller, a threshold of a level of the data signal is memorized, and the level of the data signal is compared with the threshold. If the level of the data signal becomes under the threshold, the controller determines that the filmstrip has a coloring defect. Further, if there is a dust on the filmstrip, the level of the data signal becomes higher. Because the auxiliary light is diffused by the dust, and a part of the auxiliary light is received by the defect detector.Type: GrantFiled: April 16, 2002Date of Patent: May 24, 2005Assignee: Fuji Photo Film Co., Ltd.Inventors: Yukihiko Yamaguchi, Koichi Murai
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Patent number: 6894769Abstract: A method and system are provided for monitoring erosion of system components in a plasma processing system. The system components contain emitters that are capable of producing characteristic fluorescent light emission when exposed to a plasma. The method utilizes optical emission to monitor fluorescent light emission from the emitters for determining system component status. The method can evaluate erosion of system components in a plasma, by monitoring fluorescent light emission from the emitters. Consumable system components that can be monitored using the method include rings, shields, electrodes, baffles, and liners.Type: GrantFiled: December 31, 2002Date of Patent: May 17, 2005Assignee: Tokyo Electron LimitedInventors: Audunn Ludviksson, Eric J. Strang
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Patent number: 6894790Abstract: A test pattern formed in a scribe line area of a wafer is irradiated with a light beam to measure the width thereof; the test pattern is irradiated with an electron beam so as to measure the width thereof; an amount of change in the width of the test pattern is calculated; a dummy pattern having the same width as that of a semiconductor device of the wafer is irradiated with an electron beam to measure the width thereof; and the width of a pattern is estimated by the use of the calculated amount of width change so as to determine the shape of the pattern. Thus, a shape measuring system and method capable of determining the shape of a micropattern in a semiconductor device without changing the dimensions of the micropattern can be provided.Type: GrantFiled: November 12, 2002Date of Patent: May 17, 2005Assignee: Hitachi High-Technologies CorporationInventors: Yasuhiro Mitsui, Yasutsugu Usami, Isao Kawata, Yuya Toyoshima, Tadashi Otaka, Nobuyuki Iriki
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Patent number: 6894777Abstract: A multiple-channel spectrometer assembly for analyzing a plurality of sample flows. The assembly includes a plurality of spectrometer channels, each fluidly connectable to a respective one of the sample flows. Each channel has a sample inlet and a sample outlet connectable to a respective one of the sample flows. Each channel has a chassis and a light source mounted to the chassis. A spectrometer module is adjacent to each chassis and is optically coupled a light outlet portion of the light source. The spectrometer module has an optical inlet axially coupled to the light outlet portion to receive light from the light source. A high-pressure flow cell assembly is positioned adjacent to the chassis between the light source and the spectrometer module to emulate a fiber optic cable therebetween. The flow cell assembly has a flow passageway in fluid communication with the sample inlet and sample outlet.Type: GrantFiled: August 7, 2002Date of Patent: May 17, 2005Inventors: Romaine R. Maiefski, Bruce O. Blizzard
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Patent number: 6885447Abstract: The present invention relates to a spectrometer whereby the accuracy of wavelength measurement can be improved without being affected by the environment of use. The present invention is characterized by improvements made to a spectrometer for spectrally dividing the light under measurement by transmitting the components thereof at different, wavelength-by-wavelength angles, and receiving and detecting the light under measurement thus spectrally divided by the chromatic dispersion device using an optical detector. The apparatus according to the present invention comprises a refractive index compensation means for compensating changes in the angle at which the chromatic dispersion device transmits the light under measurement, according to changes in the refractive index of the medium in which the chromatic dispersion device is placed.Type: GrantFiled: September 3, 2003Date of Patent: April 26, 2005Assignee: Yokogawa Electric CorporationInventors: Yasuyuki Suzuki, Yoshihiro Sanpei, Makoto Komiyama, Kenji Ogino, Raiju Okada, Shuuhei Okada, Shin Kamei
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Patent number: 6885446Abstract: A method and system are presented for use in controlling a process of material removal from the surface of a patterned structure, by measuring at least one of residue, erosion, dishing and corrosion effects in the structure induced by this process. The structure is imaged utilizing phase modulation of light reflected from the structure, and a phase map of the structure is thereby obtained. This phase map is analyzed and data indicative of light reflective properties of layer stacks of the structure is utilized to determine a phase difference between light reflected from a selected measured site and at least one reference site spaced-apart from the selected site. The phase difference is thus indicative of the measured effect.Type: GrantFiled: December 4, 2002Date of Patent: April 26, 2005Assignee: Nova Measuring Instruments Ltd.Inventors: Vladimir Machavariani, David Scheiner, Amit Weingarten, Avi Ravid
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Patent number: 6876444Abstract: A refractometer with a measuring prism on whose measuring surface a sample to be tested can be mounted, which sample can be illuminated by a light beam emitted by a source of light under a range of angles that includes a critical angle for total reflection, and with a reciever for recieving the reflected light. An optical device that decomposes the reflected light into a color spectrum that is mounted in the path of the reflected light between the measuring surface and the reciever.Type: GrantFiled: May 18, 2001Date of Patent: April 5, 2005Assignee: Franz Schmidt & Haensch GmbH & Co.Inventors: Sükrü Yilmaz, Mathis Kuchejda
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Patent number: 6870619Abstract: An entrance slit of the spectrometer is illuminated with optical radiation. An optical component images the entrance slit to an optical modulator by the optical radiation and disperses the optical radiation into a spectrum. The spectrum is modulated by the optical modulator The optical component composes spectral non-dispersive measurement radiation of the spectrum and images the entrance slit included in the measurement radiation to an exit slit which may be the same one as the exit slit or a different one. Measurement radiation is detected from the entrance slit with a detector, which converts the measurement radiation into an electrical measurement signal.Type: GrantFiled: September 27, 2000Date of Patent: March 22, 2005Assignee: Valtion Teknillinen TutkimuskeskusInventors: Jussi Tenhunen, Jouko Malinen, Markku Känsäkoski
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Patent number: 6870618Abstract: A wavelength variable light source emits a light whose wavelengths continuously change from a preset start wavelength up to a stop wavelength to a measuring object. A timing information output section generates timing information showing emission timings of lights emitted from the wavelength variable light source and having start and stop wavelengths and a plurality of wavelengths obtained by delimiting the wavelengths between the start and stop wavelengths in predetermined steps. A light receiving section receives the light output from the measuring object and outputs a signal showing a measured value of a received light. A plurality of amplifiers receive the signal output from the light receiving section and amplify the signal at each predetermined amplification factor.Type: GrantFiled: April 26, 2002Date of Patent: March 22, 2005Assignee: Anritsu CorporationInventors: Takashi Sugimoto, Hiroaki Ohtateme
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Patent number: 6870614Abstract: Method, system and computer product for formulating a bi-directional color match. In this disclosure, a computing unit obtains spectral measurements of a target bi-directional color. The computing unit uses a bi-directional color formulation tool determine a combination of pigments, dyes and platelet-shaped pigments that generates spectral measurements that match the spectral measurements of the target bi-directional color.Type: GrantFiled: May 30, 2002Date of Patent: March 22, 2005Assignee: General Electric CompanyInventors: John Frederick Graf, Hongyi Zhou
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Patent number: 6864977Abstract: Described herein is a spectrophotometer having an inlet slit associated to which is at least one electrostatic-film shutter.Type: GrantFiled: June 13, 2003Date of Patent: March 8, 2005Assignee: C.R.F. Societa Consortile per AzioniInventor: Marco Pizzi
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Patent number: 6864489Abstract: A method of detecting wear on a substrate including coating a composition that includes a fluorescent compound on the surface of a first substrate, exposing the coated surface to wear, exposing the coated surface to radiation capable of exciting the fluorescent compound, and detecting the presence or absence of fluorescence.Type: GrantFiled: October 30, 2001Date of Patent: March 8, 2005Assignee: 3M Innovative Properties CompanyInventors: Yen Lane Chen, Gary S. Williamson
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Patent number: 6859277Abstract: A fluid particle counter comprising an inlet jet tip producing an air flow, a strip laser diode producing a laser beam, and a beam shaping system that includes an aspheric collimating lens, an achromatic spherical lens, a cylinder lens, and a series of cascading apertures. A retarder rotates the polarization so that the TE mode is along the direction of fluid flow. The optical system is designed so that along the flow axis the laser beam is single mode, while the multimodes due to the strip laser are constrained to the dimension perpendicular to the flow. The beam is pinched to a 35 micron waist and has a Gaussian profile along the flow direction which permits locating the beam within 3.5 mm of the flow tip while preventing stray light scattering from the tip. The beam profile along the axis perpendicular to the flow is closer to a square wave than a Gaussian.Type: GrantFiled: August 27, 2002Date of Patent: February 22, 2005Assignee: Particle Measuring Systems, Inc.Inventors: Gregg A. Wagner, Thomas Bates
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Patent number: 6847451Abstract: Apparatuses and methods for determining the concentration of an analyte in a physiological sample are provided. The subject apparatuses include at least one light source, a detector array, means for determining whether a sufficient amount of sample is present on each of the plurality of different areas, and means for determining the concentration of the analyte based on the reflected light detected from those areas determined to have sufficient sample, where areas having insufficient sample are not used in analyte concentration determination. The subject methods include illuminating each area of a test strip, obtaining reflectance from each of the different areas, determining which areas have sufficient sample based on detected light therefrom and deriving analyte concentration from the areas determined to have sufficient sample, where areas determined not to have sufficient sample are not used in the derivation. Also provided are kits for use in practicing the subject methods.Type: GrantFiled: May 1, 2002Date of Patent: January 25, 2005Assignee: LifeScan, Inc.Inventor: Jerry T. Pugh
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Patent number: 6847441Abstract: Disclosed are a spectacle lens optical characteristics measuring method and a lens meter in which measurement beams are not intercepted by lens pressers. The left and right lenses of a pair of spectacles are point-supported by lens rest shafts at some midpoints in the optical paths of a pair of left and right measurement optical systems, and the spectacle frame for the lenses is held by a pair of frame retaining plates from the front and rear sides. In this state, the spectacle lenses are pressed against lens rest shafts by lens presser shafts to be thereby supported, whereby the way the spectacle frame is held by the frame retaining plates is corrected.Type: GrantFiled: July 11, 2003Date of Patent: January 25, 2005Assignee: Kabushiki Kaisha TopconInventors: Shinichi Nakamura, Eiichi Yanagi
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Patent number: 6839139Abstract: A wavelength monitor includes: a splitter on an optics block dividing an input beam into a first portion and a second portion; a first detector and a second detector; a wavelength selective element in an optical path of one of the first and second portions before a respective detector; and an optical bench on which the splitter, the first and second detectors, and the wavelength selective element are mounted. The optical bench may include a hole through which an application beam, separate from the first and second portions, is to pass. The optical bench may include a reflective surface below an active area of the detectors for directing the light onto the active areas.Type: GrantFiled: March 15, 2002Date of Patent: January 4, 2005Assignee: Digital Optics Corp.Inventors: Xiansong Chen, Yinbao Yang
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Patent number: 6833915Abstract: Optical diagnosis system for small animal imaging, in which the animal which has been arranged on a bearing plate and treated with an activatable optical contrast medium is irradiated by an excitation source and the resulting fluorescent radiation that is radiated back is detected by a detector system, in which case the bearing plate is designed as a radiation-transparent window (13) for a reference radiation—generated by a second marker of the contrast medium—for the detection of the initial concentration of the inert contrast medium.Type: GrantFiled: July 5, 2002Date of Patent: December 21, 2004Assignee: Siemens AktiengesellschaftInventors: Jürgen Beuthan, Arne Hengerer, Tobias Jochum, Thomas Mertelmeier
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Patent number: 6825927Abstract: A method and apparatus relating to a controller for controlling a light emitting array by setting a power level provided to each individual light emission source within the light emitting array is provided. The controller includes a processor for executing instructions and a memory device for storing data. The data from the memory device provides individual instruction for a power level required for each individual light emission source to achieve a normalized detection of light within the fluorometer. A method of manufacturing a controller for controlling the emission of light in a fluorometer includes analyzing the well values of illumination and storing power level values in a memory device corresponding to predetermined illumination levels of the illumination sources.Type: GrantFiled: June 12, 2002Date of Patent: November 30, 2004Assignee: MJ Research, Inc.Inventors: Jeffrey A. Goldman, Igor Kordunsky, Khalid M. Aboushhiwa, Robert Alan Iovanni