Abstract: A method and a device for determining the battery discharge characteristics and estimating the remaining battery capacity easily by a simple mechanism even if time elapses. A discharge characteristics calculation section reads voltage, current, and temperature from a voltage sensor, a current sensor, and a temperature sensor, respectively, and determines the approximated discharge characteristics at a given time based on a position relationship of the discharge characteristics curved surface function V=a.multidot.log(H.sub.0 -H)+b.multidot.H+c to voltage-temperature-duration of discharge axes. A duration of discharge characteristics calculation section determines the duration of discharge from a fully charged state to the present based on the approximated discharge characteristics. A remaining capacity calculation section determines the remaining capacity based on the approximated discharge characteristics.

Abstract: A tubular single-layer winding coil is installed on the outer periphery of a thin wall portion of a cylindrical container case and a columnar electrode is provided at the center of the inside of the cylindrical container case. A fuel channel is formed between the coil and the electrode so that the permittivity of fuel flowing through the fuel channel is detected from the electrostatic capacity therebetween. Further, variation of the electrostatic capacity due to the temperature characteristics of the fuel is compensated by the temperature characteristics of the permittivity of the thin wall portion of the sensor unit. Furthermore, variation of the electrostatic capacity due to the temperature characteristics of the fuel is compensated by the temperature compensation capacitor which is connected with the single layer winding coil in parallel.

Abstract: Systems and methods for testing ASIC and RAM memory devices are disclosed. The method comprises determining a signature map of valid power supply current values for a known good microcircuit wherein each valid power supply current value is measured at a fixed level of power supply voltage and corresponds to a unique test input stimuli pattern applied to the known good microcircuit. The signature map of power supply current values is stored in an electronic memory (300). The test input stimuli patterns are then applied to an unproven microcircuit (330) and the power supply current of the unproven microcircuit is forced to the levels stored in the signature map by a current supply (360) while the voltages across the power supply inputs of the unproven microcircuit are measured by a voltmeter (340). The measured power supply voltages for each power supply current value are then compared to the fixed voltage supply level used to test the known good microcircuit.

Abstract: An apparatus measures a repetitive signal in a coherent manner, including a signal generating circuit to output the repetitive signal in accordance with first clock signals which are generated by a first clock circuit. A sampling circuit samples the repetitive signal in accordance with second clock signals to output a sampled signal, the second dock signals are output by a second clock circuit. An output circuit stores the sampled signals and outputs a reconstructed signal based on said sampled signal.

Abstract: A method is provided for more efficiently and inexpensively testing semiconductor devices by an automated process of monitoring the performance of the test equipment and certifying that it is working properly, both before and after the actual tests of the devices are conducted. If the automated process can certify that the test equipment was working properly, prior and subsequent to the actual tests of the devices, then it can be assumed that the actual tests were performed correctly and the results are valid. Those devices that "passed" the actual tests are then ready for the next step in the fabrication process, or typically ready to be shipped to the customer. If the test equipment's performance degrades significantly during the actual tests, then the results of the actual tests are considered invalid. Consequently, the test equipment can be repaired or recalibrated and all of the devices retested.

Abstract: A method of non-intrusive testing of a terminal resistor on a data bus includes inserting a signal onto the data bus adjacent one end thereof by magnetically coupling a signal generator to the data bus and producing a signal of known repetition rate and amplitude in the data bus. The reflection of the signal from the end of the data bus is observed electronically, and the amplitude and phase of the reflected signal, if any, is determined to indicate whether the terminal resistor is correctly sized or correctly installed.

Abstract: An indicating device for electric control units has a light-emitting diode together with at least two resistors placed between a supply voltage and ground. A control line extends from the control unit and is connected between the two resistors. The control unit controls the potential on the control line in such a manner that when a defect is recognized an indication is provided. An indication is also provided in the event of a short circuit between the control line and the supply voltage, as well as upon an interruption in the control line.

Abstract: The present invention discloses a method for obtaining frequency parameters to determine the resonator inductances of a crystal. Under this method, a plurality of frequencies are applied to a first electrode. This application is performed once while the second electrode and the common electrode are connected by a short circuit, and then again when the second electrode and the common electrode are capactively connected or open circuited. During each application of the plurality of frequencies to the crystal, the phase response for the output of the resonator circuit is monitored. Then the time response of the crystal is determined. Next, the time delay relative maxima for the time response is determined. Finally, the frequencies at which the time delay relative maxima occur are determined. These frequencies correspond to the inflection points where the change in phase goes from monotonically increasing to monotonically decreasing.

Abstract: A method for measuring the resistance or conductivity between two or more conductors which are placed against a semiconductor element, the conductors are placed either in contact with the top surface or one conductor is placed in contact with the top surface and the other conductor is in the form of a large ohmic contact applied to the bottom surface of the semiconductor element. In order to bring the contact resistance between the top conductor(s) and the element to, and hold it at, a predetermined value during measuring, the conductor(s) are held at a constant distance and/or under constant pressure relative to the semiconductor element by use of a scanning proximity microscope. The top conductor may have a boron implanted diamond tip. The carrier profile of the semiconductor element is determined from previously derived calibration curves.

Abstract: The present invention is a device for measuring the electric surface charge density on each surface of a sheet. The sheet can either be moving or non-moving. If the sheet is non-moving a pliers-like device having a pair of electrodes aligned opposite with each other is used. The sheet is placed between the electrodes and the surface measurement is made by either one or two electrometers. For a moving web, the apparatus includes a first and second roller each having a charge measurement segment electrically isolated from the roller shell wherein the charge measurement segments periodically engage the web running through the two rollers. Two grounded shields which periodically shield the charge measurement segment are provided. Two electrometers are provided and from this surface charge density measurement and net charge density measurement on the moving sheet are obtained.

Abstract: A contact probe for semiconductor in-line process monitoring or device measurement is disclosed in this invention which uses gallium, indium or any low-melting and low-vapor pressure electrically conductive alloy as a contact probing material. The probe can be used to directly measure mobile ion density without requiring the formation of aluminum dots on the semiconductor wafers. The safety issues caused by high temperature operation are also eliminated. The time requirement for process-equipment qualification is significantly reduced because the preparation time for aluminum dot formation is now eliminated. In comparison to the mercury probes, since in this invention, the contact is formed at high temperature thus leading to better contacts between the probe and the wafer, which in turn resulting in higher measurement accuracy. Furthermore, the conventional pin slip problem during elevated temperature stress is eliminated by the use of the contact probe of this invention.

Abstract: A broadband electrical signal spectrum analyser comprises a spatial light modulator such as a Bragg cell located within at least one resonant cavity and illuminated by a polychromatic source of light. The signal to be analysed is connected to the Bragg cell. The tuned cavity is arranged to lase the diffracted light to thereby enhance the signal before detection. In one arrangement the cavity is formed by opposed mirrors set at the Bragg angle and one of the mirrors is oscillated through a range of frequencies required by the broadband application. In a second arrangement a plurality of narrow band channels is formed by a fibre optic array. The fibres are arranged such that first ends of the fibres form a linear input array and the second ends form a linear output array. Light at the Bragg angle passes into an appropriate one or more of the output array fibres, passes around the looped fibres to the input array where the light (zero order) is transmitted through the Bragg cell and then back to the fibre loop.

Abstract: The present invention relates to a double ended spring probe ring interface for multiple pin test heads, such as a 120 pin sentry style test head. The double ended spring probe ring is comprised of a non-conductive ring having a plurality of apertures equally spaced along an outer radius of the ring. A plurality of double-ended spring probes are held in the ring by a holding device which is coupled to each spring probe. The holding device holds the spring probe within the ring so as to maintain coplanarity among the spring probes.

Abstract: A probe system tests the electrical characteristics of chips arranged in a matrix on a semiconductor wafer. An XYZ stage movable in the directions of three-dimensional axes is disposed under a probe card having probes to be brought into contact with the electrode pads of the chips. A wafer table rotatable within a horizontal plane is disposed on the XYZ stage. A first image pickup means for picking up the probe images is mounted on the XYZ stage. A second image pickup means for picking up a wafer image is disposed above the table. The second image pickup means is movable horizontally to and from a use position under the probe card. A target is supported and moved by a driving member mounted on the XYZ stage, for aligning the focal points and optical axes of the first and second image pickup means. The target is moved between forward and retreat positions within and outside the field of view of the first image pickup means.

Abstract: Three embodiments of an improved electronic device for testing or monitoring storage batteries that may be only partially charged are disclosed. The device determines the battery's small-signal dynamic conductance in order to provide either a proportional numerical readout, displayed in appropriate battery measuring units, or a corresponding qualitative assessment of the battery's relative condition based upon its dynamic conductance and electrical rating. Without additional user intervention, the device also determines the battery's terminal voltage in an essentially unloaded condition and utilizes this information to automatically correct the measured dynamic conductance. By virtue of this automatic correction, the quantitative or qualitative information displayed to the user conforms with that of a fully-charged battery even though the battery may, in actual fact, be only partially charged. If the battery's state-of-charge is too low for an accurate assessment to be made, no information is displayed.

Abstract: The invention relates to a deformation measuring device (11) for measuring the torque of a cylindrical shaft (10), which device consists of a sensor (12) which rotates together with the shaft (10) and at least one transducer (16) for converting a torque-dependent deformation of the shaft (10) into a signal which can be evaluated and displayed, the sensor (12) being mounted in an axially aligned manner on the external surface (13) of the shaft (10) and comprising edge portions (14, 19) which extend in the axial direction and which are mounted on the external surface (13) of the shaft (10) so as to transmit the deformation of the shaft, the sensor (12) comprising at least one portion (15) of reduced cross-section which is situated between said edge portions (14, 19) and which supports a deformation transducer (16).

Abstract: To increase the measuring sensitivity of a simple-to-manufacture, multi-faced solid optical current sensor, at least one of the light-reflecting lateral faces is displaced radially inward with respect to the remaining light-reflecting lateral faces and has a lesser minimum distance from a center of the solid optical current sensor than the other lateral faces. Because of this displacement, the incident light beam does not move through a closed polygonal progression in the course of a single circuit around a recess for a current conductor, whose current intensity is to be measured by means of the Faraday effect. Helically overlapping displacements of the light circuit paths are created, which cause an increase in light sensitivity. The lateral face or another lateral face can also be displaced outwardly instead of inwardly.

Abstract: An analog test probe includes an integrated circuit having a large number of separate channels, each connected to one of its inputs. There is a plurality of probe tips and 100 ohm coaxial cables, each cable connecting one of said probe tips and one of the IC inputs. This structure introduces reverse signals into the channels that would seriously degrade probe operation if not removed. A capacitor and resistor in each probe tip, and in series with the coaxial cable and ground, match the impedance of the coaxial cable in the reverse direction, so that reverse signals are dissipated in the resistance and capacitance and do not reflect into the probe channels.

Abstract: A method and apparatus for determining the corrosivity of fluids on a metallic material by means of a coil with AC current with predetermined frequency, amplitude, wave form and range, and a metallic specimen with composition identical to the metallic material exposed to the fluid. The specimen, held within the magnetic field of the coil, sustains loss of mass by exposure to the fluid media with concomitant change in the magnetic quantities of inductivity and inductive resistance. Such changes are then converted from analog to digital, measured, collected and processed by a microprocessor.

Abstract: A chip detector is an open circuit device that attract metal chips circulating throughout a piece of equipment such as a transmission. If a chip closes the circuit in the chip detector, then it is subjected to a first pulse of energy in an attempt to burn or displace it from the chip detector contacts. The energy content of the first pulse is selected to burn fuzz, which represents chips of an acceptable size. If the chip remains in the chip detector, then it is subjected to one or more additional pulses each having a greater energy content than the first pulse. The number of pulses and their energy contents are recorded to determine the size of the chips captured by the chip detector and to provide a history of the equipment being monitored. If the chip in the chip detector exceeds a predetermined threshold, then an indication is given on a user interface.