Patents Examined by Kenneth A. Wieder
  • Patent number: 5625284
    Abstract: An electric field sensor comprises a substrate 4, an incident optical waveguide 5 formed on the substrate 4, two branched optical waveguides 6 formed on the substrate 4 to be branched from the incident optical waveguide 5 and having refractive indexes which are variable in response to an electric field intensity applied thereto, an outgoing optical waveguide 7 formed on the substrate 4 to join the branched optical waveguides 6, and an electric field shielding member 8 formed in the vicinity of a part of the branched optical waveguides 6 for shielding an electric field. The substrate 4 may be provided with a reflection mirror 16 for reflecting light beams from the branched optical waveguides 6. The substrate 4 is made of a ferroelectric material and has polarization directions reverse to each other at portions where the two branched optical waveguides 6 are formed.
    Type: Grant
    Filed: March 7, 1995
    Date of Patent: April 29, 1997
    Assignee: Tokin Corporation
    Inventor: Yuichi Tokano
  • Patent number: 5625300
    Abstract: An IC is tested through I.sub.DDQ -measurements. The IC's substrate includes a region of a conductivity type with a supply node for supply of the circuit and with a biasing node for connection to a biasing voltage to bias the region. I.sub.DDQ -testing of the circuit is conducted while the supply node and the biasing node are galvanically disconnected to separate the contribution to the quiescent current from the circuit functionality features from the contribution to the quiescent current from the biasing features.
    Type: Grant
    Filed: December 14, 1994
    Date of Patent: April 29, 1997
    Inventor: Manoj Sachdev
  • Patent number: 5623210
    Abstract: A current-voltage convertor 32 respectively generates positive and negative voltages Xa when a battery 20 is being charged and discharged. A voltage synthesizer 34 adds a prescribed positive voltage to the voltage Xa, and always generates a positive sample voltage Xs. This sample voltage Xs and prescribed reference voltages X1, X2 are compared by means of two differential amplifiers 40, 42 to obtain signals V1, V2 for the currents being charged and discharged. Then, these signals are supplied to a microcomputer 44.
    Type: Grant
    Filed: March 8, 1995
    Date of Patent: April 22, 1997
    Assignee: Sanyo Electric Co., Ltd.
    Inventor: Norinobu Sakamoto
  • Patent number: 5623209
    Abstract: In a capacitive discharge ignition system there being a first circuit detecting the voltage across the storage capacitor marking the onset of discharge of the storage capacitor, a second circuit detecting the voltage across the storage capacitor marking the substantially complete discharge of the storage capacitor, a third circuit for measuring the time between the events marked by the first and second circuits, and a fourth circuit for analyzing the measured time to determine conditions in the ignition system.
    Type: Grant
    Filed: December 7, 1995
    Date of Patent: April 22, 1997
    Assignee: Altronic, Inc.
    Inventors: Joseph M. Lepley, Gary A. Kleinfelder
  • Patent number: 5623202
    Abstract: A single IC testing machine can be used to test several IC chips connected in parallel by a unique hardware design and a special software program for execution, for instance, a single testing head and a single set of address input lines can be used for testing the chips by connecting the corresponding similar address input pins of the chips together first and then connecting to the address input lines of the testing machine, and connecting the data I/O pins of the chips to the data I/O pins of the testing machine, and then connecting the voltage input and the ground of the chips to separate voltage sources.
    Type: Grant
    Filed: September 26, 1994
    Date of Patent: April 22, 1997
    Assignee: United Microelectronics Corporation
    Inventor: C. Y. Yung
  • Patent number: 5623214
    Abstract: A membrane probe (10) for simultaneously testing two or more columns or rows of integrated circuits (37) while still on the wafer (56) upon which they are manufactured includes a flexible visually clear and self planarizing membrane (18) having circuit traces (22). A substrate (12) on which the membrane (18) is mounted features parallel ports (14) corresponding to alternate columns or rows of circuit chips (37) on the wafer to be tested. Two such substrates (12,112) thus forming two alternately used probe test heads (10,110) are employed for testing each full wafer, one test head (10) containing ports (14) corresponding to one set of alternate wafer columns or rows, the other test head (110) containing ports (114) corresponding to the remaining interlaced wafer columns or rows. Probe contact pads (30) are electroplated on areas of the traces (22) so that the contact pads (30) are visually registrable through the substrate ports.
    Type: Grant
    Filed: September 4, 1996
    Date of Patent: April 22, 1997
    Assignee: Hughes Aircraft Company
    Inventor: John Pasiecznik, Jr.
  • Patent number: 5623199
    Abstract: An inspecting device body (1) including an input terminal group (23), an output terminal group (24), a connection terminal group (25), a signal output portion (38), a signal input portion (39), first and second memory portions (40, 41), a comparing and determining portion (42), a lighting and flashing drive portion (44), and a control portion (48) is electrically connected to a work table (2) including an input connector (4), an output connector (5), LEDs (6), an earth plate (7) by one flexible printed wiring board (9), thereby reducing the rejection rate of wiring harnesses at assembly on an assembly line, allowing the final inspection of the wiring harnesses for acceptance or rejection, and improving assembly efficiency.
    Type: Grant
    Filed: November 16, 1995
    Date of Patent: April 22, 1997
    Assignee: Sumitomo Wiring Systems, Ltd.
    Inventors: Yoshikazu Taniguchi, Katsutoshi Kato
  • Patent number: 5621326
    Abstract: A passenger protection apparatus is provided with a plurality of squibs (activating elements). Transistors are respectively connected in series to these squibs. By switching on these transistors at predetermined differing timing, first monitor currents are conducted via current-controlling resistors to the respective squibs. First monitor currents can be independently conducted to the respective squibs with this structure. For this reason, the voltage levels generated at the squibs by the first monitor currents can be enlarged. Resistance values of the respective squibs can be calculated with high accuracy from these voltage values.
    Type: Grant
    Filed: June 2, 1995
    Date of Patent: April 15, 1997
    Assignee: Nippondenso Co., Ltd.
    Inventors: Makoto Watanabe, Yukiyasu Ueno
  • Patent number: 5621332
    Abstract: An apparatus for identifying and measuring in real time substances overlying a surface comprises a plurality of electrodes, a temperature sensor, an electrode control system connected to the plurality of electrodes for defining an electric field, an amplitude and phase measurement system connected to the plurality of electrodes and to the electrode control system for measuring a plurality of currents responsive to the electric field and converting the currents to a measurement set and computer for storing a map comprising a partition of a vector space of predetermined characteristics of substances into regions of profiles corresponding to the substances which could be overlying the surface. The computer correlates the measurement set with the map thereby identifying and quantifying the substances overlying the surface and generates an output signal corresponding to the identity and quantity of substances overlying the surface.
    Type: Grant
    Filed: April 5, 1995
    Date of Patent: April 15, 1997
    Inventors: Stuart Inkpen, John Hall, Chris Nolan, Chris Marshall
  • Patent number: 5621328
    Abstract: In a spacer detection structure of a connector having: an oval connector housing (2); a plurality of connector terminals (32) housed in the connector housing; and a terminal fixing spacer (4) engaged with the connector terminals when the connector terminals are fully inserted into the connector housing and formed with a curved base wall portion (5) along an oval shape of the connector housing, the curved base wall portion (5) of the terminal fixing spacer (4) is formed with a recessed portion (10) having a flat bottom surface (9) brought into contact with at least one detection plate (8) of a connector fixing jig (7) for inspecting whether the terminal fixing spacer is full inserted into the connector housing. Therefore, it is possible to securely inspect an imperfect insertion of the oval terminal fixing spacer (4) into the oval connector housing (2), without increasing the manufacturing cost of the connector fixing jig (7) of the inspection instrument.
    Type: Grant
    Filed: July 6, 1995
    Date of Patent: April 15, 1997
    Assignee: Yazaki Corporation
    Inventor: Makoto Yamanashi
  • Patent number: 5621309
    Abstract: A method of detecting failed disks in power-system surge arresters comprising a network of at least two parallel-coupled stacks of series-coupled ZnO varistors includes measuring differential current flow through each pair of stacks during surge voltage conditions, and comparing the current so measured with a fixed fraction of the total current carried by the arrester. Because each stack contains a like number of substantially identical varistors, current flow through the stack containing a failed disk will measurably exceed current flow through each non-defective stack. If the measured current flow through a stack is excessive relative to current flow through the remaining stacks, the excessive current flow stack is presumed to contain a defective disk. In today's technology, precision Rogowski coils or fiber-optic current sensors provide the high-bandwidth, high dynamic-range transducers necessary for the measurement of both total and differential current.
    Type: Grant
    Filed: February 21, 1996
    Date of Patent: April 15, 1997
    Assignee: Electric Power Research Institute
    Inventor: James M. Feldman
  • Patent number: 5621329
    Abstract: An automatic self-calibration system for digital teraohmmeter wherein a built-in standard resistor is provided. The system is able to calibrate the values of the key components by taking the standard resistor as reference. The calibration procedure of the invention is controlled by a computer and executed automatically. The system is used to measure high-resistance standards up to 10.sup.15 .OMEGA. where the standard uncertainty does not exceed 100 ppm after a traceable calibration.
    Type: Grant
    Filed: April 13, 1995
    Date of Patent: April 15, 1997
    Assignee: Industrial Technology Research Institute
    Inventors: Sai-Hoi Tsao, Chun-Chun Chen, Yu-Chuang Lin
  • Patent number: 5621330
    Abstract: A system for measuring the moisture content of a multi-layer bale of material, comprising a source of microwave radiation disposed on a first side of the bale for directing a circularly polarized source beam through the bale in a direction substantially parallel to the layers thereof so as to exit from the bale as an exit beam and a conveyor for conveying the bale past the source of microwave radiation. A pair of microwave antennas are disposed on an opposite side of the bale for receiving mutually orthogonal components of the exit beam permitting determination of a maximum amplitude of the exit beam corresponding to an amplitude of the exit beam in a direction normal to the layers of the bale. This permits calculation of an attenuation of the beam consequent to absorption by moisture in the bale and thus allows the moisture content of the bale to be determined.
    Type: Grant
    Filed: July 18, 1995
    Date of Patent: April 15, 1997
    Assignee: Malcam Ltd.
    Inventors: Alexander Greenwald, Danny S. Moshe, Boris Tsentsiper
  • Patent number: 5619141
    Abstract: The invention comprises a method for determining the hole or electron concentration, transition temperature, ratio T.sub.c /T.sub.c (max), or state of doping of a material capable of exhibiting superconductivity when cooled below its critical temperature, by measuring the thermopower of a sample of the material above the critical temperature of the material and determining from the thermopower the hole or electron concentration, transition temperature, ratio T.sub.c /T.sub.c (max), or state of doping of the material as to whether it is underdoped, overdoped or optimally doped. The sample may be differentially heated and/or cooled to generate a temperature difference across the sample, the temperature difference across the sample measured, the voltage across the sample measured, and the hole concentration or similar determined from the measured temperature difference and the measured voltage. Means for determining the hole concentration, transition temperature, or doping of the material is also claimed.
    Type: Grant
    Filed: December 30, 1994
    Date of Patent: April 8, 1997
    Inventors: Jeffery L. Tallon, John R. Cooper, Sandro D. Obertelli
  • Patent number: 5619143
    Abstract: A method and apparatus for detecting grain direction in wood by means of microwave radiation. A sample of timber is exposed to a polarized microwave beam emitted by a transmitter (11). A polarized receiver (12) evaluates the microwave energy that has been affected by the timber. The receiver and transmitter polarization planes are locked at either 0 or 90 degrees respect to each other. Both are rotated synchronously and the received energy is plotted versus angle. The energy maximum or minimum gives indication of the grain direction in the timber sample under evaluation.
    Type: Grant
    Filed: November 30, 1992
    Date of Patent: April 8, 1997
    Assignee: Commonwealth Scientific and Industrial Research Organisation
    Inventors: Thomas J. Stevens, Robert H. Leicester
  • Patent number: 5619144
    Abstract: Detector and method for detecting the presence of a liquid, such as water dew or of ice, or for detecting a change of phase in liquid, based on a change in an electrical resistance. The detector comprises a substrate onto whose face one or several resistor patterns are applied. For detecting the presence of a liquid or ice or equivalent by a change in the detector resistance, a low-mass detector resistor pattern is applied onto a substrate out of such a metal or equivalent as has a considerable dependence on temperature. On the substrate, there are contact patterns that feed a short pulse of electric current to heat the detector resistor as a short pulse, the presence of a liquid or ice and or a change of phase being detected by the change in resistance taking place during the short pulse. The thickness of the metal film in the resistor pattern (15) of the detector resistor (R.sub.det) is, as a rule, chosen as s<1 .mu.m.
    Type: Grant
    Filed: August 23, 1994
    Date of Patent: April 8, 1997
    Assignee: Vaisala Oy
    Inventor: Lars Stormbom
  • Patent number: 5617019
    Abstract: A direct current of high intensity having alternating current components superposed thereon is flowing in a conductor 1 through a magnetic circuit 5, 6. Two measuring coils 7, 8 are arranged inside opposite air-gaps of the magnetic circuit and are connected in an electric measuring circuit in series with each other and in parallel to voltage dividers 12, 13 and 14, 15. The alternating current components induce voltages in the coils 7 and 8 which add up, the sum thereof appearing across the series-connection of resistors 13, 15. This voltage is integrated by an integrating circuit 10 and then filtered in a band-pass filter 11. The magnetic circuit 5, 6 is screened by lateral screening members 30, 31 so that the remaining field lines of a lateral parasitic magnetic field produce in the magnetic circuit flux portions which are approximately equal and which are added to the useful flux in one air-gap and are substracted from the useful flux in the other air-gap.
    Type: Grant
    Filed: February 21, 1996
    Date of Patent: April 1, 1997
    Assignee: Liaisons Electroniques-Mecaniques LEM S.A.
    Inventor: Marcel Etter
  • Patent number: 5617033
    Abstract: A plurality of cores of a multi-core cable are collectively conducted at first ends side thereof and are isolated from one another at second ends side thereof. The cores are engaged at the first ends side with grooves formed on a movable member one by one so as to be picked up and are sequentially transported toward an electrode. The picked-up core is cut during :its transportation so as to be electrically separated from a collective conducting part at the first end side. A high voltage is charged to the picked-up core through the electrode and based on an electric conduction characteristic of its charging current a judgment is made about whether there is a defective contact (dielectric breakdown) between the picked-up core and other cores. Further, the electric charge of the picked-up core is discharged, the picked-up core is recharged, and based on electric conduction characteristics of these discharging current and charging current a confirmation that the above judgment was not a misjudgment is made.
    Type: Grant
    Filed: April 3, 1995
    Date of Patent: April 1, 1997
    Assignee: Mitsubishi Cable Industries, Ltd.
    Inventors: Tohru Kashioka, Shogo Tanno, Etsuro Mamishin
  • Patent number: 5617018
    Abstract: An electrical test device for use by an electrician in testing circuits. The device includes a voltage sensor, display, and steady current source. The voltage sensor monitors the type of voltage (AC or DC) between the two conductors, and provides a signal to the display which responsively displays the type of voltage and the voltage level. The power supply has a steady current source that is in series with a tactile transducer, so that the test device may measure a broad range of voltages while only a limited amount of current flows through the voltage sensor. Consequently, lower cost components may be used in the voltage sensor. In another embodiment, the tester also includes a substantially independent continuity tester. The continuity tester includes its own power supply and alarm to indicate the continuity of a conductor and, thus, may operate even if the voltage sensor and display become inoperable.
    Type: Grant
    Filed: September 18, 1995
    Date of Patent: April 1, 1997
    Assignee: Etcon Corporation
    Inventor: Kent L. Earle
  • Patent number: 5617032
    Abstract: A misfire detecting device for an internal combustion engine is provided.
    Type: Grant
    Filed: January 17, 1996
    Date of Patent: April 1, 1997
    Assignee: NGK Spark Plug Co., Ltd.
    Inventor: Hiroshi Inagaki