Abstract: Disclosed is a semiconductor processing apparatus for processing batches of wafers with variable numbers of wafer lots. The apparatus includes an operator interface server adapted to receive batch information for a track-in operation, an equipment management server adapted to store data used to process the batch of wafers, and a device interface server adapted to control a selected unit of processing equipment used to process the batch of wafers. The batch information is transmitted from the operator interface server to the device interface server, and the device interface server attempts to set a sub-recipe in the selected unit of processing equipment based on the batch information. After the sub-recipe is set in the selected unit of processing equipment, the device interface server then attempts to set a process recipe in the device interface server.

Abstract: A production loss tracking system for a manufacturing system includes a collection module, an event module, and a report module. The collection module collects a processing status from a plurality of processing stations. The event module forecasts an upstream production loss event for a first of the processing stations that is upstream from a second of the processing stations that experienced a production loss event when the processing status indicates the production loss event. The event module forecasts a downstream production loss event for a third of the processing stations that is downstream from the second of the processing stations that experienced the production loss event when the processing status indicates the production loss event. The report module communicates with the event module and generates a report indicating the upstream production loss event, the downstream production loss event, and the production loss event.

Abstract: A watering warning device (1) for determining watering intervals for at least one plant to be monitored, having at least one moisture content sensor (2), a timer (6) and an evaluation unit (3) is described. The evaluation unit (3) is designed for determining the time (tG) of the next necessary watering operation for the at least one monitored plant in dependence on a characteristic watering curve (S) over time (t), the watering curve (S) being determinable in a self-learning manner in at least one learning phase from a low moisture value (FGN), measured at a watering time, the high moisture value (FGH), measured after completion of the watering operation following the watering time, and the time (tN) until the low moisture value (FGN) is reached, determined with the timer (6) or extrapolated.

Abstract: Systems and methods for sensing temperatures of multiple functional blocks within a digital device and controlling the operation of these functional blocks in a manner that selectively reduces temperatures associated with some of the functional blocks, but not others. One embodiment comprises an integrated circuit having multiple functional blocks (such as processor cores) and a set of thermal sensors coupled to sense the temperatures of the functional blocks. The integrated circuit includes control circuitry configured to receive signals from the thermal sensors, detect thermal events in the functional blocks and to individually adjust operation of the functional blocks to reduce the temperatures causing the thermal events. In one embodiment, the control circuitry includes a detection/control circuit coupled to each of the functional blocks and a thermal management unit configured to evaluate detected thermal events and to determine actions to be taken in response to the thermal events.

Abstract: Systems and methods for urging a valve plug off a seat of a control valve and toward a set point in the absence of significant delay. Adjustable, user-selected input parameters to the input of a lead-lag filter in communication with the input of a control loop facilitates achieving tunable response by a control valve upon application of small amplitude inputs.

Abstract: Methods for determining tolerances are disclosed that can be used for determining whether a lot of semiconductor wafers needs to be reworked. Overlay tolerance, critical dimension tolerance and a dynamic line edge placement tolerance are determined using error measurements that are taken from sample wafers in the lot, giving tolerances that reflect the error state of that particular lot of semiconductor wafers.

Abstract: Systems and methods are disclosed for using 802.11 based wireless protocols in various energy management applications wherein a host controller uses various types of communication networks to distribute information to an on-premise processor that in turn uses 802.11 based wireless protocols to communicate with various types of end devices, such as utility meters. Various forms of communication are defined between the end device, the on-premise processor, and the energy management host for accomplishing power load control, including determining when to activate or deactivate a load, requesting permission to activate a load, reading usage data, activating or deactivating a meter, and determining rate schedules. A flexible scheme allows control to be shifted to be resident in various entities. The architecture is applicable not only for power load control, but other control type and metering devices.

Abstract: A method for tracking multiple SKUs of contact lenses in a manufacturing line comprising the steps of: a) molding a plurality of contact lenses, b) providing a plurality of carriers each having a carrier indicator, c) inspecting each contact lens to determine information relating to its prescription, d) transferring each lens to a carrier, e) reading the carrier indicator of the carrier of step d) and f) storing in machine-accessible memory the information associated with the carrier indicator of the carrier of step (e) and the information relating to the lens for step (c).

Abstract: A moving mechanism includes a first structural member having a first guide surface, a moving member being movable along the first guide surface, a second structural member having a second guide surface, and an actuator having a movable element provided on the moving member and a stator which is movable along the second guide surface. The first structural member is supported by the second structural member at three positions.

Abstract: In a method for the adaptive feed rate regulation on a numerically controlled machine tool, which is used for the metal-removing processing of workpieces using a tool rotating on a spindle according to the specification of an NC program, the input power of the spindle is held as constant as possible by the influence of a tool feed rate established in the NC program for the motion between the tool and the workpiece. The method for the adaptive feed rate regulation is activated by a command of the NC program that initiates the processing of the workpiece, and is deactivated by a command of the NC program that terminates the processing of the workpiece.

Abstract: A power tool control system allows a user to operate a power tool through a graphical user interface communicatively coupled with a non-contact measurement and alignment device. The graphical user interface correlates user engageable selectors with a logically related menu of power tool setting options displayed on a display screen in a high quality and easily readable format. The non-contact measurement and alignment device uses one or more lasers to determine power tool settings and establish proper alignment based on user needs. The power tool control system further enables stud detection and visual indication of stud location.

Abstract: An earthquake disaster prevention system having: an estimation section to estimate a size of an earthquake from a P-wave of the earthquake detected by the earthquake detector; a stopping control section to control to stop the motion of the operation device when the size of the earthquake estimated by the estimation section exceeds a stopping reference value; a calculation section to calculate at any time the size of the earthquake from the S-wave of the earthquake detected by the earthquake detector; a convergence judgment section to judge convergence of the earthquake by judging whether a predetermined earthquake convergence condition is satisfied from the size of the earthquake calculated by the calculation section; and a resumption control section to resume a predetermined motion of the operation device stopped by the stopping control section when the earthquake is judged to have converged by the convergence judgment section.

Abstract: An energy control system for managing utility operation parameters, including a plurality of utility devices, at least one control module connected to at least one of the utility devices; a data processing module connected to the at least one control module via a wireless communications link; and a wireless internet control center connected to the at least one control module via the data processing module and arranged to operate a plurality of utility operation applications. The control system may further include a plurality of repeaters connected to the data processing module.

Abstract: By providing a detailed hierarchical structure for an APC algorithm and by dynamically adapting a hierarchical level in this structure, an efficient utilization of controller data is ensured, while at the same time a large number of process conditions may be taken into consideration without requiring a re-design of the hierarchical structure.

Abstract: There is provided an information processing apparatus that allows a user to understand what kinds of causes are accumulated stepwise in what kind of order to cause abnormality and due to what kinds of reasons respective causes occur from direct causes of the respective causes.

Abstract: The intensity of light of a predetermined wavelength corresponding to the type of a protective tape joined to the surface of a semiconductor wafer is adjusted by a controller, and a holding stage for holding the semiconductor wafer is scanned rotationally. At this time, at a V notch portion for positioning formed in the semiconductor wafer, light is transmitted through the protective sheet covering the surface, which is received by a photoreception sensor. Based on the change in the reception amount of light in the photoreception sensor, the position of a detection site is specified.

Abstract: The invention intends to provide a manufacturing method of a semiconductor integrated circuit device, which can detect an off-specification faulty wafer in real time. An abnormality detection server stores apparatus log data outputted from semiconductor manufacturing apparatus that processes a semiconductor wafer in an apparatus log data memory. Thereafter, in a lot end signal receiver, when a lot end signal outputted from the semiconductor manufacturing apparatus is received, an abnormal data detector, after referencing an abnormality detection condition setting file stored in a first detection condition memory, based on the referenced content, judges whether there are abnormal data in the apparatus log data stored in the apparatus log data memory or not. Upon detecting an abnormality, a detection result is outputted to an engineer PC and an operator terminal unit.

Abstract: Systems and methods for constructing custom orthotics are described. Several embodiments of the system use sensor pads to obtain both static and dynamic three dimensional information concerning the shape or topography of the bottom surface of a patient's foot. The information is analyzed to obtain information useful in constructing a custom orthotic from a selection of basic orthotic shells. Once constructed, the orthotic can modify a patient's gait. One embodiment of the present invention includes a user terminal including a sensor pad connected to a computer, a server configured to analyze three dimensional information acquired by the sensor pad, a manufacturing terminal configured to display the results of the server's analysis of the three dimensional information and a network that connects the user terminal to the server and the server to the manufacturing terminal.

Abstract: A method for item substitution in a manufacturing process includes receiving an order for manufacture of a product and generating a first electronic bill of material for the product. The first electronic bill of material identifies multiple primary components to be assembled into the product. The method also includes identifying a trigger initiating substitution of one of the primary components, identifying multiple potential substitute components in response to the trigger, and identifying a substitution rule governing selection of one of the potential substitute components. The method also includes selecting one of the potential substitute components according to the substitution rule, substituting the selected one of the potential substitute components for the one primary component, and generating a second electronic bill of material for the product. The second electronic bill of material identifies the selected one of the potential substitute components.

Abstract: A system and method for the simulation and modeling of biopharmaceutical batch process manufacturing facilities using process time lines is described herein. The system employs an eleven-field delimited string code which specifies the unit identifier code and the iteration value for each of the ten levels of nested scheduling cycles of the biopharmaceutical drug production process being modeled. The method includes generating a process time line using operational parameters, a block flow diagram, and a set of scheduling cycles for each of a sequence of unit operations. The process time line is used as a tool for batch processing and facility design.