Patents Examined by Mamadou Faye
  • Patent number: 11906448
    Abstract: An X-ray beam generating system including an X-ray source for generating an original primary X-ray beam, an optics system including a first optics component and at least one second optics component which are movable relative to the X-ray source in order either to bring the first optics component into interaction with the original primary X-ray beam, whereupon a first primary X-ray beam is generated which is deflected at a first deflection angle, or to bring the second optics component into interaction with the original primary X-ray beam, whereupon a second primary X-ray beam is generated which is deflected at a second deflection angle, and a rotating device to rotate the X-ray beam generating system through either a first rotation angle or a second rotation angle to allow either the first primary X-ray beam or the second primary X-ray beam to impinge on a sample region.
    Type: Grant
    Filed: August 21, 2020
    Date of Patent: February 20, 2024
    Assignee: ANTON PAAR GMBH
    Inventors: Josef Gautsch, Roman Prischnegg
  • Patent number: 11899338
    Abstract: A nonlinear crystal including stacked strontium tetraborate SrB4O7 (SBO) crystal plates that are cooperatively configured to create a periodic structure for quasi-phase-matching (QPM) is used in the final frequency doubling stage of a laser assembly to generate laser output light having a wavelength in the range of about 180 nm to 200 nm. One or more fundamental laser beams are frequency doubled, down-converted and/or summed using one or more frequency conversion stages to generate an intermediate frequency light with a corresponding wavelength in the range of about 360 nm to 400 nm, and then the final frequency converting stage utilizes the nonlinear crystal to double the frequency of the intermediate frequency light to generate the desired laser output light at high power. Methods, inspection systems, lithography systems and cutting systems incorporating the laser assembly are also described.
    Type: Grant
    Filed: November 21, 2022
    Date of Patent: February 13, 2024
    Assignee: KLA Corporation
    Inventors: Yung-Ho Alex Chuang, Kelly Mauser, Baigang Zhang, Xuefeng Liu, John Fielden, Yinying Xiao-Li, Elena Loginova
  • Patent number: 11892405
    Abstract: Provided herein is an apparatus for assessing a fluorescence characteristic of a gemstone. The apparatus comprises an optically opaque platform for supporting a gemstone to be assessed, one or more light source to provide uniform UV and non-UV illumination, an image capturing component, and a telecentric lens positioned to provide fluorescent images of the illuminated gemstone to the image capturing component. Also provided are methods of fluorescence analysis based on images collected using such an apparatus.
    Type: Grant
    Filed: March 14, 2023
    Date of Patent: February 6, 2024
    Assignee: Gemological Institute of America, Inc. (GIA)
    Inventor: Hiroshi Takahashi
  • Patent number: 11885754
    Abstract: A tolerance error estimating apparatus, method, program, reconstruction apparatus and control apparatus capable of estimating a deviation of a drive axis from a reference position with respect to driving time are provided. A tolerance error estimating apparatus (processing apparatus 300) X-ray analysis apparatus comprises a specific position calculating section 320 for obtaining a specific position of a reference sample at each rotation driving time from X-ray detection images and a deviation amount calculating section 330 for calculating the deviation amount ?x in the x direction and ?y in the y direction of the center position of a rotation drive shaft as the rotation drive axis at each rotation driving time from the reference position based on the specific position, when the z direction of the orthogonal coordinate system fixed to the sample is set the direction parallel to the rotation drive axis.
    Type: Grant
    Filed: March 24, 2022
    Date of Patent: January 30, 2024
    Assignee: Rigaku Corporation
    Inventor: Takumi Ota
  • Patent number: 11883206
    Abstract: Examples of the present disclosure describe systems and methods for personalized breast imaging. In aspects, a first set of patient attributes may be collected. The first set of patient attributes may relate to, or be used to determine, for example, breast size, breast thickness, and/or three-dimensional (3D) breast shape. The first set of patient attributes may be used to customize image acquisition parameters for the patient. A second set of patient attributes may also be collected. The second set of patient attributes may relate to, or be used to determine, for example, breast elasticity and breast density. The second set of patient attributes may be used to customize breast compression parameters for the patient. The customized image acquisition parameters and breast compression parameters may then be used to perform one or more procedures (e.g., an imaging procedure, a biopsy procedure, etc.) on the patient's breast.
    Type: Grant
    Filed: July 29, 2020
    Date of Patent: January 30, 2024
    Assignee: Hologic, Inc.
    Inventors: Biao Chen, Haili Chui
  • Patent number: 11885671
    Abstract: A field spectral radiometer includes a support structure and a remote sensing head disposed on the support structure. The remote sensing head includes a central axis, a first optical element disposed on a first side of the central axis and defining a first optical path for a first optical channel, and a second optical element disposed on a second side of the central axis and defining second optical path for a second optical channel. An instrumentation assembly disposed on the support structure. the instrumentation assembly includes a first detection path associated with the first optical channel and a second detection path associated with the second optical channel, the first and second detection path include optical indexers for manipulating the first and second optical channels. The field spectral radiometer may include a calibration assembly disposed on the base. The calibration assembly may include a calibrating light source for calibrating the remote sensing head.
    Type: Grant
    Filed: April 23, 2021
    Date of Patent: January 30, 2024
    Assignee: Labsphere, Inc.
    Inventors: Jeffrey William Holt, Mark Duquette, Michael Wellington Dann, Erik A. Skarin, Joseph William Jablonski, Brandon James Russell
  • Patent number: 11879842
    Abstract: Systems and methods here may be used for a setup of image capturing of a gemstone, such as a diamond, exposed to different light sources. Some examples utilize a setup that both sends light and captures the image through multiple dichroic beam splitters at pre-selected timing. The multiple light source and multiple dichroic beam splitter arrangement allows for multiple gemstones to be analyzed using multiple methods with minimal moving, changing, or adjusting the equipment for different samples.
    Type: Grant
    Filed: May 27, 2021
    Date of Patent: January 23, 2024
    Assignee: Gemological Institute of America, Inc. (GIA)
    Inventor: Tsung-Han Tsai
  • Patent number: 11879857
    Abstract: A single-crystal X-ray structure analysis system capable of surely and easily performing a precise step of soaking a very small amount of a sample in a framework of a fine crystalline sponge, is provided. There are provided a soaking apparatus 500 and a single-crystal X-ray structure analysis apparatus, the single-crystal X-ray structure analysis apparatus comprising a sample holder that holds a sample, the sample holder comprising a porous complex crystal capable of soaking the sample in a plurality of fine pores formed therein; a goniometer that rotationally moves, the goniometer to which the sample holder is attached; an X-ray irradiation section that irradiates the X-rays from the X-ray source to the sample held by the sample holder attached to the goniometer; wherein the soaking apparatus 500 soaks the sample in the porous complex crystal of the sample holder.
    Type: Grant
    Filed: November 21, 2019
    Date of Patent: January 23, 2024
    Assignee: Rigaku Corporation
    Inventor: Takashi Sato
  • Patent number: 11879835
    Abstract: A method for detecting for a presence of a toxic element in a sample includes emitting UV light from an UV-VIS LED illuminator onto a sample as incident light. Capturing a portion of the incident light being reflected from the sample using a frinGOe interferometer and converting the reflected light to an interferogram spectrum. Collecting the interferogram spectrum using a camera. Retrieving the interferogram spectrum from the camera and transforming it to absorption wavelength spectrum using Fourier transformation via a microcontroller. Comparing and normalizing the absorption strength peak wavelength using the microcontroller. Comparing the normalized absorption strength peak wavelength spectrum with stored allowable toxic chemical absorption strength peak wavelength thresholds. Sending a message indicating that the sample is safe or not safe to use to a LCD screen and a speaker based on the comparison between the normalized absorption strength peak wavelength spectrum and the stored allowable thresholds.
    Type: Grant
    Filed: August 11, 2023
    Date of Patent: January 23, 2024
    Assignee: KING FAISAL UNIVERSITY
    Inventors: Kaouther Chebbi, Hesham M. Enshasy
  • Patent number: 11874236
    Abstract: Provided is a tube weld X-ray inspection device for inspecting an abnormality, such as a tube welding part crack, of a heat exchanger by using X-rays.
    Type: Grant
    Filed: November 12, 2021
    Date of Patent: January 16, 2024
    Assignee: DIGIRAY CORP.
    Inventors: Sang Sub Kong, Young Ho Kang, Nam Woo Kim
  • Patent number: 11874238
    Abstract: User-friendly single-crystal X-ray structure analysis apparatus and method for quickly performing a single-crystal X-ray structure analysis using a crystalline sponge and enabling the analysis including management of related information, and a sample holder and an applicator therefor are provided. There are provided a single-crystal X-ray structure analysis apparatus that performs a structure analysis of a material is provided, the apparatus comprising a sample holder that comprises a porous complex crystal capable of soaking the sample in a plurality of fine pores formed therein and that holds the sample; a goniometer that rotationally moves with the sample holder 250 being attached; and an information acquisition section 600 that acquires information about the porous complex crystal.
    Type: Grant
    Filed: November 21, 2019
    Date of Patent: January 16, 2024
    Assignee: Rigaku Corporation
    Inventor: Takashi Sato
  • Patent number: 11874204
    Abstract: A user-friendly single-crystal X-ray structure analysis apparatus for quickly performing a single-crystal X-ray structure analysis using a crystalline sponge and easily making it possible by including managing related information and a method therefor, are provided. There are provided a sample holder comprising a porous complex crystal capable of soaking a sample in a plurality of fine pores formed therein; a goniometer that rotationally moves, the sample holder being attached to the goniometer; an information acquisition section 600 that acquires invariable information about the porous complex crystal or variable information provided after the sample is soaked therein; and an information storage section 111 that stores the invariable information or the variable information acquired by the information acquisition section 600.
    Type: Grant
    Filed: November 21, 2019
    Date of Patent: January 16, 2024
    Assignee: Rigaku Corporation
    Inventor: Takashi Sato
  • Patent number: 11864938
    Abstract: The present disclosure relates to a C-shaped arm for use with a medical imaging system. In accordance with certain embodiments, the C-shaped arm comprises a C-shaped portion, a radiation source carried by the C-shaped portion, and a radiation detector carried by the C-shaped portion, wherein at least a portion of the C-shaped portion is formed of a unidirectional ultra-high modulus carbon fiber material.
    Type: Grant
    Filed: June 18, 2021
    Date of Patent: January 9, 2024
    Assignees: GE Precision Healthcare LLC, IRT Jules Verne
    Inventors: Bernard Bouvier, François Kotian, Carlos Martinez Ferreira, Camille Sébastien, Stéphanie Colliou, Matthieu Kneveler
  • Patent number: 11867610
    Abstract: Any one or both of an optical system with a structured lighting pattern and a structured detecting system having a plurality of regions with different optical characteristics are used. In addition, optical signals from an object to be observed through one or a small number of pixel detectors are detected while changing relative positions between the object to be observed and any one of the optical system and the detecting system, time series signal information of the optical signals are obtained, and an image associated with an object to be observed from the time series signal information is reconstructed.
    Type: Grant
    Filed: January 10, 2023
    Date of Patent: January 9, 2024
    Assignees: The University of Tokyo, Osaka University
    Inventors: Sadao Ota, Ryoichi Horisaki, Kazuki Hashimoto
  • Patent number: 11867850
    Abstract: A radiation detector assembly is described comprising: a scintillator; a photodetector; a hermetic enclosure surrounding and defining an enclosure volume that contains the scintillator and the photodetector; wherein the enclosure comprises a wall of plastics material coated with a metal layer. A method of assembly of a radiation detector assembly is also provided.
    Type: Grant
    Filed: December 11, 2020
    Date of Patent: January 9, 2024
    Assignee: KROMEK LIMITED
    Inventors: Edward Marsden, John Atkins
  • Patent number: 11860037
    Abstract: An interferometer movable mirror position measurement apparatus for determining a position of a movable mirror of an interferometer. The interferometer movable mirror position measurement apparatus including: a laser light source; a phase separation optical system configured to make first light and second light separately detected; a signal conversion unit configured to detect the first light and the second light in synchronization with a position of a movable mirror to generate a first sinusoidal wave signal and a second sinusoidal wave signal, respectively; a phase calculation unit configured to perform normalization and phase difference correction on each of the first sinusoidal wave signal and the second sinusoidal wave signal, and then calculate a phase of the first sinusoidal wave signal or the second sinusoidal wave signal at each time point; and a movable mirror position determination unit configured to determine a position of the movable mirror at a predetermined time point.
    Type: Grant
    Filed: September 3, 2018
    Date of Patent: January 2, 2024
    Assignee: SHIMADZU CORPORATION
    Inventor: Takashi Muramatsu
  • Patent number: 11861889
    Abstract: An analysis device includes an analysis unit configured to receive scattered light, transmitted light, fluorescence, or electromagnetic waves from an observed object located in a light irradiation region light-irradiated from a light source and analyze the observed object on the basis of a signal extracted on the basis of a time axis of an electrical signal output from a light-receiving unit configured to convert the received light or electromagnetic waves into the electrical signal.
    Type: Grant
    Filed: November 29, 2022
    Date of Patent: January 2, 2024
    Assignees: The University of Tokyo, Osaka University
    Inventors: Sadao Ota, Issei Sato, Katsuhito Fujiu, Satoko Yamaguchi, Kayo Waki, Yoko Itahashi, Ryoichi Horisaki
  • Patent number: 11852951
    Abstract: There is described a terahertz illumination source for terahertz imaging.
    Type: Grant
    Filed: August 20, 2020
    Date of Patent: December 26, 2023
    Assignee: INSTITUT NATIONAL D'OPTIQUE
    Inventors: Michel Jacob, Michel Doucet, André Fougeres
  • Patent number: 11846594
    Abstract: It is enabled to surely attach a sample holder to a goniometer head with good reproducibility in a relatively easy manner, the sample holder holding a porous complex crystal where a single-crystal is soaked. There is provided a single-crystal X-ray structure analysis apparatus that performs a structure analysis of a material, the apparatus comprising a goniometer having a goniometer head 514 to which a sample holder 310 is attached, the sample holder holding a porous complex crystal where a sample is soaked; an X-ray irradiation section that irradiates the X-rays to the porous complex crystal whose position is adjusted with the goniometer head 514, wherein a positioning portion for positioning the sample holder 310 to be attached is formed on a surface of the goniometer head 514, the sample holder 310 being attached onto the surface.
    Type: Grant
    Filed: November 21, 2019
    Date of Patent: December 19, 2023
    Assignee: Rigaku Corporation
    Inventor: Takashi Sato
  • Patent number: 11841468
    Abstract: Provided herein are technologies relating to detecting x-rays and particularly, but not exclusively, to compositions, devices, systems, and methods for x-ray imaging using a direct-conversion x-ray sensor comprising a perovskite composition that minimizes and/or eliminates in-sensor k-fluorescence in photon energy channels used for medical imaging. Exemplary perovskite compositions described are those that comprise a structure of ABX3, in which A represents an inorganic and/or organic cation, B represents a heavy metal cation, and X represents a halide.
    Type: Grant
    Filed: October 12, 2021
    Date of Patent: December 12, 2023
    Assignee: Kairos Sensors LLC
    Inventor: Kendon Robert Shirley