Patents Examined by Mark R. Gaworecki
  • Patent number: 11543355
    Abstract: A light-emission detection apparatus is provided for individually condensing light emitted from each emission point of an emission-point array using each condensing lens of a condensing-lens array to forma light beam and detecting each light beam incident on a sensor in parallel. The light-emission detection apparatus can be downsized and high sensitivity and low crosstalk can be simultaneously accomplished when a certain relation between the diameter of each emission point, a focal length of each condensing lens, an interval of condensing lenses, and an optical path length between each condensing lens and a sensor is satisfied.
    Type: Grant
    Filed: August 3, 2022
    Date of Patent: January 3, 2023
    Assignee: Hitachi High-Tech Corporation
    Inventors: Takashi Anazawa, Motohiro Yamazaki
  • Patent number: 11543345
    Abstract: A colorimetric sensor array includes a CMOS image sensor having a surface including pixels and a multiplicity of colorimetric sensing elements. Each sensing element has a sensing material disposed directly on one or more of the pixels. The colorimetric sensing elements are distributed randomly on the surface of the CMOS image sensor. Fabricating the colorimetric sensor array includes spraying a sensing fluid in the form of droplets directly on a surface of a CMOS image sensor and removing the solvent from the droplets to yield a multiplicity of sensing elements on the surface of the CMOS image sensor. Each droplet covers one or more pixels of the CMOS image sensor with the sensing fluid. The sensing fluid includes a solvent and a sensing material. The droplets are distributed randomly on the surface of the CMOS image sensor.
    Type: Grant
    Filed: April 24, 2020
    Date of Patent: January 3, 2023
    Assignee: Arizona Board of Regents on behalf of Arizona State University
    Inventors: Nongjian Tao, Di Wang
  • Patent number: 11533946
    Abstract: Testing systems and methods are provided for a smoking article to determine a characteristic of the smoking article, such as density of a material used therewith. The testing system may include a test fixture and an electromagnetic energy generating device The testing methods may be carried out by subjecting the material to the electromagnetic energy and determining the amount of energy absorbed by the material.
    Type: Grant
    Filed: June 22, 2020
    Date of Patent: December 27, 2022
    Assignee: R. J. Reynolds Tobacco Co.
    Inventor: Balager Ademe
  • Patent number: 11536660
    Abstract: The present invention relates to a method for in situ sensing of water stress in a plant by contacting a plant with a biosensor, where the biosensor comprises a material capable of giving a detectable response to changes in local water potential in the plant and detecting the detectable response thereby sensing water stress in the plant. The invention further relates to a method for determining water potential in a substance, a biosensor, a system for determining water potential in a substance, a method for determining water potential in a substance, a water potential measurement computing device, and a non-transitory computer readable medium having stored thereon instructions for determining water potential in a substance.
    Type: Grant
    Filed: July 30, 2018
    Date of Patent: December 27, 2022
    Assignee: CORNELL UNIVERSITY
    Inventors: Abraham Stroock, Michael Gore, Duke Pauli, Olivier Vincent, Piyush Jain
  • Patent number: 11536651
    Abstract: The device for detecting and/or determining the concentration of an analyte present in a tissue includes a sensor which is an optical fibre interferometer, and one interferometer arm being coated with an immobilised binding agent enabling selective binding of the analyte. The interferometer arm is mounted inside a guide enabling puncturing the tissue and performing an in situ measurement without the necessity to collect or prepare a sample. The guide is provided with a closed guide face, longitudinal perforations on sidewalls enabling the analyte to reach the binding agent, and an opening in the input end of the guide for introducing the interferometer with the arm into the guide. At the input end, the opening is sealed, enabling the isolation of the interior of the guide from the surroundings. The interferometer is mounted in a position in which the interferometer does not touch the inside walls of the guide.
    Type: Grant
    Filed: May 26, 2017
    Date of Patent: December 27, 2022
    Assignee: SDS OPTIC S.A.
    Inventors: Magdalena Staniszewska, Marcin Staniszewski
  • Patent number: 11534126
    Abstract: Apparatus for diagnosing breast cancer, the apparatus comprising a controller having a set of instructions executable to: acquire a contrast enhanced region of interest (CE-ROI) in an X-ray image of a patient's breast, the X-ray image comprising X-ray pixels that indicate intensity of X-rays that passed through the breast to generate the image; determine a texture neighborhood for each of a plurality of X-ray pixels in the CE-ROI, the texture neighborhood for a given X-ray pixel of the plurality of X-ray pixels extending to a bounding pixel radius of BPR pixels from the given pixel; generate a texture feature vector (TF) having components based on the indications of intensity provided by a plurality of X-ray pixels in the CE-ROI that are located within the texture neighborhood; and use a classifier to classify the texture feature vector TF to determine whether the CE-ROI is malignant.
    Type: Grant
    Filed: February 1, 2021
    Date of Patent: December 27, 2022
    Assignee: Tel HaShomer Medical Research, Infrastructure and Services Ltd.
    Inventors: Miriam Sklair-Levy, Arnaldo Mayer, Shmuel Yitzhak Pfeffer
  • Patent number: 11525781
    Abstract: A measuring method for measuring dissolved oxygen includes performing a first measurement sequence, including: emitting a first stimulation signal onto a sensor for a first period; detecting a first detection signal; determining a phase shift between the first stimulation signal and the first detection signal; and calculating a first measured value based on the determined phase shift. Performing a second measurement sequence, including a second stimulation signal onto the sensor for a second period, wherein the second stimulation signal is different than the first stimulation signal; detecting a second detection signal; determining a decay time of the second detection signal; calculating a second measured value based on the decay time. The method further includes comparing the first measured value to the second measured value and correcting the first measured value when a difference between the first measured value and the second measured value is greater than a first limit value.
    Type: Grant
    Filed: November 30, 2020
    Date of Patent: December 13, 2022
    Assignee: Endress+Hauser Conducta GmbH+Co. KG
    Inventors: Hendrik Zeun, Ronny Michael
  • Patent number: 11525789
    Abstract: Apparatus and method for performing computed tomography scans of elongate objects, wherein the object is irradiated with X-rays emitted by a plurality of X-ray emitters which are offset relative to a forward movement direction transversal to the main axis of the object, wherein a rotation device rotates each object about its own main axis of extension while the object is irradiated by one or more beams of X-rays, wherein electronic identifying means estimate the instantaneous position and orientation of the axial portions of the object which are irradiated during the rotation, and wherein an electronic processing and control unit is programmed for combining sets of radiographic data acquired for each axial portion of the object at different detecting moments during the rotation, for processing a three-dimensional tomography reconstruction of the object while taking into account corresponding information about the position and the orientation of each axial portion at each moment.
    Type: Grant
    Filed: February 15, 2021
    Date of Patent: December 13, 2022
    Assignee: MICROTEC S.R.L.
    Inventor: Enrico Ursella
  • Patent number: 11520062
    Abstract: A radiation imaging panel is provided. The panel comprises a substrate on which a plurality of pixels each including a photoelectric conversion element are arranged, a scintillator arranged over the substrate, and a protective layer arranged so as to cover the scintillator. The scintillator includes a plurality of columnar crystals containing an alkali metal halide. The protective layer includes a resin layer containing a resin to which particles of a metal oxide are added. A thickness of the resin layer from an apex of each of the plurality of columnar crystals to an upper surface of the resin layer is not less than 10 ?m and less than 30 ?m, and a concentration of the particles in the resin layer is not less than 0.15 vol % and less than 7.5 vol %.
    Type: Grant
    Filed: July 2, 2021
    Date of Patent: December 6, 2022
    Assignee: CANON KABUSHIKI KAISHA
    Inventors: Shoshiro Saruta, Kazumi Nagano, Keiichi Nomura
  • Patent number: 11513242
    Abstract: A radiation detector is generally described. The detector can comprise a thallium halide (e.g., TlBr) and/or an indium halide. The thallium halide and/or indium halide can be doped with a dopant or a mixture of dopants. The dopant can comprise an alkaline earth metal element, a lanthanide element, and/or an element with an oxidation state of +2. Non-limiting examples of suitable dopants include Ba, Sr, Ca, Mg, La, Ce, Pr, Nd, Pm, Sm, Eu, Gd, Tb, Dy, Ho, Er, Tm, and/or Yb. Radiation detectors, as described herein, may have beneficial properties, including enhanced charge collection and long-term stability.
    Type: Grant
    Filed: March 4, 2015
    Date of Patent: November 29, 2022
    Assignee: Radiation Monitoring Devices, Inc.
    Inventors: Kanai S. Shah, Leonard Cirignano, Hadong Kim, Alexei Churilov, Andrey Gueorguiev, Alireza Kargar
  • Patent number: 11513241
    Abstract: Detection substrate, detection panel and photoelectric detection device are provided. The detection substrate includes: a detection region and a non-detection region surrounding the detection region, wherein the detection region includes a plurality of detection units in an array and a plurality of bias voltage lines; each of the detection units includes: a driving circuit, and a photoelectric conversion circuit electrically connected with the driving circuit; wherein the bias voltage lines are electrically connected with the photoelectric conversion circuits; the non-detection region comprises: input terminals electrically connected with the bias voltage lines, and voltage compensation circuits electrically connected between the input terminals and the bias voltage lines; and the voltage compensation circuits are configured to offset a voltage generated by the photoelectric conversion circuits under ambient light in a manufacturing process of the detection substrate.
    Type: Grant
    Filed: April 28, 2020
    Date of Patent: November 29, 2022
    Assignees: Beijing BOE Sensor Technology Co., Ltd., BOE Technology Group Co., Ltd.
    Inventors: Kunjing Chung, Xuecheng Hou
  • Patent number: 11513085
    Abstract: Methods and systems for measuring the orientation of a wafer at or near an X-ray scatterometry measurement location are described herein. In one aspect, an X-ray scatterometry based metrology system includes a wafer orientation measurement system that measures wafer orientation based on a single measurement without intervening stage moves. In some embodiments, an orientation measurement spot is coincident with an X-ray measurement spot. In some embodiments, an X-ray scatterometry measurement and a wafer orientation measurement are performed simultaneously. In another aspect, signals detected by a wafer orientation measurement system are filtered temporally, spatially, or both, to improve tracking. In another aspect, a wafer orientation measurement system is calibrated to identify the orientation of the wafer with respect to an incident X-ray beam. In another aspect, a wafer under measurement is positioned based on the measured orientation in a closed loop or open loop manner.
    Type: Grant
    Filed: September 6, 2020
    Date of Patent: November 29, 2022
    Assignee: KLA Corporation
    Inventors: Barry Blasenheim, Joseph A. Di Regolo, Yan Zhang, Robert Press, Huy Nguyen
  • Patent number: 11506536
    Abstract: According to one embodiment, there is provided a measuring apparatus including a measurement section and a control section. The measurement section is configured to acquire a response from a sample. The control section is configured to compare a loading obtained by performing principal component analysis in advance with a first evaluation-use loading obtained by performing principal component analysis onto the response acquired from the sample, and to generate a first reliability index for measurement using principal component analysis, in accordance with a comparison result.
    Type: Grant
    Filed: September 5, 2019
    Date of Patent: November 22, 2022
    Assignee: Kioxia Corporation
    Inventor: Taro Shiokawa
  • Patent number: 11497939
    Abstract: An improved x-ray cone-beam CT image reconstruction by end-to-end training of a multi-layered neural network is proposed, which employs cone-beam CT images of many patients as input training data, and precalculated scattering projection images of the same patients as output training data. After the training is completed, scattering projection images for a new patient are estimated by inputting a cone-beam CT image of the new patient into the trained multi-layered neural network. Subsequently, scatter-free projection images for the new patient are obtained by subtracting the estimated scattering projection images from measured projection images, beam angle by beam angle. A scatter-free cone-beam CT image is reconstructed from the scatter-free projection images.
    Type: Grant
    Filed: July 29, 2020
    Date of Patent: November 15, 2022
    Inventor: Keiichi Nakagawa
  • Patent number: 11499924
    Abstract: Methods and systems for determining one or more characteristics of light in an optical system are provided. One system includes first detector(s) configured to detect light having one or more wavelengths shorter than 190 nm emitted from a light source at one or more first angles mutually exclusive of one or more second angles at which the light is collected from the light source by an optical system for illumination of a specimen and to generate first output responsive to the light detected by the first detector(s). In addition, the system includes a control subsystem configured for determining one or more characteristics of the light at one or more planes in the optical system based on the first output.
    Type: Grant
    Filed: May 27, 2020
    Date of Patent: November 15, 2022
    Assignee: KLA Corp.
    Inventors: Larissa Juschkin, Konstantin Tsigutkin
  • Patent number: 11493662
    Abstract: A nuclear density tool may comprise a gamma source, a gamma detector, wherein the gamma detector and the gamma source are disposed on a longitudinal axis of the nuclear density tool, and a housing, wherein the gamma source and the gamma detector are disposed in the housing. The nuclear density tool may further comprise a first cutout in the housing positioned to allow the gamma source to emit an energy through the housing and a second cutout in the housing posited to allow the gamma detector to detect the energy through the housing.
    Type: Grant
    Filed: May 28, 2020
    Date of Patent: November 8, 2022
    Assignee: Halliburton Energy Services, Inc.
    Inventors: Mayir Mamtimin, Jeffrey James Crawford
  • Patent number: 11493458
    Abstract: Scatter correction for tomography: for each position, two images are acquired, a first image without and a second image with a scatter reducing aperture plate (50). A scatter image is calculated by subtracting the second image from the first image. The apertures (48) in the scatter reducing plate (50) are arranged hexagonally in order to optimise the packaging density of the apertures.
    Type: Grant
    Filed: August 17, 2020
    Date of Patent: November 8, 2022
    Assignee: GE Sensing & Inspection Technologies GmbH
    Inventors: Alexander Suppes, Nils Rothe
  • Patent number: 11484263
    Abstract: Numerous aspects of communication devices, methods, and systems are described in this application. One aspect is an apparatus comprising an energy generator comprising a plurality of generator elements operable to output a plurality of different energy types in a signal direction toward the skin. Each generator element of the plurality of generator elements may be independently operable, when the energy generator is positioned relative to skin, to communicate with different nerves associated with the skin by outputting a different portion of an energy signal in the signal direction toward the skin with one energy type of the plurality of different energy types.
    Type: Grant
    Filed: February 25, 2021
    Date of Patent: November 1, 2022
    Inventor: Matthew Robert Leaper
  • Patent number: 11486820
    Abstract: Various embodiments may relate a chemical sensor. The chemical sensor may include a substrate including a first sealed (or isolated) cavity and a second sealed (or isolated) cavity separate from the first sealed (or isolated) cavity. The chemical sensor may also include an emitter in the first sealed (or isolated) cavity, the emitter configured to emit infrared light. The chemical sensor may further include a detector in the second sealed (or isolated) cavity. The chemical sensor may also include a waveguide configured to carry the infrared light from the emitter to the detector. The waveguide may include a sensing portion configured such that a property of the infrared light carried through the sensing portion changes in response to a chemical entity in contact with the sensing portion. The detector may be configured to detect the change in the property (of the infrared light).
    Type: Grant
    Filed: October 8, 2018
    Date of Patent: November 1, 2022
    Assignee: Agency for Science, Technology and Research
    Inventors: Hong Cai, Jifang Tao, Lennon Yao Ting Lee, Alex Yuandong Gu
  • Patent number: 11480513
    Abstract: The fine particle measurement apparatus according to the present technology includes a detection section, a multiplication factor setting section, a correction factor calculation section, and a spectrum generation section. The detection section has a plurality of detectors for detecting light from fine particles. The multiplication factor setting section sets a multiplication factor for each of the plurality of detectors. The correction factor calculation section calculates a correction factor on the basis of the set multiplication factor. The spectrum generation section generates spectral data by correcting a value detected by the detector, with the calculated correction factor.
    Type: Grant
    Filed: May 31, 2018
    Date of Patent: October 25, 2022
    Assignee: Sony Corporation
    Inventors: Tomoyuki Umetsu, Masaaki Hara, Nobuhiro Hayashi, Yasunobu Kato