Abstract: A collapsible respiration bag assembly is disclosed and includes a flexible hollow body longitudinally extending about a longitudinal axis thereof between an air intake end and an air outlet end and formed with at least three annular folds. A patient valve is fitted at the outlet end and includes a face mask coupler transversing the longitudinal axis. An intake valve assembly is also included and a face mask fitted with a face engaging rim, a dome portion and a valve coupler detachably connectable to the face mask coupler. The dome portion of the face mask is deformable between an operative, concave position and a convex stowing position, where the dome portion is inverted and where the valve coupler is detached from the face mask coupler. The assembly is configurable between at least one extended, operative position and a fully collapsed stowed position where the annular fold zones at least partially overlap.

Abstract: Various embodiments of a medical device tube having scaffolding-supported inner and outer walls are provided. In particular, the medical device tube may include a plurality of struts extending from an inner wall to an outer wall of the medical device tube. In certain embodiments, each of the individual struts may connect to adjacent struts at the inner wall and the outer wall. As such, the plurality of struts may comprise a zigzag pattern circumferentially around the medical tube device. In other embodiments, the struts may extend radially from the inner wall to the outer wall of the medical tube device. Regardless, the area between the struts and the inner wall and/or the outer wall form a plurality of lumens, which may be used for suctioning, blowing, and various other applications of the medical device tube.

Abstract: The present invention relates to footwear and in particular, but not necessarily restricted thereto, relates to footwear for those with diabetes and, in particular, with ulcers of the sole. The present invention seeks to address some of the problems encountered by prior art limb compression devices and methods. In particular the present invention seeks to provide a boot which can stimulate blood flow. A further object to the invention is to provide a boot with a sole which is adaptable to conform with various shapes and conditions of human feet. The present invention also seeks to provide a new type of footwear that has a therapeutic benefit for diabetic patients with circulatory problems in their foot, and also enables the technique of “off loading” the foot to assist in the healing of any wounds present.

Abstract: A system and method of automatic delivery of appropriate flow rate of oxygen to a person flying in a pressurized aircraft cabin is disclosed. In one embodiment, an adaptable demand dilution oxygen regulator for use inside a pressurized aircraft cabin, includes an oxygen initiation and demand regulation system adapted to be responsive to differential gas pressure in a first altitude range based on a pulmonary capacity of a person flying in the pressurized aircraft cabin and to control flow of pressurized oxygen to a breathing outlet during the first altitude range. The adaptable demand dilution oxygen regulator further includes a cabin air dilution and delivery system, coupled to the oxygen initiation and demand regulation system, adapted to be responsive to differential gas pressure in a second altitude range and to output progressively enriched mixture till 100% pressurized oxygen into a breathing apparatus during the second altitude range.

Abstract: An alternator testing device has a frame to which is secured an adjustable bracket for mounting an alternator. A housing, which is also secured to the frame includes a control panel and a testing circuit. The control panel permits the operator to configure the circuit to perform a series of tests to determine whether the alternator is functioning properly. These tests are conducted in a manner which replicates the operation of the alternator in a motor vehicle, rather than in a simulation.

Abstract: This invention provides an inspecting method, an inspecting apparatus, and a defect correcting method, for an active matrix substrate including: a gate bus line; a source bus line; a pixel electrode; a switching element for driving the pixel electrode; and a pair of electrodes constituting an auxiliary capacitance. The inspecting method includes: a step of disposing a counter substrate having a face on which a counter electrode is formed so that the face faces the active matrix substrate with a liquid crystal layer interposed therebetween, and connecting signal supplying terminals to gate bus lines and source bus lines and the counter electrode; and a detection step of detecting a defect on the active matrix substrate by performing at least one of a first signal generating step, a second signal generating step, and a third signal generating step.

Abstract: A scanning electron microscope apparatus and method are described for detecting and imaging open-circuit defects in an integrated circuit (IC). The invention uses a low-energy high-current focused electron beam that is scanned over a device surface of the IC to generate a charge-induced voltage alteration (CIVA) signal at the location of any open-circuit defects. The low-energy CIVA signal may be used to generate an image of the IC showing the location of any open-circuit defects. A low electron beam energy is used to prevent electrical breakdown in any passivation layers in the IC and to minimize radiation damage to the IC. The invention has uses for IC failure analysis, for production-line inspection of ICs, and for qualification of ICs.

Abstract: A diagnostic detector head harp (23) used to detect and characterize high energy particle beams using an array of closely spaced detector wires (21), typically carbon wires, spaced less than 0.1 cm (0.040 inch) connected to a hybrid microcircuit (25) formed on a ceramic substrate (26). A method to fabricate harps (23) to obtain carbon wire spacing and density not previously available utilizing hybrid microcircuit technology. The hybrid microcircuit (25) disposed on the ceramic substrate (26) connects electrically between the detector wires (21) and diagnostic equipment (37) which analyzes pulses generated in the detector wires (21) by the high energy particle beams.

Abstract: A storm monitoring apparatus and method is described wherein two H-field antennas are oriented with respect to the heading axis of an aircraft or the like at an angle of 45.degree.. The signals developed by these two antennas are picked-up by small R-F transformers which serve the inherent function of integrating the signals and extracting the H-field current component. A printed circuit board structuring of the two antennas provides for consistency of fabrication and reliability as well as compactness. The monitoring apparatus exhibits broad band frequency response to evaluate lightning strike rate to determine storm range and intensity. A computer control test utilizing diagnostic coils at the antenna carries out periodic testing of the performance of the device and a component such as a gravity switch provides an indication to the control system as to the orientation of mounting of the antenna on an aircraft.

Abstract: A storm monitoring apparatus and method is described wherein two H-field antennas are oriented with respect to the heading axis of an aircraft or the like at an angle of 45.degree.. The signals developed by these two antennas are picked-up by small R-F transformers which serve the inherent function of integrating the signals and extracting the H-field current component. A printed circuit board structuring of the two antennas provides for consistency of fabrication and reliability as well as compactness. The monitoring apparatus exhibits broad band frequency response to evaluate lightning strike rate to determine storm range and intensity. A computer control test utilizing diagnostic coils at the antenna carries out periodic testing of the performance of the device and a component such as a gravity switch provides an indication to the control system as to the orientation of mounting of the antenna on an aircraft.

Abstract: A storm monitoring apparatus and method is described wherein two H-field antennas are oriented with respect to the heading axis of an aircraft or the like at an angle of 45.degree.. The signals developed by these two antennas are picked-up by small R-F transformers which serve the inherent function of integrating the signals and extracting the H-field current component. A printed circuit board structuring of the two antennas provides for consistency of fabrication and reliability as well as compactness. The monitoring apparatus exhibits broad band frequency response to evaluate lightning strike rate to determine storm range and intensity. A computer control test utilizing diagnostic coils at the antenna carries out periodic testing of the performance of the device and a component such as a gravity switch provides an indication to the control system as to the orientation of mounting of the antenna on an aircraft.

Abstract: A storm monitoring apparatus and method is described wherein two H-field antennas are oriented with respect to the heading axis of an aircraft or the like at an angle of 45.degree.. The signals developed by these two antennas are picked-up by small R-F transformers which serve the inherent function of integrating the signals and extracting the H-field current component. A printed circuit board structuring of the two antennas provides for consistency of fabrication and reliability as well as compactness. The monitoring apparatus exhibits broad band frequency response to evaluate lightning strike rate to determine storm range and intensity. A computer control test utilizing diagnostic coils at the antenna carries out periodic testing of the performance of the device and a component such as a gravity switch provides an indication to the control system as to the orientation of mounting of the antenna on an aircraft.

Abstract: A translator pin retention system for a translator fixture for a printed circuit board tester having a pattern of test probes facing away from a base plate upon which the translator fixture is mounted. The fixture comprises a plurality of essentially parallel and spaced apart translator plates having patterns of preformed holes for containing and supporting straight, solid translator pins extending through the plates of the translator fixture for use in translating test signals between test points on a printed circuit board supported by the fixture and the test probes on the base of the tester. A thin, flexible pin retention sheet of an elastomeric material rests on one of the translator plates so that the translator pins that extend through the translator plate on which the sheet rests also extend through the pin retention sheet.

Abstract: An apparatus and method for providing durable, high performance, probing of semiconductor devices having a large number of narrow pitch terminals. A single probe of the present invention provides flexible probing of a wide range of the devices having various sizes and terminal arrangements. In contrast, teachings of the prior art require a separate probe to be manufactured or a probe to be re-formed for each different size and terminal arrangement of the devices. The probe of the invention includes electrodes electrically coupled with a test system in such a way so as to provide the devices to be probed with a selection of more than two arrangements in which device terminals contacting the probe electrodes are not shorted with each other by the probe.

Abstract: A probe is attached to a support plate vertically to the surface of the support plate. A drop of a molten metal is formed at a tip portion of the probe. The support plate has a heater for setting the temperature of the probe and the drop of the molten metal at the tip portion of the probe. The probe is situated at a position corresponding to a position of an electrode of an LSI. The probe is connected to a measuring device for evaluating characteristics of the LSI by wiring. The drop of the molten metal connects the probe and the electrode of the LSI electrically.

Abstract: A testing apparatus has a probe card having a plurality of first contact elements to be put in contact with an object to be tested, and a plurality of electrodes electrically connected with the first contact elements, a test head to be shifted between a retreat position and a test position, for performing electrical measurement of the object in the test position, a cylindrical connection unit, having a plurality of second contact elements to be put in contact with the electrodes of the probe card in the test position, for electrically connecting the probe card with the test head, the connection member being movably supported by the test head, a head plate for supporting the probe card, a driving mechanism for moving the probe card between a test position near the head plate and a wait position away from the head plate, and a movement limiting member for limiting movement of the connection member towards the test head and applying a pressing force to the connection member and the probe card via the second cont

Abstract: Apparatus for scanning an integrated circuit chip or other device under test (DUT) for defects and for visual alignment of chip electrical leads with leads of an electrical tester for testing the chip circuit(s). The apparatus provides an image forming system to provide a visually perceptible image of the chip for chip scanning and chip lead alignment. The apparatus also provides means to translate the chip in a plane containing the chip and rotate the chip about an axis perpendicular to that plane to facilitate alignment of the chip leads with the corresponding electrical tester leads. A computer or operator views the chip through the image forming system and controls chip translation and rotation for scanning and lead alignment for subsequent chip testing.

Abstract: A test socket assembly includes a test and failure-analysis socket and an adapter board. Only the top interior surfaces of a QFP package mounted in the test socket are available for testing and probing. The socket must then be used for testing and analyzing only QFP integrated-circuit packages where the die is available for access from the top of the test socket. QFP integrated-circuit packages with a cavity-down configuration which were mounted upside-down in the test socket would have its lead connections to the test socket "scrambled" and would not match the input-pin pattern of the automatic test equipment. The adapter board to "unscramble" the connections between the tester and the test socket with a cavity-down QFP device, which is mounted upside down in the test socket, allowing the test socket to be used with a cavity-down device.

Abstract: A die testing apparatus according to the present invention includes a lead frame having a plurality of die pads, wherein a plurality of bare chips are mounted on the die pads. The bonding pads of each bare chips are connected to a plurality of leads associated with each die pad through a plurality of bonding wires. The die pads are supported by a plurality of tie bars and the leads are supported by an adhesion tape attached to the lead frame. The lead frame is placed in a test socket which includes an under socket having a plurality of slot grooves and an upper socket hinged with the under socket and having a plurality of slot holes and a plurality of test probes contacting the leads of the lead frame.

Abstract: A sensor system includes a sensor head, an optical source, and a measurement apparatus. The sensor head includes a beamsplitter having first, second, third, and fourth ports, the beamsplitter being responsive to light selectively applied to the first, second and third ports for passing light of a first input polarization state from the first port to the second port, for passing light of a second input polarization state orthogonal to the first input polarization state from the first port to the third port, and for collectively passing light of a first output polarization state and light of a second output polarization state orthogonal to the first output polarization state from the third port to the fourth port. The optical source means provides light to the first port.