Abstract: A method of data transmission from a sensor to a control unit and a sensor and control unit are described, the sensor transmitting both differential values and absolute values. The differential values are analyzed in the control unit to perform the function provided, and the absolute values are analyzed for the plausibility check of the function.

Abstract: A data processor for analyzing chromatograms in detail and collecting analysis-associated information necessary for verification of data validity throughout an analysis process. The data processor includes a first data collecting section which collects and records a detector output at every data sampling rate T1 for each sample injection, and a second data collecting section which collects and records the detector output and a monitor output indicating an analysis-associated condition at every data sampling rate T2 over a period from the start to the end of the chromatographic analysis; the data sampling rate T1 is shorter than the data sampling rate T2.

Abstract: Methods, systems and computer programs are configured to determine the presence of and/or a measurement for a plurality of constituents in a composite signal with closely correlated chemical constituents having overlapping signal lineshapes extending about a spectrum of interest obtained from a target sample undergoing analysis.

Abstract: A method for identifying modes and transitions during plant operation, wherein measured values of process variables are used to evaluate a current state of the process and its sections and subsections. An identified state of the plant is signaled and the plant is monitored for normal execution of any transition, identifying a current task being performed in the process and sending a message to different sections of the plant. Results are displayed on a visual display device and can be sent to other plant computer programs for guidance during the transition. A permanent chronological record of the sequence of events—modes and transitions—of the plant and sections and subsections including the pertinent plant conditions and information is generated for subsequent review and analysis.

Abstract: A device testing apparatus, such as a hard disk drive (HDD) testing apparatus, using one host computer to test a plurality of the devices, such as to burn-in test HDDs. A host computer having at least two serial communication ports is communicably connected to power cards which supply operating power to each HDD to be tested. A serial communication exchanger is communicably connected to the serial communication ports of the host computer and to the HDDs, and responds to channel selection instructions issued by the host computer to selectively establish a serial communication channel among HDDs, the power card, and the host computer. The single host computer conducts the testing of the HDDs by communicating with the HDDs via the established serial communication channel.

Abstract: A method for an information processing apparatus to test a connection to an information storage server from which the information processing apparatus obtains information is disclosed. The method includes the steps of (a) receiving a request for a connection test using connection information for establishing the connection to the information storage server from a screen on which at least part of the connection information is entered; (b) testing the connection to the information storage server based on the request for the connection test; and (c) outputting the result of the connection test.

Abstract: A method for appropriately managing the quality and distribution of a probe carrier. Probe carriers manufactured by a probe carrier manufacturing apparatus having ejecting portions for ejecting probe solutions, each containing a probe, which can be specifically coupled with a target substance, for applying the probe solution on a carrier, and a plurality of probe tanks storing mutually different probe solutions for supplying ejecting portions. Each probe tank is labeled with the bar-code. The labeled bar-code is read by the bar-code reader. On the basis of the read bar-code, the probe solution stored in the probe tank is identified. On the other hand, the probe tank is mounted on the ejecting portion.

Abstract: Specific wavelengths to use in optical metrology of an integrated circuit can be selected using one or more selection criteria and termination criteria. Wavelengths are selected using the selection criteria, and the selection of wavelengths is iterated until the termination criteria are met.

Abstract: Devices having setting elements are adjusted by carrying out a first measurement of a characteristic curve to be controlled at predefined measurement points, each setting element assuming a reference setting; testing a termination condition and terminating the method if this condition is satisfied; and, if the termination condition is not satisfied, modifying the reference setting of each setting element and measuring the characteristic curve again at predefined measurement points for this configuration; reproducing the initial reference setting of the modified setting element; when there is more than one setting element, calculating the gradient functions of the characteristic curve; calculating new settings by minimizing an error function by using the obtained measured values and the calculated gradient functions; and carrying out the method again, beginning with the new calculated settings serving as the new reference setting.

Abstract: A method of adjusting a strobe timing includes a first determining step in which an output pattern is compared with an expected result pattern at a strobe timing to determine whether the output pattern is matched to the expected result pattern; a variation range setting step in which a variation range of the strobe timing is set when the output pattern is not matched to the expected result pattern; a varying step in which the strobe timing is varied within the variation range; and a second determining step in which the output pattern is compared with the expected result pattern at the varied strobe timing to determine whether the output pattern is matched to the expected result pattern. Based on a result of the comparison, a function test is performed using the strobe timing to determine a pass/fail result of the semiconductor.

Abstract: Systems and methods configured to guide and manage laboratory analytical process control operations. A Biometric quality control (QC) process application is configured to monitor bias and imprecision for each test, characterize patient population data distributions and compare, contrast, and correlate changes in patient data distributions to any change in QC data populations. The Biometric QC process monitors the analytical process using data collected from repetitive testing of quality control materials and patient data (test results). The QC process identifies the optimal combination of, for example, frequency of QC testing, number of QCs tested, and QC rules applied in order to minimize the expected number of unacceptable patient results produced due to any out-of-control error condition that might occur.

Abstract: A system and method is provided for gathering and aggregating operational metrics (e.g., performance metrics, process events, health monitor state, server state) for a plurality of members as a single entity and for a plurality of entities as a singular entity. The system and method provides for operational metrics of members and entities to be aggregated and retrieved as a single result set, such that entity wide operational metrics can be acquired, monitored and displayed as a single entity.

Abstract: A data filter for filtering process data to a statistical control model is provided to enhance the performance of the control model. The data filter selects a set of template data from a set of statistical process data. A set of grids is formed comprising the set of template data and a set of sample data and an absolute distance is calculated between each point of a grid in the set of grids and a minimum accumulated distance of a point of the grid is calculated using the absolute distance. A global optimal path is identified based on the minimum accumulated distance of the point, and a set of sample data is remapped to form a set of warped data based on the global optimal path and the set of reference data.

Abstract: A method for correcting an oscillator frequency of in particular a digital transmitter/receiver interface for transmitting measurement signals of a sensor to a control unit. The method includes outputting of a first reference frequency signal by the sensor, the first reference frequency signal and comparing it with a second reference frequency signal by the control unit, calculating a correction factor on the basis of the first and second reference frequency signals, and correcting the frequency signals representing actual measured quantities subsequently sent by the sensor and received by the control unit based on the calculated correction factor to obtain corrected frequency signals.

Abstract: An intelligent electronic device (IED) includes a base module having a power monitoring circuit operative to monitor a parameter of a portion of a power distribution system and generate an analog signal representative thereof. The base module also includes a processor coupled with the power monitoring circuit, the processor having an analog to digital converter operative to convert the analog signal to a digital signal representative thereof. The processor operates to implement a first power management functionality and generate first power management data. At least one of a display and a communications interface couple with the processor and communicate the first power management data external to the IED. A first interface couples with the processor and the communications interface. The first interface operates to receive a first external function module.

Abstract: An apparatus and method for on-chip bias measurement of an analog signals on an integrated circuit with a switchable analog-to-digital converter capable of performing testing and other types of processing. Analog signal test locations are selected for testing by a test input selector which is in turn controlled by a controller on an integrated circuit, such as an imager chip. Test locations are connected to one or more analog-to-digital converters through the test input selector. The analog-to-digital converter(s) output a test measurement digital output to either test equipment or an on-chip calibration circuit. Test equipment or on-chip calibration circuits adjusts imager component bias or other operating parameters used in chip or device operation based on output from the analog-to-digital converter(s).

Abstract: A distributed, hierarchical built-in self-test (BIST) architecture for testing the operation of one or more memory modules is described. As described, the architecture includes three tiers of abstraction: a centralized BIST controller, a set of sequencers, and a set of memory interfaces coupled to memory modules. The BIST controller stores a set of commands that generically define an algorithm for testing the memory modules without regard to the physical characteristics or timing requirements of the memory modules. The sequencers receive the commands and generate sequences of memory operations in accordance with the timing requirements of the various memory modules. The memory interfaces apply the memory operations to the memory module in accordance with physical characteristics of the memory module, e.g., by translating address and data signals based on the row-column arrangement of the memory modules to achieve bit patterns described by the commands.

Abstract: A computer implemented method for generating a test plan for a communication device under test. The test plan defines test tools, test methodologies, test configurations, and algorithms for executing the test. A user input is received to define the communication device under test. Next, a knowledge database is searched to identify test plan parameters for the communication device under test. Thereafter, the test plan parameters and the user input are analyzed to identify the test plan. A system and computer readable medium having program instructions for generating a test plan for a communication device under test are also described.

Abstract: A test system with easy to fabricate hardware to make measurements on differential signals. The two legs of a differential signal are applied to a comparator. A variable bias is introduced into the comparison operation. By taking multiple measurements with different bias levels, the level of the differential signal may be determined. The time of measurements relative to the start of the signal can be varied to allow plots of the signal to be made. Variability of the signal caused by noise can be measured by collecting sets of data points with the same bias level at the same relative time. Circuitry for introducing bias into the comparison is disclosed that allows measurements to be made with a pre-packaged, commercially available high speed comparator.

Abstract: An apparatus for sensing the current in a power line of a power system and systems incorporating the apparatus are disclosed. The apparatus may comprise an enclosure providing a window operable to permit the passage of the power line therethrough. The apparatus may further comprise an active current transformer set within the enclosure and operative to produce a scaled version of the current. The apparatus may further comprise an amplifier coupled with the active current transformer and operative to reduce the phase shift and ratio error between the current and the scaled version of the current. The apparatus may further comprise a powering current transformer set within the enclosure and operative to receive power from the power line on a primary winding and deliver power on a secondary winding.