Patents Examined by Meagan S Walling
  • Patent number: 7236895
    Abstract: An analysis apparatus capable of analyzing a circuit even when the number of elements handled in a circuit analysis increases includes: a management unit receiving and dividing information into multiple pieces of information; a calculation unit calculating at least any one of a magnitude of an electric field and a magnitude of a magnetic field at a predetermined point of time for each of a circuit board and wiring; a conversion unit mutually converting at least any one of a magnitude of an electric field and a magnitude of a magnetic field and at least any one of a current value and a voltage value; and a circuit analysis unit calculating at least any one of a current value and a voltage value at a predetermined point of time for an element represented by any one of multiple pieces of information divided by the management unit.
    Type: Grant
    Filed: November 3, 2005
    Date of Patent: June 26, 2007
    Assignee: Sharp Kabushiki Kaisha
    Inventors: Hiroshi Sagesaka, Tatsuroh Kiso
  • Patent number: 7209855
    Abstract: The invention relates to a method for filtering information emitted, on the basis of pressure measurements taken by a pressure sensor mounted on a wheel of a vehicle equipped with a tire, to a central unit mounted on the vehicle. According to this method, a value representative of the pressure of the air in the tire is measured periodically, with a period ?, and from this any possible variations ?P in pressure between the values of the pressures successively measured are deduced; in parallel, with the same period ?, a value representative of the temperature of the air in the tire is measured. In addition, when there is a variation ?P in pressure between two measured pressure values, that is greater in terms of absolute value than a predetermined threshold Sp, the variation ?T between the two temperature values measured at the same instants as the measured pressures is calculated.
    Type: Grant
    Filed: September 1, 2005
    Date of Patent: April 24, 2007
    Assignee: Siemens VDO Automotive
    Inventors: Laurent Fabre, Georges Fonzes
  • Patent number: 7203610
    Abstract: Methods for estimating data-dependent jitter (DDJ) from measured samples of a transmitted data signal include a first exemplary step of obtaining a plurality of measurements (e.g., time tags and event counts for selected pulse widths in the data signal). Such measurements may be obtained at predetermined intervals within a transmitted signal or may be obtained at randomly selected intervals, and should yield measurements for each data pulse in a repeating data pattern. An average unit interval value representative of the average bit time of the transmitted signal is determined. Time interval error estimates representative of the timing deviation from each signal edge's measured value relative to its ideal value (determined in part from the calculated average unit interval value) are also determined, as well as a classification for each measured signal edge relative to a corresponding data pulse in the repeating data pattern.
    Type: Grant
    Filed: August 31, 2004
    Date of Patent: April 10, 2007
    Assignee: Guide Technology, Inc.
    Inventors: Sassan Tabatabaei, Mordechai Ben-Zeev, Paul Frederick Miller
  • Patent number: 7197407
    Abstract: A method and system for monitoring a level of liquid fuel in a tank having a known capacity, wherein the tank fluidly communicates with a fuel supply line through which the fuel is delivered in gaseous form. The method comprises measuring a flow rate of gaseous fuel flowing through the supply line, calculating an expended fuel volume based on the measured flow rate, and determining a remaining liquid fuel level in the tank based on the expended fuel volume and tank capacity. A delivery of liquid fuel to the tank is prompted in response to the remaining liquid fuel level.
    Type: Grant
    Filed: December 22, 2003
    Date of Patent: March 27, 2007
    Assignee: Fisher Controls International LLC.
    Inventors: Kenneth R. Schimnowski, David E. Woollums, Jeffrey L. Cole, Richard J. Vanderah
  • Patent number: 7197425
    Abstract: Provided is a road surface state estimating system for carrying out measuring along a plurality of measuring lines on a paved road surface, which improves the reliability of texture estimation of the road surface. A road surface state estimating system (1) includes a laser displacement meter (11) for measuring a distance to the road surface, a stepping motor (120A), rails (12A and 12B), a ball screw (121A), and mounting members (13A and 13B) for causing the laser displacement meter (11) to scan along the measuring lines, and a stepping motor (130), a rail (13), a ball screw (131), and a mounting member (11A) for moving the laser displacement meter (11) in a direction orthogonal to the measuring lines, which allows the laser displacement meter (11) to carry out measurement along the plurality of measuring lines while it is translated two-dimensionally.
    Type: Grant
    Filed: September 2, 2005
    Date of Patent: March 27, 2007
    Assignee: Seikitokyukogyo Co. Ltd.
    Inventors: Yukiei Masuyama, Junnosuke Katayama, Noritsugu Kusakari
  • Patent number: 7194362
    Abstract: It is an object to provide an individual voltmeter apparatus utilizing a switching circuit which suppresses the variation of the consumption power of the unit cell of a set of batteries. The power supply of a first current path 2m1 and a second current path 2m2 of a level shift circuit 2m is between the unit cell Vm+1 and V1, and between the unit cell Vm+1 and one lower rank cell Vm, respectively. The same current, which responds to all semiconductor switches, flows in the first current path 2m1. In the second current path 2m2, a larger current is provided to the second current path in which the semiconductor switch is connected to the higher rank unit cell.
    Type: Grant
    Filed: March 22, 2005
    Date of Patent: March 20, 2007
    Assignee: Yazaki Corporation
    Inventors: Satoshi Ishikawa, Kouichi Yamamoto
  • Patent number: 7191090
    Abstract: A method for determining a physical location of a source is provided. The method includes receiving an acoustic signal from a source placed within an acoustic monitoring area. The method also includes processing a received acoustic signal. The processing is configured to use data from at least two sensors. Also included is identifying an approximate localized point in the acoustic monitoring area. The approximate localized point defines a physical location of the source. The method further includes reporting the physical location of the source over a network.
    Type: Grant
    Filed: March 22, 2004
    Date of Patent: March 13, 2007
    Assignee: Sun Microsystems, Inc.
    Inventor: Helen A. Cunningham
  • Patent number: 7188054
    Abstract: A signal processing method is disclosed, where, after inputting a measurement data weighted-spline filter formula is selected to calculate an initial value of a spline filter, weight is adjusted, spline filter output is calculated, convergence is judged thereafter. When the weight is not judged converged, the weight is updated and the weight adjusting and spline filter output calculation are repeated, to conduct a robust spline filtering on the measurement data.
    Type: Grant
    Filed: January 18, 2005
    Date of Patent: March 6, 2007
    Assignee: Mitutoyo Corporation
    Inventors: Soichi Kadowaki, Kozo Umeda, Tomonori Goto
  • Patent number: 7184938
    Abstract: Systems and methods for the design or implementation of statistical filters for use in the spectral shaping of transmissions are disclosed. A desired power spectrum may be mapped to find pole locations that approximate the desired spectrum. These pole locations may then be mapped to the edge or inside of an equilateral polygon lying inside a unit circle, the equilateral polygon having the same number of sides as the order of the statistical filter desired and one vertex mapped to unity, to yield a set of eigenvalues. These eigenvalues may be the eigenvalues of a stochastic matrix the elements of which may be the Markov transition probabilities for use in a statistical filter designed to achieve the desired power spectrum. Use of a statistical filter employing these Markov transition values may be utilized to shape UWB or other signals to achieve the desired power spectrum.
    Type: Grant
    Filed: September 1, 2005
    Date of Patent: February 27, 2007
    Assignee: Alereon, Inc.
    Inventors: James L. Lansford, Shyam Sunder Chander
  • Patent number: 7181357
    Abstract: Briefly, a processor and a method to calibrate a temperature reading of a digital thermometer. The calibration is done by using a first temperature value measured by an analog temperature sensor located at one point on the processor die and a second temperature value measured by a digital temperature sensor located at a second point of the processor die.
    Type: Grant
    Filed: September 8, 2005
    Date of Patent: February 20, 2007
    Assignee: Intel Corporation
    Inventors: Efraim Rotem, Barnes Cooper, Ben Karr, Ravi Rangarajan
  • Patent number: 7181351
    Abstract: A status indicator and status indicating method are provided to indicate multi-working statuses of an electronic device with a single status indicator. The status indicator includes an MCU (10, 10?), and an LED circuit. The MCU includes a CPU (101), a ROM (103), a RAM (105), a counter (107, 107?) and an output port (111, 111?). In a first embodiment, the MCU further includes a PWM register (109). The CPU detects a current working status, and controls the PWM output port to output corresponding PWM waves via the PWM register according to the first embodiment, and executes an interrupt service routine stored in the ROM, thereby outputs corresponding PWM waves via the output port according to a second embodiment. The PWM waves are delivered to the LED circuit to make the LED indicate the current working status.
    Type: Grant
    Filed: March 16, 2005
    Date of Patent: February 20, 2007
    Assignee: Hon Hai Precision Industry Co., Ltd.
    Inventor: Kuan-Hong Hsieh
  • Patent number: 7177773
    Abstract: A method for predicting performance of a future product is disclosed. The method includes generating historical data for at least one product and generating a Failure Mode and Effects Analysis (FMEA) for the at least one product. The method also includes determining a relationship between an FMEA indicator of the FMEA generated for the at least one product and the historical data for the at least one product. The method further includes generating an FMEA for the future product and applying the determined relationship to the FMEA indicator from the FMEA generated for the future product to predict performance for the future product.
    Type: Grant
    Filed: May 31, 2005
    Date of Patent: February 13, 2007
    Assignee: Caterpillar Inc
    Inventors: Katherine Jane Lonn, David A. Tyler, Trent A. Simpson, Nelson A. Jones
  • Patent number: 7171327
    Abstract: A temperature sensing circuit, and method of using the same. A temperature sensing circuit includes a comparator, a temperature reference circuit and trimmer. The comparator is configured to receive a sense voltage that is indicative of a sensed temperature. The temperature reference circuit has a plurality of reference voltages coupled to the comparator such that the plurality of reference voltages are alternately compared to the sense voltage. The trimmer is coupled to the temperature reference circuit and is independently adjustable to adjust the plurality of reference voltages.
    Type: Grant
    Filed: March 24, 2004
    Date of Patent: January 30, 2007
    Assignee: Infineon Technologies AG
    Inventor: Jung Pill Kim
  • Patent number: 7167808
    Abstract: A computer implemented method modifies an experimental electron density map. A set of selected known experimental and model electron density maps is provided and standard templates of electron density are created from the selected experimental and model electron density maps by clustering and averaging values of electron density in a spherical region about each point in a grid that defines each selected known experimental and model electron density maps. Histograms are also created from the selected experimental and model electron density maps that relate the value of electron density at the center of each of the spherical regions to a correlation coefficient of a density surrounding each corresponding grid point in each one of the standard templates. The standard templates and the histograms are applied to grid points on the experimental electron density map to form new estimates of electron density at each grid point in the experimental electron density map.
    Type: Grant
    Filed: April 8, 2004
    Date of Patent: January 23, 2007
    Assignee: Los Alamos National Security, LLC
    Inventor: Thomas C. Terwilliger
  • Patent number: 7165011
    Abstract: A method of monitoring a thermal processing system in real-time using a built-in self test (BIST) table that includes positioning a plurality of wafers in a processing chamber in the thermal processing system; executing a real-time dynamic model to generate a predicted dynamic process response for the processing chamber during the processing time; creating a first measured dynamic process response; determining a dynamic estimation error using a difference between the predicted dynamic process response and the measured dynamic process response; and comparing the dynamic estimation error to operational thresholds established by one or more rules in the BIST table.
    Type: Grant
    Filed: September 1, 2005
    Date of Patent: January 16, 2007
    Assignee: Tokyo Electron Limited
    Inventors: Sanjeev Kaushal, Pradeep Pandey, Kenji Sugishima, Anthony Dip, David Smith, Raymond Joe, Sundar Gandhi
  • Patent number: 7162393
    Abstract: One embodiment of the present invention provides a system that determines the reliability of a component in a system. During operation, the system monitors inferential variables associated with a number of specimens of the component. The system then collects degradation data by first computing a likelihood value that indicates whether an inferential variable associated with a specimen of the component is behaving normally or abnormally. Next, the system determines whether the specimen of the component has degraded based on the likelihood value. If the specimen of the component is determined to have degraded, the system records the time when the specimen of the component was determined to have degraded. The system also uses the degradation data to determine the reliability of the component in the system.
    Type: Grant
    Filed: September 1, 2005
    Date of Patent: January 9, 2007
    Assignee: Sun Microsystems, Inc.
    Inventors: Dan Vacar, Kenny C. Gross, David K. McElfresh, Leoncio D. Lopez
  • Patent number: 7146279
    Abstract: A device for measuring at least one property of a material web, in particular a paper or board web, includes movable measuring probes provided on both sides of the web, which can be pressed against the web with preferably at least substantially equal force, forming a respective air pad, elements for measuring the air pads, in particular the air pad thickness, on both sides, and at least one property sensor, in particular a paper property sensor, fitted to a measuring probe supported by an air pad.
    Type: Grant
    Filed: December 20, 2004
    Date of Patent: December 5, 2006
    Assignee: Voith Paper Patent GmbH
    Inventors: Pekka Typpoe, Rudolf Muench, Thomas Ischodonat
  • Patent number: 7130754
    Abstract: A calibration information calculation unit 340 calculates the first coordinate positions of feature points included in images obtained by an image sensing apparatus at timings from an instruction unit 350 using position data, on world coordinate system, of a plurality of feature points held by a world coordinate holding unit 310 and the measured values of a position/posture sensor 130 input to a data management unit 330 at the timings. The unit 340 receives the second coordinate positions, which are acquired by an image coordinate acquisition unit 320, of the feature points included in the images obtained by the image sensing device at the timings. The unit 340 calculates calibration information using the first and second coordinate positions.
    Type: Grant
    Filed: July 16, 2004
    Date of Patent: October 31, 2006
    Assignee: Canon Kabushiki Kaisha
    Inventors: Kiyohide Satoh, Shinji Uchiyama, Toshihiro Kobayashi
  • Patent number: 7113881
    Abstract: A method, an apparatus, and a computer program are provided for the semi-automatic extraction of an ideality factor of a diode. Traditionally, current/voltage curves for diodes, which provided a basis for extrapolating the ideality factors, had to be determined by hand. By employing a thermal voltage proportional to absolute temperature (PTAT) generator in conjunction with an extraction mechanism, the ideality factor can be extracted in an semi-automatic manner. Therefore, a reliable, quick, and less expensive device can be employed to improve measurements of ideality factors.
    Type: Grant
    Filed: November 4, 2004
    Date of Patent: September 26, 2006
    Assignee: International Business Machines Corporation
    Inventors: David W. Boerstler, Eskinder Hailu, Jieming Qi
  • Patent number: 7113877
    Abstract: A method, apparatus, and system for detecting a signal of interest. According to some embodiments, a power of a frequency component of a signal is determined. The power is accumulated for a first period and a second period, the second period being shorter than the first period. Power spectrum information may be found, and high and normalized power spectrum information may be determined and compared.
    Type: Grant
    Filed: July 19, 2005
    Date of Patent: September 26, 2006
    Assignee: Intel Corporation
    Inventor: William Jenrette