Abstract: A method and system for identifying a defect or contamination on a surface of a sample. The system operates by detecting changes in work function across a surface via both vCPD and nvCPD. It utilizes a non-vibrating contact potential difference (nvCPD) sensor for imaging work function variations over an entire sample. The data is differential in that it represents changes in the work function (or geometry or surface voltage) across the surface of a sample. A vCPD probe is used to determine absolute CPD data for specific points on the surface of the sample. The combination of vibrating and non-vibrating CPD measurement modes allows the rapid imaging of whole-sample uniformity, and the ability to detect the absolute work function at one or more points.

Abstract: A method and system for identifying a defect or contamination on a surface of a material. The method and system involves providing a material, such as a semiconductor wafer, using a non-vibrating contact potential difference sensor to scan the wafer, generate contact potential difference data and processing that data to identify a pattern characteristic of the defect or contamination.

Abstract: A method of logging use of a non-electric detonator, which comprises recording identity data associated with the detonator at the time the detonator is being loaded in a blasthole, recording consumption of the detonator, and relating the identity data associated with the detonator to an inventory of non-electric detonators thereby allowing the inventory to be updated, wherein the identity data associated with the non-electric detonator are recorded using an electronic device.

Abstract: A method for linking compiled pattern data and loading the data into tester hardware includes the steps of generating a composite object that includes a shared resource, determining a local shared resource specific to a test instrument that is associated with the shared resource in the composite object, assigning a local reconciled value or address to the local shared resource, and loading the local shared resource into the test instrument.

Abstract: A method for detecting vibration signatures in a reversible drive is disclosed. The method includes the steps of acquiring digital data representative of vibrations in the reversible drive and identifying and grouping together portions of data in a plurality of groups. The identified portions of data relate to a particular direction of travel of the reversible drive and the plurality of groups relate to travel in different directions of the reversible drive. The method can include the further step of processing at least one of the groups of data using signal processing techniques. A system and computer program product for practicing the method for detecting vibration signatures in a reversible drive are also disclosed.

Abstract: A test apparatus has multiple instruments that are synchronized with respect to one another so that test data generated by them arrive at the pins of a device under test at the time specified in a test program. The synchronization of the multiple instruments is carried out by introducing delays to triggers that are generated and used by the multiple instruments. The amount of delay that is introduced varies from instrument to instrument and is based on differences in the actual transmission and processing delays and clock rates.

Abstract: In one embodiment a memory controller is provided. The memory controller comprises a predictive logic circuit to predict an increase in a current operating temperature of a memory device coupled to the memory controller, based on memory cycles to be issued to the memory device; and a temperature control circuit to perform a temperature control operation wherein if the sum of the current operating temperature and the predicted increase in temperature is greater than a threshold temperature associated with the memory device, then the number of memory cycles issued to the memory device is reduced.

Abstract: A method and system for identifying a defect or contamination on a surface of a material. The method and system involves providing a material, such as a semiconductor wafer, using a non-vibrating contact potential difference sensor to scan the wafer, generate contact potential difference data and processing that data to identify a pattern characteristic of the defect or contamination.

Abstract: A method for providing quality control on wafers running on a manufacturing line is disclosed. The resistances on a group of manufacturing test structures within a wafer running on a wafer manufacturing line are initially measured. Then, an actual distribution value is obtained based on the result of the measured resistances on the group of manufacturing test structures. The difference between the actual distribution value and a predetermined distribution value is recorded. Next, the resistances on a group of design test structures within the wafer are measured. The measured resistances of the group of design test structures are correlated to the measured resistances of the group of manufacturing test structures in order to obtain an offset value. The resistance of an adjustable resistor circuit within the wafer and subsequent wafers running on the wafer manufacturing line are adjusted according to the offset value.

Abstract: A technique for eliminating edge artifacts in magnetic microscopy includes the steps of scanning a SQUID over an object under study to acquire values of magnetic fields produced by currents running in the object to create a first data set having N data points. At the end of the first data set, N zero data points are added to create a second data set having 2N data points. Fast Fourier Transform (FFT) is further applied to the 2N data set to obtain k-space having b(k) values. The b(k) values of the k-space are averaged, and the averaged b(k) values corresponding to k exceeding a predetermined k value are filtered off. A set of current density representations i(k) in the k-space are obtained to which inverse FFT is applied to obtain a map of current densities I(x,y) of the object. A system for performing the method of the present invention includes a software designed to suppress (or eliminate) edge artifacts present in the obtained images.

Abstract: A method for controlling the axes of motors, for machine tools and the like, including the steps of: calculating, from a sequence of relative position data of each axis and of actuation states at each definite instant, a path for each individual axis, starting from parameters of initial speed, number of steps and final speed; defining a three-dimensional matrix that contains, for each axis, initial speed, number of steps and final speed, each element of the three-dimensional table, constituted by the intersection in space of the three parameters, containing an address that is suitable to point to the vector which describes a corresponding waveform; driving the axis according to the waveform.

Abstract: One embodiment disclosed relates to an apparatus for temperature control of an integrated circuit on a circuit board. The apparatus includes a first resistor on the circuit board, a second resistor on the circuit board, and a heat conductive material. The heat conductive material is attached to both the first and second resistors and to a surface of a package containing the integrated circuit. Another embodiment disclosed relates to an apparatus that provides both cooling and heating functionality in order to maintain the operational temperature of the IC within an acceptable range.

Abstract: A system and method for determining the approximate weight of metal consumables used by an electric arc welder over a period of welding time, the system comprises a program to calculate the total energy exerted by the welder over a period of welding, a divider to divide the total energy by a number including a power of a selected non-unity factor to obtain said weight. When the energy is in mega joules the factor is in the range of 3.2–4.2 and preferably approximately 4.0.

Abstract: The invention refers to single-ended test of a loop with the aid of a transceiver, wherein an input impedance (Zin(ƒ)) of the loop is generated. The transceiver has a digital part, a codec and an analog part and is connected to the loop. With the aid of a transmitted and a reflected broadband signal (vin, vout) an echo transfer function Hecho(ƒ)=V(f)out/Vin(f) is generated, which also can be expressed as H echo ? ( f ) = H ? ? ( f ) ? Z in ? ( f ) + Z h0 ? ( f ) Z in ? ( f ) + Z hyb ? ( f ) . Here Zh0(ƒ), Zhyb(ƒ) and H?(ƒ) are model values for the transceiver. In a calibration process a test transceiver, with the same type of hardware as the transceiver, is connected to known impedances, replacing the loop. Hecho(ƒ)=V(f)out/Vin(f) is generated for the known impedances and the model values are generated and are stored in a memory in the transceiver.

Abstract: The present invention generally relates to semiconductor processing, and in particular to methods and systems for analyzing photolithographic reticle defects that include detecting soft defects on a reticle and analyzing the material composition of the defects for a particular chemical signature. Specifically, the present invention scans and images a soft defect via an optical inspection scan of a reticle, mills the defect using a Focused Ion Beam, and analyzes the defect for signatures using Electron Spectroscopy for Chemical Analysis and/or Fourier Transform Infrared Spectroscopy. The present invention thus provides for real-time analysis of the chemical composition of a soft defect on a reticle without the need for a defect identification navigation system. According to an aspect of the present invention, reticle defects can be monitored without removal of a pellicle, thus facilitating increased throughput and decreased cost in reticle repair and/or cleaning.

Abstract: The present invention is directed to the detection of gas leaks from a gas-filled disk drive. In accordance with embodiments of the present invention, gas leaks from a disk drive can be detected by monitoring certain disk drive parameters. Furthermore, different types and instances of disk drive parameters may be monitored. No or few additional hardware components are required to be added to a disk drive in connection with implementing embodiments of the present invention.

Abstract: Memory circuits are calibrated by adjusting memory circuit output parameters based on data eye measurements. Data eye patterns of memory circuit outputs are measured by the memory controller for different settings of the memory circuit output parameters. Memory circuit output parameters can be adjusted to settings that correspond to widest average data eye widths, highest average data eye heights, or other suitable criteria.

Abstract: A dynamic model of non-linear tuning behavior is used to tune a tunable device. The model quantifies a difference between a tuning characteristic of an ideal device and an actual tuning characteristic of the device. The model adjusts the tuning according to the difference. A method of compensated tuning of tunable device comprises employing a dynamic model of the tunable device to produce a compensated tuning control input to the tunable device during tuning. A tuning compensator for a tunable device comprises the dynamic model that is employed with an input tuning command to generate a compensated tuning command. A tuning-compensated YTF comprises a dynamic model-based tuning compensator and a YTF. A spectrum analyzer having a tuning-compensated preselector comprises a YTF preselector, a frequency converter, a video signal processor unit, a tuning compensator, and a controller. The tuning compensator uses the dynamic model to tune the preselector.

Abstract: Reconfigurable sensor and method for selectively reconfiguring a sensor are provided. The reconfiguration of the sensor may be performed according to applicable requirements for sensing the position of an object. The method allows providing an array of sensing elements. The method further allows selecting at least one of the sensing elements of the array to supply a sensing element output signal. One or more operational parameters of the one sensing element may be adjusted to meet the applicable sensing requirements.

Abstract: A system and method for detecting defects of objects based on a CAD (Computer-Aided Design) platform includes a measurement apparatus (10), an application server (12), and a database server (14). The application server includes a data acquiring module (120) for acquiring point cloud data of an object and acquiring a three-dimensional digital model of the object; a point cloud cutting (121) module for cleaning and editing the point cloud data; a point cloud filtering module (122) for filtering the point cloud data; a data aligning module (123) for aligning the point cloud data with the three-dimensional digital model of the object; a data comparing module (124) for comparing the point cloud data with the three-dimensional digital model of the object; and a report management module (125) for generating a color comparison report. A related method is also disclosed.