Abstract: A magnetic field sensor includes built-in self-test coils in a configuration to provide magnetic field stimulation along three axes, with a high field factor, and thus, reduce a power budget of the sensor and physical size of the self-test coils. The magnetic field sensor comprises a first bridge circuit including a plurality of sense elements configured to sense a magnetic field. The magnetic field sensor further comprises re-configurable self-test current lines coupled to a self-test source to perform high field, high power wafer and die level testing and trim, as well as low power in-situ characterization and calibration of the sensor. The self-test current lines may be routed to form a coil with multiple turns around the TMR elements.

Abstract: Load Pull tuning pattern and probe movement algorithms allow creating a test pattern allowing to avoid instability regions and spurious oscillations of microwave transistors during testing using slide screw load and source tuners. The impedances are selected based on the stability circle and instability area on the Smith chart and the probe movement trajectory allows both avoiding the static and circumventing the transient crossing through the instability area. All tuning commands are saved in a pattern file.

Abstract: A reflectometer for allowing a test of a device, the reflectometer comprising: a source of pulsed radiation; a first photoconductive element configured to output a pulse in response to irradiation from said pulsed source; a second photoconductive element configured to receive a pulse; a transmission line arrangement configured to direct the pulse from the first photoconductive element to the device under test and to direct the pulse reflected from the device under test to the second photoconductive element; and a termination resistance provided for said transmission line configured to match the impedance of the transmission line.

Abstract: In a method and magnetic resonance (MR) apparatus to determine sample points of a random undersampling scheme of k-space to acquire reduced MR data with multiple coils, a set of sample points of the random undersampling scheme to acquire the reduced MR data is determined, and an indicator of a signal noise in reconstructed MR data is calculated. Furthermore, an additional sample point, which is not included in the set of sample points is determined, and a change of the indicator that results by an addition of the additional sample point to the set of sample points is calculated. The additional sample point is selectively added to the set of sample points dependent on the calculated change.

Abstract: Disclosed are systems and methods for altering functionality of an application. An example method comprises updating the application, wherein the application includes one or more functional modules; detecting events occurring on the computer after the updating, wherein types of the detected events belong to a set of detectable events; determining which of the one or more functional modules of the application caused the detected events; and altering the one or more detected functional modules, wherein the altering of the functional modules and which functional modules are altered depend on the detected events and on which functional modules caused the detected events.

Abstract: Provided is a method for adapting the sensitivity of a sensor system, in particular of a capacitive sensor system, which provides a sensor signal, wherein a first lower threshold value is adapted, if the sensor signal fulfills a first switching threshold criterion, a first upper threshold value is adapted, if the sensor signal fulfills a second switching threshold criterion, and at least one switching threshold value is adapted such that the switching threshold value has a predetermined first distance from the first upper threshold value and/or a predetermined second distance from the first lower threshold value.

Abstract: An apparatus for evaluating a semiconductor device includes: a chuck stage; an insulating substrate; a plurality of probes; a temperature adjustment unit; an evaluation/control unit; and a probe position/temperature inspection device including an inspection plate, a thermo-chromic material, a photographing unit, and an image processing unit. The photographing unit photographs a color-change image of the thermo-chromic material in a state in which distal end portions of the plurality of probes are pressed against the upper surface of the inspection plate. The image processing unit performs image processing to the color-change image to calculate in-plane positions and temperatures of the distal end portions of the plurality of probes.

Abstract: An insulation problem detection apparatus includes a microcomputer configured to: control a voltage detecting circuit to measure an insulation resistance of a vehicle based on a voltage at which a capacitor in the vehicle is charged, the microcomputer controlling the voltage detecting circuit to connect the capacitor in series to a power supply mounted in the vehicle and a ground of a body of the vehicle to measure the voltage at which the capacitor is charged; obtain a total voltage of the power supply from an external apparatus that is external to the microcomputer when the insulation resistance of the vehicle is measured by the voltage detecting circuit; and detect whether there is an insulation problem of the vehicle based on (i) the total voltage of the power supply obtained from the external apparatus and (ii) the insulation resistance of the vehicle measured by the voltage detecting circuit.

Abstract: A portable device for field testing watthour meters including a socket with one or more connectors configured to engage a watthour meter blade is disclosed. The connectors may include a pair of wire forms so oriented that the connector can connect to a watthour meter blade oriented in either of two orientations 90° apart from each other by resiliently deflecting portions of the wire forms. The connectors may include a jaw socket cup, a torsion clip in the jaw socket cup for contacting a watthour meter blade when the watthour meter blade is inserted into the jaw socket cup. The torsion clip includes a first surface and a pair of facing surfaces connected to, and extending away from, the first surface that define a channel sized to receive the watthour meter blade.

Abstract: An improved sensor apparatus for developing a signal related to an inductive sensor in a resonant circuit are disclosed. This improvement is realized by adding a known capacitance to the resonant circuit and comparing the resulting natural resonance frequency to the frequency without the known capacitance. In this way a measure of the resonant capacitance is developed to correct the sensor signal for the effect of any changes in that capacitance. One disclosed embodiment adds an electronically variable capacitance which is adjusted to yield a constant capacitance that produces a sensor signal insensitive to variations in the resonant circuit capacitance. The resonant capacitance measurement may also provide an indication of another sensor state, such as temperature or pressure, which may be used to further correct for temperature or pressure sensitivities in the sensor signal. The invention is extended by juxtaposing the inductance for capacitance in the sensor resonant circuit.

Abstract: A method and a probe device for testing an interposer prior to assembly are described herein. The method includes coupling a plurality of probe tips of a probe device to the plurality of signal interconnect paths of the interposer to be tested. A test signal is provided from the probe device to the plurality of signal interconnect paths of the interposer and a quality characteristic of signal interconnect paths of the interposer is detected based on behavior of the interposer in response to the test signal.

Abstract: A device for monitoring a solenoid plunger position, comprising means for storing one or more inductance values for the solenoid indicative of desired positions of the solenoid plunger; means for measuring an actual inductance value of the solenoid; means for comparing the actual inductance value and the stored inductance values and for providing an indication of the actual position of the solenoid plunger based on the comparison.

Abstract: An electrode configuration for a capacitive sensor device has a transmitting electrode and a receiving electrode, wherein the transmitting electrode can be brought into a capacitive coupling with the receiving electrode, wherein the electrode configuration has at least one first and second sensor area, wherein both of the electrode surfaces of the transmitting electrode and of the receiving electrode in the first sensor area are small compared to the electrode surfaces of the transmitting electrode and of the receiving electrode in the second sensor area. A capacitive sensor device for the detection of an approximation may have such an electrode configuration. An electrical device, particularly an electrical hand-held device, may have at least one such capacitive sensor device.

Abstract: A grounding monitoring device is disclosed herein. In a described embodiment, the grounding monitoring device comprises a wrist strap comprising a first conductive portion for providing a first discharge path between a human arm and a ground; and a second conductive portion electrically isolated from the first conductive portion for providing a different second discharge path between the human arm and the ground. The grounding monitoring device further comprises a bipolar control voltage generator for applying a first voltage at a frequency f0 to the first conductive portion and an opposite second voltage at the frequency f0 to the second conductive portion; and an electrical circuit for: receiving a first total signal from the first conductive portion; receiving a second total signal from the second conductive portion; and forming an output signal based on a differential and common mode gains of the electrical circuit.

Abstract: The invention provides methods and apparatus for image processing that perform image segmentation on data sets in two- and/or three-dimensions so as to resolve structures that have the same or similar grey values (and that would otherwise render with the same or similar intensity values) and that, thereby, facilitate visualization and processing of those data sets.

Abstract: Magnetic resonance imaging (MRI) systems and methods to effect accelerated MR image reconstruction for undersampled data acquisitions with radial strip acquisitions of k-space are described. The improved MR image reconstruction is performed by acquiring k-space data in accordance with a data acquisition pattern which comprises a plurality of strips leaving a plurality of undersampled areas therebetween that do not have another undersampled area in a diametrically opposed position of k-space. The acquired k-space data is then used to generate an MR image.

Abstract: A fluid sensor (10) comprises a core (27) defining a fluid flow path (21) and a cavity member (30) located externally of the core. The cavity member (30) comprises an electrically-conductive composite material including a matrix and one or more reinforcing elements embedded within the matrix. The cavity member (30) is configured so as to provide confinement for an electromagnetic field and the core (27) is configured so as to permit transmission therethrough of electromagnetic radiation at a frequency of the electromagnetic field. The electromagnetic field may be a radiofrequency (RF) electromagnetic field. The fluid sensor (10) may be used in the measurement of the composition and/or flow characteristics of fluid in the fluid flow path (21).

Abstract: A prober for testing devices in a repeat structure on a substrate is provided with a probe holder plate, probe holders mounted on the plate, and a test probe associated with each holder. Each test probe is displaceable via a manipulator connected to a probe holder, and a substrate carrier fixedly supports the substrate. Testing of devices, which are situated in a repeat structure on a substrate, in sequence without a substrate movement and avoiding individual manipulation of the test probes in relation to the contact islands on the devices, is achieved in that the probe holders are fastened on a shared probe holder plate and the probe holder plate is moved in relation to the test substrate.

Abstract: A probe pin according to an embodiment of the present invention has a two-piece structure consisting of a pogo pin part and a barrel part, in which the pogo pin part includes an upper plunger having an outside contact point at an upper end, a lower plunger having an outside contact point at a lower end, and a spring portion composed of one or more springs and connected to a lower end of the upper plunger and an upper end of the lower plunger; and the barrel part has a cylindrical shape surrounding a portion of the pogo pin part and has a barrel-fixing spring portion protruding on an outer side of the barrel part to apply elasticity outward.

Abstract: Etching for probe wire tip is described particularly well suited to microelectronic device test. In one example, wires of a probe head are covered with an encapsulation material, the wires being attached to a test probe head substrate, each of the wires having two ends, the first end being attached to the substrate and the second end being opposite the substrate, each wire having an outer coating around a core. The wires are etched to remove the outer coating at the second end of the wires. The encapsulation material is then removed.