Abstract: The present disclosure relates to a method for determining a water cut value of a composition comprising a hydrocarbon. In some embodiments, the disclosure relates to an apparatus for determining the water cut value of the composition that comprises one or more of a capacitance probe, a temperature probe, a salinity probe, and a computer.

Abstract: A small-sized power factor measurement apparatus capable of measuring a power factor by one element is desired. The power factor measurement apparatus includes a pair of coupling ends (12) for coupling to a power supply in parallel with a load, two magnetic elements (21, 22) whose changes in electric resistance are different from each other due to the same external magnetic field, a pair of measurement terminals (13) for outputting a differential voltage between the two magnetic elements, a power factor sensor (10) including a pair of sensor terminals (10t) connected to the pair of coupling ends (12), a voltage detector (15) for measuring a voltage between the measurement terminals (13), a low-pass filter (16) connected to the output of the voltage detector (15), a high-pass filter (17) connected to the output of the voltage detector (15), a rectifier (18) connected to the high-pass filter (17), and a divider (19) for dividing the output of the low-pass filter (16) and the output of the rectifier (18).

Abstract: In a method to correct a signal phase in the acquisition of MR signals of an examination subject in a slice multiplexing method, in which MR signals from at least two different slices of the examination subject are detected simultaneously in the acquisition of the MR signals, a linear correction phase in the slice selection direction is determined for each of the at least two slices. An RF excitation pulse with a slice-specific frequency is radiated in each of the at least two different slices. A slice selection gradient is activated during a slice selection time period, during which the different RF excitation pulses are radiated in the at least two different slices, and the slice selection time period has a middle point in time in the middle of the slice selection time period, and the different RF excitation pulses temporally overlap for the at least two different slices.

Abstract: A magnetic angle sensor including a first Wheatstone bridge circuit having a plurality of first magnetoresistive elements; and a second Wheatstone bridge circuit having a plurality of second magnetoresistive elements, wherein the plurality of second magnetoresistive elements have diversity with respect to the plurality of first magnetoresistive elements.

Abstract: A substrate inspection apparatus can efficiently inspect electric characteristics of the semiconductor device. A prober 10 includes a probe card 15 having a multiple number of probe needles 17 to be brought into contact with electrodes of a semiconductor device formed on a wafer W; and a test box 14 electrically connected to the probe card 15. A card-side inspection circuit of the probe card 15 reproduces a circuit configuration on which the semiconductor device is to be mounted after separated from the wafer W, e.g., the circuit configuration of a function extension card, and a box-side inspection circuit 21 of the test box 14 reproduces a circuit configuration on which the semiconductor device is to be mounted, e.g., a part of the circuit configuration of the mother board.

Abstract: Systems and methods are provided for investigating a downhole formation using a nuclear magnetic resonance (NMR) tool having two or more radio frequency receiving coils. While the tool is moving through the borehole, the formation is magnetized and resulting signals are obtained. In accordance with the present approach, the acquired signals can be resolved azimuthally and can be reconstructed to obtain an indication of a parameter of the formation at multiple locations along the length of the borehole.

Abstract: A method and apparatus for testing the mounting of an integrated circuit on a printed circuit board using a ball grid array comprises directing an inclined laser beam from a line scan laser sensor at the integrated circuit, detecting the position of the lower edge of the integrated circuit from laser light backscattered from the integrated circuit and printed circuit board, determining through a trigonometric calculation the height of the integrated circuit above the printed circuit board following soldering of the ball grid array and comparing the height with reference data. The integrated circuit is deemed to have been successfully mounted to the printed circuit board if the height falls within a predetermined range.

Abstract: This disclosure describes an electric-field imaging system and method of use. In accordance with implementations of the electric-field imaging system, a fluid sample can be placed on top of a pixel-based impedance sensor. An image of the target analytes can be created immediately afterwards. From this image, computer imaging algorithms can determine attributes (e.g., size, type, morphology, volume, distribution, number, concentration, or motility, etc.) of the target analytes.

Abstract: Provided is a pulse detection apparatus and a pulse detection method less susceptible to movement of a subject and less susceptible to noise. An oscillation frequency controller is configured to cause a frequency variable oscillator to oscillate at a predetermined oscillation frequency, which is a frequency within a range assumed as a resonance frequency of a molecule of a predetermined constituent constituting the blood flowing through a human body. The oscillation frequency controller also controls an oscillation frequency based on a phase difference signal and an amplitude signal, wherein the phase difference signal indicates the phase difference between a transmission signal transmitted from an antenna to the human body and a reception signal received by the antenna, and the amplitude signal indicates the magnitude of the amplitude of the received signal. A pulse detector detects the change of the amplitude signal in an amplitude direction as a pulse signal.

Abstract: An apparatus for the thermal testing of electronic devices may include a universal base board for coupling to an electronic driver unit for receiving electrical signals therefrom, and a plurality of test boards arranged on the base board. Each test board may include a holder for receiving a device under test and routing thereto electrical signals from the electronic driver unit as well as an adaptation board to the base board. Each test board may include a respective electrically powered heating element for heating the electronic device received thereat.

Abstract: A panel function test circuit is able to perform a function test when a display panel is in a first state and is able to perform electrostatic protection when the display panel is in a second state, whereby the display panel requires fewer components and less wiring space.

Abstract: Embodiments of the present disclosure provide techniques and configurations for integrally determining a parameter (e.g., temperature) of a die of an integrated circuit. In one instance, the apparatus may comprise a die including a first (e.g., remote) area and a second (e.g., local) area disposed at a distance from the first area, and circuitry to determine a parameter associated with the remote area of the die. The circuitry may include: a first sensing device disposed in the remote area, to provide first readings associated with the parameter; a second sensing device disposed in the local area, to provide second readings associated with the parameter; and a control module coupled with the sensing devices and disposed in the local area, to facilitate a determination of the parameter based on the first and second readings provided by the first and second sensing devices. Other embodiments may be described and/or claimed.

Abstract: A method for detecting a spacing defect between two adjacent strands of a layer of a fiber fabric includes positioning of the fiber fabric on a metal plate, the fiber fabric covered by an air-tight casing, removing air from between the metal plate and the casing, displacing an inductive sensor relative to the fiber fabric and identifying a defect based on a signal generated by the inductive sensor.

Abstract: A semiconductor device includes a first circuit structure and a second circuit structure. The first circuit structure includes a wiring line and a via upon and electrically contacting the wiring line. The via induces lateral etching voids between the via and the wiring line below the via upon the surface of the wiring line. The second circuit structure includes a similar wiring line, relative to the reference wiring line, without or fewer via thereupon. The first circuit structure is therefore relatively more prone to lateral etching void formation as compared to the second circuit structure. Resistances are measured across the first circuit structure and the second circuit structure and compared against a comparison threshold to determine whether the first circuit structure includes one or more lateral etching voids. If the first structure is deemed to not include lateral etching voids, the fabrication process of the device may be deemed reliable.

Abstract: Methods and test structures for testing the reliability of a dielectric material. The test structure may include a first row of contacts and a line comprised of a conductor. The line is laterally spaced in a direction at a minimum distance from the first row of contacts. The test structure further includes a second row of contacts laterally spaced in the direction from the first row of contacts by a distance equal to two times a minimum pitch. The line is laterally positioned between the first row of contacts and the second row of contacts.

Abstract: The separated particle charge multivariate analysis instrument includes a transparent sealed container and, inside the transparent sealed container, an axial fan, a tube carrier plate, a rail board, double screw shafts, a biaxial motor, parallel electrode plates and so on. The separated particle charge multivariate analysis instrument of the present invention measures out the charge amount of the particle after leaving the particle bed by simulating a controllable environmental factor in the transparent sealed container on the basis of the inner tube, the outer tube, the electrometer and the charge amount of the particle entering into the inner tube at the measurement site, and analyzes effects of environmental factors, particle physical parameters and geometric parameters to the charge by adjusting environmental variables in the transparent sealed container.

Abstract: A nuclear magnetic resonance (NMR) apparatus includes at least one solenoid configured to induce a radio frequency magnetic field in a sample. The sample is located inside the solenoid. At least one cylindrical magnet is arranged to induce a static magnetic field in the sample, wherein the magnet is located inside the sample.

Abstract: The present disclosure relates to a method for determining a water cut value of a composition comprising a hydrocarbon. In some embodiments, the disclosure relates to an apparatus for determining the water cut value of the composition that comprises one or more of a capacitance probe, a temperature probe, a salinity probe, and a computer.

Abstract: A test assembly system protects a user from potentially energized equipment. Aspects of the system provide access to the equipment through a socket connection and a test probe assembly that is configured to interface with the socket connection to read voltage or continuity across a bus of the equipment being inspected. The probe assembly shields the user from the equipment to prevent energy or arc flashes from projecting out to contact the user.

Abstract: Example field instrument temperature apparatus and methods for affecting or regulating a temperature of a field instrument are disclosed. An example apparatus includes a vortex tube having an inlet to receive a fluid, a first outlet to dispense a first portion of the fluid at a first temperature and a second outlet to dispense a second portion of the fluid at a second temperature, the second temperature being greater than the first temperature. The example apparatus also includes a first passageway fluidly coupled to the first outlet to direct the first portion of the fluid to an electronic device in a process control system to affect a temperature of the device.