Abstract: An automated method and system are provided for facilitating monitoring of energy usage within a data center. The method includes automatically determining energy usage of one or more electronics racks of a data center by automatically ascertaining time-based energy usage of the electronics racks. The automatically ascertaining includes obtaining multiple measurements of instantaneous energy usage by each of the electronics racks in the data center over a period of time, and then separately averaging the multiple measurements for each electronics rack to obtain the time-based energy usage of each electronics racks. The method also includes outputting the time-based energy usage of the electronic(s) racks to facilitate monitoring of the data center.

Abstract: A fabrication history a group of wafers is provided, having a record for each wafer of the manufacturing events that did or did not occur in its fabrication, and having the measured value of a given target. A binary decision rule is formed based on the fabrication history, the rule being that if a wafer has a particular pattern of manufacturing events in its fabrication history then the statistic of the given fabrication target for that wafer is a first value; otherwise, the statistic is a second value having at least a given distance from the first value. The pattern of manufacturing events in the binary decision rule is identified in the generation of the binary decision rule. The identified pattern is significant with respect to the given target.

Abstract: An embedded device testing system for comparing actual device under test input/output vector pairs with modelled device under test input/output vector pairs, wherein actual device under test output vectors are sampled in accordance with a predefined timing reference.

Abstract: A method of assessing damage of a dual damascene structure includes obtaining a wafer after the wafer has been processed using a dual damascene process. A first damage-assessment procedure is performed on the wafer using an optical metrology process to gather damage-assessment data for a first set of measurements sites on the wafer. For each measurement site in the first set of measurement sites, the optical metrology process determines an amount of damage of a damaged area of a periodic grating in the measurement site. The damage-assessment data includes the amount of damage determined by the optical metrology process. A first damage-assessment map is created for the dual damascene process. The first damage-assessment includes the damage-assessment data and the locations of the first set of measurement sites on the wafer. One or more values in the damage-assessment map are compared to damage-assessment limits established for the dual damascene process to identify the wafer as a damaged or undamaged wafer.

Abstract: A method for detecting structure-borne noise events in a roller bearing, wherein a measuring signal M of a pressure or dilatation sensor arranged on a roller bearing is fed to a frequency filter for filtering out undesired signal parts. A first variance value is calculated from digital values of the frequency filter output signal and at least one second variance value is calculated from other digital values of the frequency filter output signal and a weighted arithmetic average of the at least two variance values is calculated with the aid of a recursive calculation of the variance value. If the weighted arithmetic variance average value exceeds a pre-selected variance threshold value, then it is assessed that a structure-borne noise event provoked by mechanical damage to the roller bearing has occurred.

Abstract: Processing of information signals separated according to modulation and carrier components in a more controlled way is made possible by a device for processing an information signal including a unit for converting the information signal to a time/spectral representation by block-wise transforming of the information signal and a unit for converting the information signal from the time/spectral representation to a spectral/modulation spectral representation, wherein the unit for converting is designed such that the spectral/modulation spectral representation depends on both a magnitude component and a phase component of the time/spectral representation of the information signal. A unit then performs a manipulation and/or modification of the information signal in the spectral/modulation spectral representation to obtain a modified spectral/modulation spectral representation.

Abstract: An example embodiment provides a method for calibrating an active RC filter and RC time constant calibrator for an active RC filter. The RC time contact calibrator includes a RC timer and a calibration code generator. The RC timer outputs a holding signal based on a comparison of a first output signal and a second output signal. The holding signal output by the RC timer causes a digital count value to be compared to a digital target value. The calibration code generator generates a slope control code and a flag signal based on the comparison of the digital count value and the digital target value and outputs the slope control code as a calibration code based on the flag signal. The slope control code controls the slope of the first output signal and the slope of the second output signal.

Abstract: The present invention provides a new approach for processing hyper-spectral radiance data. It uses a transformation matrix to convert an instrument radiance spectrum into a pseudo-monochromatic radiance spectrum. The pseudo-monochromatic radiance spectrum is produced by an empirical transform of the instrument channel spectrum to a monochromatic equivalent spectrum (i.e., a pseudo-monochromatic spectrum). Eigenvector regression is used to produce the empirical transformation. Although the transformation does not produce the monochromatic radiance spectrum without error, the transformation error is generally well below nominal instrument noise levels for most spectral channels. The reduction in instrument noise results from a noise filtering effect of the eigenvector transformation.

Abstract: One embodiment of the present invention provides a system that facilitates high-sensitivity detection of an anomaly in telemetry data from an electronic system using a telemetric impulsional response fingerprint of the telemetry data. During operation, the system applies a sudden impulse step change to one or more operational parameters of the electronic system during operation. Next, the system generates a three-dimensional (3D) telemetric impulsional response fingerprint (TIRF) surface from a dynamic response in the telemetry data to the sudden impulse step change. The system then determines from the 3D TIRF surface whether the telemetry data contains an anomaly.

Abstract: A fabrication history of a group of wafers is provided, having a record for each wafer of the manufacturing events that did or did not occur in its fabrication, and having the measured value of a given target. A binary decision rule is formed based on the fabrication history, the rule being that if a wafer has a particular pattern of manufacturing events in its fabrication history then the statistic of the given fabrication target for that wafer is a first value; otherwise, the statistic is a second value having at least a given distance from the first value. The pattern of manufacturing events in the binary decision rule is identified in the generation of the binary decision rule. The identified pattern is significant with respect to the given target.

Abstract: A sensor apparatus for calculating an angle of inclination includes a three-axis acceleration sensors used for sensing acceleration and resolving the acceleration into a first acceleration component in a first axis direction, a second acceleration component in a second axis direction perpendicular to the first axis direction, and a third acceleration component in a third axis direction perpendicular to a plane formed by the first and second axes. A calculator compares absolute values of the first, second, and third acceleration components with each other to calculate a first angle of inclination from one of the three acceleration components that is largest in absolute value and one of the remaining two acceleration components, and calculate a second angle of inclination from the one acceleration component largest in absolute value and the other of the two acceleration components.

Abstract: There is reduced labor to directly connect two ports selected from ports of a network analyzer in order to measure transmission tracking errors. A network analyzer, to which a test set which branches four ports to nine ports (main port group: three ports, and sub port groups: three ports ×2) is connected, includes transmission/reception ports, a transmission tracking error determining unit which determines transmission tracking errors of a combination of one of possible connections in the main port group and one of possible connections in the sub port groups for all the possible connections in the main port group based on signals before transmitted by the transmission/reception ports and reception signals, and a transmission tracking error deriving unit which derives other transmission tracking errors based on the transmission tracking errors determined by the transmission tracking error determining unit.

Abstract: A positioning system is provided for mounting a circuit board or device to be tested, and for mounting a sensor assembly, the positioning system having the capability of moving the sensor assembly in three dimensions. The sensor assembly is positioned on the mounting assembly such that it is not in contact with the circuit board under test. The sensor assembly in operation samples the electromagnetic field emanating from the circuit under test and converts those signals into a representative electrical signal in a digitized format. A processing system compares the measured values from the sensor assembly with reference values from the same point in a circuit known to be good and provides an indication to the user as to whether the difference therebetween is within an acceptable range or outside thereof.

Abstract: A method and system is disclosed for scaling performance indicators of control applications in an environmental control system. The method and system include receiving more than one performance indicator from a first control application, wherein the first control application includes a modulating control output and receiving more than one performance indicator from a second control application, wherein the second control application includes a staged-control output. The method and system further include identifying a probability distribution, wherein the probability distribution is characteristic of a fault-free environmental control system and calculating probability distributions associated with the performance indicators of the first and second control applications. The method and system also include displaying the probability distributions of the first and second control applications on a common scale.

Abstract: A structure formed on a semiconductor wafer can be examined using a support vector machine. A profile model is defined by profile parameters that characterize the geometric shape of the structure. A training set of values for the profile parameters is obtained. A training set of simulated diffraction signals is generated using the training set of values for the profile parameters. The support vector machine is trained using the training set of values for the profile parameters. A simulated diffraction signal is generated using a set of values for the profile parameters as inputs to the trained support vector machine. A measured diffraction signal is compared to the simulated diffraction signal. When the signals match within one or more matching criteria, values of profile parameters of the structure are determined to be the set of values for the profile parameters used to generate the simulated diffraction signal.

Abstract: Each data lane connected to a FPGA and forming part of a SFI channel may be trained independently to enable the outputs from the FPGA to be aligned. In operation, a known fixed pattern is repeated on each of the data lanes with the exception of the data lane being trained. The short fixed pattern is smaller than an SERDES capture range so that the SERDES may temporarily lock onto the short fixed pattern for all data lanes other than the lane being trained. Training data is then transmitted on the lane being trained and the preskew delay for that lane is adjusted until the receiving component indicates that the lanes are aligned. This process may iterate to find acceptable preskew delay values for all lanes. By training the lanes one at a time and using a short repeating pattern on the untrained lanes, the SERDES may register that the untrained lanes are operating correctly so that the feedback from the SERDES is related only to the lane being trained.

Abstract: A work piece 1 mounted on a movable table 22 is rotated while adjusting cutting depths of a grinding wheel 23 by means of feed motor so as to perform cylindrical grinding. During the cylindrical grinding, a thermocouple 42 is pushed to and caused to contact the rotating cylindrical grinding surface 1a of the work piece 1 at a constant pressure and thermoelectromotive force generated by the thermocouple 42 is measured. Surface roughness data corresponding to the measured thermoelectromotive force are obtained on the basis of the thermoelectromotive data obtained by the measurement and correlation between thermoelectromotive force and surface roughness concerning a known standard surface previously obtained and memorized. The surface roughness data are output and displayed on a display section. Therefore, an in-process measurement of surface state of the work piece 1 can be performed, while the machining such as cylindrical grinding is being carried out.

Abstract: A structure-borne sound sensor unit, in particular for an agricultural machine, includes a signal converter, which converts a mechanical sensor signal into an electrical sensor signal, and preprocessing electronics, which are connected with the signal converter. The preprocessing electronics include at least one programmable function component, a data input for receiving configuration data, and a programming interface to configure the function component based on the configuration data received. A control unit for a such a structure-borne sound sensor unit, a sensor system, which includes such a control device and such a structure-borne sound sensor unit, and a related method for controlling such a structure-borne sound sensor unit are provided.