Abstract: A system and method for measuring sample material properties by coherently averaging cantilever free-decay signals in a scanning probe microscope is described.

Abstract: Methods and apparatus for automatically determining a feedback setpoint for use in operating an atomic force microscope (AFM) are provided. The setpoint may be determined by modulating a feedback setpoint while monitoring for a change in a detector signal. In an effort to avoid tip damage and remain in non-contact, attractive mode during use, a setpoint just above a setpoint corresponding to a detected change in a parameter of the detector signal, such as an abrupt change in phase, may be used to operate the AFM.

Abstract: An object is to provide a gas sensor which can suppress positional shift of a to-be-held member such as a gas detection element, as well as a method of manufacturing the gas sensor. A gas sensor (101) includes a gas detection element (111), a metallic shell (131), a plate packing (157), and a first packing (159). A proximal end surface (113t2) of a projection (113) of the gas sensor element (111) and a central inner circumferential surface (135n) of the metallic shell (131) form an acute-angle clearance (120). The first packing (159), which has a wedge-like cross section, is disposed in the clearance (120) such that the first packing (159) is pressed against the proximal end surface (113t2) of the projection (113) of the gas sensor element (111) and the central inner circumferential surface (135n) of the metallic shell (131).

Abstract: One inventive aspect is related to an atomic force microscopy probe. The probe comprises a tip configuration with two probe tips on one cantilever arm. The probe tips are electrically isolated from each other and of approximately the same height with respect to the cantilever arm. The outer surface of the tip configuration has the shape of a body with a base plane and an apex. The body is divided into two sub-parts by a gap located approximately symmetrically with respect to the apex and approximately perpendicular to the base plane. Another inventive aspect related to methods for producing such an AFM probe.

Abstract: A method for monitoring the integrity of a permeable structure that is disposed in an environment containing a fluid at ambient pressure is provided. At least one cavity is formed in or on the permeable structure. A source of first fluid is provided at a first pressure greater than the ambient pressure. The cavity is coupled to the source through a high-fluid-flow impedance to establish a flow of the first fluid through the permeable structure via the cavity. A rate of flow of the first fluid through the permeable structure is allowed to stabilize to a steady-state rate. A change in the steady-state flow rate of the first fluid through the permeable structure is monitored.

Abstract: A gas sensing material includes a nonphotosensitive organic silver salt. A gas inspecting method includes adhering a gas sensing material to a surface of an inspection object, wherein the gas sensing material includes a nonphotosensitive organic silver salt; and heat developing the gas sensing material.

Abstract: In a probe apparatus that intermittently irradiates a sample with excitation light to observe the sample while subjecting a cantilever including a probe arranged to face a surface of the sample to self-excited vibration at a predetermined frequency, the sample is irradiated with the excitation light at a predetermined timing when a distance between the probe and the sample is not greater than a predetermined distance.

Abstract: A humidity sensor includes: a substrate; a pair of electrodes on the substrate; a humidity sensitive member between the electrodes having a capacitance changeable in accordance with humidity; an output element connecting to the electrodes in order to detect a capacitance of the humidity sensitive member and outputting a signal corresponding to the capacitance; and a setting member for setting a maximum amount of moisture in the humidity sensitive member to be a standard maximum amount of moisture. The humidity sensitive member is capable of absorbing a moisture up to the maximum amount of moisture. The setting member includes at least one of an element for reducing the maximum amount of moisture and an element for increasing the maximum amount of moisture.

Abstract: The present invention provides a test tee device for leak testing a pipe line system. In structure, the test tee device includes a tee fitting, comprising a tubular section extending between a first and a second opposing openings axially aligned with each other, a third opening communicating with the tubular section of the tee fitting; wherein the tubular section has a inside diameter greater than the first opening inside diameter and the second opening inside diameter. The present invention can also be viewed as a method for leak testing a pipe line system. The method operates by inserting a test tee fitting, applying a test pressure to the test tee fitting through the third opening; and removing the removable insert, if the test pressure is maintained for the predetermined time.

Abstract: A magnetostrictive torque sensor system stabilizes and detects steering torque applied to a steering shaft.

Abstract: A gas sensor is disclosed having an element holder body with which a sensor element is fixedly supported, and an atmosphere-side insulator covering a base portion of the sensor element and providing electrical connection between lead wires and terminal electrodes of the sensor element. The element holder body includes a housing and an element-side insulator fixedly mounted in the housing. The atmosphere-side insulator incorporates therein a plurality of spring terminals held in electrical contact with the electrode terminals of the sensor element. At least one of the element holder body and the atmosphere-side insulator carries thereon convexed portions with which the atmosphere-side insulator can tilt with respect to the element holder body.

Abstract: In accordance with the invention, rapid surface seeks to the measurement surface by a scanning probe microscope are enabled by using an actuator coupled to a position sensor.

Abstract: A gas sensor and method of producing the same, the gas sensor including a sensor element extending along a longitudinal axis of the gas sensor; a metal shell surrounding the sensor element; and a protector fixed on a front portion of the metal shell and covering a front portion of the sensor element which projects from the front end of the metal shell, wherein an oil agent is present on one or both of an inner gas-receiving surface of the metal shell and an inner peripheral surface of the protector in a total amount of less than 0.7 mg.

Abstract: Apparatus and methods are described for isolating or manipulating a portion of a sample at non-ambient temperatures and pressures. One apparatus embodiment of the invention comprises a primary sample containment vessel defining a primary chamber, the vessel having a primary sample inlet and outlet; a secondary sample collection container defining a collection chamber fluidly connected to the primary containment vessel; and a sample probe comprising a distal end able to isolate a secondary sample in the primary chamber and transfer it to the collection chamber, the probe fluidly connected to the primary chamber via a seal allowing at least the distal end to be moved in 3-dimensions within the primary chamber. This abstract complies with rules requiring an abstract. It should not be used to limit the scope or meaning of the claims. 37 CFR 1.72(b).

Abstract: A semiconductor probe and a method of writing and reading information using the same. The semiconductor probe includes a cantilever and a tip formed on an end portion of the cantilever to write or read information on or from a ferroelectric medium on a surface of which an electrode is formed. The tip includes a resistive region lightly doped with semiconductor impurities and a conductive region heavily doped with the semiconductor impurities. The cantilever includes an electrostatic force generation electrode formed on a bottom surface facing the medium. A contact force between the tip and the medium is adjusted by selectively applying a voltage between the electrode formed on the ferroelectric medium and the electrostatic force generation electrode.

Abstract: An ionic liquid piezoelectric gas sensor for the detection of polar and nonpolar organic vapors. The gas sensor can operate at high temperatures with a fast linear response which is also reversible. At high temperatures, the frequency change (?f) versus concentration (C) curve mirrors the Henry's gas law, such that the concentration of a gas sample in liquid solvent is proportional to the concentration or partial pressure of the sample in gas phase. The gas sensor can be used for quantitative analysis of gas vapors and determination of Henry constants.

Abstract: Apparatuses and methods for using proximal probes. A method includes measuring motion of an oscillating probe, producing a signal indicative of motion of the oscillating probe, and filtering the signal indicative of motion of the oscillating probe. In one embodiment, filtering includes performing signal decomposition to produce a filtered signal. In another form, filtering includes performing a Fourier transform, comb filtering in the frequency domain, and performing an inverse Fourier transform to produce a filtered signal. In another embodiment, filtering includes amplifying specific frequencies of the signal indicative of motion of the oscillating probe. Apparatuses according to the present invention are also provided.

Abstract: The present invention provides a sensor capable of maintaining an electrical connection between the lead frame and an electrode terminal section of the detection element even when an inadequate external force is applied to a lead frame and a sensor production method capable of preventing the lead frame from buckling and being deformed into an inadequate shape. The lead frame (second lead frame) can inhibit movement of a second frame main body section axially toward a rear end side through engagement of a third locking surface of a second locking section with a second locking groove and can inhibit the second frame main body section from going apart from an inner surface of an insertion hole through engagement of a fourth locking surface of the second frame locking section, which faces an element engagement section side.

Abstract: A method, system and unit for determining alignment in a layered device such as a semiconductor device includes providing a first layer having detectable surface and subsurface material properties and positioning a patterned photoresist layer over the first layer, patterned photoresist layer having detectable surface and subsurface material properties. The layers are imaged with a FIRAT probe to detect the material properties, and the detectable material properties are compared for mapping an alignment of the compared detectable material properties. The first layer may be a substrate or have a previously processed layer formed thereon. A surface topography may be included over the substrate and an etchable layer formed over the substrate or first layer. The FIRAT probe may be a single tip probe or a dual tip probe.

Abstract: An exhaust gas analyzer includes a main flow path and at least one sub-flow path. Exhaust gas from an internal combustion engine is introduced to the main flow path; sub-flow paths are parallel to the main flow path. Plural kinds of analyzers are mounted on the main flow path and sub-flow paths to measure concentration of multiple components in the exhaust gas. Actual measurement values of the concentration for the measured components are obtained. A deviance from a true value generated to an actual measurement value due to a mutual influence of the measured components is corrected based on at least one actual measurement value.