Patents Examined by Michael P Lapage
  • Patent number: 12044693
    Abstract: The present invention relates to an apparatus for conducting assays on samples and/or processing of samples. The apparatus comprises a rotatably arranged cylindrical sample holder for holding a sample at a lateral surface of the cylindrical sample holder. The cylindrical sample holder is configured to be at least partly covered by a liquid layer. The apparatus further comprises a liquid dispensing means configured to add liquid to the liquid layer, a reagent dispensing means configured to add a reagent to the liquid layer and a liquid contacting means configured to distribute liquid within said liquid layer. The liquid contacting means comprises a plate-like element flexibly assembled in relation to the cylindrical sample holder. The present invention also relates to a method for conducting assays on samples and/or processing of samples.
    Type: Grant
    Filed: February 28, 2022
    Date of Patent: July 23, 2024
    Assignee: Single Technologies AB
    Inventors: Johan Strömqvist, Bengt Sahlgren, Nils Tingstam
  • Patent number: 12038270
    Abstract: A non-contact non-destructive testing method includes spatially and/or temporally controlling a laser excitation light based on a predetermined pattern. The laser excitation light is projected onto a surface of a test object to generate acoustic waves on the test object. The acoustic waves apply stress loading to the test object. The method also includes imaging the test object with and without stress loading using shearography imaging, and analyzing shearography imaging data to determine a presence of a defect in the test object.
    Type: Grant
    Filed: March 26, 2020
    Date of Patent: July 16, 2024
    Assignee: AGENCY FOR SCIENCE, TECHNOLOGY AND RESEARCH
    Inventors: Lei Zhang, Weng Heng Liew, Huajun Liu
  • Patent number: 12031898
    Abstract: A method for determining a focal length of a particle in a medium, wherein the method comprises: providing a sample; emitting a coherent light beam to irradiate the sample, wherein a first part of the light beam is scattered by the particle; recording an interference image; computing for a set of positions an electric field from the interference image; generating a representation comprising, for each of said positions, an intensity value of the coherent light beam calculated from the computed electric field; finding two positions, a first of which lies in the sample, a second of which lies in the beam direction behind or in front of said first position; and determining the focal length from the two found positions.
    Type: Grant
    Filed: April 29, 2021
    Date of Patent: July 9, 2024
    Assignee: Universität für Bodenkultur Wien
    Inventors: Petrus Dominicus Joannes Van Oostrum, Erik Olof Reimhult
  • Patent number: 12017278
    Abstract: Additive manufacturing, such as laser sintering or melting of additive layers, can produce parts rapidly at small volume and in a factory setting. To ensure the additive manufactured parts are of high quality, a real-time non-destructive evaluation (NDE) technique is required to detect defects while they are being manufactured. The present invention describes an in-situ (real-time) inspection unit that can be added to an existing additive manufacturing (AM) tool, such as an FDM (fused deposition modeling) machine, or a direct metal laser sintering (DMLS) machine, providing real-time information about the part quality, and detecting flaws as they occur. The information provided by this unit is used to a) qualify the part as it is being made, and b) to provide feedback to the AM tool for correction, or to stop the process if the part will not meet the quality, thus saving time, energy and reduce material loss.
    Type: Grant
    Filed: April 26, 2023
    Date of Patent: June 25, 2024
    Inventor: Araz Yacoubian
  • Patent number: 12019013
    Abstract: The disclosed subject matter relates to a method of treating of asbestos or asbestos-containing material, comprising applying to the asbestos or asbestos-containing material a composition including a treatment compound comprising at least one of hexafluoro titanium di-ammonium, potassium hexafluoro zirconate. ammonium hexafluoro phosphate. ammonium hexafluoro stannate, ammonium hexafluoro germanate, ammonium tetrafluoro borate or ammonium heptafluoro tantalite; and a fluorine scavenger compound.
    Type: Grant
    Filed: July 30, 2021
    Date of Patent: June 25, 2024
    Inventors: Ferdinando F Bruno, Manuele Bernabei, LTC Andrea Chiappa, David Ziegler, Nicole F Farhadi
  • Patent number: 12008746
    Abstract: An inspection device includes an acquisition unit that acquires a plurality of images, captured from a given height, of an inspection object controlled to move at a constant velocity, a comparison unit that compares movements of the inspection object in the images on the basis of the plurality of images, and a determination unit that determines the condition of the inspection object on the basis of a comparison result.
    Type: Grant
    Filed: December 6, 2018
    Date of Patent: June 11, 2024
    Assignee: NEC CORPORATION
    Inventor: Jun Takada
  • Patent number: 12000688
    Abstract: Provided are a shape inspection device, a processing device, a height image processing method, and a height image processing program capable of accurately inspecting a measurement object. A profile data generation unit sequentially generates a plurality of pieces of profile data as the measurement object relatively moves in a Y-axis direction. A height image generation unit extracts characteristic points for the respective pieces of profile data, and moves the respective pieces of profile data in a plane intersecting with a Y axis such that the extracted characteristic points are aligned in a line in a direction corresponding to the Y axis. Then, the height image generation unit arranges the moved profile data in a direction corresponding to the Y axis to correct a height image.
    Type: Grant
    Filed: May 20, 2022
    Date of Patent: June 4, 2024
    Assignee: KEYENCE CORPORATION
    Inventors: Kaoru Kanayama, Takashi Atoro
  • Patent number: 12000701
    Abstract: A surveying system includes a distance measuring unit for performing the distance measurement based on the distance measuring light, an optical axis deflector configured to enable two-dimensionally deflecting the optical axis of the distance measuring light, a projecting direction detecting module for performing the angle measurement of the optical axis of the distance measuring light, and an arithmetic control module performs captures the pole by a scan pattern having a predetermined shape, acquires the point cloud data of at least two positions where the scan pattern crosses the pole, calculates an axis of the pole, calculates a direction vector, performs a linear scan along the direction vector, determines as a measuring point a point where an intersection of the optical axis of the distance measuring light and the direction vector coincides or substantially coincides with a measurement result, and calculates the three-dimensional coordinates of the measuring point.
    Type: Grant
    Filed: July 22, 2020
    Date of Patent: June 4, 2024
    Assignee: TOPCON CORPORATION
    Inventor: Nobuyuki Nishita
  • Patent number: 11988496
    Abstract: A method and apparatus for measuring the width of a strip or the widths of multiple strips being conveyed longitudinally through a sensing region of a gauge. The apparatus includes a correction bar that has very highly accurately machined edges and includes a laser point displacement sensor that traverses across the sensing region of the gauge of the invention. The method of the invention uses the correction bar by sensing its edge distance positions and using the data for the sensed edge distance positions and data for its highly accurately known edge distance positions to generate corrections for all distance positions continuously across the entire sensing region. Corrections are then made to sensed edge distance positions of a strip or strips being sensed by the gauge, regardless of the positions of the strip edges.
    Type: Grant
    Filed: March 22, 2022
    Date of Patent: May 21, 2024
    Assignee: Advanced Gauging Technologies, LLC
    Inventors: Todd Allen, Nick Hunkar, John Bihn
  • Patent number: 11988501
    Abstract: A method for 3D surface imaging of an object, comprising generating a sinusoidal pattern from an input beam; projecting the sinusoidal pattern onto the object; acquiring deformed structured images from the object; reconstructing and displaying the surface of the object in real-time. A system comprises an device encoding an input beam with a structured pattern; a filter configured to spatially filter the encoded beam; a projector lens projecting the structured pattern onto the object; a high speed camera acquiring a structured pattern deformed by the 3D surface of the object; a graphic processing unit; and a CoaXPress interface transferring data acquired by the camera to the graphic processing unit; the graphic processing unit reconstructing and displaying the 3D surface of the object in real-time.
    Type: Grant
    Filed: February 6, 2020
    Date of Patent: May 21, 2024
    Assignee: INSTITUT NATIONAL DE LA RECHERCHE SCIENTIFIQUE
    Inventors: Jinyang Liang, Cheng Jiang, Patrick Kilcullen
  • Patent number: 11982623
    Abstract: A method of analysis of defects of a type from among a plurality of types of defects between two samples based on an image of each sample characteristic of a type of defect from among the plurality of types of defects includes: for each sample, creating a minimap including bins and representative of a type of defect whose resolution is less than the image of the sample, each bin of the minimap being associated with pixels of the image of the sample and having a score dependent on the pixels and representative of the quantity of a type of defects; determining the distance between each minimap representing the same type or types of defects, the distance between two minimaps being defined as the minimum distance between two minimaps by considering the following transformations: a rotation and/or a symmetry so that each distance between two minimaps is associated with a transformation.
    Type: Grant
    Filed: July 30, 2019
    Date of Patent: May 14, 2024
    Assignee: COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES
    Inventors: Patrick-Jeremy Dahan, Renaud Varache, Wilfried Favre
  • Patent number: 11953309
    Abstract: In one embodiment, systems and methods include using an inspection and projection system to measure the thickness of a coating and provide visual guidance for secondary operations. The inspection and projection system comprises a robotic arm operable to rotate about a plurality of axes, wherein an end effector is disposed at a distal end of the robotic arm. The inspection and projection system further comprises a linear rail system, wherein the robotic arm is coupled to the linear rail system, and wherein the robotic arm is operable to translate along the linear rail system. The inspection and projection system further comprises a frame, wherein the linear rail system is disposed on top of the frame, and an information handling system coupled to the frame, wherein the information handling system is operable to actuate the robotic arm and the linear rail system.
    Type: Grant
    Filed: September 22, 2021
    Date of Patent: April 9, 2024
    Assignee: Lockheed Martin Corporation
    Inventors: Shane Whitaker, Jeffrey Drewett, Anthony Mann
  • Patent number: 11946862
    Abstract: A method for in-line analysis of a composite product, wherein a hyperspectral sensor is used to acquire images of samples of target materials that are part of the composite product, in order to perform an in-line optical inspection at process speed.
    Type: Grant
    Filed: July 21, 2021
    Date of Patent: April 2, 2024
    Inventors: Anselmo Cicchitti, Enrico Iavazzo
  • Patent number: 11946850
    Abstract: A device for detecting particles in air; said device comprising: a receiver for receiving a flow of air comprising particles; a particle capturing arrangement configured to transfer the particles from the flow of air to a liquid for collection of a set of particles in the liquid; a flow channel configured to pass a flow of the liquid comprising the set of particles through the flow channel; a light source configured to illuminate the set of particles in the flow channel, such that an interference pattern is formed by interference between light being scattered by the set of particles and non-scattered light from the light source; and an image sensor comprising a plurality of photo-sensitive elements configured to detect incident light, the image sensor being configured to detect the interference pattern.
    Type: Grant
    Filed: December 18, 2020
    Date of Patent: April 2, 2024
    Assignee: IMEC VZW
    Inventors: Geert Vanmeerbeeck, Ziduo Lin, Abdulkadir Yurt, Richard Stahl, Andy Lambrechts
  • Patent number: 11940267
    Abstract: A method including the following steps: clamping and centering a toothing on a measuring spindle of a coordinate measuring machine; and measuring a geometry of a toothing using an optical measuring system of the coordinate measuring machine. The toothing is rotated during the measurement by a rotation of the measuring spindle. A rotational speed of the measuring spindle is adjusted and/or increased or decreased depending on a tolerance class of the toothing to be measured.
    Type: Grant
    Filed: January 31, 2022
    Date of Patent: March 26, 2024
    Assignee: KLINGELNBERG GMBH
    Inventor: Fabian Thones
  • Patent number: 11920915
    Abstract: Systems and methods are provided for inspection. One embodiment is a method for measuring a hole. The method includes driving a fiber optic probe into the hole, determining a profile by scanning the hole via the fiber optic probe, and determining whether an interface gap exists at the hole based on the profile.
    Type: Grant
    Filed: January 3, 2022
    Date of Patent: March 5, 2024
    Assignee: The Boeing Company
    Inventors: Farahnaz Sisco, Jeffrey Martin Devlin, Nathan Christopher McRae
  • Patent number: 11913870
    Abstract: Provided are methods and devices for assessing biological particles for use in cell immunotherapy. By utilizing a microfluidic chip device together with optical force measurement and cell imaging, the methods enable comprehensive assessment and characterization of biological particles with regard to morphology, motility, binding affinities, and susceptibility to external forces, including but not limited to, chemical, biochemical, biological, physical and temperature influences. The methods enable the selection and production of biological particles, such as engineered T-cells, for use in immunotherapy and biomanufacturing.
    Type: Grant
    Filed: January 26, 2022
    Date of Patent: February 27, 2024
    Assignee: Lumacyte, Inc.
    Inventors: Sean Hart, Colin Hebert
  • Patent number: 11913889
    Abstract: A prediction device for predicting the growth direction of a crack that occurs in a subject includes: an obtainer that obtains video of the subject; a derivation unit that derives displacement of each of a plurality of regions in the obtained video; a selector that selects, from among the plurality of regions, two or more regions each having displacement similar to displacement of a reference region included in the plurality of regions; and an identification unit that identifies, as the growth direction, the longitudinal direction of a collective region made up of the two or more selected regions.
    Type: Grant
    Filed: December 29, 2020
    Date of Patent: February 27, 2024
    Assignee: PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
    Inventors: Yuki Maruyama, Hiroya Kusaka, Taro Imagawa, Akihiro Noda
  • Patent number: 11906287
    Abstract: A shape profile measurement device includes: a light projector and a light receiver arranged facing each other; a belt conveyor for conveying an object for measurement; and a calculation unit. The light projector includes a plurality of light-emitting portions arranged in an array direction, and each emits substantially parallel measurement light. The light receiver includes a plurality of light-receiving portions arranged in the array direction facing the plurality of light-emitting portions, and each receives the measurement light emitted from a corresponding light-emitting portion. The light-receiving portions output a signal indicating a light intensity of the received measurement light.
    Type: Grant
    Filed: June 24, 2022
    Date of Patent: February 20, 2024
    Assignee: SICK K.K.
    Inventors: Tatsuya Eki, Kou Ikeda, Yuji Ogusu
  • Patent number: 11905545
    Abstract: Method for characterising a microorganism, comprising: —illuminating, in the wavelength range of 390 nm-900 nm, the microorganism having a natural electromagnetic response in said range; —acquiring, in said range, a light intensity reflected by said (or transmitted through said) illuminated microorganism; and —determining the microorganism as being a yeast or a bacterial strain according to the light intensity acquired in said range.
    Type: Grant
    Filed: December 20, 2018
    Date of Patent: February 20, 2024
    Assignee: BIOMERIEUX
    Inventors: Jordane Lallemand, Denis Leroux, Manuel Petit