Abstract: A method and apparatus in which retroreflective materials and surfaces are used for determining the position, orientation and scale of work pieces in order to accurately place process beams thereon for the purpose of surface patterning or treatment.

Abstract: A first temperature sensor is formed in a first measurement area. A first input part is formed in the first measurement area so that an output surface thereof is exposed to the inner surface of the liquid tank. A first light receiving part receives a reference light through the liquid from the first input part. A second input part causes a second incident light to be incident on a living body. A second light receiving part receives a measurement light from the second input part. Based on the light intensity of the reference light and the measurement light, an absorbance calculation device can detect the absorbance of the liquid and living body tissue. A concentration calculation device compares the absorbance of the liquid with the absorbance of the living body tissue and calculates a concentration of a measured component contained in the living body tissue.

Abstract: A modulated reflectance measurement system includes three monochromatic diode-based lasers. Each laser can operate as a probe beam or as a pump beam source. The laser outputs are redirected using a series of mirrors and beam splitters to reach an objective lens. The objective lens focuses the laser outputs on a sample. Reflected energy returns through objective and is redirected by a beam splitter to a detector. A lock-in amplifier converts the output of the detector to produce quadrature (Q) and in-phase (I) signals for analysis. A Processor uses the Q and/or I signals to analyze the sample. By changing the number of lasers used as pump or probe beam sources, the measurement system can be optimized to measure a range of different samples types.

Abstract: An edge flaw detection device includes an elliptical mirror having a mirror surface on the inside thereof and having a cutout that allows an object to be inserted therethrough formed at the apex thereof, a light-emitting unit that radiates coherent light toward an edge of the object arranged in the vicinity of a first focal position of the elliptical mirror, a photo detector that is arranged in a second focal position of the elliptical mirror, and a light-shielding member that shields low-order diffracted light that is reflected regularly. The light-emitting unit is moved in the thickness direction of the object by a moving member so that the light-emitting unit can radiate the coherent light in a different radiation range in the thickness direction at the edge of the object.

Abstract: An apparatus and methods for the real-time inspection for defects in and on transparent sheets, such as a sheet of glass, are described. A sensor detects a transparent light reflective coating on a transparent sheet and defines a sample profile. An optical inspection system utilizes an illumination source and an imaging device to obtain images of the transparent sheets. An image processing system analyzes for defects in the transparent sheets, including coating defects and defects in edge deleted perimeters. Inspection variables which correspond to the sample profile are used by the optical inspection system and image processing system for real-time inspection.

Abstract: An apparatus and method embodying the invention include utilizing a device with a limited number of interrogation devices to accomplish a large number of measurements on a target tissue (50). An instrument embodying the invention includes a plurality of detection devices (54) that are arranged in a predetermined pattern on a tissue contacting face of the instrument. The face of the instrument is located adjacent the target tissue (50), and a plurality of tissue characteristic measurement are simultaneously conducted. The detection devices (54) are moved to a new position, preferably without moving the tissue contacting face, and a second plurality of tissue characteristic measurements are simultaneously conducted. By conducting a series of measurements cycles in this manner, the ultimate resolution of the device is increased, while still obtaining a given resolution, which reduces potential cross-talk errors.

Abstract: The invention relates to methods and systems for detecting and or analyzing an agent in a sample with a chip having optical components incorporated therein.

Abstract: An optical measurement system for evaluating a sample has a azimuthally rotatable measurement head. A motor-driven rotating mechanism is coupled to the measurement head to allow the optics to rotate with respect to the sample. In particular, a preferred embodiment is a polarimetric scatterometer (FIG. 1) for measuring optical properties of a periodic structure on a wafer sample (12). This scatterometer has optics (30) directing a polarized illumination beam at non-normal incidence onto the periodic structure. In addition to a polarizer (8), the illumination path can also be provided with an E-O modulator for modulating the polarization. The measurement head optics also collect light reflected from the periodic structure and feed that light to a spectrometer (17) for measurement. A polarization beamsplitter (18) is provided in the collection path so that both S and P polarization from the sample can be separately measured.

Abstract: A system for measuring properties of an optical component, such as a progressive, multifocal ophthalmic spectacle lens comprises a design having a set of concentric circles, means for recording images of the design directly and through the optical component in a computer memory, means for superimposing the images to form a moiré-effect pattern and a method for analyzing the pattern to measure a property (e.g., powers) of the optical component that includes a comparison of a portion of the pattern generated with the component with a portion of a pattern generated by a master component.

Abstract: A method for measuring the quality properties of paper and/or board on moving webs is disclosed. The present invention utilizes a staged evaluation method in which the basic properties of the paper or board and further properties are determined via multi-stage modeling.

Abstract: A system for aligning the optical components of a chemical analysis system in which capillaries or optical fibers are supported by a substrate. The system provides for alignment of elements of an electrophoresis system in an efficient high sampling rate capability. The system provides multiple sources, such as lasers or LEDs that are optically coupled to each capillary or channel. Multi-analyte capability, a variety of analysis modes and DNA sequencing operations are applications of systems using a plurality of lasers per channel.

Abstract: The invention relates to a surface plasmon resonance sensor for the simultaneous measurement of a plurality of samples present in fluid form. The aim of the invention is to provide such a sensor which can be arranged into a defined array and where the surface plasmon resonance sensors can be produced using technology which is simpler and more economical than those produced according to the prior art. To this end several strip-like optical wave guides (2) are arranged on a planar support (1) at a defined distance to each other in such a way that their front faces (21, 22) are flush with opposite sides (11, 12) of the planar support (1). Each strip-like optical wave guide (2) in a section which is to be brought into contact with the fluid samples has at least one thin metal layer (3) which permits the excitation of surface plasmons.

Abstract: The present invention relates to a method of detecting an image formation characteristic of a projection optical system for projecting a reference pattern on a reticle on a substrate. According to the detection method, a reticle stage is moved so that a reference mark on the reticle comes to a first reference position and a second reference position, and a wafer stage is moved so that a light transmission portion on the wafer stage crosses an image forming position of a projected image of the reference mark obtained through the projection optical system. The positions of the reticle stage and the wafer stage at the first and second reference positions are measured as moved distances of the stages, respectively. From the distances of movement of the reticle and wafer stages measured, the image formation characteristic of the projection optical system is calculated.

Abstract: A visual examination apparatus for a semiconductor device for optically reading an image of a semiconductor device having a substantially rectangular package is disclosed, comprising:four polarized light sources which are disposed so as to confront the four side surfaces of said package;four reflection means each of which is disposed between each of said four polarized light sources and the corresponding side surface of said package, and reflects a projection image at each side surface side which is formed from polarized light emitted to said package from a polarized light source which said reflection means confronts through said package; andimage reading means for collectively picking up projection images at the respective side surface sides which are reflected from said four reflection means and an image at the flat surface side of said package.

Abstract: A system for aligning the optical components of a chemical analysis system in which capillaries or optical fibers are supported by a micromachined substrate. The system provides for alignment of elements of an electrophoresis system in an efficient high sampling rate capability.

Abstract: A self-leveling laser plumb apparatus comprising an elongated straight tubular housing having an upper end and a pointed lower end thereof and a laser beam module prealigned and connected in said upper end in conjunction with confirmed precise alignment of a laser beam emitted from the laser beam module with a longitudinal axis of said housing. The pointed lower end of the housing is also in precise alignment with the longitudinal axis of said housing. A generally elongated C-shaped support includes a lower base supportable in a horizontal surface and an upper housing suspension member which is cooperatively structured with an upper portion of the housing to suspend the housing with the laser beam module in place in free-moving pendulum fashion. With the pointed lower end positioned just above the horizontal surface, a laser beam from said laser beam module strikes an overhead surface directly vertically above a mark on the horizontal surface over which said pointed lower end is aligned.

Abstract: A method and apparatus for accurate automated alignment of semiconductor chips (12,14) or thin-film networks includes forming a plurality of vias (16-19,22-25) in each integrated circuit element in respective locations, and moving the integrated circuit elements to bring the corresponding vias into alignment. In one embodiment, the integrated circuit elements (12,14) are moved by inserting a plurality of spindles (36-39) into respective vias in the integrated circuit elements to align the integrated circuit elements. In another embodiment, the integrated circuit elements (40,42) are moved by providing a source of light (48) on one side of the integrated circuit elements and a light sensor (50) on another side of the integrated circuit elements, and moving the integrated circuit elements to maximize the amount of light traversing the vias (44,46). To enable precision alignment of the integrated circuit elements, the vias may be formed with diameter less than 50 .mu.m.

Abstract: A zoom lens comprises a plurality of lens elements arranged into three lens units. More specifically, there is a first lens unit of positive refractive power, a second lens unit of negative refractive power, and a third lens unit of positive refractive power. The third lens unit is located between the first and the second lens units. The plurality of lens elements provide: (i) a zoom ratio greater than 1.5, (ii) an F/number in the telephoto position of less than F/5 and an F/number in the wide angle position of less than F/3.6, (iii) and an overall compactness ratio L.sub.v /f.sub.t <1.0, where L.sub.v is the distance from a front vertex of the zoom lens to the image plane in a telephoto position, and f.sub.t is the focal length of the zoom lens in the telephoto position.

Abstract: Analytical optical system design optimization implements an optical material selection module (302), a thin lens power calculation module (304), a prescription module (306), a figure of merit determination module (308), a bending adjustment module (310), and a focal length scaling module (312). The optical material selection module (302) selects a set of optical materials that are appropriate for use together in an optical system using the dispersion coefficients of the materials. Potential optical designs are screened according to thin lens power criteria. For each design with acceptable power distribution, a lens prescription is arranged and thickness is added to each lens by the prescription module (306) to provide a thick lens assembly. Designs can then be analyzed according to a figure of merit that evidences optical system performance by the figure of merit determination module (308). In an exemplary embodiment the polychromatic RMS spot radius for each design is analyzed.

Abstract: A method and apparatus for measuring the length, width, and height of rectangular solid objects moving on a conveyor. The apparatus includes a light curtain, two laser triangulation range finders, and a pulse tachometer mounted on a frame around a conveyor. As an object is conveyed through the frame, measurements from each of the sensors are correlated by a digital computer to estimate the length, width and height of the object. The method and apparatus does not require a break in the surface of the conveyor, and is insensitive to object placement and orientation on the conveyor.