Patents Examined by Nasima Monsur
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Patent number: 11644439Abstract: A magnetic body inspection apparatus includes a magnetic field application unit configured to apply a magnetic field to a long material including a magnetic body to be inspected, a detector configured to excite, in a longitudinal direction of the long material, magnetization of the magnetic body, the detector being configured to acquire a detection signal based on the magnetic field of the magnetic body that has been excited, and a detection apparatus body including the magnetic field application unit and the detector, the detection apparatus body being configured to be attachable to the long material in a short-side direction of the long material.Type: GrantFiled: January 16, 2020Date of Patent: May 9, 2023Assignee: SHIMADZU CORPORATIONInventor: Kenji Iijima
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Patent number: 11609609Abstract: A pressure sensor, includes: a first substrate; a pressure sensing layer on one surface of the first substrate; and a driving electrode and a sensing electrode on the pressure sensing layer and spaced apart from each other, wherein the driving electrode and the sensing electrode are on a same layer, and each of the driving electrode and the sensing electrode is directly on the pressure sensing layer.Type: GrantFiled: April 17, 2020Date of Patent: March 21, 2023Assignee: Samsung Display Co., Ltd.Inventors: So Hee Park, Won Ki Hong, Hee Seomoon, Hyeon Jun Lee
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Patent number: 11609285Abstract: According to one embodiment, a method includes: supplying electrical energy to a first path by an inspection circuit with a short circuit between two first terminals through a first probe; and detecting an electrical characteristic on the first path by the inspection circuit. The two first terminals are included in a plurality of second terminals included in a flexible printed circuit board. The flexible printed circuit board includes: an electronic component including the inspection circuit and a plurality of third terminals; the plurality of second terminals; and a plurality of first wired lines connecting the plurality of second terminals and the plurality of third terminals. The first path is formed by: the two first terminals; two second wired lines connected to the two first terminals among the plurality of first wired lines; and two fourth terminals connected to the two second wired lines among the plurality of third terminals.Type: GrantFiled: September 4, 2020Date of Patent: March 21, 2023Assignees: KABUSHIKI KAISHA TOSHIBA, TOSHIBA ELECTRONIC DEVICES & STORAGE CORPORATIONInventor: Yoshihiro Amemiya
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Patent number: 11604167Abstract: Disclosed herein is a differential probe, a testing device having at least one such differential probe, and a method for producing the same. The differential probe has a first half-probe and a second half-probe, at least one conductor loop pair having a conductor loop of each half-probe being shaped mirror-inverted relative to each other and, in respect of a mirror-inverted arrangement thereof on respective sides of a mirror plane. The conductor loops are oriented parallel to the mirror plane, are arranged offset relative to each other in an offset direction, also parallel to the mirror plane, wherein the conductor loops overlap in part in the direction normal to the mirror plane.Type: GrantFiled: April 4, 2018Date of Patent: March 14, 2023Assignee: PRÜFTECHNIK DIETER BUSCH GMBHInventors: Bernd Fuchsloch, Jürgen Peters
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Patent number: 11604224Abstract: A fast calibration method for slide-screw impedance tuners employs a new tuner control board and routine with independent direct triggering and data sampling by the VNA; a new vertical scaling algorithm bypasses the traditional iterative approach and uses numerical curve-fitting and ISO circle definition. Full tuner calibration executes without motor stopping, yielding time reduction typically by a factor of 8.Type: GrantFiled: August 6, 2020Date of Patent: March 14, 2023Inventor: Christos Tsironis
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Patent number: 11598897Abstract: A metal detector apparatus having a balanced coil system, a receiver unit, a drive coil with at least one capacitor forming a series resonant circuit connected to a transmitter unit having a converter, and a drive controller. The metal detector apparatus configuration generates a first square wave signal set to a fixed/selectable operating frequency which is applied to a first drive switch connected on one side to a first voltage potential and on another side to a centre tap of a half-bridge circuit. A second square wave signal set is generated to the fixed/selectable operating frequency and is applied to a second drive switch connected on one side to a second voltage potential and on another side to the centre tap, via which a drive current is supplied to the drive coil.Type: GrantFiled: April 16, 2020Date of Patent: March 7, 2023Assignee: METTLER-TOLEDO SAFELINE LTD.Inventor: Peter Howard
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Patent number: 11598750Abstract: An eddy current flaw detection device according to an embodiment includes: a first exciter/detector that is supplied with alternating current and can induce eddy current in a tested object by generating a magnetic field change in the tested object; a second exciter/detector disposed opposite side of the first exciter/detector sandwiching the tested object therebetween. The second exciter/detector can detect a change in a reactive magnetic field generated by the eddy current. The first and second exciter/detectors each may have a coil including a helical coil wire, and the coil wire of the first exciter/detector may be thicker than the coil wire of the second exciter/detector.Type: GrantFiled: January 25, 2021Date of Patent: March 7, 2023Assignee: Toshiba Energy Systems & Solutions CorporationInventors: Noriyasu Kobayashi, Jun Semboshi, Megumi Akimoto, Masaru Ukai
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Patent number: 11598809Abstract: Systems and methods for automatically verifying that power relays have been disconnected include relays arranged between two power sources. Test nodes are positioned between the relays on each line, and feed into a detection circuit. Voltage drop resistors, voltage drop diodes, an optocoupler, and additional resistors and capacitors are used to provide voltage isolation for the detection circuit. Relays are methodically opened and closed to check the individual functioning of each relay, and a digital signal generated from the detection circuit. The design of the system with detection circuit isolation provides a safer and lower cost system for verifying that relays are operating correctly, with less costly components than traditional systems.Type: GrantFiled: April 21, 2020Date of Patent: March 7, 2023Assignee: Sonnen, Inc.Inventors: Chetan Bhusanur, Andres Salazar-Llinas, Carlos Restrepo
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Method and apparatus for obtaining residual electric quantity, electronic device, and storage medium
Patent number: 11592487Abstract: A method for obtaining a residual electric quantity of a battery in an electronic device includes: obtaining a present electric quantity variation of a battery within a present detection period; obtaining a maximum discharge electric quantity of the battery corresponding to a number of charging and discharging within the present detection period; and obtaining a present residual electric quantity of the battery based on the maximum discharge electric quantity and the present electric quantity variation.Type: GrantFiled: April 16, 2021Date of Patent: February 28, 2023Assignee: BEIJING XIAOMI MOBILE SOFTWARE CO., LTD.Inventors: Zhenhuan Xu, Zongqiang Wang -
Patent number: 11592512Abstract: A method for calibrating a magnetometer. The magnetometer travels through (Si) a set of path positions, and acquires (S2) a plurality of measurements of the magnetic field. Trajectory information (S3) is provided representative of the location and the orientation of a point integral with the magnetometer. The measurements of the magnetic field are matched up (S4) with the trajectory information. A determination (S5) is made of calibration parameters of the magnetometer by the minimisation of a cost function involving, for a plurality of determination times, at least the calibration parameters, a measurement of the magnetic field, and a relationship linking the change in a magnetic field with the change in the location and in the orientation of the magnetometer derived from the trajectory information.Type: GrantFiled: July 26, 2018Date of Patent: February 28, 2023Assignee: SYSNAVInventors: David Vissiere, Charles-Ivan Chesneau, Mathieu Hillion, Hendrik Meier, David Caruso
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Patent number: 11579174Abstract: An energy detection warning device includes a housing. An electronic indication component is disposed within the housing. One or more sensors are disposed within the housing and are configured to detect an energized conductor present within a particular proximity of a location of the energy detection warning device, and detect a direction in which the energized conductor is located with respect to the location of the energy detection warning device. The direction is an approximate direction. The device also includes a microcontroller configured to: receive input from the one or more sensors, and actuate the electronic indication component, in response to receipt of the input, to indicate the direction in which the energized conductor is located with respect to the location of the energy detection warning device.Type: GrantFiled: May 17, 2021Date of Patent: February 14, 2023Assignee: Safeguard Equipment, Inc.Inventors: John Wayne Thompson, Timothy Ledford, Brandon Bledsoe
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Patent number: 11566882Abstract: A magnetic tag sensor includes a cylinder and threaded pipe embedded therein and simulates a magnetic dipole; two threaded pipe wiring interfaces being connected to first and second cables, running through a cylinder upper cross-section outer wall and extending out of the cylinder; the cylinder is sleeved on a guide rail and at a junction between a riverbed and water; an guide rail end inserts into the riverbed, a water sealing box is mounted on a top of the guide rail, a power supply module, a relay and a load arranged inside the water sealing box, the first cable connected to a positive pole of the power supply module, and the second cable connected to a negative pole through the relay and load connected in series; and the threaded pipe in the wall of the cylinder moves up and down with the riverbed to generate a magnetic field signal.Type: GrantFiled: July 23, 2019Date of Patent: January 31, 2023Assignee: SHANDONG UNIVERSITYInventors: Zeying Yang, Jianbo Qu, Shucai Li, Qingsong Zhang, Xinzhuang Cui, Zhi Ge, Hetao Hou, Li Tian, Ke Wu, Tianmin Wang, Yuhui Shan, Fengjin Zhao, Peng Zhang, Jie Liu, Minghao Sun, Weisong Qu, Cuiping Qu, Qianyi Yang, Zhenyu Zhao, Yuntong Guo, Haoze Yu, Yinglin Sun
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Patent number: 11567098Abstract: A sensor assembly comprising a holder body and a housed semiconductor sensor element situated on the holder body for rotational speed measurement and/or position measurement, a cured enveloping material that covers the housed semiconductor sensor element completely being situated on the holder body. It is provided that the housed semiconductor sensor element is glued onto a mounting surface of the holder body using an adhesive that differs from the enveloping material, and that the adhesive is situated in a receiving space between the mounting surface and a bottom side of the housed semiconductor sensor element that is facing the mounting surface.Type: GrantFiled: October 19, 2018Date of Patent: January 31, 2023Assignee: Robert Bosch GmbHInventors: Mathias Elzner, Thomas Ullmann
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Patent number: 11567143Abstract: An object of the present invention is to propose a partial discharge determination device and method that can highly reliably determine the degree of progress of partial discharge occurring in an underground power transmission cable without preparing plural standard patterns. A distribution pattern of a set of the charge amount and the occurrence phase angle of each partial discharge occurring in a period of one or more cycles of an applied voltage of a power transmission cable is sequentially generated, a first classification process in which the pattern is classified into any one of classes on the basis of a standard distribution pattern for each class and a second classification process in which the distribution pattern are executed, a classification result by the first classification process is evaluated on the basis of a classification result by the second classification process, and the degree of progress is determined.Type: GrantFiled: November 16, 2020Date of Patent: January 31, 2023Assignee: HITACHI, LTD.Inventors: Hiromichi Yamada, Mitsuyasu Kido
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Patent number: 11557450Abstract: A method for diagnosing the cause of tripping of an electrical protection device includes, after detection by the auxiliary device of a loss of electrical power, determining a type of electrical fault on the basis of recorded values, the determining operation including: comparing, with a first threshold value, the largest value of the maximum intensity of the current from the recorded values for a plurality of measurement intervals preceding the loss of power, a short circuit being diagnosed if the largest value of the maximum intensity is greater than a first threshold value; comparing, with a second threshold value, the largest RMS value of the current from the recorded values, an overload being diagnosed if the largest RMS value is greater than a second threshold value.Type: GrantFiled: July 17, 2019Date of Patent: January 17, 2023Assignee: Schneider Electric Industries SASInventors: Michel Hennequin, Wedian Youssef
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Patent number: 11555844Abstract: A method for determining an emission coefficient of a device under test (DUT) using a test circuit comprises coupling a parameter measurement circuit associated with the test circuit to an input pin associated with the DUT, wherein the input pin is coupled to a diode element within the DUT and performing voltage and current measurements associated with the input pin using the parameter measurement circuit. In some embodiments, the method further comprises determining a plurality of contact resistance values respectively based on the voltage and current measurements and an emission coefficient estimate using a contact resistance estimation circuit; and determining an emission coefficient associated with the DUT based on the determined plurality of contact resistance values using an emission coefficient determination circuit.Type: GrantFiled: June 29, 2018Date of Patent: January 17, 2023Assignee: Infineon Technologies AGInventors: Ralf Arnold, Lukas Niedergriese
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Patent number: 11536765Abstract: A probing apparatus includes a frame, a testing device, a rotatable testing platform, and a probe module. The testing device is disposed on the frame and is displaceable along an X direction and a Y direction perpendicular to the X direction. The rotatable testing platform is disposed on the frame and is rotatable around a rotating axis extending in the X direction. A direction perpendicular to the X direction and the Y direction is a Z direction, and the rotatable testing platform and the testing device are located at different positions of the Z direction. The probe module is disposed on the rotatable testing platform.Type: GrantFiled: June 3, 2020Date of Patent: December 27, 2022Assignee: MPI CORPORATIONInventors: Kang-Yen Fu, Ya-Hung Lo, Shou-Jen Tsai, Wei-Cheng Ku
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Patent number: 11499941Abstract: A flexible eddy current probe for non-destructive testing of a metallic object may include one or more plus-point coils and a flexible printed circuit having first and second parallel sides, third and fourth parallel sides, and a number of adjacent strips. The strips have first and second ends that are contiguous with the first and second parallel sides, respectively. Each of the strips may contain a pair of coils oriented along the length of the strip, a first coil being proximate to the first end and a second coil being proximate to the second end, and each of the coils is configured to excite an eddy current in the metal object or to sense an eddy current. Each of the strips may also be independently flexible from one another. The eddy current sensor array is configured to be scanned over the metal object.Type: GrantFiled: December 11, 2019Date of Patent: November 15, 2022Assignee: Zetec, Inc.Inventors: Steve Timm, Evan Lloyd, Tom O'Dell, Bill Ziegenhagen, Evans Nguyen
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Patent number: 11486899Abstract: A wafer test system includes a probe apparatus, a data server, an automation subsystem, and a probe mark assessment subsystem. The probe apparatus includes a probe card, a tester, and a camera. The probe card includes probe pins for contacting test pads in the wafer, and the camera captures an image of the test pads. The automation subsystem obtains an image specification from the probe apparatus and triggers an automated assessment of a probe mark in the image of the test pads. The probe mark assessment subsystem performs the automated assessment of the probe mark in the image of the test pads. The probe mark assessment subsystem performs an image-processing operation to obtain a probe mark assessment result, and the automation subsystem stops the probe apparatus if the probe mark assessment result indicates a probe test failure.Type: GrantFiled: January 31, 2020Date of Patent: November 1, 2022Assignee: NANYA TECHNOLOGY CORPORATIONInventors: Chia-Lin Tsai, Wun-Ye Ku, Tien-Yu Chen, Chia-Yi Lin
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Patent number: 11487038Abstract: The present invention, thanks to the horizontal positional tracking unit (20)—mounted to a hand-held metal detector (10)—consisting of optical flow sensor lens (22), an optical flow sensor camera (21), an optical flow sensor processor (23), a height sensor (24) and an IMU sensor (25); allows the calculation of the depth of the target (60) by tracking the horizontal position while the user freely sweeps the search head (11) of the metal detector (10) with the “optical flow” method and using the metal detection signals received from many point positions around the detected target center with this position; so it relates to a method of measuring a target depth and a metal detector using this method, which allow calculation to be made independently of the type and practical the size of the metal.Type: GrantFiled: June 21, 2018Date of Patent: November 1, 2022Assignee: NOKTA MUHENDISLIK A.S.Inventors: Basri Kutlu Yavas, Mehmet Onlek