Patents Examined by Nicole M Ippolito
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Patent number: 11774856Abstract: An extreme ultraviolet light (EUV) source apparatus includes a light source part for generating a plasma that emits EUV light; a first vacuum housing in which the light source part is located; a second vacuum housing arranged between the first vacuum housing and a utilizing apparatus in which the EUV light is utilized; and a debris trap located inside the second vacuum housing for deflecting debris particles emitted from the plasma, whereby the debris particles do not ingress into the utilizing apparatus. Between the first and second vacuum housings, there is provided a window through which the EUV light emitted from the light source part passes from the first vacuum housing to the second vacuum housing. A wall of the second vacuum housing has a through-hole and a window that is configured to allow the EUV light to pass from the second vacuum housing to the utilizing apparatus.Type: GrantFiled: May 11, 2021Date of Patent: October 3, 2023Inventors: Hajime Kikuiri, Hironobu Yabuta
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Patent number: 11769649Abstract: An object is to provide a multipole unit capable of achieving both high positional accuracy and ease of assembling and preventing a decrease in the transmission rate of the magnetic flux. A multipole unit 109a includes a pole 1 that is made of a soft magnetic metal material, a shaft 2 that is made of a soft magnetic metal material and is magnetically connected to the pole, and a coil 3 that is wound around the shaft 2. The pole 1 is provided with a first fitting portion JP1 that forms a first recessed portion or a first protruding portion. The shaft 2 is provided with a second fitting portion JP2 that forms a second protruding portion or a second recessed portion. The first fitting portion JP1 and the second fitting portion JP2 are fitted with each other such that the pole 1 and the shaft 2 are physically separated from each other.Type: GrantFiled: January 14, 2022Date of Patent: September 26, 2023Assignee: Hitachi High-Tech CorporationInventors: Masanori Mita, Yoshinobu Ootaka, Hideto Dohi, Zhaohui Cheng
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Patent number: 11769601Abstract: A light-weight radiation protection panel comprising radiation protection layer and a flexible material. The radiation protection layer comprises a plurality of a shielding material distributed in repeated and adjacent units of geometrical shapes, the light-weight radiation protection panel being able to be embodied in a wearable garment providing flexibility.Type: GrantFiled: March 4, 2022Date of Patent: September 26, 2023Assignee: STEMRAD LTD.Inventors: Oren Milstein, Gideon Waterman, Meytal Baron, Tamar Nix, Payal Jain
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Patent number: 11770890Abstract: A device for generating soft x-rays includes an electron source configured to generate an electron beam comprising electron micro-bunches; an electron accelerator configured to accelerate the electron micro-bunches from the electron source; and a laser configured to generate a laser beam (536) colliding with the accelerated electron micro-bunches (534) in a counterpropagating direction to generate the soft x-rays by inverse Compton scattering. The electron source has a magneto-optical trap configured to produce an ultracold atomic gas; two counterpropagating excitation laser beams configured to produce a standing wave for inducing a periodic spatial modulation of the ultracold atomic gas along a beam propagation direction; and an ionization laser configured to induce photo-ionization of the ultracold atomic gas.Type: GrantFiled: November 1, 2019Date of Patent: September 26, 2023Assignee: Technische Universiteit EindhovenInventors: Otger Jan Luiten, Jim Gerardus Hubertus Franssen
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Patent number: 11769602Abstract: A nuclear waste cask in one embodiment includes an axially elongated cask body defining a longitudinally-extending opening forming an entrance to an internal storage cavity of the cask configured for holding radioactive nuclear waste materials. A closure lid detachably coupled to the cask body at the top opening seals the cavity. A cask locking mechanism includes a plurality of first locking protrusions spaced apart on the lid which are selectively interlockable with a plurality of second locking protrusions spaced apart on the cask body to lock the lid to the cask body. The first locking protrusions may be disposed on slideable locking bars moveable between locked and unlocked positions while the lid remains stationary on the cask body. Hydraulic or pneumatic actuators may be used to change position of the locking bars. The cask and lid may include other features such as impact absorbers and lifting elements.Type: GrantFiled: June 3, 2022Date of Patent: September 26, 2023Inventor: Krishna P. Singh
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Patent number: 11759539Abstract: There is provided an apparatus, system and method to treat air and surfaces using light. The apparatus comprises a hollow body having an inlet and outlet for passage of air. Treatment lamps are body mounted for movement between an air treatment position to treat air inside the body and a surface treatment position to treat air/an external surface. When installed in a room environment, the apparatus, via a system controller, operates in an air treatment mode, a surface treatment mode or an off mode. Room sensors (e.g. interlock and presence) communicate with the controller and the controller permits or prevents operation in the surface treatment mode accordingly. If any interlock sensor senses an open position or the presence sensor senses a presence (e.g. motion), operation in the surface mode is prevented. A remote control communicates with the controller to select an operating mode.Type: GrantFiled: March 8, 2021Date of Patent: September 19, 2023Assignee: LIND EQUIPMENT LTD.Inventors: Brian Astl, Sean Van Doorselaer
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Patent number: 11764029Abstract: A method of measuring an aberration in an electron microscope includes: acquiring an image for measuring the aberration in the electron microscope; and measuring the aberration by using the image. In measuring the aberration, a direction of defocusing is specified based on a residual aberration that is uniquely determined by a configuration of an optical system of the electron microscope and an optical condition of the optical system.Type: GrantFiled: January 14, 2022Date of Patent: September 19, 2023Assignee: JEOL Ltd.Inventors: Shigeyuki Morishita, Ryusuke Sagawa, Fuminori Uematsu, Tomohiro Nakamichi, Keito Aibara
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Patent number: 11764042Abstract: A method and apparatus for dosage measurement and monitoring in an ion implantation system is disclosed. In one embodiment, a transferring system, includes: a vacuum chamber, wherein the vacuum chamber is coupled to a processing chamber; a shaft coupled to a ball screw, wherein the ball screw and the shaft are configured in the vacuum chamber; and a vacuum rotary feedthrough, wherein the vacuum rotary feedthrough comprises a magnetic fluid seal so as to provide a high vacuum sealing, and wherein the vacuum rotary feedthrough is configured through a first end of the vacuum chamber and coupled to the ball screw so as to provide a rotary motion on the ball screw.Type: GrantFiled: March 22, 2022Date of Patent: September 19, 2023Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.Inventors: Tsung-Min Lin, Fang-Chi Chien, Cheng-Yi Huang, Chao-Po Lu
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Patent number: 11759659Abstract: A beam delivery system for a radiotherapy system comprises a particle accelerator for generating a radiation beam and a positioning apparatus for moving the particle accelerator. The positioning apparatus comprises a counterbalanced lever carrying the particle accelerator. The particle accelerator may be a proton accelerator producing a proton beam.Type: GrantFiled: August 29, 2022Date of Patent: September 19, 2023Assignee: Muir IP LtdInventor: Kevin Paul
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Patent number: 11761926Abstract: In DM-SWATH a plurality of CoVs and a precursor ion mass range are received. A processor performs an iterative series of steps for each CoV of the plurality of CoVs. For each CoV of the plurality of CoVs, the CoV is applied to the DMS device to select a group of precursor ions. A mass filter is instructed to select precursor ions of the group that are within the precursor ion mass range, producing a subgroup of precursor ions. A fragmentation device is instructed to fragment the subgroup of precursor ions, producing a group of product ions. A mass analyzer is instructed to measure the intensity and m/z of the group of product ions, producing a product ion spectrum for each CoV of the plurality of CoVs. DM-SWATH is further used to validate if a known compound is in a sample.Type: GrantFiled: July 22, 2022Date of Patent: September 19, 2023Assignee: DH Technologies Development Pte. Ltd.Inventors: Yves Le Blanc, Brendon Seale
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Patent number: 11764028Abstract: A charged particle beam device is provided in which axis adjustment as a superimposing lens is facilitated by aligning an axis of an electrostatic lens resulting from a deceleration electric field with an axis of a magnetic field lens. The charged particle beam device includes: an electron source; an objective lens that focuses a probe electron beam from the electron source on a sample; a first beam tube and a second beam tube through each of which the probe electron beam passes; a deceleration electrode arranged between the first beam tube and a sample; a first voltage source that forms a deceleration electric field for the probe electron beam between the first beam tube and the deceleration electrode by applying a first potential to the first beam tube; and a first moving mechanism that moves a position of the first beam tube.Type: GrantFiled: May 22, 2018Date of Patent: September 19, 2023Assignee: Hitachi High-Tech CorporationInventors: Yuta Imai, Masahiro Sasajima, Yoshihiro Takahoko
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Patent number: 11761751Abstract: A method of evaluating a thickness of a film on a substrate includes detecting atomic force responses of the film to exposure of electromagnetic radiation in the infrared portion of the electromagnetic spectrum. The use of atomic force microscopy to evaluate thicknesses of thin films avoids underlayer noise commonly encountered when optical metrology techniques are utilized to evaluate film thicknesses. Such underlayer noise adversely impacts the accuracy of the thickness evaluation.Type: GrantFiled: June 22, 2022Date of Patent: September 19, 2023Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.Inventors: Chih Hung Chen, Kei-Wei Chen, Te-Ming Kung
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Patent number: 11764047Abstract: A universal nanochip for mass spectrometry analysis and preparing method and application of the same, relates to a technical field of mass spectrometry analysis. A main material of the nanochip is a silicon-based semiconductor material, array-type spotting wells are distributed at a surface of the main material, and an inner surface of the spotting well is of a nanostructure; the surface of the main material has a regional hydrophobic modification, and inside the array-type spotting well is a hydrophilic region and outside the spotting well is a hydrophobic region; or outside the array-type spotting well is a hydrophilic region and inside the spotting well is a hydrophobic region. The nanostructure can extract molecules on a surface of a biological tissue sample to be tested, and improves laser energy absorption and utilization, thereby improving ionization efficiency and enhancing mass spectrum signals. The universal nanochip can be widely applied to clinical inspection.Type: GrantFiled: May 24, 2021Date of Patent: September 19, 2023Assignee: Hangzhou Well-Healthcare Technologies Co., LTDInventors: Jianmin Wu, Xiaoming Chen, Xisheng Chen, Qiaoling Zhong, Chunyan Luan, Jiekai Yu
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Patent number: 11759536Abstract: A case for a mobile device is disclosed. The case includes a housing having a portion configured to receive a mobile device, and a tethered disinfecting module selectively removeable from the housing, the tethered disinfecting module having one or more UV light emitting devices configured to selectively emit disinfecting light upon surfaces of the case and the mobile device. Various embodiments include visible and blue light for disinfecting surfaces of a mobile device and the case.Type: GrantFiled: March 22, 2021Date of Patent: September 19, 2023Inventors: Peter Garth Levandowski, John Phillip Levandowski, II
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Patent number: 11764051Abstract: An ion trap (100) includes a first electrode pair (110) and a second electrode pair (130), each including a first conductive member (112) and a second conductive member (120) and facing each other so that the first conductive member (112) of the first electrode pair (110) is on a common plane with the second conductive member (120) of the second electrode pair (130) and so that the second conductive member (120) of the first electrode pair (110) is on a common plane with the first conductive member (112) of the second electrode pair (130), a gap (132) therebetween. A signal generator (210) generates a periodic signal (212) applied to the first conductive members (112). A phase shifter (216) generates a second periodic signal (218) that is 180 out of phase therewith applied to the second conductive members (120). Ions are trapped by a resulting electric field.Type: GrantFiled: April 1, 2020Date of Patent: September 19, 2023Assignee: Georgia Tech Research CorporationInventors: Wade Rellergert, Robert Clark, Harley Hayden, Brian Sawyer
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Patent number: 11761893Abstract: Systems and method for minimizing the impact of water vapor or other interferent analyte on analyte concentration measurements in a gas exchange measurement system. A system is includes a gas source, first and second gas analyzers coupled to first and second gas flow lines and configured to measure first and second concentrations of a target analyte in the first and second gas flow lines, respectively, a sample chamber configured to hold a water saturable sample, and a water vapor selective element and having a first and second inputs fluidly coupling the gas source to first and second sides, respectively, of the water vapor selective element, and at least one output fluidly coupling the first side of the water vapor selective element to the first and second gas flow lines and a second output coupling the second side of the water vapor selective element to the second gas flow line.Type: GrantFiled: November 30, 2020Date of Patent: September 19, 2023Assignee: LI-COR, Inc.Inventors: Jason Hupp, Mark Johnson, Bob Eckles, Douglas Lynch
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Patent number: 11761981Abstract: An apparatus and a method for identifying a sample position in an atomic force microscope according to an exemplary embodiment of the present disclosure are provided. The method for identifying a sample position in an atomic force microscope includes receiving a vision image including a subject sample through a vision unit; determining a subject sample region in the vision image using a prediction model which is configured to output the subject sample region by receiving the vision image as an input; and determining a position of the subject sample based on the subject sample region.Type: GrantFiled: December 24, 2021Date of Patent: September 19, 2023Assignee: PARK SYSTEMS CORP.Inventors: JeongHun An, YongSung Cho, Sang-il Park
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Patent number: 11756777Abstract: Humidification systems and methods to introduce water vapor to a laser-ablated sample prior to introduction to an ICP torch are described. A system embodiment includes, but is not limited to, a water vapor generator configured to control production of a water vapor stream and to transfer the water vapor stream to at least one of a sample chamber of a laser ablation device or a mixing chamber in fluid communication with the laser ablation device, wherein the mixing chamber is configured to receive a laser-ablated sample from the laser ablation device and direct the laser-ablated sample to an inductively coupled plasma torch.Type: GrantFiled: December 7, 2021Date of Patent: September 12, 2023Assignee: Elemental Scientific Inc.Inventors: Michael P. Field, Jude Sakowski, Jordan Krahn, Ciaran J. O'Connor
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Patent number: 11756779Abstract: An apparatus includes a tubular connector having a longitudinal axis. The connector includes a first end that connects to a first analytical system, a second end that connects to a second analytical system, and a flexible portion between the first end and the second end that curves in a direction transverse to the axis of the connector such that the connector contains ion guides to transfer ions between the first analytical system and the second analytical system.Type: GrantFiled: January 6, 2022Date of Patent: September 12, 2023Assignee: Trace Matters Scientific LLCInventor: Mazdak Taghioskoui
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Patent number: 11756780Abstract: A first multipole assembly includes a first plurality of rod electrodes arranged about an axis and configured to confine ions radially about the axis. A second multipole assembly disposed adjacent to the first multipole assembly includes a second plurality of rod electrodes arranged about the axis and configured to confine the ions radially about the axis. An orientation of the first multipole assembly about the axis is rotationally offset relative to an orientation of the second multipole assembly about the axis.Type: GrantFiled: December 2, 2021Date of Patent: September 12, 2023Assignee: Thermo Finnigan LLCInventors: Harald Oser, Raman Mathur