Patents Examined by Nicole M Ippolito
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Patent number: 11835545Abstract: An exemplary apparatus can provide radiation to a sample(s), which can include, for example, a radiation source arrangement configured to provide radiation, a beam splitter configured to split the radiation into (i) a first radiation, and (ii) a second radiation. An optical element can also be provided which, in operation, can, e.g., (a) receive the first radiation and the second radiation, (b) reflect the first radiation as a reference radiation, (c) provide the second radiation as illumination for the sample(s), (d) receive a resultant radiation from the sample(s) that can be based on the illumination from the second radiation, and (e) provide the reference radiation and the resultant radiation to be detected and used for interferometric imaging or spectroscopy.Type: GrantFiled: January 14, 2021Date of Patent: December 5, 2023Assignee: The Trustees of Columbia University in the City of New YorkInventors: Alexander Swinton McLeod, Lin Xiong, Shuai Zhang, Dimitri N. Basov
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Patent number: 11837452Abstract: Disclosed herein are various methods and apparatus for performing charge detection mass spectrometry (CDMS). In particular, techniques are disclosed for monitoring a detector signal from a CDMS device to determine how many ions are present in the ion trap (10) of the CDMS device. For example, if no ions are present the measurement can then be terminated early. Similarly, if more than one ion is present, the measurement can be terminated early, or ions can be removed from the trap (10) until only a single ion remains. Techniques are also provided for increasing the probability of there being a single ion in the trap (10). A technique for attenuating an ion beam is also provided.Type: GrantFiled: May 16, 2022Date of Patent: December 5, 2023Assignee: Micromass UK LimitedInventors: Keith Richardson, Jeffery Mark Brown, David J. Langridge
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Patent number: 11830636Abstract: The invention relates to the field of nuclear technology. A container for storing, transporting and disposal of solid radioactive waste comprises a cask made of reaction-sintered silicon carbide comprising free silicon in an amount of 3-30 wt. % with a layer of gas-phase silicon carbide deposited on the surface thereof. The outer layer of the cask is made of a metal foam with an open porosity of 60-70% and a pore size of 5-6 mm; the pores are filled with boron carbide powder having a dispersity of 40-50 ?m, which protects the environment from nuclear radiation emitted by HLW. A canister made of stainless steel with a thickness of 1-1.5 mm and intended for receiving radioactive waste is placed inside the silicon carbide cask. A 5 mm gap between the inner surface of the silicon carbide cask and the stainless-steel canister is filled with boron carbide powder which protects the environment from nuclear radiation emitted by HLW.Type: GrantFiled: September 8, 2020Date of Patent: November 28, 2023Assignee: Ceramic Technologies Ltd.Inventors: Gennady Ivanovich Babayants, Konstantin Gennadievich Babayants, Oleg Vitalievich Sharykin
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Patent number: 11828772Abstract: A sample for atomic force microscopy-based infrared spectroscopy includes a substrate, a measurement portion provided on the substrate and having a first light absorption intensity when a light of a first wavelength is irradiated thereon, and a first film provided on the measurement portion and having a higher coefficient of thermal expansion than the measurement portion and a second light absorption intensity, which is less than the first light absorption intensity, when the light of the first wavelength is irradiated thereon.Type: GrantFiled: August 5, 2022Date of Patent: November 28, 2023Assignee: Kioxia CorporationInventors: Machiko Ito, Yuji Yamada, Takehiro Nakai
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Patent number: 11827973Abstract: The current disclosure is directed to methods and assemblies configured to deliver a mixture of germanium tetrafluoride (GeF4) and hydrogen (H2) gases to an ion implantation apparatus, so H2 is present in an amount in the range of 25%-67% (volume) of the gas mixture, or the GeF4 and H2 are present in a volume ratio (GeF4:H2) in the range of 3:1 to 33:67. The use of the H2 gas in an amount in mixture or relative to the GeF4 gas prevents the volatilization of cathode material, thereby improving performance and lifetime of the ion implantation apparatus. Gas mixtures according to the disclosure also result in a significant Ge+ current gain and W+ peak reduction during au ion implantation procedure.Type: GrantFiled: March 7, 2022Date of Patent: November 28, 2023Assignee: ENTEGRIS, INC.Inventors: Oleg Byl, Ying Tang, Joseph R. Despres, Joseph D. Sweeney, Sharad N. Yedave
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Patent number: 11830700Abstract: The current disclosure is directed to a repellent electrode used in a source arc chamber of an ion implanter. The repellent electrode includes a shaft and a repellent body having a repellent surface. The repellent surface has a surface shape that substantially fits the shape of the inner chamber space of the source arc chamber where the repellent body is positioned. A gap between the edge of the repellent body and the inner sidewall of the source arc chamber is minimized to a threshold level that is maintained to avoid a short between the conductive repellent body and the conductive inner sidewall of the source arc chamber.Type: GrantFiled: March 11, 2022Date of Patent: November 28, 2023Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.Inventors: Ching-Heng Yen, Jen-Chung Chiu, Tai-Kun Kao, Lu-Hsun Lin, Tsung-Min Lin
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Patent number: 11821788Abstract: A method of monitoring light output from at least one solid-state light source involves sensing any light produced by the at least one solid-state light source and reflected, by at least one surface spaced apart from the at least one solid-state light source, to at least one reference location spaced apart from the at least one surface. Apparatuses and uses of the apparatuses are also disclosed.Type: GrantFiled: September 12, 2022Date of Patent: November 21, 2023Assignee: Acuva Technologies Inc.Inventors: Ashkan Babaie, Ali Shagerdmootaab
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Patent number: 11822258Abstract: A foil trap that captures debris released from a plasma includes a hub structure, a plurality of foils, and a shield member. The hub structure has a circumferential surface portion and a front surface portion facing the plasma. The foils are arranged radially around the hub structure and are supported by brazing on the circumferential surface portion. The shield member is disposed on the front surface portion, has a circumferential edge portion that shields the circumferential surface portion from the plasma, and forms a thermal resistance section between the shield member and the hub structure.Type: GrantFiled: March 4, 2022Date of Patent: November 21, 2023Assignee: Ushio Denki Kabushiki KaishaInventor: Hironobu Yabuta
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Patent number: 11823885Abstract: A method for analyzing a sample collected from a surface, the method comprising placing at least a portion of a substrate having a pressure sensitive adhesive layer containing the sample in a holder, adding a spray solvent to the sample-containing pressure sensitive adhesive layer, and analyzing the sample contained in the pressure sensitive adhesive layer and the spray solvent using paper spray mass spectrometry.Type: GrantFiled: December 18, 2020Date of Patent: November 21, 2023Assignees: The Trustees of Indiana University, The U.S. Government as Represented by the U.S. Army Combat Capabilities Development CommandInventors: Nicholas Edward Manicke, William Raymond Anthony Wichert, Ethan M. McBride, Trevor G. Glaros, Phillip M. Mach
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Patent number: 11815527Abstract: Disclosed is a multipurpose scanning microscopy probe comprising a probe holder, a cantilever connected to the probe holder, and a probe tip connected to the cantilever, wherein the probe tip is a three-dimensional geometry, and wherein the probe tip is a 3D printed part. In some embodiments the probe is made from SU8 epoxy-based resin. In some embodiments the probe is made from a combination of SU8 and nanomaterial such as carbon nanotubes. In some embodiments the probe includes cavities and voids. In some embodies the probe includes fluidic features and elements. Scanning microscopy probe methods are also disclosed.Type: GrantFiled: November 5, 2021Date of Patent: November 14, 2023Assignee: NEW YORK UNIVERSITYInventors: Mohammad A. Qasaimeh, Ayoub Glia
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Patent number: 11814720Abstract: A method for fabricating structures includes on a substrate includes providing the substrate having a substrate surface, and generating nanostructures or microstructures on the substrate surface at least in part by exposing the substrate surface to thermal particles from a thermal particle source while irradiating the substrate surface with an ion beam. The generated nanostructures or microstructures have a smaller surface area than the area of incidence of the ion beam or a beam generated by the thermal particle source. The method also includes obtaining a measurement of a characteristic of the substrate surface and adjusting at least one of the thermal particle source and the ion beam based on the measurement.Type: GrantFiled: October 20, 2020Date of Patent: November 14, 2023Assignee: Purdue Research FoundationInventors: Jean Paul Allain, Osman J. El-Atwani, Juan Jose Pavon Palacio
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Patent number: 11817302Abstract: Methods and systems for delivering a liquid sample to an ion source for the generation of ions and subsequent analysis by mass spectrometry are provided herein. In accordance with various aspects of the present teachings, MS-based systems and methods are provided in which the flow of desorption solvent within a sampling probe fluidly coupled to an ion source can be selectively controlled such that one or more analyte species can be desorbed from a sample substrate inserted within the sampling probe within a decreased volume of desorption solvent for subsequently delivery to the ion source. In various aspects, sensitivity can be increased due to higher desorption efficiency (e.g., due to increased desorption time) and/or decreased dilution of the desorbed analytes.Type: GrantFiled: October 17, 2022Date of Patent: November 14, 2023Assignee: DH Technologies Development Pte. Ltd.Inventors: Don W. Arnold, Thomas R. Covey, Chang Liu
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Patent number: 11817301Abstract: A signal processing unit comprises: at least one data signal input line adapted to receive a measured data signal generated by an image current, the measured data signal comprising an added crosstalk signal induced by a source of electromagnetic disturbance; at least one disturbance signal input line adapted to receive a decoupled disturbance signal, extracted from the source of electromagnetic disturbance; an output line adapted to supply a compensated data signal; a conditioning module, to which the decoupled disturbance signal is supplied via the disturbance signal input line and which provides a compensation signal; and an adding module, to which the measured data signal and the compensation signal are provided and in which the measured data signal and the compensation signal are superposed, whereby the decoupled disturbance signal is conditioned by the conditioning module such that the compensation signal essentially corresponds to an inverted added crosstalk signal.Type: GrantFiled: June 10, 2022Date of Patent: November 14, 2023Assignee: Thermo Fisher Scientific (Bremen) GmbHInventors: Alexander Kholomeev, Gregor Quiring, Frank Czemper
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Patent number: 11817289Abstract: As a device for correcting positive spherical aberration of an electromagnetic lens for a charged particle beam, a spherical aberration correction device combining a hole electrode and a ring electrode is known. In this spherical aberration correction device, when a voltage is applied between the hole electrode and the ring electrode, the focus of the charged particle beam device changes due to the convex lens effect generated in the hole electrode. Therefore, in a charged particle beam device including a charged particle beam source which generates a charged particle beam, a charged particle beam aperture having a ring shape, and a charged particle beam aperture power supply which applies a voltage to the charged particle beam aperture, the charged particle beam aperture power supply is configured to apply, to the charged particle beam aperture, a voltage having a polarity opposite to a polarity of charges of the charged particle beam.Type: GrantFiled: April 20, 2022Date of Patent: November 14, 2023Assignees: Hitachi High-Tech Corporation, Japan Fine Ceramics CenterInventors: Tsunenori Nomaguchi, Shunichi Motomura, Tadahiro Kawasaki, Takeharu Kato, Ryuji Yoshida
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Patent number: 11806438Abstract: Described herein is a decontamination device for use in vehicle applications. The decontamination device includes a device body and an ultraviolet (UV) light. The UV light includes a UV light source, coupled to the device body and configured to move relative to the device body. A plurality of openings is disposed around the UV light source.Type: GrantFiled: August 11, 2020Date of Patent: November 7, 2023Assignee: The Boeing CompanyInventor: Jamie J. Childress
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Patent number: 11810773Abstract: A mass spectrometry method comprises: introducing a first packet of ions into an electrostatic trap mass analyzer through a set of electrostatic lenses, wherein, during the introducing of the first packet, either the lenses are operated in a first mode of operation or an injection voltage of a first pre-determined magnitude is applied to an electrode of the mass analyzer; mass analyzing the first ion packet using the mass analyzer; introducing a second packet of ions into the mass analyzer through the set of lenses, wherein, during the introducing of the second packet, either the lenses are operated in a second mode of operation or an injection voltage of a second pre-determined magnitude is applied to the electrode of the mass analyzer; and mass analyzing the second packet of ions using the electrostatic trap mass analyzer.Type: GrantFiled: January 24, 2023Date of Patent: November 7, 2023Assignee: Thermo Finnigan LLCInventors: Jesse D. Canterbury, Michael W. Senko
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Patent number: 11810685Abstract: An infusion system (10) including a radioisotope generator (52) that generates a radioactive eluate via an elution, an activity detector (58) configured to measure an activity of a first radioisotope in the radioactive eluate generated by the radioisotope generator, and a controller (80). The controller can track a cumulative volume of radioactive eluate generated by the radioisotope generator and also track the activity of the first radioisotope in the radioactive eluate generated by the radioisotope generator. The controller can determine a predicted volume of the radioactive eluate generated by the radioisotope generator at which the activity of the first radioisotope in the radioactive eluate will reach a threshold based on the tracked cumulative volume of the radioactive eluate and the tracked activity of the first radioisotope. This information can be useful for proactively removing the radioisotope generator from service and/or replacing the radioisotope generator with a fresh generator.Type: GrantFiled: March 28, 2019Date of Patent: November 7, 2023Assignee: Bracco Diagnostics Inc.Inventor: Adrian Nunn
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Patent number: 11809083Abstract: Impurities in a liquefied solid fuel utilized in a droplet generator of an extreme ultraviolet photolithography system are removed from vessels containing the liquefied solid fuel. Removal of the impurities increases the stability and predictability of droplet formation which positively impacts wafer yield and droplet generator lifetime.Type: GrantFiled: October 5, 2021Date of Patent: November 7, 2023Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.Inventors: Cheng-Hao Lai, Ming-Hsun Tsai, Hsin-Feng Chen, Wei-Shin Cheng, Yu-Kuang Sun, Cheng-Hsuan Wu, Yu-Fa Lo, Shih-Yu Tu, Jou-Hsuan Lu, Shang-Chieh Chien, Li-Jui Chen, Heng-Hsin Liu
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Patent number: 11810682Abstract: The object of the invention relates to a neutron absorbing concrete wall (10), which concrete wall (10) has an internal delimiting surface (11a), and an external delimiting surface (11b) on an opposite side to the internal delimiting surface (11a), the essence of which is that it contains a first concrete layer (13a) on the side of the internal delimiting surface (11a), and a second concrete layer (13b) on the side of the external delimiting surface (11b), which first concrete layer (13a) contains at least 0.05 mass % boron-10 isotope (10B), and the second concrete layer (13b) is formed as heavyweight concrete. The object of the invention also relates to a method for creating a neutron radiation absorbing concrete wall (10) that has an internal delimiting surface (11a), and an external delimiting surface (11b) on an opposite side to the internal delimiting surface (11a), the essence of which is a first concrete layer (13a) containing at least 0.Type: GrantFiled: May 8, 2019Date of Patent: November 7, 2023Assignee: MIRROTRON KFTInventors: Ferenc Mezei, Luca Zanini
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Patent number: 11810772Abstract: In one aspect, a method of processing ions in a mass spectrometer is disclosed, which comprises trapping a plurality of ions having different mass-to-charge (m/z) ratios in a collision cell, releasing said ions from the collision cell in a descending order in m/z ratio, and receiving the ions in a mass analyzer having a plurality of rods to at least one of which an RF voltage is applied, where the RF voltage is varied from a first value to a lower second value as the released ions are received by the mass analyzer.Type: GrantFiled: April 28, 2022Date of Patent: November 7, 2023Assignee: DH Technologies Development Pte. Ltd.Inventor: Mircea Guna