Abstract: The present invention provides a radio frequency (RF) power supply in a mass spectrometer. The power supply provides an RF signal to electrodes of a storage device to create a trapping field. The RF field is usually collapsed prior to ion ejection. In an illustrative embodiment the RF power supply includes a RF signal supply; a coil arranged to receive the signal provided by the RF signal supply and to provide an output RF signal for supply to electrodes of an ion storage device; and a shunt including a switch operative to switch between a first open position and a second closed position in which the shunt shorts the coil output.

Abstract: A method is provided for processing ions in a multipole ion trap, comprising generating RF radial confinement fields within a first and second multipole rod set positioned in tandem, a ratio of q value exhibited by the second rod set relative to the first rod set being greater than one for any m/z, said RF axial confinement fields within the first and second rod sets interacting in an interaction region between the first and second rod sets so as to produce a fringing field; transmitting ions through said first rod set towards said second rod set; and increasing the radial oscillation amplitude of at least a portion of the ions within said first rod set such that at least a portion of said ions having an increased radial oscillation amplitude are repulsed by said fringing field.

Abstract: A multi charged particle beam writing apparatus includes an aperture member to form multiple beams, a blanking plate in which there are arranged a plurality of blankers to respectively perform blanking deflection for a corresponding beam in the multiple beams having passed through a plurality of openings of the aperture member, a blanking aperture member to block each beam having been deflected to be in OFF state by at least one of the plurality of blankers, a first grating lens, using the aperture member as gratings, to correct spherical aberration of the charged particle beam, and a correction lens configured to correct high order spherical aberration produced by the first grating lens.

Abstract: In some embodiments, a time of flight mass spectrometer can comprise an input orifice for receiving ions, a first ion accelerator stage for accelerating the ions along a first path, at least one ion reflector for receiving said accelerated ions and redirecting said ions along a second path different than the first path, a detector for detecting at least a portion of the ions redirected by said at least one ion reflector, and at least first and second field free drift regions disposed between said first acceleration stage and said detector, wherein said second field free region is disposed in proximity of the detector. In some embodiments, the lengths of the field free drift regions can be selected so as to provide 1st and 2nd order corrections of the time of flight of the ions with respect to variation in their initial positions.

Abstract: A mobile digital fluoroscopy system comprises either a G-arm (18) stand (1) having two X-ray beam transmitter (21,23)/receiver (22,24) pairs arranged at right angles to each other or a C-arm having a single transmitter/receiver pair. Protective collimator shutter plates (1060) at each transmitter limit the X-ray irradiation area. These collimator plates are properly adjusted via servo motors prior to or during the operation, by fingertip movements, touching collimator representations on a touchscreen for each transmitter/receiver pair, to provide both protection to the surgeon and patient and sufficient fluoroscopic view to the surgeon of the operation site of interest in the body.

Abstract: An exterior container has a primary base, side walls and an open top. A primary floor is located in the exterior chamber and forms an operational chamber. An interior container has a secondary floor, side walls and top. The interior container is removably received within the exterior container. A retainer is positioned within the interior chamber for receiving a catheter. A source of light is provided within the exterior chamber to irradiate the catheter.

Abstract: An example particle accelerator includes a coil to provide a magnetic field to a cavity; a cryostat comprising a chamber for holding the coil, where the coil is arranged in the chamber to define an interior region of the coil and an exterior region of the coil; magnetic structures adjacent to the cryostat, where the magnetic structures have one or more slots at least part-way therethrough; and one or more magnetic shims in one or more corresponding slots. The one or more magnetic shims are movable to adjust a position of the coil by changing a magnetic field produced by the magnetic structures.

Abstract: The invention relates to a method for performing charged particle beam proximity effect correction, comprising the steps of: receiving a digital layout pattern to be patterned onto a target using one or more charged particle beams; selecting a base proximity function comprising a sum of an alpha and a beta proximity function, wherein said alpha proximity function models a short range proximity effect and said beta proximity function models a long range proximity effect, wherein a constant ? is defined as a ratio between the beta proximity function and the alpha proximity function in said sum, with 0<?<1; determining a modified proximity function which corresponds to said base proximity effect function wherein the alpha proximity function has been replaced by a Dirac delta function, and using an electronic processor, performing a deconvolution of the digital layout pattern with the modified proximity function to produce a corrected layout pattern.

Abstract: A mass spectrometer is provided comprising a first ion trap arranged upstream of an analytical second ion trap. The charge capacity of the first ion trap is set at a value such that if all the ions stored within the first ion trap up to the charge capacity limit of the first ion trap are then transferred to the second ion trap, then the analytical performance of the second ion trap is not substantially degraded due to space charge effects.

Abstract: The invention relates to methods for the mass spectrometric analysis of microbes, in particular to a transfer method of microbes that are required to be identified from agar plates onto mass spectrometric sample supports and their preparation for ionization by matrix-assisted laser desorption (MALDI). Microbes from microcolonies which have grown on the agar plates after a culture time of only six to eight hours are transferred with a high transfer yield onto contact surfaces of suitable size by direct contact and cell disrupted on the contact surface; the released proteins are prepared with matrix material on the contact surface as MALDI samples. The ionization by matrix-assisted laser desorption also takes place on the contact surface.

Abstract: Methods of characterizing an analyte of interest are provided. The methods can involve using a population of nanoparticles (e.g., magnetic ferrite nanoparticles) as a matrix for matrix-assisted laser desorption ionization (MALDI) mass spectrometry. The size, shape, and composition of the nanoparticles can be selected in view of a variety of factors, including the nature of the analyte of interest, the desired characteristics of the mass spectrum, the nature of the energy directed onto the target composition, and combinations thereof. The nanoparticle matrix can enhance MALDI analysis by providing a cleaner mass spectral background and/or inducing abundant fragmentation of analyte ions by in-source decay (ISD). The nanoparticles are also versatile and selective; the nanoparticle matrix can be tuned to render the matrix particles compatible with an analyte of interest and/or improve selectivity for an analyte of interest.

Abstract: The invention relates generally to sample ionization, and provides ionization probe assemblies, systems, computer program products, and methods useful for this purpose.

Abstract: A glass radiation-source with customized geometries to maximize receipt of radiation into treatment areas that is formed from either neutron-activated glass, radioisotopes molecularly bonded to glass, or radioisotopes encased within glass.

Abstract: Embodiments of the present disclosure are directed to an electron beam imaging/inspection apparatus having an electron source device to direct flood electrons on a sample immediately before image acquisition or inspection. The apparatus comprises a first device configured to charge a sample in a first mode, wherein the first device includes an electron source configured to provide a flood beam of charged particles to a first area of the sample. The apparatus also comprises a second device configured to generate a primary beam of electrons and characterize an interaction between the primary beam and a second area of the sample within the first area in a second mode. The apparatus is configured to switch from the first mode to the second mode less than 1 second.

Abstract: A control circuit accesses machine limitations information and target motion boundary information. The control circuit then combines the machine limitations information with the target motion boundary information when acting with respect to a radiation treatment plan. By one approach the control circuit acts with respect to a radiation treatment plan by presenting machine limitation information in combination with target motion boundary information. As another approach, the control circuit acts by combining the foregoing information while developing the radiation treatment plan to use that information to make automatic adjustments to the radiation treatment plan to correct instances where a planned configuration reveals a conflict between the physical limitations of the treatment platform and the target motion boundary.

Abstract: An optical instrument, including a chamber, an object exposed to an interior of the chamber, a source of low-pressure gas, the gas comprising at least one of low-pressure molecular hydrogen gas, low-pressure molecular oxygen and a low-pressure noble gas, the source of low pressure gas being fluidly coupled to the chamber, a low voltage source electrically coupled between the object and a remaining portion of the instrument that is exposed to the interior of the chamber so as to maintain the object at a low voltage relative to the remaining portion, and an EUV/VUV light source adapted to direct EUV/VUV light through the low pressure gas in the chamber onto the object. In such a system, when the EUV/VUV light source is activated ions of the low-pressure gas are formed and directed to the object. The ions may be ions of Hydrogen, Oxygen or a noble gas.

Abstract: A multi charged particle beam writing apparatus includes a unit to calculate a predetermined function expression by a correction coefficient that corrects an open area of each opening for forming a beam group, wherein the predetermined function expression minimizes a sum of squared values of all the beam groups, where each of the squared values is calculated by squaring a difference between a current value measured of the beam group and a sum of products for the beam group, where each of the products is obtained by multiplying a corrected open area by the predetermined function expression; a unit to calculate the correction coefficient that corrects the open area by using the predetermined function expression and the current value of the beam, for each beam; and a unit to calculate a current density of each of the multiple beams by the predetermined function expression.

Abstract: Methods and devices are provided for calibrating the mobility axis of an ion mobility spectrum and determining the mobility characteristic of ion species from an ion mobility spectrum, in particular for calibrating the drift time axis of an ion mobility spectrum acquired by a drift type ion mobility spectrometer (IMS). An ion mobility spectrometer uses an ion source that comprises a first ionization region which is fluidly coupled to a sample source, a second ionization region which is spatially separated from the first ionization region and fluidly coupled to a calibrant reservoir, and electrical means for controlling the transfer of sample ions from the first region into the second ionization region or into a third region of the ion source wherein the third region is fluidly coupled to the first and second ionization region and located closer to a mobility analyzer than the first and second ionization region.

Abstract: A charged particle beam treatment apparatus includes: an accelerator configured to emit a charged particle beam by accelerating charged particles; an irradiation portion configured to irradiate an irradiation object with the charged particle beam through a scanning method; a transport line configured to transport the charged particle beam emitted from the accelerator to the irradiation portion; an energy adjusting portion configured to adjust energy of the charged particle beam; an electromagnet which is provided in the irradiation portion or the transport line; an electromagnet power source which is connected to the electromagnet; and a control portion. Semiconductors are connected between the electromagnet power source and the electromagnet in series. When switching a layer of the irradiation object to be irradiated with the charged particle beam, the control portion reduces the energy of the charged particle beam by controlling the energy adjusting portion and increases a resistance of the semiconductors.

Abstract: A charged particle emission and air-blowing device includes a communication port biased toward an end portion in a predetermined direction with respect to an air outlet, and a width expander configured to widen a flow path between an air directing plate of the end portion and a second blowing duct wider than a periphery. Emitted light from a light guide plate is reflected by the air directing plate in the delivery direction of an air flow. An air flow passes from a downward direction to an upward direction along a circuit board in an auxiliary suction path, and an opening portion faces the upper portion of the circuit board.