Patents Examined by Patrick J Assouad
  • Patent number: 7089152
    Abstract: A system for assisting shoe selection can select and present a shoe type that fits a customer by estimating the anatomical characteristics of a foot from the state of the foot. The system includes the following: a measured data input portion for measuring and inputting data that show the state of a foot of a person to be measured; a normalization processing portion for normalizing the data input from the measured data input portion and storing the normalized data at least temporarily; a shoe catalog database for storing information of a plurality of types of shoes; and a selection portion for estimating the anatomical characteristics of the foot of the person based on the normalized data, referring to the shoe catalog database based on the anatomical characteristics, and selecting and presenting a shoe type that fits the person.
    Type: Grant
    Filed: June 18, 2004
    Date of Patent: August 8, 2006
    Assignee: Mizuno Corporation
    Inventors: Takao Oda, Natsuki Sato, Isao Nakano, Yasunori Kaneko, Tomohiro Ota
  • Patent number: 7085663
    Abstract: An analog-to-digital converter (ADC) exhibiting an uncorrected non-linear transfer function receives measured analog voltage amplitudes and outputs uncorrected digital values. A calibration circuit receives each uncorrected digital value and outputs a corrected digital value. The measured analog voltage amplitudes received by the ADC and the corresponding corrected digital values output by the calibration circuit define points approximating an ideal linear transfer function of the ADC. The calibration circuit performs piecewise-linear approximation of the uncorrected transfer function and associates each uncorrected digital value with the applicable linear segment that passes through a segment endpoint on the uncorrected transfer function. The calibration circuit calculates each corrected digital value using calibration coefficients associated with the applicable linear segment, such as the slope of the linear segment.
    Type: Grant
    Filed: November 4, 2005
    Date of Patent: August 1, 2006
    Assignee: ZiLOG, Inc.
    Inventor: Anatoliy V. Tsyrganovich
  • Patent number: 7085684
    Abstract: A system for managing and diagnosing a state of a facility apparatus. If information falling under a level of abnormality is extracted from gathered information on an operating state of the facility apparatus, an advanced analysis and diagnosis section on a facility diagnosis center side performs an advanced analysis and diagnosis process and promptly notifies a user side of the information on the best way of dealing with the facility apparatus determined to be abnormal, and further uploads a facility management data analysis program from the advanced analysis and diagnosis section to a facility monitoring section on the user side so that raw information of a large information amount can be analyzed on the user side without sending it to the facility diagnosis center side.
    Type: Grant
    Filed: July 4, 2001
    Date of Patent: August 1, 2006
    Assignees: Asahi Kasei Engineering Corporation
    Inventors: Osamu Yoshie, Nobuyoshi Sato, Tatsuya Fukunaga
  • Patent number: 7082373
    Abstract: Dynamic power controller apparatus, systems and methods are provided which utilize system and user data to control power to components. The present invention employs dynamically controlled idle timeout values which are based, in part, on the historical use of the component. It can also employ user settings, event occurrences and available resources of a system to dynamically control the power to one of the system's components or a remote component. In an instance of the present invention related to hard disk power control, it is employed in an operating system's kernel where disk idleness is monitored. When the hard disk's idle time meets a dynamically computed power control idle timeout, the disk driver is commanded to power down the device.
    Type: Grant
    Filed: August 23, 2004
    Date of Patent: July 25, 2006
    Assignee: Microsoft Corporation
    Inventor: Matthew H. Holle
  • Patent number: 7079971
    Abstract: A fail analysis device enabling a simplified operation and a reduced operation time. A reduced data acquiring section (40) reads a reduced logical data, obtained by reducing detailed logical data as a test result, from a CFM (120) in a semiconductor test device (100) and acquires it. A main viewer generating section (80) generates a main viewer window including a list of a test result for each DUT based on the reduced logical data for displaying on a display device (94). The list includes a result image indicating a pass/fail for each DUT and the reduced image of a fail bit map.
    Type: Grant
    Filed: November 16, 2001
    Date of Patent: July 18, 2006
    Assignee: Advantest Corporation
    Inventor: Hiroaki Fukuda
  • Patent number: 7079982
    Abstract: A working machine failure diagnosis method for performing a failure diagnosis by transmitting and receiving signals through communication devices provided at a working machine and at an information management center, according to the present invention, includes: a first step in which a first signal related to a failure of the working machine is generated at the working machine and the first signal is transmitted to the information management center from the working machine via the communication devices; a second step in which, after the first signal is transmitted, the information management center generates a second signal for identifying a location of the failure based upon the first signal and the second signal is then transmitted from the information management center to the working machine via the communication devices; and a third step in which failure information corresponding to the first signal and the second signal is provided to an operator.
    Type: Grant
    Filed: April 26, 2002
    Date of Patent: July 18, 2006
    Assignee: Hitachi Construction Machinery Co., Ltd.
    Inventors: Hiroshi Ogura, Hiroshi Watanabe, Genroku Sugiyama, Hideo Karasawa, Yoshiyuki Umeno, Osamu Tomikawa, Shuichi Miura, Kiyoshi Ono, Yasushi Ochiai
  • Patent number: 7072798
    Abstract: A resonant frequency sensor is disposed in a plasma-processing chamber included in a semiconductor fabricating apparatus. A change in the resonant frequency caused by etching, sputtering or deposition is sensed in order to detect the timing of performing the maintenance of the processing chamber. If data representing the relationship between an amount of etching or deposition occurring at a predetermined position in the processing chamber and occurrence of an abnormality is produced in advance, an optimal maintenance timing can be determined.
    Type: Grant
    Filed: February 6, 2004
    Date of Patent: July 4, 2006
    Assignee: Tokyo Electron Limited
    Inventor: Mitsuhiro Yuasa
  • Patent number: 7072804
    Abstract: A real time DSO is equipped with a Digital Trigger Filter that performs high frequency rejection, low frequency rejection, AC and DC triggering. The Digital Trigger Filter includes first and second digitally implemented IIR (Infinite Input Response) Filters. A digitized Conditioned Input Signal is applied to the first IIR Filter. It has taps that provide the Trigger Signal outputs needed for high and low frequency rejection. The high frequency rejection output of the first ER Filter is essentially a low pass output (3 dB down at 50 KHz) and is also used as the digital input to the second IIR Filter, whose output is a much more aggressive suppression of high frequencies (3 dB down at 50 Hz). The AC Trigger Signal output is produced by subtracting the output of the second IIR filter from the original input to the entire Digital Trigger Filter, and the DC Trigger Signal output is simply the same as that original input. A MUX selects which Trigger Signal is applied to a Digital Trigger Comparator.
    Type: Grant
    Filed: September 28, 2004
    Date of Patent: July 4, 2006
    Assignee: Agilent Technologies, Inc.
    Inventor: Dennis J. Weller
  • Patent number: 7072796
    Abstract: A modification risk degree measurement system includes a central processing unit (CPU), a program storage unit, a data storage unit, an input unit performing a control instruction and data input and an output unit performing data output. The extracting module, influence range specifying module, influence degree determining module, risk degree calculating module and re-factoring module are incorporated in the CPU. The extracting module performs extraction processing, the influence range specifying module specifies the influence range, the influence degree determining module determines the influence degree, the risk degree calculating module calculates the risk degree from the influence range and the influence degree, and the re-factoring module provides assistance in re-factoring.
    Type: Grant
    Filed: May 10, 2004
    Date of Patent: July 4, 2006
    Assignee: Kabushiki Kaisha Toshiba
    Inventor: Yoshio Kataoka
  • Patent number: 7072795
    Abstract: The invention relates to a method and a system for detecting at least one partial model of a model pertaining to a system. A state of the system is described by state variables. At least on e of the state variables is a discrete state variable. Several value sets of the state variables are detected. A probability distribution for the state variables is detected by using the sets. The partial model of the system is detected using the sets and the probability distribution of the state variables and a statistical learning method. The partial model describes the system under the condition of the probability distribution for the state variables.
    Type: Grant
    Filed: December 21, 2000
    Date of Patent: July 4, 2006
    Assignee: Panoratio Database Images GmbH
    Inventors: Michael Haft, Reimar Hofmann, Volker Tresp
  • Patent number: 7069179
    Abstract: The present invention discloses a workflow mining system which can evaluate, analyze and determine previous execution results of processes or activities by applying a data mining technique to workflow log data accumulated during the operation of a workflow system, and a method therefor. The workflow mining system extracts necessary data from a database of a workflow server, generates an analysis table, performs a preprocessing process for removing unnecessary attributes on the basis of the extracted data or converting a digital variable into a symbolic variable, and analyzes a decision making tree or association by using the preprocessed data. C4.5 algorithm is used for the decision making tree analysis and Apriori algorithm is used for the association analysis.
    Type: Grant
    Filed: September 30, 2002
    Date of Patent: June 27, 2006
    Assignee: Handysoft Co., Ltd.
    Inventors: Yeong-Ho Kim, Sung Kim, Byeong-Kwon Kwak, Yong-Woon Shin
  • Patent number: 7069162
    Abstract: Constant components and rotation fundamental mode components on the slide plane between a rotor and a stator are derived from a magnetic field distribution at a predetermined time. The analysis space is divided into a rotor space and a stator space. A fundamental mode on the slide plane is rotated by a rotation angle of a rotation magnetic field corresponding to a time-step width. A solution obtained in this state is added to the constant components. By using the addition result as the boundary conditions on the slide plane, non-linear magnetic field analysis is performed by taking into consideration the magnetic saturation in the stator space. The rotation fundamental mode on the slide mode is rotated by an angle obtained by subtracting the rotation angle of the rotor from the rotation angle of the rotation magnetic field corresponding to the time-step width.
    Type: Grant
    Filed: January 22, 2004
    Date of Patent: June 27, 2006
    Assignee: Hitachi, Ltd.
    Inventor: Kenji Miyata
  • Patent number: 7065471
    Abstract: An operation monitoring unit 11 for acquiring process data from sensors 10 installed to a gas turbine and operation information of the gas turbine; communication units 12, 14 for transmitting each of said two kinds of data on the gas turbine acquired in the operation monitoring unit 11; an analysis server 16 which calculates values of equivalent operating time using each of the two kinds of data obtained through the communication units 12, 14, the value of equivalent operating time evaluating a degree of damage of a diagnosed position for each of a plurality of degradation-and-damage modes, and calculates a value of whole equivalent operating time by adding the values of equivalent operating time for the individual degradation-and-damage modes; and a facility management unit 15 client-server systemized using the analysis server 16 and a WWW browser 20 or WWW server 19 are provided.
    Type: Grant
    Filed: June 18, 2001
    Date of Patent: June 20, 2006
    Assignee: Hitachi, Ltd.
    Inventors: Jinichiro Gotoh, Yasushi Hayasaka, Shigeo Sakurai, Hiraku Ikeda
  • Patent number: 7062402
    Abstract: A system and related techniques automatically exercise the output capabilities of a printer or other output device, and return a log or record of those capabilities to the print manager of a host operating system or other destination. According to embodiments, the host, client or other machine may decide to query a printer, facsimile machine, copy or multifunction machine or other device to determine its range of output capabilities such as available fonts, graphical or rending routines, firmware compatibility or other functions or capabilities. The host may transmit a composite electronic document, containing various components including intermediate language objects which may be interpreted to execute various output processing, such as exercising a set of fonts, scaling, rotating, or other rendering or output functions.
    Type: Grant
    Filed: May 19, 2004
    Date of Patent: June 13, 2006
    Inventors: Joseph D. Ternasky, Robert L. C. Parker, Michael M. Byrd, Adam Eversole, Joseph King, Michael Stokes
  • Patent number: 7058549
    Abstract: An apparatus 10 is provided that includes a spatial array of at least two unsteady pressure sensors 18–21 placed at predetermined axial locations x1–xN disposed axially along a pipe 14 for measuring at least one parameter of a fluid 12 flowing in the pipe 14. The pressure sensors 18–21 comprise a plurality of pressure sensing elements such as piezoelectric film sensors 23 for measuring unsteady pressures associated with acoustical pressures and/or vortical disturbances. The sensing elements are disposed circumferentially around the pipe and spaced a predetermined distance. The pressure signals P1(t)–PN(t) provided by the pressure sensors 18–21 are processed by a processing unit to provide an output signal indicative of a parameter of the fluid.
    Type: Grant
    Filed: January 21, 2004
    Date of Patent: June 6, 2006
    Assignee: C1DRA Corporation
    Inventors: Daniel L. Gysling, Douglas H. Loose, Robert Maron, Thomas Engel, Paul Croteau
  • Patent number: 7058527
    Abstract: The precision of a micromagnetization analysis is improved. Parameters of the micromagnetization assigned to the center of a divided microelement and the vector potential assigned to a side or a node of the element are received in procedure 1. A magnetic field equation which supplies an external magnetic field for micromagnetization is generated in procedure 2. A solution of the magnetic field equation is obtained in display 3. A time integral of a LLG equation is obtained using the solution in procedure 4. It is determined in procedure 5 whether or not the micromagnetization obtained in procedure 4 satisfies a convergence condition. When it is not satisfied, a magnetic field equation is corrected and a time is stepwise increased in procedure 6, and the procedures in and after procedure 3 are repeated.
    Type: Grant
    Filed: March 2, 2004
    Date of Patent: June 6, 2006
    Assignee: Fujitsu Limited
    Inventor: Koichi Shimizu
  • Patent number: 7054786
    Abstract: In an operation monitoring method according to the present invention, operation data of a plasma processing system (1) are detected for every wafer (W) by means of a plurality of detectors, and a principal component analysis using the operation data is carried out by means of a controller (10). An operation state of the plasma processing system (1) is evaluated by using the results of the principal component analysis.
    Type: Grant
    Filed: July 3, 2001
    Date of Patent: May 30, 2006
    Assignee: Tokyo Electron Limited
    Inventors: Shinji Sakano, Tsuyoshi Sendoda
  • Patent number: 7054781
    Abstract: At least one radio channel is measured and stored. At least one simulation is performed with the at least one radio channel stored.
    Type: Grant
    Filed: May 25, 2004
    Date of Patent: May 30, 2006
    Assignee: Elektrobit OY
    Inventors: Janne Kolu, Pekka Kyösti, Patrick Jourdan, Tommi Jämsä, Ari Hulkkonen
  • Patent number: 7050948
    Abstract: The invention describes a method and computer program product for the evaluation of data recorded by measuring instruments, which is particularly applicable to the precise localization of non-reflecting marks on a reflecting medium by means of a light-sensitive receiver and can be especially applied in precision positioning devices.
    Type: Grant
    Filed: May 23, 2002
    Date of Patent: May 23, 2006
    Assignee: Dr. Johannes Heidenhain GmbH
    Inventors: Uwe Trautwein, Fred Vogler
  • Patent number: 7050942
    Abstract: An object state classification method includes a step of designating a to-be-determined object that is to be determined, and a state of the to-be-determined object, a step of creating a method set including, as elements, methods called from the designated state of the to-be-determined object, a step of using, as a to-be-determined state, the designated state of the to-be-determined object or another state obtained by calling methods from the designated state, and executing a program for calling methods included in the method set from the to-be-determined state, a step of recording an execution result in a case of calling the methods, and a step of creating a pseudo-state by merging a method group that is the elements of the method set, and the execution result in the case of calling each method of the method group, in association with the to-be-determined state of the to-be-determined object.
    Type: Grant
    Filed: December 17, 2003
    Date of Patent: May 23, 2006
    Assignee: Kabushiki Kaisha Toshiba
    Inventors: Masayuki Hirayama, Katsuhiko Ueki, Wataru Okamoto