Abstract: A performance test system includes a measuring device to measure an object device, and a computing device having a controller to test performance of the object device based on measured data transmitted from the measuring device, wherein the controller controls to display a report setup window through which data to be reflected in a measurement report is inputted, a coordinate-system setup window through which a coordinate system is set up based on the object device, and a measuring option setup window through which options for measuring the performance of the object device are set up, controls operation of the measuring device and the object device based on the options set up through the measuring option setup window, and tests the performance of the object device based on the measured data transmitted from the measuring device according to the operation of the object device and the measuring device, and controls to display a report window to process and to output report data inputted through the report setup

Abstract: A system and method are provided for monitoring the operation of a plurality of turbines in respective operating locations. The method includes inputting operation data from each of the turbines and processing the operation data to generate secondary operation data. Further, the method also includes generating at least one report based on the secondary operation data.

Abstract: An apparatus for detecting the probable existence, location, and type of defects in a workpiece is described. The apparatus includes a sensor subsystem, an optimizer, a control subsystem, and a computer system having a processor and computer readable memory. Sensor subsystem senses a first section of the workpiece and produces signals corresponding to a physical characteristic of the workpiece. The computer system is configured to generate a workpiece model based on the signals produced by the sensor subsystem. In an alternate embodiment, a defect assembler can be provided to merge signals from a plurality of sensor subsystems. The defect assembler can also be configured to generate the workpiece data model. The optimizer is configured to generate workpiece segmentation recommendations based on the workpiece data model.

Abstract: A method for maintaining a complex article, including retrieving maintenance information relating to maintenance of a component of a complex article from an electronically-accessible tag coupled to the component and applying the retrieved maintenance information to a determination regarding maintenance of the complex article. A device including a complex article including a first component and a second component, the first and second components being one of individually replaceable and maintainable. The first component is tagged with a first tag that stores first computer accessible information including a first identifier identifying the first component and first maintenance information describing maintenance of the first component. The second component is tagged with a second tag that stores second computer accessible information including a second identifier identifying the second component and second maintenance information describing maintenance of the second component.

Abstract: A system for determining a signal running time between a position measuring system and an evaluation unit. The system includes a position measuring system that has a graduation connected to a moving element, a scanning unit that scans the graduation, wherein scanning of the graduation generates signals representative of a position of the moving element and a transceiver means for generating serial data that is transmitted along a data line connected to the transceiver. The system further includes an evaluation unit connected to the data line, the evaluation unit having means for determining a signal running time between the position measuring system and the evaluation unit.

Abstract: A high resolution potentiometer implemented using at least two digital potentiometers connected in parallel. Each digital potentiometer is controlled to provide a corresponding resistance value, and a desired resistance value is attained by such control. The resolution is high in some range of desired resistance values and low in other ranges. A high resolution in a desired range can be attained by connecting another resistor in series with the digital potentiometers connected in parallel.

Abstract: A method for quantifying effects of resonance in an integrated circuit's power distribution network is provided. The power distribution network includes a first power supply line and a second power supply line to provide power to the integrated circuit. Test ranges are selected for two test parameters, reference voltage potential of a receiver and data transmission frequency of the integrated circuit. At each combination of the two test parameters, bit patterns are transmitted by the integrated circuit to the receiver. A comparison is made between the transmitted bits and the received bits to determine whether the transmitted bits were correctly received. The comparison may be used to determine and report a range of values for the reference voltage potential and data transmission frequency that allow the transmitted bits to be correctly received.

Abstract: A method and apparatus is provided for fault detection and classification based on calculating distances between data points. The method comprises receiving a data sample representative of measurements of one or more variables associated with a process operation, determining a distance between the data sample and one or more data points of a history data of the process operation and detecting a fault associated with the process operation based on the distance between the data sample and the one or more data points of the history data.

Abstract: A measuring device (1) has, e.g., a voice input portion (27) for a measurer to input an arbitrary comment at a time of measurement, and it allows a voice recognition portion (28) to recognize the measurer's comment inputted by the voice input portion (27) and also allows a recognition result to be stored in a comment storing portion (43) in correlation with information on date and time, thereby storing conditions or the like of the measurer at the time of measurement, together with the measurement data.

Abstract: For characterizing an information signal having an amplitude-time waveform with local extreme values, at first the local extreme values of the information signal are determined, wherein a local extreme value is defined by a time instant and an amplitude. Furthermore, area information of valleys or mountains of the information signal in case of a one-dimensional amplitude of the information signal or volume information in case of a two-dimensional amplitude of the information signal of valleys or mountains is ascertained. A valley or mountain is defined by a temporal section of the information signal, wherein the section of the information signal extends from the time instant of a local extreme value to a temporarily adjacent value of the information signal having the same amplitude as the local extreme value.

Abstract: Upon performing a remote maintenance/diagnosis of a manufacturing equipment, data deriving from the manufacturing equipment that is a subject of the remote maintenance/diagnosis, data deriving from a manufacture related equipment other than the manufacturing equipment, and data regarding a manufacturing execution are collected as data used for the remote maintenance/diagnosis. The data collected as the data used for the remote maintenance/diagnosis is transmitted to a remote center that performs the maintenance/diagnosis of the manufacturing equipment.

Abstract: The invention relates to statistical testing method for the objective verification of auditory steady-state responses (ASSR) in the frequency domain by using a “q-sample uniform scores test” whereby only the phase angles are used. Phase angles computed by Fourier transformation are used in one embodiment example. In another embodiment example, spectral amplitudes and phase angles are used; however, the phase angles remain unranked while ranks for the spectral amplitudes are still taken into account for the test. In yet another embodiment example, the values of the phase angles and of the spectral amplitudes are used directly (unranked) whereby said values are computed by means of Fourier transformation. The invention relates also to a testing device to carry out the statistical test method.

Abstract: A method and apparatus is disclosed for assessing performance of control applications in an environmental control network and for diagnosing performance problems. The apparatus includes a performance assessment and diagnostic display comprising a facility navigation tree, a system navigation tree and a performance/diagnostics window. The facility navigation tree and system navigation tree may be used to select the facilities and systems that are to have their associated control applications assessed and/or diagnosed. The performance/diagnostics window includes graphs of performance indictors that are indicative of performance levels for the included control applications. The system tree may be used to delve to more detailed views of the performance indicators to obtain additional information that may help to diagnose problems noted in performance of the selected control applications.

Abstract: A spectroscopy instrument that uses spectra produced from random binary sequence modulated data. Statistical estimation techniques are used to achieve resolution enhancement, while properly accounting for the Poisson noise distribution and other artifacts introduced by a modulator or “chopper” or other system components. Indeed, a resolution similar to that of modern spectrometers can be achieved with a dramatic performance advantage over conventional, serial detection analyzers. Both static and dynamic behaviors are theoretically or measured experimentally accounted for in the model as determined. In one embodiment, the finite penetration of the field beyond the plane of the chopper leads to non-ideal chopper response, which is characterized in terms of an “energy corruption” effect and a lead or lag in the time at which the beam responds to the chopper potential.

Abstract: Assessing the condition of a device includes receiving signals from a sensor that makes electrical measurements of the device. An expected response of the device is estimated in accordance with the received signals, and a measured response of the device is established in accordance with the received signals. An output residual is calculated according to the expected response and the measured response. The condition of the device is assessed by identifying a fault of the device in accordance with the output residual.

Abstract: A method for calibrating a delay element is described herein. In some embodiments, the method may include generating a clock signal with a clock edge, generating a reference signal with a reference edge using an adjustable delay line to delay the clock signal, and delaying a selected one of the clock signal and the reference signal through an array delay line having an array delay element with an array delay. In some embodiments, the method may further include adjusting the adjustable delay line to obtain a first adjustable delay so that the clock and reference edges are aligned on one side of the array delay element, adjusting the adjustable delay line to obtain a second adjustable delay so that the clock and reference edges are aligned on the other side of the array delay element, and ascertaining a delay difference between the first and the second adjustable delays to determine a value of the array delay provided by the array delay element.

Abstract: Improved endpoint detection and/or thickness measurements may be obtained by correcting sensor data using calibration parameters and/or drift compensation parameters. Calibration parameters may include an offset and a slope, or other parameters. Drift compensation parameters may include off-wafer measurements.

Abstract: A system and method for determining harmonics caused by non-linear loads are disclosed. Briefly described, one embodiment is a method comprising metering voltage on an electric power system; metering current on the electric power system; determining a predicted current based upon the metered voltage; comparing the predicted current with the metered current; and determining a harmonic current component using a plurality of weights determined when the predicted current converges with the metered current.

Abstract: An apparatus (14) for detecting a zero-crossing of an alternating current after occurrence of a fault in a current path (2) for determining a suitable time for opening an electric switching device (2) arranged in the current path for breaking the current in the current path comprises members (15) adapted to detect the current in the current path. An arrangement (19) is adapted to calculate the dc-level of the current and the decay of the dc-level with time on the basis of values of the alternating current detected and also predict the time for a future zero-crossing of the alternating current on the basis of at least current values obtained through said current detection, the dc-level calculated, the dc-decay calculated and information about the period time of the alternating current.

Abstract: A switched current temperature sensing circuit (1) comprises a measuring transistor (Q1) which is located remotely of a measuring circuit (5) which applies three excitation currents (I1,I2,I3) of different values to the measuring transistor (Q1) in a predetermined current sequence along lines (10,11). Resulting base/emitter voltages from the measuring transistor (Q1) are applied to the measuring circuit (5) along the same two lines (10,11) as the excitation currents are applied to the measuring transistor (Q1). Voltage differences ?Vbe of successive base/emitter voltages resulting from the excitation currents are integrated in an integrating circuit (36) of the measuring circuit (5) to provide an output voltage indicative of the temperature of the measuring transistor (Q1).