Abstract: A system and method for laser source detection. An exemplary embodiment of the system includes a first array of lenses, a second array of opto devices (including light sources and light detectors), and at least one processor. By positioning the array of lenses to determine the lens position at which energy from an incoming laser is greatest on the light detectors, the approximate location of the laser source may be determined. Upon determining the source, responsive action may be taken. If the incoming laser is from a friendly party, a friendly-party notification may be provided. If the incoming laser is from an enemy, reciprocal targeting or false reflections may be employed.

Abstract: An optocoupler package is disclosed. The optocoupler package includes a substrate comprising a leadframe and a molding compound, and a plurality of optocouplers, each optocoupler including (i) an optical emitter, (ii) an optical receiver, (iii) and an optically transmissive medium disposed between the optical emitter and optical receiver, where the optical emitter and the optical receiver are electrically coupled to the leadframe.

Abstract: A passive all fiber optic encoder that will be able to determine speed, position, and direction of movement of a movable object. The all passive encoder utilizes no electronics within the sensing part and therefore is deployable in harsh environments, electrical, electromagnetic and radiation fields, otherwise not possible with conventional electronic encoders. The system utilizes a multiwavelength light source and one optical fiber leading to the encoder sensor housing which has a shutter, a light filter assembly and reflective mirror. The movement of the shutter produces a sequential series of light impulses sequenced proportional to the movement of the shutter. The light filter assembly utilizes a minimum of two different filters each of which passes or rejects light within a certain space and wavelength range.

Abstract: A displacement measuring device including a scale, and an optical readhead including an index pattern and a light receiving element is provided. A bright/dark pattern arising from a scale grating is detected by the readhead to measure displacement. In various embodiments, a magnification of the pattern is adjusted by the spacing between at least a lens element, aperture element, and detection plane of the readhead. An aperture can be designed to provide a diffraction-limited telecentric imaging configuration that filters an image of the scale grating to provide a sinusoidal intensity pattern that supports highly interpolated measurements. An aperture dimension, selected in relation to the grating pitch and other parameters, can provide a desirable combination of readhead operating characteristics including one or more of a desired depth of field; degree of spatial filtering; and optical signal power.

Abstract: Provided is a photodetector in which a transparent nonconductive material having an interface charge and a trapped charge is deposited on a semiconductor surface so as to form a depletion region on the surface of the semiconductor, and the depletion region is employed as an optical detecting region, thereby not only improving detection with respect to light having a wavelength of ultraviolet and blue ranges but also filtering light having a wavelength of visible and infrared ranges, and in which a fabricating process thereof is compatible with a universal silicon CMOS process.

Abstract: A light beam detection device includes a light-receiving element for receiving a light beam and outputting a detection signal. A light detection circuit generates and outputs a light-emission signal based on the detection signal. A light-emitting element emits light based on the light-emission signal. The light-receiving element and the light-emitting element are arranged on a detection member. A supporting member supports the detection member. A driving device moves the supporting member in a reciprocative manner in an X axis direction and a Y axis direction to form a detection region with the detection member. The light-emitting means forms an afterimage on the detection region when the light beam irradiates the detection region.

Abstract: A discrimination device which is disposed on a conveyance path of conveyed items, such as planographic printing plates, slip sheets and the like. The discrimination device is structured with a first sensor, which detects presence or absence of the conveyed items, and second and third sensors, which identify types of the conveyed items. The first sensor can judge presence or absence of a conveyed item from whether or not irradiated light is reflected by a conveyed item. The second and third sensors discriminate between the types—the planographic printing plates and the slip sheets—by the intensity of reflected light, on the basis of a difference in surface reflectivities of the conveyed items. With these three optical sensors, it is possible to reliably identify four conveyance configurations of the conveyed items.

Abstract: Integral fiber optic-based condition sensors detect conditions of a composite structure, e.g., a coated wire assembly so as to detect damage or conditions that may damage the same. Preferably, at least one optical fiber sensor having a plurality of Bragg gratings written into the fiber at spaced-apart locations along its axial length is integrated into the electrical insulator coating of a wire, wire bundle or wiring harness. The fiber optic sensor may thus be employed to measure the environmental loads on the electrical wiring including stresses from bending, axial loading, pinch points, high temperature excursions and chemical damage. The system is capable of detecting and locating transient conditions that might cause damage to a wiring system or permanent changes in state associated with damage events. The residual stress in the electrical insulator coating of a wire, wire bundle, or wiring harness are used to monitor the evolution of damage by wear or chaffing processes.

Abstract: A photodetector includes a high-indium-concentration (H-I-C) absorption layer having a Group III sublattice indium concentration greater than 53%. The H-I-C absorption layer improves responsivity without decreasing bandwidth. The photoconversion structure that includes the H-I-C absorption layer can be formed on any type of substrate through the use of a metamorphic buffer layer to provide a lattice constant gradient between the photoconversion structure and the substrate. The responsivity of the photodetector can be further improved by passing an incoming optical signal through the H-I-C absorption layer at least twice.

Abstract: A device for detecting radiation direction is an integrated circuit that includes a first and second phototransistor positioned anti-parallel with respect to each other and a reference phototransistor. The device does not require impinging radiation to be mechanically aligned using pinholes, apertures or mechanical slits. The first phototransistor detects the direction of the radiation in an x-plane, and the second phototransistor detects the direction of the radiation in the y-plane. The first and second phototransistors have two differential pairs. The P type base regions are formed in the <111> plane of the silicon to form opposing sidewalls for receiving radiation signals from a radiation source. A current is induced in the PN junction of each phototransistor, thereby causing a current output on the emitters of the phototransistors. The differential currents represent rectangular coordinates describing the direction of the radiation detected on the <111> plane.

Abstract: An unsealed optical encoder does not function properly in a fluid other than air because the optics do not function when interfaced with a medium having an index of refraction significantly higher than air. The collimating lens of an optical encoder has two refracting surfaces, at least one of the refracting surfaces being convex. An orthogonal cap of the present invention is attached over an optical encoder's collimating lens to create a sealed air cavity between the convex refracting surface of the collimating lens and the orthogonal cap. This placement of the orthogonal cap is such that the collimated light leaving the sealed air cavity may enter the surrounding medium at an angle that is normal to the surface of the medium, such as transparent oil, so that the collimated light does not bend even though the light is traveling from air to a much slower medium.

Abstract: The semiconductor device of the present invention comprises an optical transmission region, and a light receiving part for converting light propagating through the optical transmission region to an electrical signal, wherein the optical transmission region comprises a two-dimensional optical waveguide layer, and wherein at least a portion of the light receiving part is embedded in the optical transmission region, whereby the present invention can provide a semiconductor device having reduced direction dependency when light propagating through the optical transmission region is received.

Abstract: An apparatus for imaging an array of a plurality of features associated with a sample tile. The apparatus can comprise a stage that supports the sample tile in an illumination region, and an illumination source having a plurality of LEDs adapted to emit light. At least a portion of the light can illuminate the illumination region. Additionally, the apparatus can comprise an image collecting device adapted to selectively collect images of either a first signal when the illumination source is illuminating the illumination region, or a second signal absent illumination of the illumination region. The first signal can have wavelengths effectively different from the wavelengths of the portion of the light emitted by the LEDs that illuminates the illumination region.

Abstract: A sensor array having a plurality of pixels each including a sensor element coupled to a sensor input (24) of an electronic processing circuit is fabricated by first forming an integrated circuit having at least one array of electronic processing circuits (25, 26) each having a respective sensor input (24) disposed with terminal nodes of the integrated circuit toward a first surface of the wafer. In respect of either each pixel or each terminal node, an electrically conductive via (31) is formed through the wafer (20) extending from either the respective sensor input (24) or from the respective terminal node to a second surface (28) of the wafer opposite the first surface. This allows each electrically conductive via (31) exposed at the second surface of the wafer to serve for connection thereto of either a sensor element or a terminal connection that is electrically connected through the electrically conductive via (31) to the respective sensor input or terminal node.

Abstract: An inspection system includes a CMOS integrated circuit having integrally formed thereon an at least two dimensional array of photosensors and providing an inspection output representing an object to be inspected. A defect analyzer is operative to receive the inspection output and to provide a defect report.

Abstract: An image intensification camera system (C) for gathering image data includes an image intensifier (310) for amplifying received light (312). A relay optic assembly (316) is coupled between the image intensifier (310) and a digital image sensor (318), such as a CMOS or CCD device. Digital logic (322) is used to process or output an image or related data (334).

Abstract: An image pickup device has a plurality of photoelectric converter substrates carrying respective input/output terminals connected to the photoelectric converters. The device comprises leads connected to the input/output terminals and extending to the side opposite to the light receiving surfaces of the photoelectric converter substrates thorough the gaps separating the substrates.

Abstract: An encoder calculates position error values and applies compensation values to encoder position measurements in-situ. The encoder includes a scale and a multi-section detector for detecting a spatially periodic pattern, such as an optical interference pattern, produced by the scale. The detector includes spatially separated first and second sections. A signal processor estimates respective phase values from detector sections and calculates a phase difference reflecting a spatial position error in the scale. A compensation value is calculated from the phase difference and included in the estimate of the scale position to compensate for this spatial position error. The compensation values may be calculated and used on the fly, or calculated and saved during an in-situ calibration operation and then utilized during normal operation to compensate uncorrected measurements.

Abstract: An encoder and related methods for use in a printing device indexing system are provided. In some embodiments, the system comprises a feedroller or other component configured to index media through a printing device, and an encoder disk is coupled to the feedroller. In these embodiments, the system includes a reflective optical detector having a transmitter and a receiver provided adjacent a first surface of the encoder disk, the reflective optical detector being configured to detect the passage of the home position mark as the encoder disk rotates by the reflection of radiation off of the first surface. Also provided in some embodiments are methods for setting a counter to correspond with the home position of a rotatable element by utilizing threshold signal levels.

Abstract: Low intensity light is incident upon a photodiode whose output is coupled to an integrator. The output of the integrator is coupled to an input of an A/D converter, whose output is coupled to a microprocessor, whose output is coupled to a filter. A second output of the microprocessor is coupled to a gate electrode of a FET to provide a reset signal to the FET to reset the integrator. The microprocessor compares the digital samples of the integrated signal from the A/D converter and, firstly, generates the reset signal if a sample is beyond a set limit, and, secondly, calculates delta values between adjacent samples and interpolates the delta values for the reset periods so as to provide a continuous data stream which can be filtered by a filter matched to the form of the original signal.