Abstract: A chip testing method and apparatus, and an electronic equipment are provided. The method includes: determining, according to pad distribution information of a target chip, positions of set state pads and positions of non-set state pads in the target chip, the set state pads being pads with set states, and the set states including a first state or a second state; determining a plurality of pad state setting schemes according to the positions of the set state pads and the positions of the non-set state pads, the pad state setting schemes including setting each of the non-set state pads to the first state or the second state; and determining a test voltage setting scheme satisfying a preset condition according to information of differential voltage pad pairs in each of the pad state setting schemes, the differential voltage pad pair comprising two adjacent pads in different states.

Abstract: A method uses the nuclear spin singlet of three hydrogen atoms on the dopamine benzene ring to achieve selective detection of dopamine signals in a complicated system. The present invention is based on magnetic resonance technology to detect dopamine, has good accuracy, sensitivity and selectivity, can accurately detect the signal of dopamine from the complicated system, and the interference of signals of other substances are well eliminated. Meanwhile, the present invention further has the advantages of simple operation and non-intervention, can be used for monitoring the content and distribution of the dopamine in a living body, and has important application value in the fields of biology and medicine.

Abstract: An electronic device and phase detector are provided. The phase detector includes a first input terminal, a second input terminal, a first input buffer, and a second input buffer. The first input buffer is electrically connected to the first input terminal. The second input buffer is electrically connected to the second input terminal.

Abstract: An apparatus to detect a liquid in a wafer processing device includes a first conductor proximate the wafer processing device. The apparatus includes a second conductor spaced apart from the first conductor and proximate the wafer processing device. The apparatus includes a liquid absorption material surrounding the first conductor and the second conductor. The apparatus includes a current source coupled to the first conductor. The apparatus includes a current detector coupled to at least one of the first conductor or the second conductor. The liquid absorption material establishes a conductive pathway between the first conductor and the second conductor when the liquid absorption material absorbs the liquid in the wafer processing device. A current is generated, by the current source, in at least one of the first conductor or the second conductor through the conductive pathway. The current detector detects the current.

Abstract: A capacitive sensing system includes a controller, a node connected to one side of a capacitance, the controller configured to measure the capacitance by measuring a time for a voltage across the capacitance to reach a predetermined reference voltage, a noise measurement circuit configured to measure electrical noise on the node, and the controller receiving the measurement of noise from the noise measurement circuit.

Abstract: A method identifies a cause of change in magnetic permeability of an object under inspection and evaluates the state of surface treatment(s) of the object under inspection with high accuracy. An embodiment of the method includes preparing a non-destructive inspection apparatus; placing the object under inspection; generating eddy current in the object under inspection; continuously changing the penetration depth of an AC magnetic field in the object under inspection; calculating the value of impedance at each penetration depth in the object under inspection; and evaluating the state of the surface treatment(s) by: calculating the ratio between the value of impedance at each penetration depth in the object under inspection and the value of impedance at a corresponding penetration depth in steel which has not been subjected to a surface treatment; and identifying a cause of a change in magnetic permeability of the object under inspection based upon the calculated ratio.

Abstract: An experimental technology for detecting a hydrogen bond based on an ssNMR technology includes: (1) exciting a 1H nucleus of an RNA sample with a ?/2 pulse; (2) applying two ? pulses every half rotation period on an X nucleus of the RNA sample; (3) applying a ? pulse on the 1H nucleus of the RNA sample; (4) applying two ? pulses every half rotation period on the X nucleus of the RNA sample; (5) applying a 90° pulse on 1H and X atoms of the RNA sample; r a chemical shift of X in indirect dimension; (7) applying the 90° pulse on the 1H and X nuclei of the RNA sample; (8) repeating steps 2, 3, and 4; and (9) collecting the 1H signal in direct dimension; where X is selected from the group consisting of 15N and 13C.

Abstract: Front-end circuits that combine inductive and capacitive sensing are described. In one embodiment, an apparatus includes a plurality of inductive elements, an inductive measurement circuit, and a frequency divider circuit. The inductive measurement circuit is to output a first signal with a first frequency. The first signal is associated with an inductance change of one of the inductive elements. A feedback circuit can maintain the sinusoidal operation of the first signal. The frequency divider circuit can generate a second signal with a second frequency that is lower than the first frequency.

Abstract: The present invention provides a device and a method for measuring fluid saturation in nuclear magnetic resonance (NMR) on-line displacement, the method comprising: measuring a nuclear magnetic resonance (NMR) T2 spectrum under the dead volume filling of the on-line displacement system as displacing phase fluid and the core to be measured as saturated nuclear magnetic detection phase fluid to generate a calibrated T2 spectrum; measuring a nuclear magnetic resonance (NMR) T2 spectrum of a process in which the core to be measured is converted from a saturated displaced phase fluid into a displacing phase fluid to generate a displacement process T2 spectrum; generating the fluid saturation of the on-line displacement system in real time according to the generated calibrated T2 spectrum and the displacement process T2 spectrum. The present invention achieves the purpose of improving measurement precision of fluid saturation in the on-line displacement process.

Abstract: A sensor for detecting properties of a gas, gas mixture, or a gas or gas mixture containing particles, all collectively referred to as a “gas”. A flow tube contains a pair of electrodes arranged such that at least a portion of the gas flows between the electrodes. A controller applies voltage to the electrodes and measures response data from the electrodes representing the voltage-current relationship between the electrodes while the gas is between the electrodes. Based on the response data, the controller determines a concentration of particles within the gas.

Abstract: A burn in board test device including: a plurality of devices under test, wherein each of the devices under test includes a burn in device; a plurality of resistors connected to each of the plurality of devices under test; a plurality of device under test switches connected to each of the plurality of resistors; and a device under test tester which is connected a plurality of sub input/output (I/O) channels connected to each of the plurality of device under test switches, and a main I/O channel for connecting the plurality of sub I/O channels to each other to test the plurality of devices under test.

Abstract: A semiconductor apparatus includes a semiconductor device that performs signal processing, a driving control unit that controls drive of the semiconductor device, and a lifetime obtaining unit that obtains remaining lifetime information that represents a remaining lifetime of the semiconductor device. In a case where the remaining lifetime information represents a first length, the driving control unit drives the semiconductor device in a first condition. In a case where the remaining lifetime information represents a second length shorter than the first length, the driving control unit drives the semiconductor device in a second condition in which throughput of the signal processing is lower than that in a case where the semiconductor device is driven in the first condition, and the remaining lifetime of the semiconductor device is longer than that in the case where the semiconductor device is driven in the first condition.

Abstract: A metal structure evaluator for rolled steel sheets includes: a magnetic property measuring unit configured to measure a magnetic property of an evaluation target point in at least two or more different magnetization directions by performing, in the at least two or more different magnetization directions, processing of: applying a magnetic field on a surface of a rolled steel sheet in one direction; and measuring a magnetic property of the evaluation target point on the surface of the rolled steel sheet; and a determination unit configured to determine a metal structure of the evaluation target point based on the magnetic property measured by the magnetic property measuring unit.

Abstract: A method is provided for calibrating a test system, including first and second test instruments. The method includes connecting a first test port of the first test instrument to a second test port of the second test instrument; generating a first RF signal using a first RF source of the first test instrument while a second RF source of the second test instrument is turned off; measuring first phase of the first RF signal at the first test port using first incident and reflected signals; generating a second RF signal using a second RF source of the second test instrument while the first RF source; measuring second phase of the second RF signal at the first test port using the second incident signal and reflected signals; determining a phase difference between the first and second phases; and adjusting the first and/or second RF source to remove the determined phase difference.

Abstract: A drive controller according to an aspect controls drive of a three-phase motor, and includes an electric value calculation unit that calculates an electric value in each of coordinate axes of rotating coordinates of the three-phase motor based on an electric value that is at least one of a current value and a voltage value generated in the three-phase motor, and a fault determination unit that determines a fault phase having a fault in phases of the three-phase motor by combining positive-negative information on at least one of a difference between a calculation electric value calculated by the electric value calculation unit and a target electric value indicating a control target of an electric value in each of the coordinate axes, and a variation of the difference, with each of the coordinate axes.

Abstract: A metal structure evaluator for rolled steel sheets includes: a magnetic property measuring unit configured to measure a magnetic property of an evaluation target point in at least two or more different magnetization directions by performing, in the at least two or more different magnetization directions, processing of: applying a magnetic field on a surface of a rolled steel sheet in one direction; and measuring a magnetic property of the evaluation target point on the surface of the rolled steel sheet; and a determination unit configured to determine a metal structure of the evaluation target point based on the magnetic property measured by the magnetic property measuring unit.

Abstract: A device and method to test microelectronic parts to determine whether the parts are compromised by active illumination in a testing fixture within a shielded enclosure by analysis of emission metrics. The testing fixture can include a first layer with a capacitive member and a second layer with a cavity to receive a microelectronic part. A filter in a transmission chain can pass a high power signal to the fixture. A filter in a receving chain can pass a low power signal to the analysis unit.

Abstract: High-speed tubular inspection systems include a frame at least one magnetic flux generator contained in a coil annulus and a detector assembly each having inlet and outlet openings for passing a tubular member there through. The detector assembly has one or more magnetic detectors and one or more eddy current detectors configured to be spaced a first distance from the tubular member during an inspection. The detectors are each contained in one or more EMI detector shoes. A conveyor supports the frame and a drive mechanism configured to drive the tubular member through the coil annulus (or drive the coil annulus past the tubular member) at high-speeds.

Abstract: The apparatus is useful for monitoring integrity of casings, tubings, and other tubular strings in oil and gas wells. An apparatus for defectoscopy of downhole casings includes several units in a housing. An electromagnetic field generation unit generates excitation pulse of a specified amplitude and duration. It includes an exciter coil containing a core made a high magnetic permeability material. A pick-up sensor unit includes an integral pick-up coil and radial pick-up coils mounted around the exciter coil winding. Each pick-up coil has a U-shaped core with poles directed perpendicularly to the surveyed pipe surface and having a center line parallel to the center line of the exciter coil winding. A data control, acquisition, and processing unit includes operational amplifiers with variable amplification factors and analog-to-digital converters (ADCs) that transmit signals from the pick-up coils to software for casing defect analysis.

Abstract: An eddy current probe based on a Halbach array coil includes a first coil, a second coil, a third coil, a fourth coil and a fifth coil arranged in a form of a Halbach array. One side with dense magnetic induction lines is used as a displacement measurement direction of the eddy current probe.