Patents Examined by Rahul Maini
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Patent number: 12222370Abstract: A probe head and a probe card having the same are provided. The probe head includes a plurality of guide plates each having a guide hole, wherein each of the guide plates has a shape in which a plurality of layers are stacked, and each of the guide plates includes: a first guide layer provided at a lowermost side thereof, and having a first guide hole; and a second guide layer provided at an uppermost side thereof, and having a second guide hole, wherein a side wall of the first guide hole and a side wall of the second guide hole are not provided on the same vertical line.Type: GrantFiled: April 20, 2021Date of Patent: February 11, 2025Assignee: POINT ENGINEERING CO., LTD.Inventors: Bum Mo Ahn, Seung Ho Park, Sung Hyun Byun
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Patent number: 12203979Abstract: Placing a first side of an active thermal interposer device of a thermal management head against a device under test (DUT). Disposing a cold plate against a second side of the active thermal interposer. The DUT includes a die and the active thermal interposer device includes a plurality of zones, each zone of the plurality of zones corresponding to a respective module of the plurality of modules and operable to be selectively heated. Receiving a respective set of inputs corresponding to each zone of the plurality of zones. Performing thermal management of the plurality of modules of the DUT by separately controlling temperature of each zone of the plurality of zones by controlling a supply of coolant to the cold plate, and individually controlling heating of each zone of the plurality of zones.Type: GrantFiled: May 23, 2023Date of Patent: January 21, 2025Assignee: Advantest Test Solutions, Inc.Inventors: Karthik Ranganathan, Gregory Cruzan, Paul Ferrari, Samer Kabbani, Martin Fischer
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Patent number: 12196738Abstract: A soil testing device includes at least one sensor assembly, after the sensor assembly is inserted into soil, the sensor assembly and the soil cooperatively form a battery cell; and an analog meter, electrically connected with the at least one sensor assembly, the at least one sensor assembly is configured to transmit a micro current of the battery cell reflecting a measure of soil characteristic to the analog meter, the analog meter is configured to display a value reflecting the soil characteristic.Type: GrantFiled: August 14, 2022Date of Patent: January 14, 2025Inventor: Jian Yu
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Patent number: 12190704Abstract: A moisture sensor includes a circuit board and a plurality of circuits monitoring a plurality of moisture probes, wherein at least two sets of a plurality of probes are on the bottom of the sensor, one set in direct contact with the floor, a second set separated from the floor; a set of conductive pins that enable the body of the circuit board to be spaced from the floor to help any moisture accumulation beneath the sensor to evaporate, preventing mold growth; two sets of a plurality of probes along the edge of the sensor, such that when the sensor is installed edge on, these edge sensors will be in direct contact with the floor. The sensor transmits data periodically when sensed resistance is below a predetermined value.Type: GrantFiled: June 30, 2021Date of Patent: January 7, 2025Assignee: ENCO ELECTRONIC SYSTEMS, LLCInventors: Terry Lance Beasley, Daniel L. Dietzen, Gary H. Dietzen, Ronald R. Murphy
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Patent number: 12181531Abstract: A warning method for battery thermal runaway includes: acquiring current temperature data of each temperature sensor arranged in a battery pack, current voltage data of each voltage sensor arranged in the battery pack, and current sensor disconnection data of each temperature sensor; calculating a number of occurrences of a primary feature at a current moment according to the current temperature data; calculating a number of occurrences of a secondary feature at the current moment according to the current voltage data and the current sensor disconnection data in a case that the number of occurrences of the primary feature is greater than 0; calculating a sum of the number of occurrences of the primary feature and the number of occurrences of the secondary feature at the current moment; and sending a warning for battery thermal runaway when the sum is greater than a preset feature number threshold.Type: GrantFiled: November 28, 2022Date of Patent: December 31, 2024Assignee: BYD COMPANY LIMITEDInventors: Linwang Deng, Yonggang Yin, Tianyu Feng, Sijia Liu
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Patent number: 12174146Abstract: An apparatus for and a method of measuring permanent-magnet eddy-current loss is provided. A magnetic flux density measured in a Gaussmeter 60 is fed back to a control device 70, and thus operation of a power supply 80 is automatically controlled. Accordingly, an experiment can be efficiently conducted. A non-magnetic and non-conductive measurement jig 30 blocks heat generated in a permanent magnet sample from being dissipated to an iron core 10. Accordingly, eddy-current loss occurring in the permanent magnet sample 40 can be measured more precisely.Type: GrantFiled: June 2, 2022Date of Patent: December 24, 2024Assignees: HYUNDAI MOTOR COMPANY, KIA CORPORATION, IREA SYSTEM INDUSTRYInventors: Seok Jin Ha, Ho Jin An, Min Uk Lee
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Patent number: 12174228Abstract: An apparatus and a system measure electrical power with improved accuracy as a result of compensating for sources of thermal energy that are not caused by the electrical power of the electrical circuit under test. The apparatuses and systems provide a separate electrical signal source (e.g. RF electrical circuits under test) and DC sides. The apparatuses and systems include devices adapted to convert thermal energy into voltages having reversed polarities. The apparatuses and systems are adapted to compensate for temperature changes not caused by the electrical power of the electrical circuit under test (e.g., ambient temperature change and thermal energy transmitted through the signal transmission lines from sources in the electrical circuit).Type: GrantFiled: August 15, 2022Date of Patent: December 24, 2024Assignee: KEYSIGHT TECHNOLOGIES, INC.Inventor: Ghazali Bin Hussin
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Patent number: 12135351Abstract: An integrated circuit (IC) includes: a first functional analog pin or pad; a first analog test bus coupled to the first functional analog pin or pad; first and second analog circuits coupled to the first analog test bus; and a test controller configured to: when the IC is in a functional operating mode, connect an input or output of the first analog circuit to the first analog test bus so that the input or output of the first analog circuit is accessible by the first functional analog pin or pad, and keep disconnected an input or output of the second analog circuit from the first analog test bus, and when the IC is in a test mode, selectively connect the input or output of the first and second analog circuits to the first analog test bus to test the first and second analog circuits using the first analog test bus.Type: GrantFiled: February 3, 2022Date of Patent: November 5, 2024Assignee: STMicroelectronics S.r.l.Inventor: Filippo Colombo
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Patent number: 12105126Abstract: An electronic device and phase detector are provided. The phase detector includes a first input terminal, a second input terminal, a first input buffer, and a second input buffer. The first input buffer is electrically connected to the first input terminal. The second input buffer is electrically connected to the second input terminal.Type: GrantFiled: June 12, 2023Date of Patent: October 1, 2024Assignee: NANYA TECHNOLOGY CORPORATIONInventor: Wu-Der Yang
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Patent number: 12099035Abstract: Provided are methods and system for hydrocarbon exploration. The method may include using a downhole reconfigurable pipe inspection tool for electromagnetic logging. The method may also include using the electromagnetic pipe inspection tool for inspecting wellbore pipes. The tool may include at least two modules, a signal generator for exciting the transmitter coil; and a receiver circuitry for measuring voltage across the receiver coil, wherein at least one tool parameter is reconfigurable. The first module houses a transmitter coil, a first end, and a second opposing end, wherein the first and second ends each have a connector thereon. The second module houses a receiver coil, a first end, and a second opposing end, wherein the first and second ends of the second module each have a connector thereon.Type: GrantFiled: December 1, 2021Date of Patent: September 24, 2024Assignee: Halliburton Energy Services, Inc.Inventors: Ahmed Fouda, Junwen Dai
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Patent number: 12092610Abstract: High-speed tubular inspection systems include a frame at least one magnetic flux generator contained in a coil annulus and a detector assembly each having inlet and outlet openings for passing a tubular member there through. The detector assembly has one or more magnetic detectors and one or more eddy current detectors configured to be spaced a first distance from the tubular member during an inspection. The detectors are each contained in one or more EMI detector shoes. A conveyor supports the frame and a drive mechanism configured to drive the tubular member through the coil annulus (or drive the coil annulus past the tubular member) at high-speeds.Type: GrantFiled: July 20, 2022Date of Patent: September 17, 2024Assignee: SCAN SYSTEMS, CORPInventors: Danny Uselton, John Tolman, John Zeigler
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Patent number: 12085603Abstract: A noise monitoring apparatus includes a row selection circuit, a direct current (DC) cancellation circuit and an amplifier circuit. The row selection circuit selects a row of a DUT array to be a selected row during a readout period, wherein the selected row comprises a plurality of selected DUTs. The DC cancellation circuit is coupled to unselected DUTs of the DUT array during the readout period, generates a DC current signal based on bias current signals from a group of unselected DUTs and subtract the DC current signal from a first noise signal of the selected DUT to generate a second noise signal. The amplifier circuit is coupled to the plurality of selected DUTs of the selected row during the readout period, and amplifies the second noise signal from each of the selected DUTs to generate an output signal.Type: GrantFiled: August 2, 2022Date of Patent: September 10, 2024Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.Inventors: Chin Yin, Chih-Lin Lee, Kuo-Yu Chou
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Patent number: 12067910Abstract: A display panel includes: a display including pixel columns electrically connected to data lines; a non-display area adjacent the display; a test circuit configured to receive a lighting test signal passing through at least a portion of the non-display area and to transfer the lighting test signal to the data lines in response to a test control signal; and a switch configured to receive a data signal from an external component and to transfer the data signal to the data lines in response to a switching signal.Type: GrantFiled: June 18, 2021Date of Patent: August 20, 2024Assignee: Samsung Display Co., Ltd.Inventors: Won-Kyu Kwak, Hwan-Soo Jang, Seung-Kyu Lee
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Patent number: 12044640Abstract: A method uses the nuclear spin singlet of three hydrogen atoms on the dopamine benzene ring to achieve selective detection of dopamine signals in a complicated system. The present invention is based on magnetic resonance technology to detect dopamine, has good accuracy, sensitivity and selectivity, can accurately detect the signal of dopamine from the complicated system, and the interference of signals of other substances are well eliminated. Meanwhile, the present invention further has the advantages of simple operation and non-intervention, can be used for monitoring the content and distribution of the dopamine in a living body, and has important application value in the fields of biology and medicine.Type: GrantFiled: November 29, 2019Date of Patent: July 23, 2024Assignee: EAST CHINA NORMAL UNIVERSITYInventors: Yefeng Yao, Jiaxiang Xin, Huixia Liu, Daxiu Wei
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Patent number: 12044724Abstract: A chip testing method and apparatus, and an electronic equipment are provided. The method includes: determining, according to pad distribution information of a target chip, positions of set state pads and positions of non-set state pads in the target chip, the set state pads being pads with set states, and the set states including a first state or a second state; determining a plurality of pad state setting schemes according to the positions of the set state pads and the positions of the non-set state pads, the pad state setting schemes including setting each of the non-set state pads to the first state or the second state; and determining a test voltage setting scheme satisfying a preset condition according to information of differential voltage pad pairs in each of the pad state setting schemes, the differential voltage pad pair comprising two adjacent pads in different states.Type: GrantFiled: January 17, 2022Date of Patent: July 23, 2024Assignee: CHANGXIN MEMORY TECHNOLOGIES, INC.Inventor: Hang Gao
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Patent number: 12038462Abstract: An electronic device and phase detector are provided. The phase detector includes a first input terminal, a second input terminal, a first input buffer, and a second input buffer. The first input buffer is electrically connected to the first input terminal. The second input buffer is electrically connected to the second input terminal.Type: GrantFiled: August 5, 2022Date of Patent: July 16, 2024Assignee: NANYA TECHNOLOGY CORPORATIONInventor: Wu-Der Yang
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Patent number: 12013362Abstract: An apparatus to detect a liquid in a wafer processing device includes a first conductor proximate the wafer processing device. The apparatus includes a second conductor spaced apart from the first conductor and proximate the wafer processing device. The apparatus includes a liquid absorption material surrounding the first conductor and the second conductor. The apparatus includes a current source coupled to the first conductor. The apparatus includes a current detector coupled to at least one of the first conductor or the second conductor. The liquid absorption material establishes a conductive pathway between the first conductor and the second conductor when the liquid absorption material absorbs the liquid in the wafer processing device. A current is generated, by the current source, in at least one of the first conductor or the second conductor through the conductive pathway. The current detector detects the current.Type: GrantFiled: April 18, 2022Date of Patent: June 18, 2024Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LIMITEDInventors: Eric Chen, Snap Wang, James Wu
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Patent number: 12000876Abstract: A capacitive sensing system includes a controller, a node connected to one side of a capacitance, the controller configured to measure the capacitance by measuring a time for a voltage across the capacitance to reach a predetermined reference voltage, a noise measurement circuit configured to measure electrical noise on the node, and the controller receiving the measurement of noise from the noise measurement circuit.Type: GrantFiled: August 14, 2019Date of Patent: June 4, 2024Assignee: TEXAS INSTRUMENTS INCORPORATEDInventors: Krishnasawamy Nagaraj, Paul Kimelman, Abhijit Kumar Das
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Patent number: 11994493Abstract: A method identifies a cause of change in magnetic permeability of an object under inspection and evaluates the state of surface treatment(s) of the object under inspection with high accuracy. An embodiment of the method includes preparing a non-destructive inspection apparatus; placing the object under inspection; generating eddy current in the object under inspection; continuously changing the penetration depth of an AC magnetic field in the object under inspection; calculating the value of impedance at each penetration depth in the object under inspection; and evaluating the state of the surface treatment(s) by: calculating the ratio between the value of impedance at each penetration depth in the object under inspection and the value of impedance at a corresponding penetration depth in steel which has not been subjected to a surface treatment; and identifying a cause of a change in magnetic permeability of the object under inspection based upon the calculated ratio.Type: GrantFiled: January 17, 2020Date of Patent: May 28, 2024Assignee: SINTOKOGIO, LTD.Inventor: Yoshiyasu Makino
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Patent number: 11973498Abstract: Front-end circuits that combine inductive and capacitive sensing are described. In one embodiment, an apparatus includes a plurality of inductive elements, an inductive measurement circuit, and a frequency divider circuit. The inductive measurement circuit is to output a first signal with a first frequency. The first signal is associated with an inductance change of one of the inductive elements. A feedback circuit can maintain the sinusoidal operation of the first signal. The frequency divider circuit can generate a second signal with a second frequency that is lower than the first frequency.Type: GrantFiled: December 21, 2022Date of Patent: April 30, 2024Assignee: Cypress Semiconductor CorporationInventors: Paul M. Walsh, Kofi Makinwa, Matheus Pimenta, Ça{hacek over (g)}ri Gürleyük, Dermot Macsweeney, Daniel O'Keeffe, Dennis Seguine