Patents Examined by Raul Rios Russo
  • Patent number: 9529481
    Abstract: An electrode layer has a plurality of substantially parallel electrodes disposed along a first direction. At least one electrode has a length along the first direction and a width from a first edge to a second edge along a second direction transverse to the first direction. At least one electrode comprises across its width at least one edge section, at least one intermediate section, and at least one central section, wherein an intermediate section is disposed along the electrode width between an edge section and the central section. At least one electrode edge section and intermediate section includes a plurality of electrically isolated regions arranged in a pattern along the electrode length. An electrode conductive area of the edge section is less than an electrode conductive area of the intermediate section.
    Type: Grant
    Filed: February 11, 2013
    Date of Patent: December 27, 2016
    Assignee: 3M INNOVATIVE PROPERTIES COMPANY
    Inventors: Roger W. Barton, Billy L. Weaver, Matthew W. Gorrell, Brock A. Hable
  • Patent number: 9523785
    Abstract: A method for determining geological subsurface resistivity. The method includes obtaining a set of lightning parameters associated with a lighting strike received by a geological volume of material, the set of lightning parameters including an indicium of the current of the lightning strike at a first initial time and an indicium of the current of the lightning strike at a first decay time subsequent to the first initial time, and inferring the resistance of the volume of geological material, at least in part, from the set of lightning parameters.
    Type: Grant
    Filed: August 4, 2014
    Date of Patent: December 20, 2016
    Assignee: Dynamic Measurement, LLC
    Inventors: L. R. Denham, H. Roice Nelson, Jr., D. James Siebert
  • Patent number: 9519015
    Abstract: Among other things, one or more systems and techniques for transition time evaluation of a circuit are provided herein. In some embodiments, a comparator is configured to receive a circuit signal from the circuit. The circuit signal is evaluated by the comparator based upon one or more control voltages to create one or more voltage waveforms. In some embodiments, the one or more voltage waveforms have substantially similar slopes. A time converter, such as a time-to-current converter or a time-to-digital converter, is used to evaluate the one or more output waveforms to determine a transition time, such as a rise time or a fall time, of the circuit. In some embodiments, the one or more output waveforms are used to reconstruct a transition waveform representing a waveform of the circuit signal.
    Type: Grant
    Filed: January 29, 2014
    Date of Patent: December 13, 2016
    Assignee: Taiwan Semiconductor Manufacturing Company Limited
    Inventors: Yang Chung-Chieh, Chih-Chiang Chang, Chung-Ting Lu, Chung-Peng Hsieh
  • Patent number: 9519319
    Abstract: Various embodiments described herein include systems, methods and/or devices for dissipating heat generated by electronic components in an electronic system (e.g., a memory system that includes closely spaced memory modules). In one aspect, an electronic assembly includes a first circuit board, a second circuit board flexibly coupled to the first circuit board, a connecting module coupled to the second circuit board, and a fastener. The fastener is configured to couple the first circuit board to the connecting module such that the first circuit board and the second circuit board are substantially parallel and are separated by a space, wherein the space forms at least part of a channel that is configured to direct airflow through the space between the first circuit board, second circuit board, and connecting module.
    Type: Grant
    Filed: April 3, 2014
    Date of Patent: December 13, 2016
    Assignee: SANDISK TECHNOLOGIES LLC
    Inventors: David Dean, Robert W. Ellis
  • Patent number: 9513360
    Abstract: A method for testing mainframe performance of different types of PD detectors based on analog voltage signal injection, the method comprises: using a function generator (19) with an adjustable output frequency of 0 to 3.5 GHz and an adjustable output amplitude of 0 to 10V, directly injecting or injecting via a DC blocking element (28) with a frequency band of 10 kHz to 10 MHz equivalent analog voltage signals generated by said function generator (19) based on PD waveforms actually tested by a pulse current PD detection sensor (6), an ultrasound PD detection sensor (12,13) and a UHF PD detection sensor (9) into mainframes of a pulse current PD detector, an ultrasound PD detector and a UHF PD detector respectively. The advantages are that the test method is universalized and standardized, the test result is reproducible and measurable, the application scope of the test object is wide, and the test content is comprehensive.
    Type: Grant
    Filed: August 12, 2014
    Date of Patent: December 6, 2016
    Assignee: The Electric Power Research Institute of Yunnan Power Grid Company Limited
    Inventors: Ke Wang, Xianping Zhao, Junyu Dong, Xiangyu Tan, Jing Peng, Enxin Xiang
  • Patent number: 9507468
    Abstract: An electromechanical polymer (EMP) sensor includes (a) a first set of EMP layers provided between a first electrode and a second electrode forming a capacitor, the first set of EMP layers having one or more EMP layers capable of being activated by application of a voltage across the first and second electrodes; and (b) a sensing circuit coupled to the first electrode and the second electrode for detecting a change in capacitance or a change in voltage across the first and second electrodes. The EMP sensor may further include means for disconnecting the second electrode from a ground reference after the pre-determined voltage is applied, such that the sensing circuit senses a change in capacitance. The sensing circuit may be capable of detecting a noise portion of a voltage across the first and second electrode.
    Type: Grant
    Filed: August 30, 2013
    Date of Patent: November 29, 2016
    Assignee: Novasentis, Inc.
    Inventors: Li Jiang, Lawrence Wang, Matthew Douglas Rogge, Brian Zellers, Christophe Ramstein
  • Patent number: 9506956
    Abstract: A detection apparatus that detects a state of power has a first current transformer that measures a first current on a side of a first power line with respect to a connecting point between the first power line extending from a commercial power supply and a second power line extending from a power generation means that supplies power having the same frequency as the commercial power supply, a second current transformer that measures a second current on a side of the second power line with respect to the connecting point, a first current direction detector that detects a direction of the first current, a second current direction detector that detects a direction of the second current, and an exclusive OR calculator that calculates an exclusive OR between a detected value of the direction of the first current and a detected value of the direction of the second current.
    Type: Grant
    Filed: October 23, 2012
    Date of Patent: November 29, 2016
    Assignee: OMRON Corporation
    Inventors: Hiroshi Imai, Ryota Akai, Chen Chen, Yasukazu Ohno
  • Patent number: 9500716
    Abstract: The present disclosure is a system for monitoring power that has a unified polyphase distribution transformer monitoring (PDTM) device that interfaces with at least three electrical conductors electrically connected to a transformer. In addition, the PDTM device measures a current and a voltage of each of the three electrical conductors. Additionally, the system has logic that calculates values indicative of power corresponding to the transformer based upon the currents and the voltages measured and transmit data indicative of the calculated values.
    Type: Grant
    Filed: March 31, 2014
    Date of Patent: November 22, 2016
    Assignee: GRID 20/20, Inc.
    Inventors: Randall Turner, Michael Vandenberg, Lan Xu, John Cecil Kuurstra
  • Patent number: 9500723
    Abstract: A magnetic field detection device and a corresponding method for detecting a magnetic field. The magnetic field detection device includes a coil core, a receiving coil coupled to the coil core, a plurality of electrically separated field coils coupled to the coil core, an excitation unit for generating a magnetic field excitation via a particular excitation current of the plurality of field coils coupled to the coil core and an evaluation unit for evaluating a magnetic field signal received via a receiving coil coupled to the coil core.
    Type: Grant
    Filed: October 11, 2013
    Date of Patent: November 22, 2016
    Assignee: Robert Bosch GmbH
    Inventors: Tamer Sinanoglu, Amin Jemili
  • Patent number: 9494538
    Abstract: A moisture sensor that has a drive electrode and a separate sense electrode is described. Both electrodes have surfaces that face the sensed material and the surfaces are co-planar. The drive electrode receives an excitation signal and generates an electric field that produces a current in the sense electrode. The current is indicative of moisture in the sensed material.
    Type: Grant
    Filed: April 4, 2014
    Date of Patent: November 15, 2016
    Assignee: Deere & Company
    Inventors: Andrze J Kozicki, Michael Tuchscherer, Michael L. Rhodes, Jefrey S. Wigdahl, James J. Phelan, Brian J. Booth, Jerry B. Hall
  • Patent number: 9482627
    Abstract: A method of inspection of a tire was developed using microwave imaging comprising the steps of selecting a plurality of regions from within a tire to be imaged; determining the dielectric properties of the tire components in each of the selected regions in a plurality of frequency bands; selecting a specific location on a tire to be imaged; providing a scanning platform for microwave imaging of the tire; imaging the selected location on a tire using microwave imaging at a plurality of microwave scanning frequencies and at a selected microwave polarization to obtain images of the internal state of the sample; and filtering the images to remove the effects of curvature of the selected location of the tire.
    Type: Grant
    Filed: July 28, 2014
    Date of Patent: November 1, 2016
    Assignees: Michelin Recherche et Technique S.A., Compagne Generale des Etablissements Michelin
    Inventors: Reza Zoughi, Mohammad Tayeb Ghasr
  • Patent number: 9470657
    Abstract: The invention relates to a method and apparatus for measuring lay length of a wire rope having a number or external strands to form a rope having spiral grooves in the surface between the strands. A magnetic flux circuit is generated, part of which is formed within a region of the advancing wire rope. Variations of magnetic field around the region of the rope or variations of magnetic flux entering or leaving the rope are sensed by at least two sensors arranged around the rope. Signals from the sensors are subtractively combined to eliminate variations due to off-axis movements of the rope, and the combined signals reveal an oscillating pattern due to the undulating surface of the rope. Linking the oscillating pattern to distance along the rope reveals the lay length, which corresponds to a number of oscillations which is the same as the number of strands at the surface.
    Type: Grant
    Filed: October 4, 2012
    Date of Patent: October 18, 2016
    Assignee: Her Majesty the Queen in Right of Canada as Represented by the Minister of Natural Resources Canada
    Inventor: Sylvain Ouellette
  • Patent number: 9466245
    Abstract: The present invention provides a pixel driving circuit and a driving method thereof, and a display apparatus, which can raise starting point for writing a data, ensure time for writing the data, and avoid distortion of the written data. The pixel driving circuit comprises a reset module, a data write module, an output module and a pre-charging module, wherein during a period after a reset stage and before inputting of a row driving signal, the pre-charging module performs a step of pre-charging.
    Type: Grant
    Filed: July 29, 2014
    Date of Patent: October 11, 2016
    Assignee: BOE TECHNOLOGY GROUP CO., LTD.
    Inventor: Zhanjie Ma
  • Patent number: 9459307
    Abstract: An in-circuit testing auto open and close system, apparatus and method includes an in-circuit tester having an upper panel and a lower panel, wherein the upper and lower panels are used to test electrical connections of one or more electronic units. One or more actuators are each coupled to both the upper panel and the lower panel such that they are able to move the upper and lower panels with respect to each other. As a result, a controller coupled with the in-circuit tester and the actuators is able to cause the actuators to automatically close the panels such that the panels sandwich the electronic units at the beginning of a testing program and to automatically open the panels such that the panels are separated at the end of the testing program.
    Type: Grant
    Filed: March 5, 2014
    Date of Patent: October 4, 2016
    Assignee: Flextronics AP, LLC
    Inventors: Juan Francisco Duran Hernandez, Jose Antonio Becerra Castrejon
  • Patent number: 9455564
    Abstract: A current and voltage module is provided that includes a housing having an opening extending at least partially therethrough in an axial direction. The housing is configured to receive a conductor within the opening. The module also includes a threaded metal insert extending radially through the housing and configured to align with a threaded opening defined in the conductor. The module further includes a fastening device configured to be inserted within the threaded metal insert and into the threaded opening to electrically couple the housing to the conductor. A voltage sensor is coupled to the threaded metal insert within the housing and is configured to sense an amount of voltage in the conductor. The module also includes a current sensor within the housing configured to sense an amount of current flowing in the conductor.
    Type: Grant
    Filed: February 21, 2014
    Date of Patent: September 27, 2016
    Assignee: General Electric Company
    Inventor: Cecil Rivers, Jr.
  • Patent number: 9435847
    Abstract: Methods for testing a special pattern and testing a probe card defect in wafer testing are provided. In the method for testing the special pattern, a wafer is divided into multiple testing partitions, in which each of the testing partitions includes multiple dies. The dies in each testing partition of the wafer are respectively tested by multiple sites of the probe card to obtain a testing map. Then, a number of the dies having defects and a number of the dies without defect within each of the testing partitions in the testing map are accumulated to construct chi-square test and calculate a maximum P-value. Finally, it is determined whether a minimum of the maximum P-values of all of the testing partitions is smaller than a certain predetermined threshold. If the minimum is smaller than the threshold, it is determined that the testing map of the wafer contains the special pattern.
    Type: Grant
    Filed: June 26, 2014
    Date of Patent: September 6, 2016
    Assignee: MACRONIX International Co., Ltd.
    Inventors: Shih-Hsien Chang, Kai-Wen Tu, Yen Lin, Ching-Ren Cheng
  • Patent number: 9436215
    Abstract: A device to detect and quantify a force applied on a surface includes a test specimen, an electrically insulating substrate, a first electrode bound to the substrate, a second electrode, an assembly of conductive or semi-conductive nanoparticles in contact with the two electrodes, and a measurement device. The measurement device provides proportional information with respect to an electrical property of the nanoparticles assembly. The electrical property is measured between the first and second electrode. The test specimen is the nanoparticles assembly itself and the electrical property is sensitive to the distance between the nanoparticles of the assembly. The nanoparticles assembly itself is used as a test specimen and allows a force to be quantified even if the nanoparticles assembly is deposited on a rigid substrate.
    Type: Grant
    Filed: June 9, 2015
    Date of Patent: September 6, 2016
    Assignee: NANOMADE CONCEPT
    Inventors: Benoît Viallet, Laurence Ressier, Jérémie Grisolia, Lionel Songeon, Eric Mouchel La Fosse, Lukas Czornomaz
  • Patent number: 9429625
    Abstract: An analog test network includes a conductor. The conductor is coupled to provide a first analog signal from a circuit under test to an analog-to-digital converter circuit. The analog-to-digital converter circuit is operable to generate a first digital signal based on the first analog signal. A control circuit is operable to generate a second digital signal based on the first digital signal. A digital-to-analog converter circuit is operable to generate a second analog signal based on the second digital signal. The conductor is coupled to provide the second analog signal from the digital-to-analog converter circuit to the circuit under test.
    Type: Grant
    Filed: May 18, 2012
    Date of Patent: August 30, 2016
    Assignee: Altera Corporation
    Inventors: Weiqi Ding, Sergey Shumarayev
  • Patent number: 9425798
    Abstract: A semiconductor device capable of reconfiguration, including: a plurality of logic units which configure an array and are connected to each other, wherein each logic unit includes a pair of a first and a second memory cell units, each of the first and the second memory cell units operates as a logic element when truth value table data is written in, which is configured so that a logic calculation of an input value specified by a plurality of addresses is output to a data line, and/or operates as a connection element when truth value table data is written in, which is configured so that an input value specified by a certain address is output to a data line to be connected to an address of another memory cell unit, a latter stage of the first memory cell unit includes a sequential circuit which synchronizes with a clock, and the logic units include, for each pair of the first and the second memory cell units, a selection unit which selectively outputs an address to the first or the second memory cell unit in ac
    Type: Grant
    Filed: February 14, 2013
    Date of Patent: August 23, 2016
    Assignee: TAIYO YUDEN CO., LTD.
    Inventors: Masayuki Satou, Koshi Sato
  • Patent number: 9423422
    Abstract: A probe for a measurement instrument comprises an input terminal configured to receive an input signal from a device under test (DUT), an output terminal configured to transmit an output signal to a measurement instrument, and a clamping circuit disposed in a signal path between the input terminal and the output terminal and configured to clamp an internal probe signal between an upper clamping threshold and a lower clamping threshold to produce the output signal, wherein the clamping circuit operates with substantial gain and amplitude linearity throughout a range between the upper clamping threshold and the lower clamping threshold.
    Type: Grant
    Filed: April 24, 2013
    Date of Patent: August 23, 2016
    Assignee: Keysight Technologies, Inc.
    Inventors: Edward Vernon Brush, IV, Michael T. McTigue, Kenneth W. Johnson