Abstract: A spectral method is provided for partitioning type and loading with aerosol optical depth. Based on multi-spectral optical aerosol depth, particle-size distribution and refractive index are derived by normalizing first- and second-order derivatives for processing quantitative calibration of main components. According to the optical feature parameters of various aerosol types, a radiation theory is applied to simulate multi-spectral optical depth for each density, including those of mixed types. The intrinsic parameters of aerosol types are figured out by constructing normalized derivative aerosol indices (NDAI). The clear characteristic differences between aerosol types are used to figure out main components of aerosols and their mixing ratios. The simulation result of the normalized index of various aerosol type is in good agreement with the ground observation data of Aerosol Robotic Network. It shows that NDAI is quite practicable in quantitative calibration of main components of atmospheric aerosol.

Abstract: An injection molded article is obtained by injection molding a molten resin into a mold. The injection molded article includes: a base as a thin plate-shaped member that is connected to a gate of the mold; and a plurality of protrusions each integrally molded on the base and having a thickness greater than a plate thickness of the base. The plurality of protrusions have holes each extending through the base, and the holes in the respective protrusions are connected through another component to form a flow channel. A processed region processed to have a surface roughness greater than a surface roughness of a mirror surface region including a region between the holes on the base is formed in a projected region where a region having a predetermined thickness value is projected on the base.

Abstract: The present invention intends to enable light path length to be kept the same between sample measurement and reference measurement and thereby improve measurement accuracy, and is an optical analyzer that analyzes a sample flowing through a pipe having translucency. In addition, the optical analyzer includes: a light source unit that has a light source and a condenser lens; a light detection unit that detects light of the light source unit; and a support mechanism that movably supports the light source unit and the light detection unit. Further, the support mechanism moves the light source unit and the light detection unit between a sample measurement position and a reference measurement position.

Abstract: This fluid evaluation device is provided with an irradiation unit for irradiating a fluid with light, a light reception unit for receiving scattered light from the fluid and outputting a light reception signal, and an estimation unit for estimating at least one from among flow rate and density by mapping input points, which are on a first plane defined by flow rate and frequency and are expressed by light amount information indicating the amount of scattered light included in the light reception signal and frequency information indicating a frequency for a beat signal resulting from the Doppler shifting of the light included in the light reception signal, onto a second plane defined by fluid flow rate and fluid density.

Abstract: A shape measuring apparatus applies, to a light beam, a periodic pattern having periodicity in a direction perpendicular to an optical axis and displaceable in the direction perpendicular to the optical axis, relatively displaces a focal point of an objective lens in a direction parallel to the optical axis, and calculates, based on amplitude of intensity of the light beam detected by a photodetector, face shape data on the object to be measured. Then, a top surface measuring step of acquiring face shape data on a top surface of the object to be measured, and a bottom surface measuring step of acquiring face shape data on a bottom surface of the object to be measured by transmitting through the top surface of the object to be measured and aligning the focal point of the objective lens on the bottom surface of the object to be measured are performed.

Abstract: A system for measuring the spatial distribution of the spectral emission of a measurement zone of an object, comprises: a first objective; means for selecting a portion of an image formed by the first objective; a diaphragm; light-dispersing means located in the vicinity of the diaphragm and allowing the light coming from the selecting means to be dispersed; and a second objective placed between the selecting means and the diaphragm, interacting with the first objective so that the aperture of the diaphragm is optically conjugated with the measurement zone by the first and second objectives. The first objective forms an image on a predetermined Fourier surface on which each point corresponds to an emission direction of the object for one particular wavelength. The selecting means have a selection surface shaped depending on the predetermined. Fourier surface, and the selecting means are placed on the predetermined Fourier surface.

Abstract: A system for optical imaging of defects on unpatterned wafers that includes an illumination module, relay optics, a segmented polarizer, and a detector. The illumination module is configured to produce a polarized light beam incident on a selectable area of an unpatterned wafer. The relay optics is configured to collect and guide, radiation scattered off the area, onto the polarizer. The detector is configured to sense scattered radiation passed through the polarizer. The polarizer includes at least four polarizer segments, such that (i) boundary lines, separating the polarizer segments, are curved outwards relative to a plane, perpendicular to the segmented polarizer, unless the boundary line is on the perpendicular plane, and (ii) when the area comprises a typical defect, a signal-to-noise ratio of scattered radiation, passed through the polarizer segments, is increased as compared to when utilizing a linear polarizer.

Abstract: A film thickness measuring system measures thicknesses of first films of respective first substrates by spectroscopy, captures first image data of surfaces of second substrates each having a second film to acquire first color information of the surfaces of the second substrates, and calculates a correlation between a thickness of the second film and color information of the surface of the second substrate by using the measured thickness of the first films and the first color information. When estimating a thickness of a third film of a third substrate, the film thickness measuring system acquire second color information of the surface of the third substrate by using captured image data of the third substrate, and estimates a thickness of the third film in the second region, by using the calculated correlation and the second color information.

Abstract: Aspects of the present disclosure include methods for modulating an intensity profile of a laser beam. Methods according to certain embodiments include irradiating an acousto-optic device with a laser to generate an output laser beam having a plurality of angularly deflected laser beams, capturing an image of the output laser beam, determining an intensity profile of the output laser beam along a horizontal axis from the captured image and adjusting one or more parameters of a waveform inputted into the acousto-optic device in response to the determined intensity profile to generate an output laser beam having a modulated intensity profile. Systems having a laser, an acousto-optic device, an imaging sensor and a waveform generator as well as non-transitory computer readable storage medium with instructions for practicing the subject methods are also described.

Abstract: There is provided a profile measuring apparatus, including: an irradiation section configured to irradiate a measurement light to a measurement area of the object; an imaging section configured to obtain an image of the measurement area; a table configured to place the object thereon; a coordinate calculation section configured to calculate a position of the measurement area based on an image detected by a detection section; and a positioning mechanism configured to drive and control a relative position of the imaging section and the table. The positioning mechanism calculates a relative position of the imaging section to the table, based on an information with respect to an edge line direction of a convex portion or an extending direction of a concave portion in the measurement area of the object having a repetitive concave-convex shape, to move at least one of the table and the imaging section.

Abstract: A smoke detector for an air duct includes a photoelectric detection system and an air flow pathway in fluid communication with the air duct. The air flow pathway includes an inlet, an optic tube, and an outlet. The photoelectric detection system includes a circuit board having at least one light emitter and at least one light receiver mounted thereon. The optic tube passes through the circuit board and between the at least one light emitter and at least one light receiver.

Abstract: A method of measuring thickness of a liquid layer includes applying a light beam to a liquid layer disposed on a surface of a member, detecting reflected light by a sensor, and analyzing the reflected light according to a spectral interference method with a curve fitting technique to determine the thickness of the liquid layer.

Abstract: A purpose of the present invention is to provide an optical measurement system or the like suitable for optical measurement of nucleic acids, proteins, etc. In a first aspect of the present invention, an optical measurement system that provides optical sample measurement comprises: an optical cell having a sample-holding hollow portion; and a light source unit that emits broadband light containing first and second light to the optical cell. The optical cell includes: a first light guide where light passes through a first transparent portion that transmits the first light more readily than the second light and the hollow portion without passing through a second transparent portion that transmits the second light more readily than the first light; and a second light guide that differs from the first light guide, in which light passes through the second transparent portion and the hollow portion without passing through the first transparent portion.

Abstract: An object surface data detection method and system, an electronic apparatus, and a storage medium. The object surface data detection method, applied to a three-dimensional scanning system comprising detection auxiliary devices and a scanning device, includes: obtaining a unified coordinate system established for the detection auxiliary devices, wherein a number of the detection auxiliary devices is at least two; respectively obtaining first scan data of the scanning device scanning a surface of an object and tracking results of the detection auxiliary devices tracking the scanning device; and comprehensively calculating the tracking results, the first scan data, and the unified coordinate system to obtain an object surface detection result.

Abstract: A drifting and measurement tool is disclosed. The tool includes a first portion configured to mount on a first end of a tubular segment, and a second portion configured to mount on a second end of the tubular segment. The first portion has a rotatable component configured to rotate about a longitudinal axis of the tubular segment. The rotatable component includes a laser device configured to emit light toward the second portion and receive reflected light.

Abstract: A chromatic range sensor (CRS) system is provided that determines a workpiece thickness and includes an optical pen, an illumination source, a wavelength detector and a processing portion. The optical pen includes an optics portion providing axial chromatic dispersion, the illumination source is configured to generate multi-wavelength light and the wavelength detector includes a plurality of pixels distributed along a measurement axis. In operation, the optical pen inputs a spectral profile from the illumination source and outputs corresponding radiation to first and second workpiece surfaces of a workpiece (e.g., which may be transparent) and outputs reflected radiation to the wavelength detector which provides output spectral profile data. The processing portion processes the output spectral profile data to determine a thickness of the workpiece.

Abstract: Disclosed herein is a method for increasing signal-to-noise (SNR) in optical imaging of defects on unpatterned wafers. The method includes: (i) irradiating a region of an unpatterned wafer with a substantially polarized, incident light beam, and (ii) employing relay optics to collect and guide, radiation scattered off the region, onto a segmented polarizer comprising at least four polarizer segments characterized by respective dimensions and polarization directions. The respective dimensions and polarization direction of each of the at least four polarizer segments are such that an overall power of background noise radiation, generated in the scattering of the incident light beam from the region and passed through all of the at least four polarizer segments, is decreased as compared to utilizing a linear polarizer.

Abstract: A measurement probe of the present disclosure that scans a surface of a measurement object to measure a three-dimensional shape or the like of the surface of the measurement object includes a first movable portion having a stylus, a second movable portion that is connected to the first movable portion to be movable in a Z direction, a third movable portion that is connected to the second movable portion to be movable in the Z direction, a first position measurer that measures a first position of the first movable portion in the Z direction, a second position measurer that measures a second position of the second movable portion in the Z direction, and a third position measurer that measures a third position of the third movable portion in the Z direction. A first relative position is calculated based on the first position and the second position. A second relative position is calculated based on the first position and the third position.

Abstract: A particle monitoring device includes a camera sensor for imaging particles, a set of light sources, and an optical component. A first light source provides light of a first color component. A second light source provides light of a second color component. The optical component receives light of the first color component in a first direction from the first light source, and redirects the light of the first color component in an output direction towards the particles to illuminate the particles using light of the first color component. The optical component receives light of a second color component in a second direction, different from the first direction, from the second light source, and redirects the light of the second color component in the output direction towards the particles to illuminate the particles using light of the second color component.

Abstract: The impact of a stabilizing additive for treating oil-based fluids having destabilized solids, such as asphaltenes and polynuclear aromatics, may be quantitatively assessed, by determining the settling rate of flocculated destabilized solids in samples of untreated oil-based fluids and oil-based fluids treated with the stabilizing additive through the use of a turbidity meter or nephelometer while the field and quantifying the difference between the two settling rates to determine if a change in the amount of stabilizing additive applied to the oil-based fluid is necessary.