Patents Examined by Rebecca C Bryant
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Patent number: 11391658Abstract: An air bubble measurement device is a device that measures the air bubbles moving in the liquid. The air bubble measurement device includes a measurement chamber that holds a liquid. The measurement chamber includes an introduction port to introduce the air bubbles in the liquid from a lower side and a transparent inclined surface that faces obliquely downward and is disposed at a position to which the air bubbles present inside the liquid move up. The transparent inclined surface includes a hydrophilic membrane. The hydrophilic membrane has a contact angle with water of 20 degrees or less. This structural arrangement allows for reducing an attachment of the air bubbles on the transparent inclined surface even when the air bubbles become small. This allows for reducing stay of the air bubbles on the transparent inclined surface and allows for accurately measuring the states of the air bubbles (that is, the size and quantity of the air bubbles).Type: GrantFiled: September 28, 2020Date of Patent: July 19, 2022Assignee: SUMITOMO METAL MINING CO., LTD.Inventor: Shintaro Ishikawa
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Patent number: 11391710Abstract: Described herein is a method for predicting the methane (CH4) emission of a dairy cow, the method including: a) determining the total amount of milk of a dairy cow per one day; b) determining the energy corrected milk value (ECM) of the milk of the dairy cow of the same day); c) determining the percentage amount of saturated fatty acids (SFAs) of the total milk fat of the dairy cow of the same day) and the percentage amount of stearic acid (C18:0) of the total milk fat of the dairy cow of the same day; d) calculating the daily amount of methane emitted by the dairy cow based on the ECM as determined according to b), the percentage amount of SFAs of the total milk fat as determined according to c), and the percentage amount of C18:0 of the total milk fat as determined according to c).Type: GrantFiled: August 30, 2018Date of Patent: July 19, 2022Assignee: Leibniz-Institut für NutztierbiologieInventors: Cornelia C. Metges, Stefanie W. Engelke, Gürbüz Das, Björn Kuhla
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Patent number: 11385154Abstract: Techniques herein include an apparatus and method for measuring and monitoring properties of fluids consumed in a semiconductor fabrication process. The apparatus includes a flow cell having a hollow chamber, a first chamber sidewall of the hollow chamber bisecting the length of the flow cell, the first chamber sidewall having a predetermined angle to the incoming direction of light from the first light source; a refractive index sensor configured to detect the light from the first light source transmitted through the hollow chamber of the flow cell and exiting the flow cell through the second flow cell sidewall of the at least six flow cell sidewalls; and a first light sensor configured to detect the light from the first light source scattered off the fluid in the hollow chamber.Type: GrantFiled: September 28, 2020Date of Patent: July 12, 2022Assignee: Tokyo Electron LimitedInventors: Ivan Maleev, Ching Ling Meng
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Patent number: 11371835Abstract: Provided is an object detection device capable of controlling to stop operation of a sensor that detects an object shape when operation of this sensor is not needed. An object detection device (1) includes a feature extraction unit (2) and a sensor activation unit (4). When an object passes an irradiation area of irradiation light from a first sensor configured to detect a feature of a part of a surface of an object by applying irradiation light, the feature extraction unit (2) extracts a feature of the object in the irradiation area. The sensor activation unit (4) activates a second sensor configured to detect an object shape when variation of the extracted feature falls below a predetermined first threshold.Type: GrantFiled: March 16, 2018Date of Patent: June 28, 2022Assignee: NEC CORPORATIONInventor: Akira Tsuji
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Patent number: 11366398Abstract: Semiconductor device metrology including creating a time-domain representation of wavelength-domain measurement data of light reflected by a patterned structure of a semiconductor device, selecting an earlier-in-time portion of the time-domain representation that excludes a later-in-time portion of the time-domain representation, and determining one or more measurements of one or more parameters of interest of the patterned structure by performing model-based processing using the earlier-in-time portion of the time-domain representation.Type: GrantFiled: July 18, 2019Date of Patent: June 21, 2022Assignee: NOVA LTDInventors: Gilad Barak, Michael Chemama, Smadar Ferber, Yanir Hainick, Boris Levant, Ze'Ev Lindenfeld, Dror Shafir, Yuri Shirman, Elad Schleifer
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Patent number: 11346760Abstract: The invention provides for methods and apparatuses for testing liquid samples using small amounts of the liquid sample in a non-destructive fashion.Type: GrantFiled: July 27, 2021Date of Patent: May 31, 2022Assignee: BIONTER AGInventor: Tobias Werk
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Patent number: 11346655Abstract: An apparatus for measuring a thread includes a holder for detachably holding a tube having a thread formed at an end of the tube. A first optical measuring section having an optical sensor is attached to a manipulator in order to move the measuring section relative to the tube. The optical measuring section is adjustably tiltable about a first adjusting axis relative to a thread axis of the thread. A second optical measuring section having a second optical sensor is arranged at the manipulator, wherein the optical measuring sections collectively form a measuring channel to provide simultaneous measurement of opposite sides of the thread of the tube.Type: GrantFiled: June 2, 2017Date of Patent: May 31, 2022Assignee: SMS GROUP GMBHInventors: Martin Sauerland, Frank d'Hone
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Patent number: 11313954Abstract: An optoelectronic sensor for detecting three-dimensional image data from a monitored zone is provided that has an illumination unit for illuminating the monitored zone with modulated transmitted light, a light receiver for a simultaneous light reception of the transmitted light remitted by objects in the monitored zone at at least two locations at a mutual distance corresponding to a first resolution pattern, and a control and illumination unit that is configured to determine times of flight from properties of the modulated and remitted transmitted light and to detect three-dimensional data in a second resolution pattern finer than the first resolution pattern by at least one measurement repetition with a light reception from at least two other locations shifted with respect to the first resolution pattern.Type: GrantFiled: June 6, 2019Date of Patent: April 26, 2022Assignee: SICK AGInventors: Martin Marra, Harmut Gimpel
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Patent number: 11313671Abstract: A confocal range sensing (CRS) system is provided including a wavelength detector, source light configuration, and one or more measurement channels. Each measurement channel is configured to sense a respective distance to a workpiece surface and includes a confocal detection aperture and confocal light source aperture. The source light configuration includes first and second phosphor compositions, a wavelength combining configuration, and a shared source light path. The first and second phosphor compositions are located in separate respective first and second phosphor regions. As part of workpiece height measurement operations, the first and second phosphor compositions emit first and second emitted light, respectively, to the wavelength combining configuration which outputs first and second emitted light along the shared source light path as source light (i.e.Type: GrantFiled: May 28, 2019Date of Patent: April 26, 2022Assignee: Mitutoyo CorporationInventor: David William Sesko
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Patent number: 11307233Abstract: In a general aspect, a vapor cell includes a body defined by a stack of layers bonded to each other. The stack of layers includes a first end layer disposed at a first end of the body and a second end layer disposed at a second, opposite end of the body. Intermediate layers extend between the first and second end layers and define an internal cavity extending through the body between the first end layer and the second end layer. Each intermediate layer includes a through-hole that defines a portion of the internal cavity through the intermediate layer. The vapor cell also includes a vapor or a source of the vapor disposed in the internal cavity.Type: GrantFiled: September 21, 2021Date of Patent: April 19, 2022Assignee: Quantum Valley Ideas LaboratoriesInventors: Hadi Amarloo, Jennifer Ann Joe Erskine, Jaime Ramirez-Serrano, Somayeh M. A. Mirzaee, James P. Shaffer
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Patent number: 11300492Abstract: Methods and apparatuses to image particles are described. A plurality of illuminating light beams propagating on multiple optical paths through a particle field are generated. The plurality of illuminating light beams converge at a measurement volume. A shadow image of a particle passing through a portion of the measurement volume at a focal plane of a digital camera is imaged. Shadow images of other particles in the particle field are removed using the plurality of illuminating light beams.Type: GrantFiled: February 11, 2020Date of Patent: April 12, 2022Assignee: ARTIUM TECHNOLOGIES, INC.Inventors: William D. Bachalo, Gregory A. Payne, Khalid Ibrahim, Michael J. Fidrich
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Patent number: 11293752Abstract: In one embodiment, a method includes inspecting a fiber weave for use in a printed circuit board with an automated optical inspection tool and identifying a distance between fiber bundles in the fiber weave. The fiber weave comprises a plurality of the fiber bundles woven to form the fiber weave and a portion of the fiber bundles comprise markers and identifying a distance between the fiber bundles in the fiber weave comprises measuring a distance between the markers.Type: GrantFiled: May 6, 2020Date of Patent: April 5, 2022Assignee: CISCO TECHNOLOGY, INC.Inventors: Amendra Koul, Yaochao Yang, Mike Sapozhnikov, Joel Richard Goergen, Kartheek Nalla
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Patent number: 11287245Abstract: In one embodiment, a method includes inspecting a layer of a printed circuit board through an inspection window comprising an opening formed in one or more other layers of the printed circuit board and identifying a location of a trace aligned with the inspection window, relative to a marker in a fiber bundle of a fiber weave to assess fiber weave skew.Type: GrantFiled: May 6, 2020Date of Patent: March 29, 2022Assignee: CISCO TECHNOLOGY, INC.Inventors: Amendra Koul, Yaochao Yang, Mike Sapozhnikov, Joel Richard Goergen, Kartheek Nalla
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Patent number: 11287360Abstract: A gas detecting device is provided to detect characteristics of a gas under test. The gas detecting device includes a shell component, a sensing component, and a dust blocking element. The shell component includes a gas passage and a groove. The gas under test passes through a detecting area on a path of the gas passage along the gas passage. The sensing component is disposed inside the shell component. The sensing component includes a substrate, a sensor, and a laser light source. The sensor and the laser light source are respectively disposed corresponding to the detecting area. The dust blocking element is detachably disposed in the groove of the shell component. The dust blocking element includes a base and a cover. The cover is light permeable.Type: GrantFiled: September 23, 2020Date of Patent: March 29, 2022Assignee: RADIANT INNOVATION INC.Inventors: Shao-Yun Yu, Tseng-Lung Lin, Yu-Chien Huang
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Patent number: 11255767Abstract: A method and a device for measuring light field distribution are provided; including steps of utilizing the optical trap to stably levitating particles, moving the optical trap to bring the particles close to the light field to be measured, and utilizing the photodetector to collect the scattered light signals of the particles at different positions in the three-dimensional space of the light field to be measured, and calculating the light field distribution of the light field to be measured according to the scattered light intensity which is proportional to the light intensity at that position. The device for measuring the optical field distribution includes a laser, an optical trapping path, particles, a photodetector, a control system and an upper computer; the laser emits a laser, passes through the optical trapping path, and emits highly focused captured light B to form an V optical trap to capture particles.Type: GrantFiled: July 10, 2021Date of Patent: February 22, 2022Assignees: Zhejiang Lab, Zhejiang UniversityInventors: Zhenhai Fu, Cheng Liu, Zhiming Chen, Xingfan Chen, Nan Li, Huizhu Hu
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Patent number: 11247705Abstract: A measurement process, intended for measuring at least one wheel of a train, including an acquisition step, during which a plurality of profiles of at least a part of the wheel are acquired by plurality of optical sensors, as the train moves in front of the optical sensors, a mapping step, during which, for each optical sensor, the profiles acquired by the optical sensor are joined by a control module, to obtain a map of the part of the wheel further transformed into a cloud of points, a rejoining step, during which the clouds of points obtained from the optical sensors are joined to form a three-dimensional image of the wheel, and an analysis step, during which a plurality of reference points and reference distances are measured on the three-dimensional image.Type: GrantFiled: May 29, 2019Date of Patent: February 15, 2022Assignee: Alstom Transport TechnologiesInventors: Danilo Esposito, Francesc-Xavier Cabre Puiggali, Pau Gratacos Marti, David Morley, Steve Dixon, Josep Forest Collado, Albert Torrent Palomeras, Albert Ciurana Ferragutcases, Joaquim Serra Mochales
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Patent number: 11248906Abstract: The invention relates to achieve a rapid, reproducible and reliable characterization of the quality of ply-by-ply machining of multilayer materials.Type: GrantFiled: November 14, 2017Date of Patent: February 15, 2022Assignee: Bayab IndustriesInventor: Francois Cenac
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Patent number: 11248903Abstract: A three-dimension measurement device includes a moving device, a projecting device, a surface-type image-capturing device and a processing device. The moving device carries an object, and moves the object to a plurality of positions. The projecting device generates a first light to the object. The surface-type image-capturing device senses a second light generated by the object in response to the first light to generate a phase image on each of the positions. The processing device is coupled to the surface-type image-capturing device and receives the phase images. The processing device performs a region-of-interest (ROI) operation for the phase images to generate a plurality of ROI images. The processing device performs a multi-step phase-shifting operation for the ROI images to calculate the surface height distribution of the object.Type: GrantFiled: December 17, 2019Date of Patent: February 15, 2022Assignee: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTEInventors: Chia-Hung Cho, Po-Yi Chang, Yi-Sha Ku, Kai-Ping Chuang, Chih-Hsiang Liu, Fu-Cheng Yang
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Patent number: 11243114Abstract: The invention relates to a method for determining at least one beam propagation parameter (M2, w0, ?, z0) of a laser beam, comprising: directing the laser beam through a lens arrangement towards a spatially resolving detector, imaging the laser beam at a plurality of different focus positions (F1, . . . ) relative to the spatially resolving detector by adjusting a focal length (f1, . . . ) of the lens arrangement, and determining the at least one beam propagation parameter (M2, w0, ?, z0) by evaluating an intensity distribution (l(x,y)) of the laser beam on the spatially resolving detector at the plurality of different focus positions (F1, . . . ). The method comprises adjusting the focal length (f1, . . . ) of the lens arrangement by arranging lens elements (A1, . . . ; B1, . . . ) having different focal lengths (fA1, . . . ; fB1, . . . ) in a beam path of the laser beam.Type: GrantFiled: September 17, 2018Date of Patent: February 8, 2022Assignee: TRUMPF Lasersystems for Semiconductor Manufacturing GmbHInventors: Viktor Granson, Jonathan Mueller, Dirk Sodtke
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Patent number: 11237089Abstract: Disclosed herein is a novel, compact, real time optical particle identification and characterization system and method of use within both gaseous and liquid media. The system can implement elastic and/or inelastic light scattering techniques simultaneously and complimentarily under the same sensor platform. By separating the sensing components from the electro-optical unit and using optical fibers for interconnection, only the sensing components need to be exposed to the environmental conditions. This reduces the design constraints on the electro-optical unit and permits the incorporation of optical components into the sensor probe that can withstand high-temperature, high-pressure, and corrosive environments. Thus, the system can be used in benign, moderate, and harsh environments.Type: GrantFiled: February 8, 2019Date of Patent: February 1, 2022Assignee: Hal Technology, LLCInventors: Hai Lin, Gregor Arthur Waldherr