Abstract: According to an apparatus for inspecting defects of a honeycomb structure that is provided with a current plate and an air current formation means (air source and a header tube), fine defects or defects taking place in the vicinity of an outer periphery of the honeycomb structure can be detected with high sensitivity.

Abstract: A measuring device for determining the relative offset between two components in a z-direction includes two measuring members. A first measuring member is affixable on a first component, and the second measuring member is affixable on a second component. Furthermore, the measuring device includes a sensor device for determining the relative position of the two measuring members. The first measuring member and the second measuring member are affixable on the first components at a rigid angle. At least one of the measuring members is able to be brought into adhesive contact with the first component or the second component. The measuring device includes support members for at least one measuring member so that the measuring member is able to assume a parking or an operating position. The measuring members are precisely and reproducibly aligned in space relative to each other in the parking position.

Abstract: There is provided an evanescent wave multimode optical waveguide sensitive to a chemical species or to a physical parameter. The optical waveguide comprises a core and a cladding having a cladding refractive index lower than that of the core for guiding light to be propagated in the optical waveguide. The cladding defines with the core an optical waveguide providing mode coupling. A chemical indicator is provided in the cladding for causing a variation of the optical absorption of the cladding as a function of the chemical species or the physical parameter. The cladding is interrogated by the evanescent wave of the propagated light. The mode coupling causes unabsorbed light power to be redistributed among the multiple modes while light propagates along the optical waveguide.

Abstract: A microfluidic device comprises inlets for a sample flow and an out-of-plane focusing sheath flow, and a curved channel section configured to receive the sample flow and out-of-plane focusing sheath and to provide hydrodynamic focusing of the sample flow in an out-of-plane direction, the out-of-plane direction being normal to a plane including the curved channel.

Abstract: Methods and apparatus for measuring ion implant dose in a material provide for: measuring a reflection spectrum through an implantation surface of the material, the implantation surface having been subjected to an ion implantation process to create a material layer from the implantation surface to a depth within the material and a layer of weakness below the material layer; storing magnitudes of the reflection spectrum as a function of respective wavelengths of incident light on the implantation surface; and computing an ion implant dose used during the ion implantation process based on comparisons of at least two magnitudes of the reflection spectrum at least two corresponding wavelengths of the incident light.

Abstract: An apparatus and method for monitoring optical fiber obstructions in an optical split network is described. The monitoring apparatus comprises a broadband-monitoring light source module, an optical circulator, an optical spectral analyzer, a high-density multi-wavelength OTDR, a controlling computer, a wavelength division multiplexer, a specific wavelength optical filter, a monitoring-waveband reflector, and an optical channel selector. The monitoring apparatus utilizes the specific wavelength optical filter and the monitoring-waveband reflector to collectively construct an optical split network optical fiber obstruction monitoring apparatus for the passive optical network having multiple split routes by filtering, reflecting, and transmitting coming lights, so as to achieve the purposes of locating the obstructed split routes and obstruction locations at the same time.

Abstract: A measuring device for measuring optical properties of transparent substrates includes a light transmitter and/or light receiver comprising a hollow cylinder having a highly reflective and diffusely dispersive inner surface. The light transmitter comprises a light source arranged in its interior and a light exit opening at a distance from the light source. The light receiver has a light sensor instead of the light source, at a distance from a light entrance opening. The light source and light sensor are arranged at such a distance from the light exit opening and light entrance opening respectively, given a corresponding direction of propagation of the light, that light emitted by the light source or received by the light sensor and multiply reflected in the hollow cylinder emerges as diffuse light from the light exit opening or is incident on the light sensor.

Abstract: Method for monitoring the velocity of growing polymer particles flowing in a two-phase stream during a polymerization process, said method comprising measuring the degree of attenuation in the propagation of light in said two-phase stream by means of a photometric instrument, said photometric instrument comprising: one or more transmitting optical waveguides connecting one or more light sources to said two-phase stream, one or more receiving optical waveguides connecting said two-phase stream to a light detector.

Abstract: A surface inspection system, as well as related components and methods, are provided. The surface inspection system includes a beam source subsystem, a beam scanning subsystem, a workpiece movement subsystem, an optical collection and detection subsystem, and a processing subsystem. The system features a variable polarization a polarizing relay assembly arranged to selectively permit the scattered light having a selected polarization orientation to pass along a detector optical axis to a light detection unit in the detection subsystem. They system also features a collector output width varying subsystem for varying the width of an output slit in response to changes in the location of the location scanned on the workpiece.

Abstract: A device and method of operation for analyzing signal features over multiple optical wavelengths is presented. A plurality of rotating thin film filters is arranged with respect to a collimated beam of light so that each thin film filter transmits light of a particular wavelength to a detector unit responsive to an angle of incidence of light upon the thin film filter when the thin film filter optically interposes the collimated light beam. Each of the plurality of thin film filters is optically interposed periodically and rotated so that the angle of incidence of light from the first input unit upon the thin film filter varies when the thin film filter is optically interposed to scan the light by wavelength within a selected wavelength band into a detector unit for measurement.

Abstract: A target substance detecting device, which is a device that has a substrate, a structure disposed on a substrate surface in isolation using a metal, and a target substance trapping substance disposed on the structure, and which is for detecting a target substance using localized plasmon resonance, characterized in that the above-mentioned structure is constructed by stacking at least two metal layers, sandwiching a non-conductive layer between the metal layers.

Abstract: The present invention relates to a method for identifying transparent objects, for example measurement cuvettes, with the aid of their absorption spectrum and therefore makes it possible to protect articles against forgery or imitation.

Abstract: A photosensitive chip, including: at least one set of photosensors substantially aligned in a Y direction; and a layer of non-transmissive material including a plurality of openings. Each opening in the plurality of openings includes a respective center line and overlaps only a portion of a respective photosensor so that only the portion of the respective photosensor is photosensitive. The respective center lines for openings for each set of photosensors are not collinear in the Y direction. In an example embodiment, the plurality of openings includes at least one row of openings substantially aligned in an X direction, orthogonal to the Y direction. In an example embodiment, each opening has an equal width in an X direction, orthogonal to the Y direction.

Abstract: A method for inspecting lenses, especially wet contact lenses provided in a volume of liquid inside a container is described. A first image of the lens at a first position in the container is obtained, the lens then being moved to a second position within the container where a second image is obtained. A computer algorithm processes the first and second images to compare features that have moved with the lens to those features that have not moved with the lens whereby lenses are rejected if a feature has moved with the lens but is not a normal feature of the lens.

Abstract: A system and method is provided for detecting concentration of an analyte in a fluid. The method comprises detecting an optical property of a first region of two or more regions in a system, the first region located in a container having a reservoir for one or more modifiers of one or more optical properties of the first region. The movement of the one or more modifiers is responsive to changes in concentration of the analyte. A next step detects an optical property of a second region of the two or more regions in the system, the second region located in a container having a reservoir for one or more modifiers of one or more optical properties of the second region. The movement of the one or more modifiers is responsive to changes in concentration of a compound, where the compound is something other than the analyte.

Abstract: A measurement apparatus which measures a transmittance distribution of an optical system, comprises a light source, a first spherical mirror which forms reference light by reflecting light which is emitted by the light source and is not transmitted through the optical system, a second spherical mirror which forms test light by reflecting light which is emitted by the light source and is transmitted through the optical system, a measurement unit which measures intensity distributions of the reference light and the test light, a unit which calculates reflectance distributions of the first spherical mirror and the second spherical mirror, and an arithmetic unit which calculates a transmittance distribution on a pupil plane of the optical system, on the basis of the intensity distributions of the reference light and the test light, and the reflectance distributions of the first spherical mirror and the second spherical mirror.

Abstract: Scattered light from the surface of a sample subjected to the same process as a process for an inspection object is observed, a defect is detected from an intensity of scattered light, and a position of the detected defect and an intensity of scattered light caused by the detected defect are acquired. Defects detected are classified into a group detectable by observing secondary electrons emitted when an electron beam is applied to the surface of the sample and a group not detectable. A decision threshold value of a scattered light intensity for extracting defects to be counted is determined, in accordance with a result of classification by the above steps and the intensity of scattered light caused by the detected defect.

Abstract: A process monitoring system determines a spectral response of a process material. This system has a tunable laser for generating an optical signal that is wavelength tuned over a scan band and an optical probe for conveying the optical signal to the process material and detecting the spectral response of the process material. The optical probe expands a beam of the optical signal to a diameter of greater than 10 millimeters. This avoids one of the difficulties with monitoring these process applications by ensuring that the spectroscopy measurements are accurate and repeatable. It is desirable to sample a relatively large area of the processed material since it can be heterogeneous. Additionally the large area mitigates spectral noise such as from speckle.

Abstract: Inspection of objects, such as semiconductor wafers, can be performed using a diluted scan wherein not all of an inspected area is actually imaged. Instead, a dilution plan can be devised based on the desired amount of area to be skipped and the particular parameters of the inspection, such as the size of each unit area to be imaged or not imaged and the distribution features of the wafer. When the same area is inspected in multiple wafers, the wafers can be inspected in sets using a dilution plan whereby a wafer (or inspected area) can be statistically inspected using diluted scans of the set of wafers. Similarly a die or group of dies of a specified type can be statistically inspected using diluted scans of a set of dies (or group of dies). When statistical inspection is used, the end results of such inspections, such as defect densities and distributions, can be corrected to account for inaccuracies that may be introduced when certain portions are imaged more often than others due to the dilution plan.

Abstract: Disclosed are systems and methods for determining the shape of a glass sheet during and/or after the forming process. In one example, a system for determining the shape of a glass sheet defining an interior bulk can include a light source, an image capture device and a processor that are configured to calculate the location of an energy centroid within a selected portion of the bulk of the glass sheet.