Abstract: A surface plasmon sensor includes a dielectric block, a metal film having a sample supporting side which is faced toward a face of the dielectric block spaced therefrom and on which a sample is placed, a light source emitting a light beam, an optical system which causes the light beam to enter the dielectric block so that the light beam is reflected in total reflection at the face of the dielectric block and various angles of incidence of the light beam to the face of the dielectric block including an angle of incidence at which surface plasmon is generated can be obtained, and a sensor which detects the angle of incidence of the light beam at which attenuation in total reflection takes place and the amount of reflected light is reduced. A distance measuring light beam is caused to enter the dielectric block to be reflected in total reflection at the face of the dielectric block.

Abstract: A method for characterizing a sample comprising the steps of depositing the sample on a substrate, measuring a first change in optical response of the sample, changing the lateral strain of the sample, measuring a second change in optical response of the sample, comparing the second change in optical response of with the first change in optical response and associating a difference between the second change and the first change in optical response with a property of interest in the sample. The measurement of the first change in optical response is made with the sample having an initial lateral strain. The measurement of the second change in optical response is made after the lateral strain in the sample is changed from the initial lateral strain to a different lateral strain. The second change in optical response is compared to the first change in optical response to find the difference between the second change and the first change.

Abstract: A system for simultaneously inspecting the frontsides and backsides of semiconductor wafers for defects is disclosed. The system rotates the semiconductor wafer while the frontside and backside surfaces are generally simultaneously optically scanned for defects. Rotation is induced by providing contact between the beveled edges of the semiconductor wafer and roller bearings rotationally driven by a motor. The wafer is supported in a tilted or semi-upright orientation such that support is provided by gravity. This tilted supporting orientation permits both the frontside and the backside of the wafer to be viewed simultaneously by a frontside inspection device and a backside inspection device.

Abstract: An optical detecting apparatus designed to reduce the time taken to stabilize the operation after a moment at which a power supply for the apparatus is turned on, as well as to limit the power consumption in a standby state. Three operating modes: a normal mode, an intermittent mode, and a precharge mode are changed by controlling two switches sw-Led and sw-Ref. In the normal mode, both the switches sw-Led and sw-Ref are maintained in the on state and the circuit of the invention is used for the same operation as the conventional circuit. In the intermittent mode, for the purpose of achieving low power consumption in the standby state, both the switches sw-Led and sw-Ref are turned on and off at a predetermined on-off ratio to make the circuit operate in an intermittent manner (that is, by turning on and off light emitting diodes at a predetermined on-off ratio).

Abstract: An automated inspection system particularly adapted for detection and discrimination of surface irregularities of specularly reflecting and other materials, such as are employed in laminate chip carriers and printed circuit boards, includes an area scan image sensor allowing illumination sources to surround an area of a surface being inspected. The illumination source preferably provides either or both bright field and dark field illumination of the surface; developing generally complementary images of surface irregularities. A self-registering rules-driven process for developing inspection masks reduces alignment operations and improves performance. Image enhancement and morphological operations to detect surface irregularities are performed by digital signal processing, preferably using a dedicated vision processor. Masks screen potential defects to critical mounting and bonding surfaces accurately without requiring alignment of data or reference images to acquired images.

Abstract: An optical analysis system includes an optical filter mechanism disposed to receive light from a light source and configured to optically compress data carried by the light into at least one orthogonal component of the light. A detector mechanism in operative communication with the optical filter mechanism measures a property of the at least one orthogonal component to measure the data.

Abstract: A single housing sensor includes a detector in the housing receiving light from a light source. A detector in the housing provides an output representative of a profile of a component which is rotatably mounted on a nozzle of the pick and place machine. The sensor also includes a receiving circuit in the housing coupled to an encoder in the pick and place machine, the encoder providing an output representative of the rotational position of the nozzle to the sensor. Computing circuitry in the sensor computes a correction signal representative of the pick-up offset of the component and of the orientation angle of the component. The correction signal is computed from the motor encoder data and from a plurality of images of the shadow of the component, each image collected at a rotational angle, &thgr;, of the nozzle. A UART serially sends the correction signal to the pick and place machine, for use in placing the component precisely onto a printed circuit board.

Abstract: The invention intends to precisely measure the distance to an object. A CCD opens an electronic shutter for a proper period of time under control of a timing generator to receive a laser beam reflected by an object, converts the amount of light entering the CCD during that period of time, after passing a corresponding beam splitter, into an electric signal (voltage), and then outputs the electric signal to a distance calculating circuit. The distance calculating circuit calculates the distance from a laser telemeter to the object using a dark voltage VD, a reflection voltage VR and a total voltage VA inputted from the CCD.

Abstract: An apparatus for characterizing multilayer samples is disclosed. An intensity modulated pump beam is focused onto the sample surface to periodically excite the sample. A probe beam is focused onto the sample surface within the periodically excited area. The power of the reflected probe beam is measured by a photodetector. The output of the photodetector is filtered and processed to derive the modulated optical reflectivity of the sample. Measurements are taken at a plurality of pump beam modulation frequencies. In addition, measurements are taken as the lateral separation between the pump and probe beam spots on the sample surface is varied. The measurements at multiple modulation frequencies and at different lateral beam spot spacings are used to help characterize complex multilayer samples. In the preferred embodiment, a spectrometer is also included to provide additional data for characterizing the sample.

Abstract: A fixed optic sensor system (200) comprising a sensor system (210), and electronic sub-system (205) and a communications means (215). The system can be used for detecting the presence of various sample (236) properties and in that regard has widespread application by leveraging off various miniaturized sensor configurations including surface plasmon resonance (50), fluorescence (80), light transmission (125) and others (150). In one embodiment, the communications means (215) is a wireless transmitter/receiver. In another embodiment, a hand held instrument (358) can be used on-site and communicates with the sensor (350) to receive sample (352) related data and transmit it to a remote processing system (370) for further analysis. In yet another embodiment, a hand held instrument (403) has a plurality of cardiac marker binding ligands (400) deposited on the sensor/sample interface providing a medical diagnosis and point-of-care device (403).

Abstract: In the measurement system for detecting optical signals of microassays, the signal-generating test objects 5 are arranged on an investigation surface of a planar carrier 4. The planar carrier 4 is, in particular, a microtitre plate for biological objects. In principle, the measurement system comprises an optical imaging arrangement which reduces the size of the test objects 4 to be measured in such a way that all the objects are imaged completely on a two-dimensional, photosensitive image sensor 6.

Abstract: An apparatus and method for making a self-supporting fiber optic cable (40) having a messenger section (42) and a core section (44). The messenger section (42) and core section (44) include a jacket (47) that are interconnected by a series of webs (48) spaced by longitudinal gaps. The core section (44) includes a slotted core (45) having at least one slot with at least one optical fiber ribbon (46). Jacket (47) includes a substantially uniform cross sectional thickness. A method of making self-supporting fiber optic cable (40) comprises the steps of drawing the messenger wire (43) and the core (45) through a melt cavity including a molten jacketing material therein. Messenger section (42) and core section (44) are then defined by coating the messenger wire and the core with the molten jacketing material. Webs (48) are formed intermittently between the messenger and core sections (42,44).

Abstract: A process for laser welding a ferrule of a fiber optic cable to a clip of a fiber module. The process can detect and correct a movement of the fiber optic cable so that the fiber is aligned with a light source such as a laser diode. The detection method includes the steps of mechanically moving the ferrule with an automated device after a weld is completed and then detecting a change in optical power of a light beam that is transmitted through the fiber optic cable. The detection can determine a direction that the ferrule shifted during the weld process. The shift of the ferrule can be corrected by subsequent laser welds of the ferrule and clip. The power and time duration of the laser welds can be determined from an empirically derived look-up table. The entire process of detection and correction can be automated.

Abstract: Multiple independent spectral measurements of light reflected from a target are produced concurrently by illuminating the target with a train of laser pulses wherein the train of pulses produces a line spectrum within the illuminating signal. A characteristic dimension of the receiving aperture is established based on illuminating wavelength, a cross-sectional dimension of illuminated region of a target, and the range between a target and the receiving aperture or image plane. The characteristic dimension corresponds to the spacing of peaks in a speckle pattern of an image plane. The use of multiple receiving telescopes having the characteristic dimension allows for independent measurements concurrently by each of the receiving telescopes. The train of illuminating pulses is generated by mode-locked operation of the laser for synchronization of sinusoidal components at line frequencies of the pulse train spectrum, and wherein the spacing of the spectral lines is at least a decorrelation frequency.

Abstract: An assemblage and method for testing a lens having a plurality of field angles employs an improved modulation transfer function (MTF) design system for evaluating image quality produced by the lens being tested. A reflecting surface capable of translational and rotational movements is arranged along a predetermined optical path for receiving a collimated array of light rays and then directing the collimated array of light rays to the lens being tested.

Abstract: A measuring device such as a spectrometer uses an automatic sample changer for carrying a plurality of samples. The automatic sample changer may include a rotary circular disk rotatable around its central shaft by a stepping motor for changing positions of the samples which are positioned in a circle around the central shaft of the disk. A memory device preliminarily storing control data for each of different kinds of automatic sample changers is provided. The automatic sample changer, when connected to a control unit in the main body, serves to receive control signals for controlling motions of the motor and to transmit data stored in the memory device through a connector. The main body of the measuring device contains a control unit which serves to read out the control data from the memory device, to use the received control data to generate the control signal and to transmit the generated control signal to the automatic sample changer.

Abstract: The present invention provides a dimensioning system for determining the minimum size box necessary to enclose an object traveling on a moving conveyor. The dimensioning system is comprised of a light source which generates a scan beam that is moved by a mirrored wheel. A line scan camera whose field of view tracks the moving scan beam receives images of the scan beam and outputs a signal which is processed to compute a three dimensional box structure of the scanned object.

Abstract: A vision system is provided which allows viewing and/or inspection of an end surface of an optical fiber through a bulkhead on a backplane of a rack. By placing such a vision system on a mount configured to be inserted in the rack, the use of such a vision system does not require the rack design be modified or that other modules be removed. Preferably an adapter for mating the vision system with the bulkhead may be moved to position the adapter relative to the bulkhead housing the fiber of interest.

Abstract: A fiber-optic connector having a transparent connector housing, having a fiber receptacle hole for receiving a fiber-optic cable end which has an insulating sheath and an optical waveguide, the connector housing having an opening which extends transversely with respect to the fiber receptacle hole and is connected thereto, the connector including a fiber holding clip that can be introduced through the opening in order to retain the fiber-optic cable end, that is positioned against a stop, the fiber holding clip being pretensioned in such a way that the fiber-optic cable end is guided in follow-up fashion against the stop in the event of length variations.

Abstract: The invention provides a unique method and apparatus for detecting defects in an electronic device. In one preferred embodiment, the electronic device is a semiconductor integrated circuit (IC), particularly one of a plurality of IC dies fabricated on a wafer of silicon or other semiconductor material. The defect detection operation is effectuated by a unique combination of critical dimension measurement and pattern defect inspection techniques. During the initial scan of the surface of the wafer, in an attempt to locate the appropriate area for a critical dimension (CD) feature or element that is to be measured, a “best fit” comparison is made between a reference image and scanned images. The critical dimension measurements are conducted on a “best fit” image. In addition, a “worst fit” comparison is made between the reference and scanned images. A “worst fit” determination represents pattern distortions or defects in the ICs under evaluation.