Abstract: To accurately detect the moving state of secondary atomic ions at the time of targeted voltage application and the moving state of secondary atomic ions due to diffusion. An ion movement measuring device includes a test specimen and a detector. The test specimen has a first electrode, a second electrode, and an electrolyte disposed between them. The first electrode and the second electrode each have a layer of an identical element, and have the identical potential in a state where no voltage is applied from outside the test specimen. At least the first electrode contains second atoms being isotopes of first atoms at an abundance ratio higher than a natural abundance ratio of the second atoms, the first atoms being present at a highest natural abundance ratio in the element. The detector detects some of ions of the first atoms and the second atoms, which are discharged from the electrolyte.

Abstract: A fence tester for testing the voltage in an electric fence comprises a handle member and a blade member pivotally coupled to the handle member between an open state extending from the handle member and a closed state partly recessed into the handle member. The handle member defines a hollow interior region, and comprises a printed circuit board having an electronic monitoring circuit therein. An antenna coupled to the electronic monitoring circuit is configured to conduct an electrical current induced therein by an electric field generated by a pulsating voltage in the electric fence when the fence tester is located adjacent the electric fence. A latching element located in the handle member operated by a manually operated operating element in the handle member latches the blade member in the open state and the closed state.

Abstract: A method, system and assembly are disclosed. A radio assembly includes at least one radio including a radio board, a plurality of filter units, a plurality of clamp elements, and an antenna unit. A subset of the plurality of filter units remain removably attached to the radio board while the remaining plurality of filter units remain removably attached to the antenna unit and plurality of clamp elements based on whether the second plurality of fastening elements are unfastened from a subset of the plurality of second filter mating elements associated with the subset of the plurality of filter units, the third plurality of fastening elements associated with the subset of the plurality of filter units are unfastened from respective first filter mating elements; and the first plurality of fastening elements associated with the remaining plurality of filter units are unfastened from respective radio mating elements.

Abstract: Proposed is a socket device used for testing integrated circuits (ICs) and, more particularly, a test socket device with a thin structure especially suitable for ICs required to process high-speed signals. The socket device includes a socket body configured to accommodate a ground probe and a signal probe, each having an upper contact pin, a lower contact pin and a coil spring, and to have noise shielding properties, and an insulating thin film member having electrical insulation properties and attached to the lower part or upper/lower parts of the socket body to elastically support the probes, and thus the socket device has a thin structure suitable for ICs required to process high-speed signals, and is easy to manufacture.

Abstract: A test and/or measurement instrument includes at least three ports and at least three measurement circuits connected to the at least three ports, respectively. The test and/or measurement instrument further includes at least one signal generator circuit and a control circuit. The control circuit is configured to set a first calibration mode and carry out a first test of the instrument by measuring the calibration signal travelling from the signal generator circuit to the respective port as well as a signal traveling from the respective port to the signal generator circuit. The control circuit is configured to set a second calibration mode and carry out a second test of the instrument by measuring the calibration signal forwarded only to the main port in the first sub-mode and the calibration signal received by the respective port from the signal generator circuit via the main port in the first sub-mode.

Abstract: A current sensing system for a magnetic resonance imaging (MRI) scanner operating at 1H and 31P resonant frequencies includes a dual-tuned RF coil with a network of up to two parallel quarter-wavelength transmission lines, each integrated with a PIN diode-coupled shunt capacitor. A multiple half-wavelength transmission line is employed with a corresponding pair of shunt capacitors and PIN diodes. A quarter-wavelength transmission line, coupled with a power amplifier through a matching network of shunt capacitors and PIN diodes, is also included. The configuration parameters are designed to tune the system to the fundamental frequency and its first odd multiple, correlating with the 1H resonant frequency, and to the 31P resonant frequency. The system accurately senses coil currents by detecting voltage variations in the matching network, thereby facilitating precise current measurements at the tuned resonant frequencies without the need for external sensors.

Abstract: A remote field eddy current, RFEC, system for detecting an azimuth location of a defect in a pipe includes a holder extending along a longitudinal axis X and shaped to flow through the pipe, a magnetic field generator located within the holder and configured to generate a first magnetic field B0, a 3-axis fluxgate magnetometer located within the holder, at a given distance away from the transmitter, along the longitudinal axis X, wherein the fluxgate magnetometer is configured to measure a second magnetic field B, which is a result of the first magnetic field B0 interacting with the defect in the pipe, and a controller located within the holder and configured to receive a value of the second magnetic field B and to determine an azimuth of the defect in the pipe by interpreting radial components of the measured field, and an extent of the defect based on the second magnetic field B.

Abstract: A device for detecting an approach of a part of a user's body or of a portable user equipment, intended to be housed on board a motor vehicle, including: a near-field communication antenna configured to transmit signals at a high frequency selected between 3 and 30 MHz, the antenna being able to detect the approach of a portable user equipment and to communicate in near-field mode with the portable user equipment. The antenna including at least one winding that extends continuously in the form of a set of comb-shaped rods such that the antenna is able to generate a variation in capacitance in response to the approach of a part of a user's body; a controller for controlling the antenna; and a measurer for measuring a variation in impedance of the antenna, generated by the variation in capacitance.

Abstract: A current sensor integrated circuit package includes a primary conductor having an input portion into which a current flows and an output portion from which the current flows, a plurality of secondary leads, and a semiconductor die disposed adjacent to a top surface of the primary conductor and positioned on an insulator portion. In some embodiments, at least one magnetic field sensing element is supported by the semiconductor die. In some embodiments, the package includes a package body with a first portion enclosing the semiconductor die and a first portion of the primary conductor and a second portion enclosing an elongated portion of the plurality of secondary leads, wherein a second portion of the primary conductor is exposed. A pad is secured to the package body and a pillar extends from the primary conductor to the pad.

Abstract: A battery test apparatus includes a lifting mechanism and a probe mechanism. The lifting mechanism is configured to drive the probe mechanism to move. The probe mechanism includes an adapting rack and a plurality of first connecting members disposed on the adapting rack. The adapting rack is detachably connected to the lifting mechanism.

Abstract: A light scattering probe includes an arm segment, a main segment located at one side of the arm segment, and a testing segment connected to another side of the arm segment. The main segment has a soldering end portion and an extending end portion respectively located at two opposite sides thereof along a predetermined direction. The testing segment has an upright shape along the predetermined direction and includes a pinpoint portion and an upright portion that connects the pinpoint portion and the arm segment. The upright portion has a roughened surface arranged on an entirety of an outer surface thereof. The roughened surface has an arithmetic average roughness (Ra) within a range from 0.1 ?m to 1 ?m. Through the roughened surface, the testing segment only forms an observation point at the pinpoint portion in an observation process of a detection apparatus.

Abstract: A pogo pin whose elastic force can be adjusted according to a contacting direction is disclosed. According to an aspect of the present invention, provided is a pogo pin with adjustable elastic force, including: a housing; plunger pins mounted on ends of the housing to directly contact a measurement object; and a spring installed inside the housing to provide elastic force so that the plunger pin contacts the measurement object, wherein a local fixing part protruding inward is formed on one side of the housing so that a first position of the spring can be pressed and fixed.

Abstract: A method and system for guiding electrode placement on the scalp. The invention includes a touch sensor arranged along a section of a flexible LED strip configured for measuring a distance between surface landmarks of the skull; and a control module with different configured settings of electrode placement schemes. By locating different cranial landmarks marked with the touch sensor and confirmed with LED lighting, it allows to guide the precise location of each electrode by illuminating the corresponding points of the LED strip.

Abstract: A probe card for a circuit probe test system and methods of fabrication thereof. The probe card includes a substrate portion, a guide plate having a plurality of openings, and a plurality of probe pins extending through the openings, including at least one first probe pin configured to carry power between the substrate portion and a device-under-test (DUT), at least one second probe pin configured to electrically couple the DUT to ground, and at least two third probe pins configured to carry loopback test signals between contact regions on the DUT. A low dielectric constant (low-k) material may be located between the third probe pins and the guide plate. The low-k material may prevent direct contact between the third probe pins and the relatively higher dielectric-constant material of the guide plate, which may improve the signal integrity (SI) of the loopback test signals.

Abstract: An abnormality locating system includes a display device, a controller, and a storage storing map data of a power feeder. The controller includes a distance information obtainer that obtains distance information indicating a distance from a power supply to a location of the abnormality, and an abnormality site display processor. The abnormality site display processor performs an abnormality site estimation process of estimating a location of an abnormality site based on the distance information, the abnormality site is a site of the abnormality of the thermal line, and a display process of causing the display device to display a map indicating a position of the thermal line based on the map data and to display, on the map, an estimated position of the abnormality site estimated through the abnormality site estimation process.

Abstract: Disclosed herein is a medical system (100, 300) comprising a memory (110) storing machine executable instructions (120) and a computational system (104). The execution of the machine executable instructions causes the computational system to receive (200) k-space data (122) and reconstruct (202) at least one three-dimensional magnetic resonance image (124) from the k-space data. The k-space data comprises lines of k-space data (510, 514) sampled according to a three-dimensional stack of stars sampling pattern (500). The three-dimensional stack of stars comprises discrete sampling planes (508) distributed periodically along a cartesian sampling direction axis (506). The lines of k-space data pass through the cartesian sampling direction axis. The lines of k-space are perpendicular to the cartesian sampling direction axis. At least a portion of the lines of k-space data (514) are distributed between the discrete sampling planes.

Abstract: A source measure device includes a current sampling circuit, a voltage sampling circuit, an overvoltage detecting circuit, and a comparing circuit. The current sampling circuit is configured to sample a current of a device under test. The voltage sampling circuit is configured to sample a voltage of the device under test. The overvoltage detecting circuit is coupled to the current sampling circuit and the voltage sampling circuit, and receives a first operation voltage of the current sampling circuit and a second operation voltage of the voltage sampling circuit so as to generate a detection voltage. The comparing circuit is coupled to the overvoltage detecting circuit, and determines whether the detection voltage is within a voltage range. If the detection voltage is not within the voltage range, the comparing circuit generates an abnormal signal.

Abstract: This is an improvement of a measuring device, for example, it is possible to stably measure an electrical characteristic even when a component is small. In the present measuring device, at least one of a relative positional relationship between a main body and a loading stand for holding the component and a relative positional relationship between the main body and at least one of a pair of probes can be adjusted. Therefore, the component held on the loading stand can be more favorably gripped by the pair of probes, and the electrical characteristic can be stably measured even when the component is small.

Abstract: An apparatus for measuring bow of a wafer includes a substrate holder including a support surface configured to support a wafer, and an air flow system including a plurality of air outlets in the support surface which are configured to output air for elevating the wafer above the substrate holder. A capacitor array unit including a plurality of electrodes laterally spaced from one another in the capacitor array unit, each electrode facing the support surface and being spaced a respective fixed distance from the support surface such that each electrode can form a capacitor with an opposing area of a wafer elevated by the substrate holder.

Abstract: A circuit board detection device includes a base, a stage assembly, a first gantry support, and a first probe assembly. The stage assembly is arranged on the base and includes a linear drive module, a rotary motor, and a platform. The platform is configured to carry a circuit board and can be driven by the linear drive module to move along a first axial direction. The platform can also be driven by the rotary motor to rotate relative to a first rotation axis. The first gantry support is fixed on the base and includes a first beam. The first beam extends along a second axial direction perpendicular to the first axial direction to span over the linear drive module, and includes a first probe guide rail. The first probe assembly is arranged on the first probe guide rail to be movable along the second axial direction.