Patents Examined by Ricky Ngon
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Patent number: 10782373Abstract: A system and method for processing highly undersampled multi-echo spin-echo data by linearizing the slice-resolved extended phase graph model generates highly accurate T2 maps with indirect echo compensation. Principal components are used to linearize the signal model to estimate the T2 decay curves which can be fitted to the slice-resolved model for T2 estimation. In another example of image processing for highly undersampled data, a joint bi-exponential fitting process can compensate for image variations within a voxel and thus provide partial voxel compensation to produce more accurate T2 maps.Type: GrantFiled: August 2, 2019Date of Patent: September 22, 2020Assignee: The Arizona Board of Regents on Behalf of the University of ArizonaInventors: Maria Altbach, Ali Bilgin, Chuan Huang, Christian Graff
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Patent number: 10783651Abstract: A three-dimensional reconstruction method and device based on a monocular three-dimensional scanning system is provided. The method includes: a depth map of a measured object is collected by using the invisible structured light scanning component, and the depth map is converted into a three-dimensional data point set, and the three-dimensional data point set includes a plurality of three-dimensional points; a target light plane equation corresponding to a target three-dimensional point is determined in the plurality of three-dimensional points; the target three-dimensional point is projected onto a modulated multi-line stripe image, and a target stripe corresponding to the target light plane equation is determined in the modulated multi-line stripe image; and a three-dimensional point reconstructed by the target stripe, in a camera coordinate system is obtained according to the target light plane equation and center coordinates of the target stripe.Type: GrantFiled: October 24, 2017Date of Patent: September 22, 2020Assignee: Shining 3D Tech Co., Ltd.Inventors: Zengyi Liu, Wenbin Wang, Xiaobo Zhao
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Patent number: 10782448Abstract: Systems and methods are disclosed to determine the severity of a thunderstorm and/or track the path of a thunderstorm. For instance, multiple thunderstorms may be tracked by assigning detected lightning flashes to thunderstorm objects based on a number of previous lightning flashes assigned to each of the thunderstorm objects and a distance between each of the lightning flashes and each of the thunderstorm objects. In addition, an updated position may be determined for each of the thunderstorm objects based on positions and ages of lightning flashes assigned to each of the thunderstorm objects. The severity of a given thunderstorm may be determined based on lightning rates, types, and/or polarities of lightning flashes and/or lightning pulses of the thunderstorm object.Type: GrantFiled: July 11, 2017Date of Patent: September 22, 2020Assignee: Vaisala, Inc.Inventor: Martin J. Murphy
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Patent number: 10776589Abstract: A system and computer-implemented method for analyzing chip card transactions to identify defective chip cards and/or defective chip readers in need of replacement. Constraints are established to define a subset of card transactions. From a full set of card transactions the subset is identified consisting of each card transaction falling within the constraints and occurring at a merchant having a chip reader. From this subset the unique chip readers are identified, and for each unique chip reader a percentage of fallback transactions is calculated. The percentage of fallback transactions is compared to a maximum value, and if the percentage of fallback transactions exceeds the maximum value, the chip reader is identified as defective. Each defective chip reader is reported to the merchant, along with at least a recommendation to replace the defective chip reader. A similar process may be used to identify defective chip cards.Type: GrantFiled: December 15, 2017Date of Patent: September 15, 2020Assignee: Mastercard International IncorporatedInventors: Christopher John Merz, Matthew Scott Morice, Ravi Santosh Arvapally
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Patent number: 10775438Abstract: Lithium ion battery state of charge (SOC) is a function of open circuit voltage (OCV). Battery internal diffusion process needs to be nearly completed to be able to measure battery open circuit voltage. The length of the minimum settling time depends on the battery type, usage and temperature. Described are methods to determine electric vehicle battery voltage relaxation time based on battery temperature and usage history.Type: GrantFiled: October 10, 2019Date of Patent: September 15, 2020Assignee: FORD GLOBAL TECHNOLOGIES, LLCInventors: Xu Wang, Xiaoguang Chang, Chuan He
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Patent number: 10775209Abstract: The present invention provides a control circuit (10; 110; 210; 310) and a method for checking the plausibility of a rotor position angle. The control circuit is designed with: a rotor position angle determination device (12) for determining a first rotor position angle, ?(tk), at a first time, tk, and at least one second rotor position angle, ?(tk?1), at a second time, ?k?1, before the first time, tk; a computing device (14; 114; 214; 314) for determining a rotor position angle, mod(tk), to be expected at the first time, tk, from a computational model of the computing device (14; 114; 214; 314) using at least the second rotor position angle, ?(tk?1); and a plausibility-checking device (16) for outputting a signal (51) which indicates the determined first rotor position angle, ?(tk), as plausible if an amount of a difference between the rotor position angle, mod(tk), to be expected and the determined first rotor position angle, ?(tk), does not exceed a predetermined threshold value.Type: GrantFiled: June 7, 2016Date of Patent: September 15, 2020Assignee: Robert Bosch GmbHInventors: Benjamin Lechner, Daniel Zirkel, Daniel Raichle, Michael Ungermann
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Patent number: 10775429Abstract: Monolithic three-dimensional integration can achieve higher device density compared to 3D integration using through-silicon vias. A test solution for M3D integrated circuits (ICs) is based on dedicated test layers inserted between functional layers. A structure includes a first functional layer having first functional components of the IC with first test scan chains and a second functional layer having second functional components of the IC with second test scan chains. A dedicated test layer is located between the first functional layer and the second functional layer. The test layer includes an interface register controlling signals from a testing module to one of the first test scan chains and the second test scan chains, and an instruction register connected to the interface register. The instruction register processes testing instructions from the testing module. Inter-layer vias connect the first functional components, the second functional components, and the testing module through the test layer.Type: GrantFiled: November 2, 2017Date of Patent: September 15, 2020Assignees: Marvell Asia Pte., Ltd., Duke UniversityInventors: Sukeshwar Kannan, Abhishek Koneru, Krishnendu Chakrabarty
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Patent number: 10776241Abstract: A system for automated process performance determination includes an interface and a processor. The interface is configured to receive log data associated with a plurality of tenants. The log data comprises one or more log data types. The processor is configured to aggregate the log data into an aggregated set of log data; and determine a set of metrics based at least in part on the aggregated set of log data. A metric of the set of metrics is associated with a tenant of the plurality of tenants and one of the one or more log data types. The processor is further configured to determine a composite metric for the tenant by combining metrics of the set of metrics associated with the tenant; determine a response based at least in part on the composite metric; and, in the event the response indicates an automated action, perform the automated action.Type: GrantFiled: November 10, 2017Date of Patent: September 15, 2020Assignee: Workday, Inc.Inventors: Lynn Christensen, Amitesh Sinha
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Patent number: 10776726Abstract: A computer implemented method for energy management in a building by taking information on energy usages of a metered building and matching the energy usage to calculated energy usages for electrical devices.Type: GrantFiled: February 3, 2010Date of Patent: September 15, 2020Inventor: McHenry Wallace
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Patent number: 10768076Abstract: A method includes receiving raw data and generating a manufacturing data packet (MDP) that includes at least a portion of the raw data. Generating the MDP includes associating metadata with the raw data and associating a timestamp with the raw data. The timestamp is synchronized to a common reference time. A data model associated with the MDP is obtained. The data model includes one or more predefined data types and one or more predefined data fields. A first data type from the one or more predefined data types is determined based at least in part on characteristics of the raw data. An algorithm is determined based at least in part on the first data type. The MDP is processed according to the algorithm to produce an output. The first data type is associated with the raw data. The output is associated with a data field of the first data type.Type: GrantFiled: October 2, 2017Date of Patent: September 8, 2020Assignee: Sight Machine, Inc.Inventors: Nathan Oostendorp, Kurtis Alan Demaagd, Ryan L. Smith
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Patent number: 10768325Abstract: A method for designing 4-D seismic acquisition source and receiver repeatability specifications, the method including: locating, with a computer subsurface anomalies above a target reservoir zone from analysis of high-resolution reflectivity images for the target reservoir zone; determining, with a computer, how the anomalies above the target reservoir zone modify target illumination for variations in the 4-D seismic acquisition source and receiver positions; and determining, with a computer, repeatability specifications for a monitor seismic survey, wherein tolerances for the source or receiver positions varies across an acquisition area based on how the anomalies modify the target illumination.Type: GrantFiled: October 2, 2017Date of Patent: September 8, 2020Assignee: ExxonMobil Upstream Research CompanyInventors: Norman C. Allegar, John E. Anderson, Simon Dewing
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Patent number: 10760934Abstract: An electronic flow meter that is configured to use localized flow conditions to determine volumetric flow. The embodiments may include a body forming a pass-through channel and a by-pass channel; a semiconductor device comprising a sensor disposed proximate the by-pass channel, the sensor configured to generate a signal with data that reflects localized pressure and localized temperature of a stream in the by-pass channel; and a processing component coupled with the sensor to receive and process the signal so as to identify a flow condition for the stream, select a calculation for volumetric flow rate in response to the flow condition, use data for localized pressure and localized temperature in the calculation to generate a value for the volumetric flow rate; and generate an output with data that reflects the value for the volumetric flow rate.Type: GrantFiled: January 2, 2018Date of Patent: September 1, 2020Assignee: Natural Gas Solutions North America, LLCInventors: Roman Leon Artiuch, Ertugrul Berkcan, Nannan Chen
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Patent number: 10746631Abstract: A method for estimating parameters of a DC machine by the least-squares method is performed by a computer system. The method includes establishing a transient model of the DC machine; expressing discrete values of the terminal voltage, the armature current and the rotational speed of the DC machine by the polynomial regression after the DC machine is started; obtaining estimated values of an armature resistance, an armature inductance and a back electromotive force constant by the least-squares method; calculating a torque based on the back electromotive force constant and the armature current; obtaining estimated values of a moment of inertia and a viscous friction coefficient by the least-squares method; and outputting the estimated values of the armature resistance, the armature inductance, the back electromotive force constant, the moment of inertia and the viscous friction coefficient.Type: GrantFiled: August 29, 2017Date of Patent: August 18, 2020Assignee: I-SHOU UNIVERSITYInventor: Rong-Ching Wu
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Patent number: 10738594Abstract: A method for using the time derivative of distributed temperature sensing (DTS) data obtained during hydraulic fracturing to identify fluid activities not as evident in conventional DTS date inside or near the wellbore during the hydraulic fracturing process comprises providing a fiber optic based distributed temperature sensing measurement system through a production region; gathering the temperatures through the production region as a function of the depth in the subsurface well and as a function of the elapsed time; calculating from the gathered data the time derivative of the temperature changes as a function of depth in the subsurface well and of the elapsed time; and displaying the time derivative data for analysis of the fluid activities inside or near the wellbore during the hydraulic fracturing process to identify fluid activities inside or near the wellbore.Type: GrantFiled: June 15, 2015Date of Patent: August 11, 2020Assignee: Halliburton Energy Services, Inc.Inventor: Hongyan Duan
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Patent number: 10734291Abstract: Disclosed is an abnormality detection apparatus including: a collection unit that collects state information indicating a state of each part of a semiconductor manufacturing apparatus in a predetermined cycle; a storage unit that stores the state information collected by the collection unit as a log for each predetermined unit; an arithmetic unit that generates a monitoring band for monitoring the state of each part of the semiconductor manufacturing apparatus, based on the log; and a determination unit that determines whether the state of each part of the semiconductor manufacturing apparatus is abnormal, based on the state information and the monitoring band.Type: GrantFiled: November 1, 2017Date of Patent: August 4, 2020Assignee: TOKYO ELECTRON LIMITEDInventors: Noriaki Koyama, Kazushi Shoji, Motokatsu Miyazaki
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Patent number: 10725190Abstract: A method for processing seismic data from a subsurface using least squares migration or wave equation migration velocity analysis over a cost function comprising a function of a matching filter by iteratively updating the reflectivity model velocity model to yield an updated reflectivity model or updated velocity model that matches the observed seismic data.Type: GrantFiled: June 29, 2015Date of Patent: July 28, 2020Assignee: CGG SERVICES SASInventors: Bruno Gratacos, Andrew Ratcliffe, Gilles Lambare, Graham Roberts, Lian Duan
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Patent number: 10725200Abstract: Borehole logging methods for estimating a parameter of interest using nuclear radiation. Methods include estimating a water saturation of the formation from gamma radiation from at least the formation detected in the borehole using a radiation detector, the gamma radiation responsive to a pulsed neutron source and resulting from at least one of: (i) decay of nitrogen-16 formed by activation of oxygen-16, and ii) inelastic scattering of neutrons from oxygen. This may include using at least one processor to: obtain a gamma ray count measurement, representing gamma rays from one of: (i) the decay of nitrogen-16 (ii) and the inelastic scattering, and estimate the water saturation using the gamma ray count measurement and a model comprising a relationship between measured gamma ray counts and modeled gamma ray counts from each of a fully water saturated formation and a minimally water saturated formation.Type: GrantFiled: September 14, 2018Date of Patent: July 28, 2020Assignee: BAKER HUGHES, a GE Company, LLCInventors: Feyzi Inanc, Rafay Zahid Ansari, W. Allen Gilchrist, David M. Chace
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Patent number: 10724359Abstract: Systems and methods compute dysfunctions via amplitude envelopes that deviate from a mean (normal) state behavior. The envelope function is constructed from a recursive application of the maximum signal value within a given window size. The aforementioned operations are causal and computationally affordable as relative short moving windows are required to trail the current point. Therefore, the proposed envelope and dysfunction calculations are amenable for any source of data streams measured at high sample rates. The effectiveness of the computing is validated as representing multiple physics in real time field drilling operations.Type: GrantFiled: June 17, 2016Date of Patent: July 28, 2020Inventors: Phil D. Anno, Hector Klie, Stacey Ramsay
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Patent number: 10725109Abstract: A battery monitoring circuit for a portable device driven by a secondary battery that supplies an electric current via a wiring pattern formed on a substrate. The battery monitoring circuit includes: a current measuring circuit that measures a current value of a current that flows in the wiring pattern by monitoring an amount of voltage drop that occurs in a specific section of the wiring pattern; a converter that converts the current value into a digital measured current value; a first storage part that stores data for compensating a variation in a resistance value of the wiring pattern depending on an individual particularity of the substrate; and a calculating part configured to correct the digital measured current value by using the data to calculate a corrected current value and to calculate a remaining capacity or to monitor a state of the secondary battery based on the corrected current value.Type: GrantFiled: October 30, 2017Date of Patent: July 28, 2020Assignee: MITSUMI ELECTRIC CO., LTD.Inventors: Hitoshi Hagimori, Yasuhiro Kinoshita
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Patent number: 10719577Abstract: A system analyzing device according to the present invention includes: a collection unit that collects a plurality of pieces of sensor data of a monitored system; a storage unit that stores a correlation modes based on at least one of a plurality of pieces of sensor data; and a standard contribution acquisition unit that acquires, for a predicted value of an objective variable of a regression equation thereof, a standard contribution indicating a ratio of contribution of each of the data included as explanatory variables.Type: GrantFiled: December 1, 2015Date of Patent: July 21, 2020Assignee: NEC CORPORATIONInventor: Masanao Natsumeda