Patents Examined by Stanley J Pruchnic
  • Patent number: 6908226
    Abstract: A method and apparatus for aspirating a liquid (e.g., blood) from a container uses an electrically biased thermistor element, mounted proximate the tip of a liquid-aspirating probe, to determine that the probe is safely submerged within a body of liquid to be aspirated at all times during the aspiration process. Also disclosed are different aspiration probe assemblies that are useful in the method and apparatus of the invention.
    Type: Grant
    Filed: February 7, 2003
    Date of Patent: June 21, 2005
    Assignee: Beckman Coulter, Inc.
    Inventors: Imran T. Siddiqui, Santos E. Vargas, Roberto Del Valle
  • Patent number: 6899457
    Abstract: An insulator 6 for holding electrode wires 4 is provided between a thermistor element 3 and a sheathed pin 5 which is a wiring, and the electrode wires 4, which are inserted into hole portions 6a of the insulator 6, are held therein not bonded to the insulator, whereby the vibration resistance of the electrode wires of the thermistor element is improved so that breaking of the electrode wires is prevented.
    Type: Grant
    Filed: March 11, 2002
    Date of Patent: May 31, 2005
    Assignee: Denso Corporation
    Inventor: Atsushi Kurano
  • Patent number: 6896407
    Abstract: A temperature information detecting device for an angle sensor is provided for detecting only temperature-dependent components based on middle-point potentials when a constant current is supplied to a bridge circuit for an angle sensor, for acquiring a temperature of the angle sensor from the temperature-dependent components, for employing compensating information corresponding to the acquired temperature without separately providing any additional temperature sensor, and for making temperature compensation of the output of the temperature sensor in automatically controlling the valve opening of a flow control valve.
    Type: Grant
    Filed: November 1, 2002
    Date of Patent: May 24, 2005
    Assignee: Yamatake Corporation
    Inventors: Takashi Nomiyama, Fumio Nagasaka, Shinichi Akano
  • Patent number: 6896408
    Abstract: A temperature detection circuit is provided inside a chip which is the same in which a CPU is provided, and includes a temperature detection part having a PMOS transistor and an NMOS transistor connected in series between a power supply potential VDD and a grounding potential. A stray capacitance between a junction (live node) between the PMOS transistor and the NMOS transistor, and the grounding potential, is charged with a current differential between the off leak current of the PMOS transistor and the off leak current of the NMOS transistor, thereby changing the potential of the live node. When the changed potential reaches a level of a threshold value in a given period of time, it is decided that the temperature of the CPU reaches a set temperature.
    Type: Grant
    Filed: September 24, 2003
    Date of Patent: May 24, 2005
    Assignee: Oki Electric Industry Co., Ltd.
    Inventor: Yasuhiro Tokunaga
  • Patent number: 6891183
    Abstract: An ultrasonic-welding apparatus including: a cradle, onto which two work pieces are mounted, and which can rotate around an axis vertical to the welding surface of the work pieces; a welding horn, which carries out welding using ultrasonic energy while sandwiching the two work pieces between it and the cradle; a transmission-type laser sensor which measures the fixed part of the work pieces after welding, rotating on the cradle, in the condition that the welding horn is apart from the work pieces after welding; and an optical sensor including a light-emitting part, a light-receiving part, a connecting part on which the light-emitting and light-receiving parts are mounted, and an adjusting part that rotates the connecting part around two axes.
    Type: Grant
    Filed: June 6, 2003
    Date of Patent: May 10, 2005
    Assignee: Fuji Photo Film Co., Ltd.
    Inventors: Kouta Kitamura, Tadashi Takahara, Kenji Ishikawa, Novuo Takahashi
  • Patent number: 6886977
    Abstract: A sensor measures temperature in stationary components of electrical machines using fiber optics. An optical fiber is embedded in a non-metallic ribbon. Notches are cut in the ribbon to effect bends that accommodate a shape of a stationary component. The ribbon and optical fiber are attached to the stationary component. A series of laser pulses can be injected from at least one end of the optical fiber, and the stationary component temperature can be monitored by interrogation of reflections from the series of laser pulses.
    Type: Grant
    Filed: July 17, 2003
    Date of Patent: May 3, 2005
    Assignee: General Electric Company
    Inventors: Christopher Anthony Kaminski, Konrad Roman Weeber, Thomas Bonner, Todd Garrett Wetzel, John William Devitt, Veera Palanivelu Rajendran
  • Patent number: 6877897
    Abstract: The temperature of a semiconductor component is determined by way of a memory cell that includes a transistor and a capacitor. To that end, a signal is determined in dependence on a threshold voltage of the transistor and a value for the temperature of the transistor is determined in dependence on the signal.
    Type: Grant
    Filed: January 30, 2002
    Date of Patent: April 12, 2005
    Assignee: Infineon Technologies AG
    Inventors: Jens Braun, Detlev Richter, Wolfgang Spirkl
  • Patent number: 6874933
    Abstract: A circuit for measuring temperature with all digital components in an integrated circuit. During manufacture, the number of clock period cycles during a known period of time at a predetermined temperature is stored in non-volatile memory. Later, during use of the integrated circuit, a clock circuit is activated and each cycle of its period is counted during a known length of time. Using the previously saved number of clock circuit cycles at a predetermined temperature and a current count of clock cycles for another known length of time, the current period of the clock circuit can be calculated and used to determine the current temperature.
    Type: Grant
    Filed: October 15, 2002
    Date of Patent: April 5, 2005
    Assignee: National Semiconductor Corporation
    Inventor: Wai Cheong Chan
  • Patent number: 6871998
    Abstract: The invention provides a method for accurately calibrating a vacuum thermogravimetric analyzer (VTGA). The invention solves the problem of calibrating a VTGA by using the actual magnetic transitions and associated transition temperatures, or Curie temperatures, Tc's, of a set of standards which can be used in-situ at the location of the sample holder obviating the difficulties associated with indirect methods of calibration. The invention encompasses a method of using a set of calibration standards comprised of a plurality of ferromagnetic slugs to provide a temperature calibration for a VTGA. The method permits accurate calibration through sufficiently numerous calibration points over a rather limited low-temperature range for determining vapor pressures of compounds. Through the use of these standards, highly accurate measurements can be made of the vapor pressures of critical hard disk drive compounds, such as lubricants, and corrosion inhibitors, that are crucial to competitive disk drive technology.
    Type: Grant
    Filed: August 1, 2003
    Date of Patent: March 29, 2005
    Assignee: Hitachi Global Storage Technologies Netherlands B.V.
    Inventors: Malika Dothresa Carter, Michael Andrew Parker
  • Patent number: 6871999
    Abstract: A method for the correction of the output signal of an infra red radiation multiple element sensor comprises the steps of determining and storing a parameter of a sensor element of the sensor and of generating a corrected signal of the sensor element in accordance with the stored parameter, where the storage of the parameter takes place in a memory supplied by the manufacturer and where prior to the correction being carried out, the parameter is transmitted to a correction device which is separate from the sensor. A sensor has several sensor elements (11a to 11i) which generate an output signal and a memory (14) provided on the sensor for the storage of at least one parameter of at least one sensor element.
    Type: Grant
    Filed: December 22, 2000
    Date of Patent: March 29, 2005
    Assignee: Perkinelmer Optoelectronics GmbH
    Inventors: Jörg Schieferdecker, Karlheinz Storck
  • Patent number: 6860635
    Abstract: A sensor, especially a temperature sensor, has a measuring resistor (7) including a substrate with an electrically insulating surface and a resistor layer situated thereon, which is enclosed by a housing (6) having current lead-ins to a plug system (1) for connection leads or contact pins (10) in a region of the housing facing away from the measurement. The measuring resistor (7) is arranged in the region of an end (14) of the housing facing the measurement, and between the measuring resistor (7) and the contact pins (10) at least one spacing element (9) of electrically insulating material is provided with lateral recesses for guiding the electrical connection leads (12) which extend from the measuring resistor (7). The temperature sensor can be simply adapted by variable configuration of the plug system and spacing element to various types of customer-specific requirements.
    Type: Grant
    Filed: March 8, 2002
    Date of Patent: March 1, 2005
    Assignee: Heraeus Electro-Nite International N.V.
    Inventors: Matthias Muziol, Michael Hoschkara, Gerhard Damaschke
  • Patent number: 6860632
    Abstract: A housing for a material holder includes an intermediate housing member having a generally horizontal member, an upper recess and a lower recess, an upper housing member having a generally horizontal member and a wall defining a material holding chamber, the upper housing member being seated within the upper recess of the intermediate housing member, and a lower housing member having a generally horizontal member, the lower housing member being seated within the lower recess of the intermediate housing member. The upper recess, the generally horizontal member of the intermediate housing member and the generally horizontal member of the upper housing member define a first cavity adapted to receive a first winding assembly, and the lower recess, the generally horizontal member of the intermediate housing member and the generally horizontal member of the lower housing member define a second cavity adapted to receive a second winding assembly.
    Type: Grant
    Filed: July 28, 2003
    Date of Patent: March 1, 2005
    Assignee: PerkinElmer Instruments LLC
    Inventor: Donald L. Groeschner
  • Patent number: 6846106
    Abstract: A finger temperature detecting device includes a carrier, a finger-attachment member extending from the carrier, a temperature sensor mounted in the carrier for detecting skin temperature of the finger of the wearer, and means of informing the wearer when a temperature value detected by the temperature sensor is larger than the precedent reading. The finger-attachment member is wearable on a finger of a wearer and allows adjustment in wearing tightness to securely retain appropriate attachment of the temperature sensor to a fixed survey area of finger surface. In another embodiment, a seat extends from the carrier for receiving the temperature sensor.
    Type: Grant
    Filed: January 29, 2004
    Date of Patent: January 25, 2005
    Inventors: Mei-Yen Chen, Fong-Lin Jang
  • Patent number: 6844720
    Abstract: A calibration apparatus for calibrating a linear variable differential transformer (LVDT) having an armature positioned in au LVDT armature orifice, and the armature able to move along an axis of movement. The calibration apparatus includes a heating mechanism with an internal chamber, a temperature measuring mechanism for measuring the temperature of the LVDT, a fixture mechanism with an internal chamber for at least partially accepting the LVDT and for securing the LVDT within the heating mechanism internal chamber, a moving mechanism for moving the armature, a position measurement mechanism for measuring the position of the armature, and an output voltage measurement mechanism. A method for calibrating an LVDT, including the steps of: powering the LVDT; heating the LVDT to a desired temperature; measuring the position of the armature with respect to the armature orifice; and measuring the output voltage of the LVDT.
    Type: Grant
    Filed: August 12, 2002
    Date of Patent: January 18, 2005
    Assignee: The United States of America as represented by the United States Department of Energy
    Inventor: Robert J. Pokrywka
  • Patent number: 6840668
    Abstract: The present invention relates to apparatus, systems, and methods for opening an autosampler sealed sample pan prior to TGA testing. The sealed sample pan comprises a pan, cover, and bail. A notch is formed in the seal sample pan cover. The cover can be opened by applying a concentrated force to the inside of the notch with a punch element integrated into the autosampler. This causes the center disk portion of the cover to be partially sheared and the sealed sample pan to be opened. It also prevents the punch element from touching the sample. A force sensor is used to determine if the cover has been opened. If the cover has been opened, then the sample pan is loaded to the TGA balance. If the cover has not been opened, the autosampler will not load the pan and will automatically move to the next sealed sample pan.
    Type: Grant
    Filed: July 25, 2003
    Date of Patent: January 11, 2005
    Assignee: Waters Investment Limited
    Inventors: John R. Reader, Jr., Amichai Shdaimah, Fred L. Ferguson
  • Patent number: 6840666
    Abstract: Described are methods and systems for providing improved defect detection and analysis using infrared thermography. Test vectors heat features of a device under test to produce thermal characteristics useful in identifying defects. The test vectors are timed to enhance the thermal contrast between defects and the surrounding features, enabling IR imaging equipment to acquire improved thermographic images. In some embodiments, a combination of AC and DC test vectors maximize power transfer to expedite heating, and therefore testing. Mathematical transformations applied to the improved images further enhance defect detection and analysis. Some defects produce image artifacts, or “defect artifacts,” that obscure the defects, rendering difficult the task of defect location. Some embodiments employ defect-location algorithms that analyze defect artifacts to precisely locate corresponding defects.
    Type: Grant
    Filed: January 22, 2003
    Date of Patent: January 11, 2005
    Assignee: Marena Systems Corporation
    Inventors: Marian Enachescu, Sergey Belikov
  • Patent number: 6837616
    Abstract: In accordance with one aspect of the disclosure, a method of sensing the temperature of a molten metal vehicle is provided. In one exemplary embodiment, the method includes utilizing at least one thermal imager located to the side of the molten metal during the dispensing of the molten metal and capturing at least one thermal image for determining the rotational position of the molten metal vehicle by calculating an area of the molten metal.
    Type: Grant
    Filed: August 26, 2003
    Date of Patent: January 4, 2005
    Assignee: Ircon, Inc.
    Inventor: Steven Ignatowicz
  • Patent number: 6834993
    Abstract: A probe for measuring the surface temperature of a pipe includes a detector assembly and a rectangular strap. The detector assembly includes a rigid, unitary clamp member having a bottom, pipe engagement surface, an oppositely disposed upper surface, and first and second locking dogs extending upwardly from the upper surface. The locking dogs define a gap having a width WG. A temperature sensor assembly is carried on the pipe engagement surface. The proximal end portion of the strap is mounted to the clamp member. The strap is flexible, longitudinally resilient and has a thickness TU in an unstretched condition and a thickness TS in a stretched condition, where TU>TS, TU>WG, and WG>TS. The probe is mounted to the pipe by positioning the pipe engagement surface of the clamp member against the pipe, wrapping the strap around the pipe, and applying a tensile force to the distal end portion of the strap such that the thickness of the strap decreases from TU to TS.
    Type: Grant
    Filed: August 19, 2003
    Date of Patent: December 28, 2004
    Assignee: Cooper Instrument Corporation
    Inventor: Peter A. Staniforth
  • Patent number: 6830372
    Abstract: A thermal testing control system for notebook computers, remotely controlled by a control means, is described. An enclosure can test notebook computers in its inner space under a predetermined temperature. A temperature sensor, mounted in the testing room is electrically connected to the control means. A blower is mounted in one opening, and electrically connected to the control means. If the temperature measured by the temperature sensor is higher than the predetermined temperature, the blower begins to operate.
    Type: Grant
    Filed: December 30, 2002
    Date of Patent: December 14, 2004
    Assignee: Quanta Computer Inc.
    Inventors: Tai-Sheng Liu, Chi-An Wu
  • Patent number: 6829820
    Abstract: A temperature sensor for detecting a temperature of, for example, an exhaust gas of a vehicle is manufactured by inserting a thermistor element into a bottomed metal tube while filling an inside of the metal tube with a filler material, preferably of silicone oil, to reduce a sliding resistance between the thermistor element and the metal tube as an integral temperature sensing structure which is then mounted in a housing.
    Type: Grant
    Filed: February 7, 2003
    Date of Patent: December 14, 2004
    Assignee: Denso Corporation
    Inventors: Tomohiro Adachi, Atsushi Kurano