Patents Examined by Stephen J. Cherry
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Patent number: 7577546Abstract: A system and method for automatically generating a computation mesh for use with an analytical tool, the computation mesh having a plurality of ?-grid lines and ?-grid lines intersecting at grid points positioned with respect to an inner boundary and an outer boundary. The method includes receiving from a user information corresponding to a shape to be analyzed using the analytical tool and solving one or more mesh equation for a plurality of point locations, the one or more mesh equations depending on a source decay factor that is inversely proportional to the number of ?-grid lines.Type: GrantFiled: December 17, 2007Date of Patent: August 18, 2009Assignee: Concepts ETI, Inc.Inventor: Shankar Subramaniam
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Patent number: 7577547Abstract: A system and method for automatically generating a computation mesh for use with an analytical tool, the computation mesh having a plurality of ?-grid lines and ?-grid lines intersecting at grid points positioned with respect to an inner boundary and an outer boundary. The method includes receiving from a user information corresponding to a shape to be analyzed using the analytical tool and solving one or more mesh equation for a plurality of point locations, the one or more mesh equations depending on a source Jacobian scaling parameter that is not equal to 2.Type: GrantFiled: December 17, 2007Date of Patent: August 18, 2009Assignee: Concepts ETI, Inc.Inventor: Shankar Subramaniam
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Patent number: 7574319Abstract: Apparatuses for a test and measurement instrument provide an instrument capable of handling acquisition, transfer, analysis, and display of large quantities of waveform data and complex waveforms. The apparatus for a test and measurement instrument consists of multiple processors with each processor being connected to its own memory controller. Each memory controller is connected to its own memory. The processors are connected in a circular arrangement by multiple high-speed interconnects. A bridge is connected to at least the first and last processors. A system bus connects the bridge to an acquisition module. The acquisition module has a signal bus interface with the system bus being connected to the acquisition module and having its own acquisition hardware. The acquisition hardware is a direct memory access machine that can transfer data to any portion of the memory. There is a signal source connected to the signal bus interface.Type: GrantFiled: March 19, 2008Date of Patent: August 11, 2009Assignee: Tektronix, Inc.Inventor: Mehrab S. Sedeh
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Patent number: 7574320Abstract: A remote monitoring system is disclosed. In one such embodiment, a system may comprise a first measuring unit disposed within a structure, a first processor disposed in operative communication with the first measuring unit, and a second processor disposed within the structure. The first measuring unit may comprise a first sensor adapted to detect a first parameter. The first measuring unit may be adapted to output a first signal associated with the first parameter. The first processor may be adapted to receive the first signal and to control the first measuring unit. The second processor may be disposed in operative communication with the first measuring unit and the first processor.Type: GrantFiled: August 31, 2006Date of Patent: August 11, 2009Assignee: JELD-WEN, inc.Inventors: Wallace Dale Corwin, Michael Shayne Walker, Budd William Beatty
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Patent number: 7571067Abstract: Apparatuses for a test and measurement instrument provide an instrument capable of handling acquisition, transfer, analysis, and display of large quantities of waveform data and complex waveforms. The apparatus for a test and measurement instrument consists of multiple processors with each processor being connected to its own memory controller. Each memory controller is connected to its own memory. The processors are connected in a circular arrangement by multiple high-speed interconnects. There are multiple bridges with each processor being connected to its own bridge. There are multiple system buses with each bridge been connected to its own system bus. A housing encloses the processors, memory controllers, high-speed interconnects, and bridges.Type: GrantFiled: March 19, 2008Date of Patent: August 4, 2009Assignee: Tektronix, Inc.Inventor: Mehrab S. Sedeh
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Patent number: 7567878Abstract: A method for monitoring machine conditions provides additional information using a one-class classifier in which an evaluation function is learned. In the method, a distance is determined from an anomaly measurement x to a boundary of a region R1 containing all acceptable measurements. The distance is used as a measure of the extent of the anomaly. The distance is found by searching along a line from the anomaly to a closest acceptable measurement within the region R1.Type: GrantFiled: November 27, 2006Date of Patent: July 28, 2009Assignee: Siemens Corporate Research, Inc.Inventors: Chao Yuan, Claus Neubauer
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Patent number: 7558700Abstract: In a failure diagnosis apparatus for a refrigerating cycle, a plurality of instrumentation amounts concerning the refrigerant such as the pressure and temperature of the refrigerating cycle apparatus or other instrumentation amounts are detected, the state quantities such as composite variables are acquired by making the arithmetic operation on these instrumentation amounts, and whether the apparatus is normal or abnormal is judged employing the arithmetic operation results. If learning is made during the normal operation, a current state is judged, and if learning is made by compulsorily performing the abnormal operation, or if the abnormal operating condition is operated during the current operation, a failure foretaste such as a critical operation can be made from a change in the Mahalanobis distance. Thereby, the secure diagnosis can be implemented with a simple constitution.Type: GrantFiled: December 17, 2004Date of Patent: July 7, 2009Assignee: Mitsubishi Denki Kabushiki KaishaInventors: Koji Yamashita, Masaki Toyoshima, Hiroshi Nakata
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Patent number: 7542861Abstract: A method and system for LED calibration is provided for a plurality of LED modules cascaded in a series. Each LED module includes a plurality of LEDs, a driver and a controller. The control signal from a calibration host is transmitted to all the modules to light all LEDs in the LED module. Through the controller of the LED module, the calibration data transmitted from the calibration host is stored in the memory inside the driver so that all the LEDs will emit light according to the calibration. The present invention improves the uniformity of the light emission and improves the module maintenance convenience.Type: GrantFiled: October 1, 2008Date of Patent: June 2, 2009Assignee: Opto Tech Corp.Inventors: Ju-Yuan You, Chien-Feng Chang, Wei-Chih Liao, Zong-Huai Lee
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Patent number: 7539593Abstract: Sensor data may be received from multiple sensors configured to sense properties of a process control system. The sensor data may include sensed values and uncertainty data corresponding to the sensed values. A new measurement associated with the process control system and corresponding uncertainty data for the new measurement may be determined based on the sensed values and uncertainty data received from the multiple sensors.Type: GrantFiled: September 26, 2007Date of Patent: May 26, 2009Assignee: Invensys Systems, Inc.Inventor: Milos Jaroslav Machacek
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Patent number: 7533004Abstract: A distributed computing environment for calibrating multiple components and reliably generating calibration data about each of the components. The calibration data from a plurality of calibration devices is stored in a database in a manner that avoids the problem of data collisions. The calibration devices include specific components or modules that allow each calibration device to independently generate calibration data, buffer calibration data, archive calibration data, transmit and receive data signals from a database, and receive data signals from a global network and display them for an operator. A method is disclosed which generated calibration data and subsequently detects and corrects calibration errors within a distributed network in a time frame that avoids the unnecessary disposal of improperly calibrated devices.Type: GrantFiled: October 20, 2003Date of Patent: May 12, 2009Assignee: Finisar CorporationInventor: Paul Sung
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Patent number: 7533005Abstract: A system for checking a reference plane of a signal trace in a PCB includes: a database, a signal filter, a signal trace selecting unit, a reference plane checking unit and a display unit. The database is configured for storing a plurality of signal files. The signal file in the PCB constitutes one or more signal groups. Each signal group has a same bus. The signal filter is configured for filtering a signal group from a signal file. The signal trace selecting unit is configured for selecting a signal for checking, from the signal group, and for selecting a trace corresponding to the signal. The reference plane checking unit is configured for checking the integrity of a reference plane that is nearest to the selected signal trace through orthographically projecting the selected signal trace to the reference plane and for checking a relationship between the reference plane and the projection. A related method is also disclosed.Type: GrantFiled: June 27, 2007Date of Patent: May 12, 2009Assignee: Hon Hai Precision Industry Co., Ltd.Inventors: Shou-Kuo Hsu, Chun-Shan Hsiao
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Patent number: 7532994Abstract: A test apparatus for testing an electronic device by providing test signals to the electronic device and comparing multiple output signals with respective anticipated values is disclosed, the test apparatus including: a reference timing detecting unit for detecting that one of the output signals has changed; a setting unit for setting beforehand a minimum time from changing of the output signal to changing of another output signal; an acquisition unit for acquiring the value of the latter output signal at a timing at which the minimum time has elapsed from detection of change of the former output signal; and a determination unit for determining the electronic device to be defective in the event that the value of the latter output signal thus acquired does not match the value which the latter output signal should assume following elapsing of the minimum time.Type: GrantFiled: March 31, 2006Date of Patent: May 12, 2009Assignee: Advantest CorporationInventors: Hideki Tada, Mitsuo Hori, Takahiro Kataoka, Hiroyuki Sekiguchi
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Patent number: 7529639Abstract: The invention is a system and method for computing a result for a location, wherein the result indicates how novel it is for a wireless device to occupy a specific location. After determining the location of a wireless device through various means, a Novelty Index Value (NIV) is calculated for the location, and the NIV is then stored into a database. The NIV may then be subsequently used by application programs to compute a desired result from the NIV. Multiple users may utilize and/or share the same NIV values. The NIV may also be used to alter the configuration of a wireless device as well. A recommendation system is also disclosed, wherein user context is utilized along with NIV values to compute particular results for a user.Type: GrantFiled: March 4, 2008Date of Patent: May 5, 2009Assignee: Nokia CorporationInventors: Eero Räsänen, Roman Kikta, Antti Sorvari, Jukka-Pekka Salmenkaita, Ykä Huhtala, Heikki Mannila, Hannu T. Toivonen, Kari Oinonen, Juhani Murto
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Patent number: 7526412Abstract: Methods of comparing a plurality of measurements to a template are described. Measurements are compared piecewise (element-by-element) and a proportion of successful comparisons at each of a plurality of distance scaling factors is calculated. The proportions are subjected to a nonlinear transformation, then normalized and combined into a weighted sum. The weighted sum is compared with a threshold value to establish the result of the comparison. Software and systems to implement embodiments of the invention are also described and claimed.Type: GrantFiled: March 31, 2006Date of Patent: April 28, 2009Assignee: Biopassword, Inc.Inventors: Seshadri Mani, Mechthild Kellas-Dicks
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Patent number: 7519497Abstract: A trace test and debug system for a target processor generates a program counter trace stream, a timing trace stream and a data trace stream. The target processor has three states, a program code execution state, an interrupt service routine code execution state, and a state where code execution is halted. The trace streams can be controlled so that the timing trace stream can be generated or excluded during the code execution halts. Similarly, when the timing trace stream is enabled for the interrupt service routine(s), the program counter and data trace streams can be selectively generated or excluded. The contents of the pipeline flattener can be held or flushed code execution halt depending on whether the pipeline is unprotected or protected. When the contents of the pipeline flattener are held during a code halt, the program counter trace stream and data trace stream is halted even if the timing trace stream remains active.Type: GrantFiled: December 5, 2003Date of Patent: April 14, 2009Assignee: Texas Instruments IncorporatedInventor: Gary L. Swoboda
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Patent number: 7516031Abstract: A method of correcting for aberrations in scattering data is described which does not require prior knowledge about the sample microstructure properties or calculations based on the modelling of peak locations. In an example, X-ray scattering apparatus integrates a correction device arranged to automatically calculate and output aberration corrected output X-ray pattern using the aberration Fourier presentation Finst(H,2?) dependent from the scattering angle 2? and the Fourier transform of the measured X-ray scattering pattern Fexp(H).Type: GrantFiled: March 7, 2006Date of Patent: April 7, 2009Assignee: PANalytical B.V.Inventor: Vladimir Kogan
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Patent number: 7512516Abstract: A collision avoidance and warning system and method are provided. The system includes a sensor and a controller. The sensor senses an object in a field of view, wherein the sensor determines a direct range measurement between the sensor and the object and an angle measurement of the object with respect to the sensor. The controller receives the direct range measurement and angle measurement from the sensor, and determines if the object is in an in-path area based upon the direct range measurement and angle measurement, as a function in a pseudo polar coordinate frame.Type: GrantFiled: November 2, 2007Date of Patent: March 31, 2009Assignee: Delphi Technologies, Inc.Inventor: Glenn R Widmann
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Patent number: 7512521Abstract: A hand held configuration for coupling to a two wire process control loop for use in configuring and monitoring field units coupled to the two wire process control loop is provided which includes a power supply, and at least two power islands. The power islands are configured to electrically isolate electrical components in one power island from electrical components in another power island. Independent power connections are provided between each power island and the power supply.Type: GrantFiled: April 30, 2003Date of Patent: March 31, 2009Assignees: Fisher-Rosemount Systems, Inc., R. Stahl Schaltgerate GmbHInventors: Joachim Düren, Günter Kämper
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Patent number: 7505864Abstract: The embodiment of the invention is related to a processor configured for determining a predetermined number of frequency estimates, determining an average of the frequency estimates for obtaining an averaged frequency offset, unbiasing received samples and/or impulse response values using the averaged frequency offset, calculating Doppler frequency estimates using the unbiased received samples and/or impulse response values and calculating selected second order statistics of the Doppler frequency estimates over a predetermined period and calculating a speed of a communication system terminal using the Doppler frequency.Type: GrantFiled: June 8, 2006Date of Patent: March 17, 2009Assignee: Nokia CorporationInventors: Sathiaseelan Sundaralingam, Khairul Hasan, Eric Jones, Mikko Säily
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Patent number: 7499809Abstract: In a measurement system, by suppressing the environmental changes of counter-flow of air, and temperature changes and the like, measurement can be accomplished with stable high precision and replication, and by providing a transparent cell 2 which stores a particles dispersed in a dispersion medium, and a light source which irradiates light onto the particles within the transparent cell 2, and multiple light detectors 5 scattered and arranged to detect the intensity of diffracted/scattered light produced by the irradiation of light, and a computer device 6 which calculates the particle size distribution of the particles based on the light intensity signal output from the light detectors 5, in addition to the establishment of cell storage space S which stores the transparent cell 2 and the equipment storage spaces S1 and S2 which store the light source 41a, the light detector 5, and the optical device 6, the equipment storage spaces S1 and S2 are given tight closed construction separate from the cell storage sType: GrantFiled: August 30, 2005Date of Patent: March 3, 2009Assignee: Horiba, Ltd.Inventors: Makoto Nagura, Yuki Ishii, Hideyuki Ikeda, Takuji Kurozumi, Yoshiaki Togawa