Patents Examined by Stephen J. Cherry
  • Patent number: 7324911
    Abstract: A business method for comprehensively planning the installation into a building of various dissimilar types of electrical cables. A feature of the method is that each individual cable, when installed in place, is then tested for the level of performance which will be required of that cable in that location.
    Type: Grant
    Filed: September 3, 2004
    Date of Patent: January 29, 2008
    Assignee: JDS Uniphase Corporation
    Inventors: Ronald J. Vogel, Lee A. Watkins
  • Patent number: 7321833
    Abstract: A valve body defines an inlet, an outlet, a valving cavity disposed between the inlet and outlet and a valving surface between the inlet and the outlet. A valve is moveable to a position away from the valving surface for permitting flow from the inlet through the valving cavity to the outlet. The fluid flow rate sensor includes a probe having a detection module adapted to change condition in response to the presence of the flow of the fluid, a control module that is electrically connected to the probe that monitors the condition of the detection module over time (e.g., a temperature), determines a rate of change of that condition over time, and generates an output that is indicative of the rate of flow of the fluid, and a I/O module connected to the control module and communicating the output of the control module to another device or a user.
    Type: Grant
    Filed: July 11, 2006
    Date of Patent: January 22, 2008
    Assignee: Emerson Electric Co.
    Inventors: Michael DuHack, Bernd D. Zimmermann, Tung-Sheng Yang
  • Patent number: 7318002
    Abstract: A method and apparatus for automated testing of display signals from video graphics circuitry includes capturing display signals that are provided from a processing device to the display device. The method and apparatus further includes converting the display signals into data acquisition signals, where a data acquisition signal includes a converted display signal having the display information contained therein wherein the data acquisition signal is in a form capable of being directly analyzed by a testing system. Furthermore, the method and apparatus includes providing the data acquisition signals to a test system that tests the display signals.
    Type: Grant
    Filed: September 29, 2003
    Date of Patent: January 8, 2008
    Assignee: ATI Technologies Inc.
    Inventors: Ara Kulidjian, Andrej Zdravkovic
  • Patent number: 7308367
    Abstract: A method and system for identifying a defect or contamination on a surface of a material. The method and system involves providing a material, such as a semiconductor wafer, using a non-vibrating contact potential difference sensor to scan the wafer, generate contact potential difference data and processing that data to identify a pattern characteristic of the defect or contamination.
    Type: Grant
    Filed: February 3, 2004
    Date of Patent: December 11, 2007
    Assignee: Qcept Technologies, Inc.
    Inventors: M. Brandon Steele, Jeffrey Alan Hawthorne, Chunho Kim, David C. Sowell
  • Patent number: 7308376
    Abstract: A computer platform automatic testing method and system is proposed, which is designed for use in conjunction with a computer platform for performing an automatic testing procedure on a computer-dedicated circuit unit installed on the computer platform, and which is characterized by the capability of performing an automatic testing procedure on a computer-dedicated circuit unit based on a user-specified set of hardware specification data about the computer platform and circuit unit under test, and the capability of automatically generating a test report that lists related data about each faulted part of the circuit unit being tested. This feature allows hardware engineers to more conveniently and efficiently correct faulted parts in the circuit unit being tested.
    Type: Grant
    Filed: February 5, 2005
    Date of Patent: December 11, 2007
    Assignee: Inventec Corporation
    Inventors: Ying-Chih Lu, Chin-Lung Wu, Chun-Yi Lee, Chia-Hsing Lee, Chi-Tsung Chang, Ling-Hung Yu
  • Patent number: 7308366
    Abstract: In a method of determining a regression model, and a method of predicting a component concentration of a test mixture using the regression model, the method of determining the regression model includes selecting a regression model, generating a plurality of observation points, each one of the plurality of observation points having a prediction target value and a measured value, determining a weight of the prediction target value and the measured value at each one of the plurality of observation points, and obtaining a calculation amount by reflecting the weights in differences between predicted values acquired by applying the measured values to the regression model and the prediction target values, and determining coefficients of the regression model to minimize the calculation amount.
    Type: Grant
    Filed: February 8, 2005
    Date of Patent: December 11, 2007
    Assignee: Samsung Electronics Co., Ltd.
    Inventor: Sang-joon Han
  • Patent number: 7305317
    Abstract: A joint approach of out-of-range detection and fault detection for power plant monitoring. The method initially determines whether a sensor is an independent sensor or a dependent sensor. If the sensor is an independent sensor, then an operating range is established for each independent sensor. A reading from each independent sensor is then compared with the operating range that has been established. If the reading is out-of-range, an alarm may be activated. If the reading is not out-of-range, then this reading is used to determine an expected operating range for each dependent sensor. A reading from each dependent sensor is then compared with the predicted operating range. Again, if the reading from the dependent sensor is out of the expected range, an alarm may be sounded.
    Type: Grant
    Filed: September 2, 2004
    Date of Patent: December 4, 2007
    Assignee: Siemens Corporate Research, Inc.
    Inventors: Chao Yuan, Zehra Cataltepe, Claus Neubauer, Ming Fang
  • Patent number: 7299137
    Abstract: A method for simulating at least one drive cycle of a vehicle using a non-engine based test system, the method including providing a non-engine based test system including a combustor in fluid communication with a catalytic converter from the vehicle; supplying fuel and air to said combustor at an air to fuel ratio (AFR) and under conditions effective to produce a feedstream flowpath; substantially stoichiometrically combusting at least a portion of the fuel in the feedstream flowpath under conditions effective to simulate at least one drive cycle of the vehicle and to produce a simulated drive cycle exhaust product for the vehicle, the conditions being effective to prevent substantial damage to the combustor; and, collecting and analyzing the simulated drive cycle exhaust product.
    Type: Grant
    Filed: May 17, 2004
    Date of Patent: November 20, 2007
    Assignee: Southwest Research Institute
    Inventors: Gordon J. Bartley, Andy M. Anderson, Cynthia C. Webb, Bruce B. Bykowski
  • Patent number: 7295947
    Abstract: A contact free optical position sensor for an inertial reference system. An optical sensor is adapted to generate image signals of a gas bearing supported inertial sensor assembly. The surface of the inertial sensor assembly is adapted with a reference surface pattern. A controller is coupled to receive the image signals from the optical sensor and is adapted with an image map of the reference surface pattern stored in a memory means that allows the controller to uniquely correlate an image captured by the optical sensor to an absolute position on the inertial sensor assembly. The controller is further adapted to determine the absolute position and attitude of the inertial sensor assembly based on the correlation between the imaged reference pattern features, the imaged reference pattern's angle of rotation, and the map of the reference pattern.
    Type: Grant
    Filed: December 3, 2004
    Date of Patent: November 13, 2007
    Assignee: Honeywell International Inc.
    Inventors: Antony J. Kurth, Karl H. Becker
  • Patent number: 7295943
    Abstract: A geomagnetic sensor capable of calibrating an accurate azimuth even if the geomagnetic sensor is in a tilting state. The geomagnetic sensor includes a geomagnetism measuring unit, having a drive pulse generating unit for generating a pulse signal and two-axis flux gates provided in X-axis and Y-axis directions which are orthogonal to each other, for outputting voltage values of the two-axis flux gates corresponding to geomagnetism produced by the drive signal, an acceleration sensor for measuring a pitch angle and a roll angle which indicate a tilting degree of the geomagnetic sensor based on X axis and Y axis, and a control unit for calibrating the azimuth by extracting normalization factors by compensating the voltage values outputted from the geomagnetism measuring unit using the pitch angle and the roll angle measured by the acceleration sensor and normalizing the compensated voltage values using the normalization factors.
    Type: Grant
    Filed: December 6, 2004
    Date of Patent: November 13, 2007
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Woo-jong Cho, Sang-on Choi, Sung-mun Cho
  • Patent number: 7292955
    Abstract: The invention performs an AC stress test assuming the CMOS operation and an AC stress test using a ring oscillator (R.O.) between a DC stress test method using single semiconductor elements and an aging test method. The deterioration of a semiconductor apparatus can be estimated highly precisely by separately performing the AC stress test assuming the CMOS operation on OFF-stress and ON-stress.
    Type: Grant
    Filed: April 11, 2003
    Date of Patent: November 6, 2007
    Assignee: Semiconductor Energy Laboratory Co., Ltd.
    Inventors: Etsuko Asano, Masahiko Hayakawa, Yoshiko Ikeda
  • Patent number: 7289912
    Abstract: In a method of estimating a component concentration of a mixture, and an apparatus for performing the method, the method includes generating a global calibration model with respect to a calibration data set using a concentration value determined by a plurality of independent variables including a predetermined specific component, a concentration of which is intended to be estimated, as a dependent variable, dividing the calibration data set into at least two small groups according to a value of the dependent variable and generating local calibration models for each of the at least two small groups using the calibration data set included in the divided at least two small groups, and determining a small group to which a spectrum of the mixture belongs and estimating a concentration of the specific component using a local calibration model of the determined small group.
    Type: Grant
    Filed: October 15, 2004
    Date of Patent: October 30, 2007
    Assignee: Samsung Electronics Co., Ltd.
    Inventor: Sang-joon Han
  • Patent number: 7283919
    Abstract: One embodiment of the present invention provides a system that tests the quality and/or the reliability of a component. During operation, the system applies test conditions to a plurality of specimens of the component. While applying the test conditions, the system measures the same variable from each of the plurality of specimens. Next, the system computes a running average of the measured variable across the plurality of specimens. The system then computes residuals between the measured variable for each specimen and the running average. The system next determines from the residuals whether the associated specimens are degraded.
    Type: Grant
    Filed: March 6, 2006
    Date of Patent: October 16, 2007
    Assignee: Sun Microsystems, Inc.
    Inventors: Kenny C. Gross, Dan Vacar, Leoncio D. Lopez, David K. McElfresh
  • Patent number: 7280929
    Abstract: A method for measuring a value of an electrical characteristic of a device under test in a circuit having a load impedance includes applying a voltage to said circuit, the voltage having a selected amplitude; measuring a current in the circuit in response to the voltage; calculating an error value using the impedance, amplitude and current; adjusting the amplitude using the error value; and repeating the preceding steps until the error value reaches a desired value. This results in the selected amplitude changing from an initial value to a final value and the current changing to a final value. The initial value of the selected amplitude and the final value of the current are used to determine the electrical characteristic value.
    Type: Grant
    Filed: September 29, 2004
    Date of Patent: October 9, 2007
    Assignee: Keithley Instruments, Inc.
    Inventor: Yuegang Zhao
  • Patent number: 7277801
    Abstract: The present application relates in general to methods for testing the performance of an automotive catalytic converter under conditions simulating those which occur in motor vehicles over extended driving conditions.
    Type: Grant
    Filed: May 25, 2006
    Date of Patent: October 2, 2007
    Assignee: Southwest Research Institute
    Inventors: Cynthia C. Webb, Bruce B. Bykowski, Gordon J. Bartley
  • Patent number: 7277825
    Abstract: An improved system and method for completing performance analysis for a target system is disclosed. According to the current invention, different types of configurations files are created, each to describe one or more respective aspects and/or portions of the target system. Each of these file types may include a combination of parameter values and equations that represent the respective portion of the system. After the configuration files are defined, scenarios are created. Each scenario includes a set of configuration files, with some or all of the files being of different file types. The files included within a scenario provide all parameter values and equations needed to calculate performance data for a particular revision of the target system. Next, a performance study is defined to include one or more of the scenarios. Finally, performance data is derived for each of the scenarios in the performance study.
    Type: Grant
    Filed: April 25, 2003
    Date of Patent: October 2, 2007
    Assignee: Unisys Corporation
    Inventors: Marwan A. Orfali, Mitchell A. Bauman, Myoungran Kim
  • Patent number: 7266462
    Abstract: A system, method and computer program for configuring power supply apparatus to supply a voltage optimized to tolerate a range about a nominal operating voltage of a device comprises a tester to test and communicate to a comparator a present utility voltage value. The comparator compares the present utility voltage with a present nominal operating voltage of the device. A configurator responds to the present utility voltage falling within an upper half of a first range having a centre point higher than the present nominal operating voltage and lower than an upper out-of-tolerance voltage of the device or within a lower half of a second range having a centre point lower than the present nominal operating voltage and higher than a lower out-of-tolerance voltage of the device, by configuring the power supply apparatus to supply a voltage respectively within the first range or the second range.
    Type: Grant
    Filed: February 10, 2005
    Date of Patent: September 4, 2007
    Assignee: International Business Machines Corporation
    Inventor: Paul Jonathan Quelch
  • Patent number: 7266468
    Abstract: A system and method for identifying significant bivariate checkpoints. The system includes a controller configured to receive measurements for a plurality of checkpoints and calculate the covariance and correlation for each checkpoint pair. The controller identifies significant bivariate checkpoints based on the covariance between the checkpoint pairs. Further, the controller may also calculate the correlation for each checkpoint pair and identify the significant bivariate checkpoints based on a combination of the covariance and the correlation between the checkpoints. Further, the controller may rank the significant bivariate checkpoints and provide the significant bivariate checkpoints to a principal component algorithm.
    Type: Grant
    Filed: March 3, 2006
    Date of Patent: September 4, 2007
    Assignee: Perceptron, Inc.
    Inventors: Jiri Gardavsky, Jim Roan, Yu Guo, Hannes Loferer, Richard A. Krakowski
  • Patent number: 7260481
    Abstract: A phase-sensitivity detector detects a phase sensitivity of an AC signal with a known frequency, output by an input amplifier, and an integrator double-integrates an output of (X-Y) of which the phase sensitivity is detected, thereby obtaining vector detecting information ?(tend?tst)/tm=A cos ? and ?(tend?tst)/tm=A sin ? of the AC signal with the known frequency.
    Type: Grant
    Filed: March 17, 2006
    Date of Patent: August 21, 2007
    Assignee: Tanita Corporation
    Inventor: Masato Nakada
  • Patent number: 7257511
    Abstract: Disclosed is a DC thermal energy generator for heating localized regions of an integrated circuit. The integrated circuit includes a pair of static circuits whose outputs are shorted, and are in contention. Contention causes current to flow through the circuits, generating heat. Integrated-circuit temperature can be varied by turning on more or fewer thermal energy generators. The thermal resistance of a packaged integrated circuit is computed using a well-known relationship among the integrated circuit's measured temperature, power consumption, and the ambient temperature.
    Type: Grant
    Filed: December 3, 2004
    Date of Patent: August 14, 2007
    Assignee: Xilinx, Inc.
    Inventors: Steven H. C. Hsieh, Siuki Chan