Patents Examined by Steven R. Garland
  • Patent number: 7532954
    Abstract: Some embodiments provide methods, systems and computer readable mediums storing programs, instructions and/or coding for use in setting up and/or controlling irrigation. A method for use in controlling an irrigation system is provided according to some embodiments that receives a first current moisture loss value, determines a first net moisture loss value since a last irrigation start day utilizing the first current moisture loss value, retrieves a threshold moisture loss value associated with one or more watering programs controlled according to one of a plurality of selectable irrigation control levels that correspond to different ways of associating threshold moisture loss values to watering programs, and defining a current day as an irrigation start day for the one or more watering programs associated with the first irrigation control level when the first net moisture loss value has a predetermined relationship with respect to the threshold moisture loss value.
    Type: Grant
    Filed: February 10, 2006
    Date of Patent: May 12, 2009
    Assignee: Rain Bird Corporation
    Inventor: Rene H. Evelyn-Veere
  • Patent number: 7519441
    Abstract: Systems, methods and apparatus are provided through which movement of a medical imaging device is detected and the movement is assisted in magnitude by an external force.
    Type: Grant
    Filed: September 30, 2005
    Date of Patent: April 14, 2009
    Assignee: General Electric Company
    Inventor: Jonathon Carl Boomgaarden
  • Patent number: 7519446
    Abstract: A manufacture condition setting system includes a manufacture state acquisition unit to which static/dynamic conditions and a product quality in the case where the static/dynamic conditions do not change for, at least, a predetermined number of manufactured articles in an ordinary manufacture state are inputted together with reference information, a dynamic condition inference unit which estimates and outputs a corresponding optimal dynamic condition in a case where a combination of the static conditions is an experienced one, and a dynamic condition correction unit which, if necessary, corrects inference knowledge stored by the dynamic condition inference unit, by using information inputted from the manufacture state acquisition unit.
    Type: Grant
    Filed: April 18, 2006
    Date of Patent: April 14, 2009
    Assignee: Omron Corporation
    Inventor: Toru Fujii
  • Patent number: 7509185
    Abstract: Methods of integrating a computer product with a pharmaceutical manufacturing software system for manufacturing of pharmaceuticals and validation of pharmaceutical manufacturing processes and quality assurance processes are described and disclosed herein. Consequently, the methods provide a means to manufacture pharmaceuticals on an integrated level whereby the manufacturer can ensure data and product integrity and minimize cost.
    Type: Grant
    Filed: August 14, 2006
    Date of Patent: March 24, 2009
    Assignee: SMP Logic Systems L.L.C.
    Inventor: Shane M. Popp
  • Patent number: 7509186
    Abstract: A method and system for reducing the variation in film thickness on a plurality of semiconductor wafers having multiple deposition paths in a semiconductor manufacturing process is disclosed. A film of a varying input thickness is applied to semiconductor wafers moving through various film deposition paths. The deposition path of each of the semiconductor wafers is recorded. A subset of semiconductor wafers is measured and an average film input thickness corresponding to each of the film deposition paths is calculated. If semiconductor wafer in the specific film deposition path does not have measurement data, by default it uses historical measurement data. The average film input thickness of the deposition path corresponding to a given semiconductor wafer is then used to modify the recipe of a process tool, such as a Chemical Mechanical Planarization (CMP) Process Tool. An improved manufacturing process is achieved without the use of excess measurements.
    Type: Grant
    Filed: November 7, 2006
    Date of Patent: March 24, 2009
    Assignee: International Business Machines Corporation
    Inventors: Yue Li, Gary W. Behm, James V. Iannucci, Jr., Derek C. Stoll
  • Patent number: 7505827
    Abstract: A scheduler for a finite capacity process provides a schedule based on an integrated assessment of both discrete and continuous constraints. Given a list of products to be provided, the scheduler generates a set of activities required to produce the products and identifies resources required and the discrete and continuous constraints related to such resources. Activities are resized, and timelines are established for the activities as a function of deadlines for the product delivery for which the activities are related. Resource balancing heuristics are used to redistribute resource utilization to prevent bottlenecks. Data structures are used to keep track of constraints. Both discrete and continuous constraints are defined. Separate solver engines for the discrete and continuous constraint problems modify the constraints. The data structures are used to share and propagate constraints between the two engines.
    Type: Grant
    Filed: November 6, 1998
    Date of Patent: March 17, 2009
    Assignee: Honeywell International Inc.
    Inventors: Mark S. Boddy, Daniel P. Johnson
  • Patent number: 7489990
    Abstract: Systems and methods for calculating and predicting performance characteristics, incremental heat rate, capacity, incremental costs, production cost and emissions, for electric power generation plants, and in particular, those that use steam and gas-turbine prime movers. The system includes models and modules for calculating current unit performance and predicting unit performance, including the incremental heat rate and maximum capacity, using unit operating parameters, unit configuration data, and fuel constituency data. The system further includes a module for forecasting or predicting unit performance and cost information, by allowing the user to alter unit configuration and fuel constituency data to model planned maintenance and projected fuel changes, and to account for anticipated atmospheric conditions.
    Type: Grant
    Filed: July 17, 2007
    Date of Patent: February 10, 2009
    Inventors: Stephen L. Fehr, Linda A. Hutchinson
  • Patent number: 7487012
    Abstract: A method of dynamic thermal management in a multi-dimensional integrated circuit or device is provided. The method includes monitoring on-chip temperatures, power dissipation, and performance of device layers. The method includes comparing on-chip temperatures to thermal thresholds, on-chip power dissipation to power thresholds and on-chip performance to performance thresholds. Also, the method includes analyzing interactions between temperatures, power, and performance of different device layers within the multi-dimensional integrated circuits. The method includes activating layer-specific thermal and power management within performance constraints on one or more device layers through actuators in the corresponding device layers, depending on the severity of heating.
    Type: Grant
    Filed: May 11, 2007
    Date of Patent: February 3, 2009
  • Patent number: 7487005
    Abstract: A process planning apparatus extracts a region to be machined based on the difference of the shape data before and after machining of the workpiece, replaces the extracted region into combinations of the predetermined machining features, allocates a predetermined fixed cycle to each of the replaced machining features, and applies an assessment function relating to a machining time and a life of the end mill to each of the combinations of the machining features to which the fixed cycles are respectively allocated, thereby selecting a group of the fixed cycles which makes an assessment value obtained by the assessment function optimum as the optimal process. By these steps, it becomes possible to design the process for causing the NC machine employing end mills as a cutting tool to perform a predetermined machining of a workpiece without relying on the experience of the designer, and without necessitating complicated work.
    Type: Grant
    Filed: October 20, 2005
    Date of Patent: February 3, 2009
    Assignees: Mori Seiki Co., Ltd., Yasda Precision Tools K.K., Yamazaki Mazak Corp., Mitsubishi Electric Corp.
    Inventors: Yoshiaki Kakino, Atsushi Matsubara, Iwao Yamaji, Yoshifumi Fujita, Hidenori Saraie, Hisashi Otsubo, Yoshinori Yamaoka, Tomonori Sato
  • Patent number: 7483764
    Abstract: An exposure apparatus for exposing a substrate to a pattern. The apparatus includes an update system to update a parameter necessary for processing in the exposure apparatus through measurement, a setting system to set a validity period of the parameter updated by the update system, and a control system to cause the update system to update the parameter. Prior to execution of a unit of the processing, the control system determines that the update system is to update the parameter if a predicted completion time of the unit is after expiration of the validity period.
    Type: Grant
    Filed: April 13, 2007
    Date of Patent: January 27, 2009
    Assignee: Canon Kabushiki Kaisha
    Inventor: Hiromi Kemmoku
  • Patent number: 7471991
    Abstract: Methods for performing boundary value analysis on a pharmaceutical manufacturing process are described and disclosed herein. The algorithm performing the boundary value analysis is integrated into a pharmaceutical manufacturing process and control of the pharmaceutical manufacturing process is attained. Consequently, the methods provide a means to manufacture pharmaceuticals on an integrated level whereby data and product integrity are achieved and over time costs are minimized.
    Type: Grant
    Filed: August 8, 2006
    Date of Patent: December 30, 2008
    Assignee: SMP Logic Systems LLC
    Inventor: Shane M. Popp
  • Patent number: 7463936
    Abstract: A method and device for adapting a stop of an electrically triggered actuator are provided, which may be implemented in a precise and simple manner and allow for a continuous adaptation. For this purpose, a check is performed to determine whether a setpoint value for a position of the actuator to be set corresponds to a stop of the actuator. In this case, a characteristic variable of the trigger signal for triggering the actuator formed for implementing the setpoint value is compared with a predefined value. Depending on the result of the comparison, a position of the stop of the actuator is adapted.
    Type: Grant
    Filed: October 28, 2005
    Date of Patent: December 9, 2008
    Assignee: Robert Bosch GmbH
    Inventors: Torsten Baumann, Mattias Hallor
  • Patent number: 7463941
    Abstract: A quality control system has: a QC value storage unit, a data acquisition device, a device internal information storage unit, a recipe storage unit, a QC value prediction unit, a wafer determination unit, a recipe selection unit, and a measurement device.
    Type: Grant
    Filed: April 3, 2006
    Date of Patent: December 9, 2008
    Assignee: Kabushiki Kaisha Toshiba
    Inventors: Akira Ogawa, Yukihiro Ushiku, Tomomi Ino
  • Patent number: 7460915
    Abstract: In a process control system, the hidden properties of a catalyst are estimated by including those properties in hidden states within a state space model and solving the state space model based on measurable inputs and outputs of the process. The process may include defining a state space model for a process having a catalyst state comprising a hidden catalyst property; defining a set of empirically measurable input variables for the state space model, defining a set of output variables for the state space model, measuring a set of input values corresponding to the set of input variables; measuring a set of output values corresponding to the set of output variables; and estimating the hidden catalyst property based on the input values, the output values, and the state space model.
    Type: Grant
    Filed: June 21, 2006
    Date of Patent: December 2, 2008
    Assignee: Honeywell International Inc.
    Inventors: Karel Marik, Roman Navratil, Petr Stluka
  • Patent number: 7460916
    Abstract: An observation system configured to observe at least one known state variable of an observed system includes a plurality of filters that are configured to receive a system input, and generate the at least one unknown state variable. Generating the unknown state variable includes processing the system input, a plurality of known state variables, and a time varying mode vector. An inverse system configured to observe at least one inverse state variable of an original system includes a plurality of filters that are configured to receive a system input, and generate the at least one inverse state variable. Generating the inverse state variable includes processing the system input, a plurality of known state variables associated with the original system, and a time varying mode vector associated with the original system.
    Type: Grant
    Filed: October 7, 2005
    Date of Patent: December 2, 2008
    Assignee: Optichron, Inc.
    Inventor: Roy G. Batruni
  • Patent number: 7460917
    Abstract: Systems and methods of industrial control processes that employ a data matching component associated with a programming logic controller (PLC), to substitute a plurality of collected data points with a data pattern (e.g., a curve). Such data matching component can facilitate data trending analysis, wherein a running industrial process can be compared with a predetermined criteria (industrial process with optimal/desired performance). A graphical tool (e.g., an on-screen) can be provided as part of the matching component, to enable a user to interactively set deviation thresholds from a predetermined criteria (e.g., optimum performance of an industrial operation.
    Type: Grant
    Filed: September 30, 2005
    Date of Patent: December 2, 2008
    Assignee: Rockwell Automation Technologies, Inc.
    Inventors: Douglas J. Reichard, Clifton H. Bromley, Eric G. Dorgelo, Kevin G. Gordon, Marc D. Semkow, Shafin A. Virji
  • Patent number: 7457675
    Abstract: The present invention is directed to a system and method of monitoring assets of an enterprise using a stand-alone software system and a process automation software system. The stand-alone software system is operable to generate a web page about a condition of the asset and to transmit data items for the condition in a single data string. The data items include a status of the condition and a URL of the web page. The process automation software system includes a human system interface (HSI) and a generic asset monitor having a changeable condition table. The generic asset monitor may be modified to create a custom asset monitor specific to the asset. The custom asset monitor is operable to monitor the status of the condition and the HSI is operable to display the data items and the web page from the stand-alone software system.
    Type: Grant
    Filed: August 15, 2005
    Date of Patent: November 25, 2008
    Assignee: ABB Inc.
    Inventor: Richard W. Vesel
  • Patent number: 7457674
    Abstract: A system for updating a plurality of monitoring models is provided. The system includes a model association module that, for each of a plurality of monitored systems determines, an association between a particular monitored system and at least one of a plurality of estimation models. Each estimation model is based upon one of a plurality of distinct sets of estimation properties, and each set uniquely corresponds to a particular estimation model. The system also includes an updating module that updates at least one of the estimation properties and propagates the updated estimation properties to each estimation model that corresponds to a distinct set containing at least one estimation property that is updated. The system further includes a model modification module that modifies each estimation model that corresponds to a distinct set containing at least one estimation property that is updated.
    Type: Grant
    Filed: August 24, 2005
    Date of Patent: November 25, 2008
    Assignees: Siemens Corporate Research, Inc., Siemens Energy, Inc.
    Inventors: Chao Yuan, Claus Neubauer, Zehra Cataltepe, Wesley McCorkle, Hans-Gerd Brummel, Ming Fang
  • Patent number: 7447566
    Abstract: A flow control apparatus having a flow monitoring system capable of detecting and identifying a downstream occlusion present within an administration feeding set loaded to the flow control apparatus is disclosed. A software subsystem is associated with the flow control apparatus and administration feeding set, the software system plots at least one discrete date point against a standard occlusion profile to detect if a downstream occlusion present within the administration feeding set.
    Type: Grant
    Filed: August 14, 2006
    Date of Patent: November 4, 2008
    Assignee: Covidien AG
    Inventors: Christopher A. Knauper, Joseph A. Hudson
  • Patent number: 7444191
    Abstract: Disclosed is a method of controlling and managing a process control system having a plurality of control loops. The method includes implementing a plurality of control routines to control operation of the plurality of control loops, respectively. The plurality of control routines may include at least one non-adaptive control routine. Operating condition data is then collected in connection with the operation of each control loop of the plurality of control loops, and a respective process model is identified for each control loop of the plurality of control loops from the respective operating condition data collected for each control loop of the plurality of control loops. In some embodiments, the identification of the respective process models may be automatic as a result of a detected process change or be on-demand as a result of an injected parameter change.
    Type: Grant
    Filed: October 4, 2005
    Date of Patent: October 28, 2008
    Assignee: Fisher-Rosemount Systems, Inc.
    Inventors: John Caldwell, Terrence L. Blevins, Peter Wojsznis, Wilhelm K. Wojsznis