Patents Examined by Steven R. Garland
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Patent number: 7353074Abstract: A production loss tracking system for a manufacturing system includes a collection module, an event module, and a report module. The collection module collects a processing status from a plurality of processing stations. The event module forecasts an upstream production loss event for a first of the processing stations that is upstream from a second of the processing stations that experienced a production loss event when the processing status indicates the production loss event. The event module forecasts a downstream production loss event for a third of the processing stations that is downstream from the second of the processing stations that experienced the production loss event when the processing status indicates the production loss event. The report module communicates with the event module and generates a report indicating the upstream production loss event, the downstream production loss event, and the production loss event.Type: GrantFiled: March 10, 2006Date of Patent: April 1, 2008Assignee: GM Global Technology Operations, Inc.Inventors: James N. Nickolaou, Henry W. Baker
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Patent number: 7353077Abstract: A method of optimizing die placement on a wafer having an alignment mark with a computing system includes arranging a plurality of fields on the wafer in a first position. Dummies are inserted between at least one arranged field and the alignment mark and inserted adjacent to the wafer edge. The total number of dies manufacturable on the wafer at the first position is determined. The wafer position is shifted to a second position relative to the position of the plurality of fields, and the total number of dies manufacturable on the wafer at the second position is determined. The total number of manufacturable dies from each of the first and the second positions is compared, and the positions having the higher number of manufacturable die are candidates of optimal die placement position. Then the total number of fields, the total number of dummies, and the total number of shared dummies are evaluated to decide the optimal die placement position.Type: GrantFiled: September 8, 2005Date of Patent: April 1, 2008Assignee: Taiwan Semiconductor Manufacturing CompanyInventors: Chih-Wei Lin, Hong-Hsing Chou, Yeh-Jye Wang, Chen-Fu Chien, Jen-Hsin Wang, Chih-Wei Hsiao
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Patent number: 7353085Abstract: As an electrochemical cell stack gets older the internal resistances within the stack rise overtime as the materials that the stack is made of degrade. Consequently, an old and “worn” electrochemical cell stack draws less current at the same stack voltage and operating temperature as a new stack. When the current draw falls the electrochemical reaction rates also fall, as less energy is available to drive the electrochemical reactions. However, if the operating temperature of an older stack is controllable raised the current draw by an electrolyzer cell stack also rises, which in turn causes the reaction rates to rise again. Accordingly, in some embodiments, a balance-of-plant system is operable to regulate the current draw of an electrolyzer cell stack by first manipulating the operating temperature of the same electrolyzer cell stack.Type: GrantFiled: September 21, 2004Date of Patent: April 1, 2008Assignee: Hydrogenics CorporationInventors: Ali Rusta-Sallehy, Michael Vale
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Patent number: 7346415Abstract: The intensity of light of a predetermined wavelength corresponding to the type of a protective tape joined to the surface of a semiconductor wafer is adjusted by a controller, and a holding stage for holding the semiconductor wafer is scanned rotationally. At this time, at a V notch portion for positioning formed in the semiconductor wafer, light is transmitted through the protective sheet covering the surface, which is received by a photoreception sensor. Based on the change in the reception amount of light in the photoreception sensor, the position of a detection site is specified.Type: GrantFiled: December 8, 2005Date of Patent: March 18, 2008Assignee: Nitto Denko CorporationInventors: Satoshi Ikeda, Masayuki Yamamoto
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Patent number: 7346418Abstract: Systems and methods for constructing custom orthotics are described. Several embodiments of the system use sensor pads to obtain both static and dynamic three dimensional information concerning the shape or topography of the bottom surface of a patient's foot. The information is analyzed to obtain information useful in constructing a custom orthotic from a selection of basic orthotic shells. Once constructed, the orthotic can modify a patient's gait. One embodiment of the present invention includes a user terminal including a sensor pad connected to a computer, a server configured to analyze three dimensional information acquired by the sensor pad, a manufacturing terminal configured to display the results of the server's analysis of the three dimensional information and a network that connects the user terminal to the server and the server to the manufacturing terminal.Type: GrantFiled: March 8, 2005Date of Patent: March 18, 2008Assignee: Quasar Group, Inc.Inventor: Craig E. Lowe
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Patent number: 7346423Abstract: In a method for the adaptive feed rate regulation on a numerically controlled machine tool, which is used for the metal-removing processing of workpieces using a tool rotating on a spindle according to the specification of an NC program, the input power of the spindle is held as constant as possible by the influence of a tool feed rate established in the NC program for the motion between the tool and the workpiece. The method for the adaptive feed rate regulation is activated by a command of the NC program that initiates the processing of the workpiece, and is deactivated by a command of the NC program that terminates the processing of the workpiece.Type: GrantFiled: August 31, 2006Date of Patent: March 18, 2008Assignee: Dr. Johannes Heidenhain GmbHInventor: Hermann Fraunhofer
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Patent number: 7346424Abstract: A machining configuration drawing apparatus includes a drawing unit for drawing a machining configuration and a present machining position, a setting unit for setting a display area in an overall drawing area, a division unit for dividing the overall drawing area into a plurality of display areas based on the set display area, and a selection unit for selecting a drawing region drawn by the drawing unit from a plurality of drawing regions. The selection unit selects a drawing region in which the present machining position exists. Further, the drawing unit draws a machining configuration and a present machining position of the selected drawing region.Type: GrantFiled: March 8, 2005Date of Patent: March 18, 2008Assignee: Fanuc LtdInventors: Toshiyuki Ogata, Koji Suzuki, Hiroyuki Abe
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Patent number: 7337030Abstract: A system and method for creating a derivative view from graphical data which is derived from native application data. The native application data may be extracted from a graphical application, such as a CAD application, converted to an intermediate or derivative format, and a derivative view of the graphic information produced by the original, native application is provided from the intermediate format.Type: GrantFiled: August 11, 2004Date of Patent: February 26, 2008Assignee: Right Hemisphere LimitedInventors: Mark Thomas, Paul Delaney, Mark Shafer, David Dauncey, Patrick Ashby
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Patent number: 7333872Abstract: A product processing system applicable to a production process for producing an electronic device is disclosed.Type: GrantFiled: September 18, 2006Date of Patent: February 19, 2008Assignee: Inventec CorporationInventors: Michael Yang, Guan-Yu Huang
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Patent number: 7333867Abstract: A substrate processing system comprises a substrate processing apparatus and a support computer, which are connected to a network respectively. Updated countermeasure information is accumulated in the support computer by a system administrator. When the substrate processing apparatus causes a failure, content of the failure is displayed on a display part while an alarm processing part controls process according to an alarm definition file. Further, a countermeasure information acquisition part requires updated countermeasure information against the failure from the support computer. In response to this, countermeasure information distribution part of the support computer transmits updated countermeasure information. Thus, updated countermeasure information can be read instantly when a failure occurs.Type: GrantFiled: March 6, 2006Date of Patent: February 19, 2008Assignee: Dainippon Screen Mfg. Co., Ltd.Inventors: Toru Kitamoto, Kenji Kamei, Hidekazu Inoue, Tetsuya Hamada
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Patent number: 7310561Abstract: Identifying an operation that is critical to meeting a due date of a production order includes identifying operations associated with the production order, obtaining schedules for the operations using infinite production planning, obtaining start intervals for the operations based on the schedules, selecting a target operation from the operations, and determining whether the target operation is critical to meeting the due date based on whether the target operation can be scheduled, using finite production planning, in a start interval obtained for the target operation.Type: GrantFiled: March 30, 2005Date of Patent: December 18, 2007Assignee: SAP AGInventors: Sonja Barnet, Hans-Juergen Biegler, Thomas Engelmann, Matthias Gressler, Thorsten Kulick, Bernhard Lokowandt, Thomas Schulz
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Patent number: 7310567Abstract: A method for the preparation, editing and maintenance of tool data sets for machining processes in an NC control system has at least one tool data organization that is separate from the control and is stored in the memory of an ADP system. The tool data organization has tool data sets for tools that for each of the tools to be used has the space for static and dynamic data. The tool data organization has separate list data sets of a machining process that can each contain a reference to the associated tool data set, and the required list data sets are taken over and stored in memory, together with the associated tool data sets, for process execution in the NC data processing unit. At least the dynamic data of the tool data sets can be updated in accordance with the current NC machining processes.Type: GrantFiled: September 12, 2002Date of Patent: December 18, 2007Assignee: Rexroth Indramat GmbHInventors: Berndt Zetek, Andreas Guenzelmann
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Patent number: 7310563Abstract: A fabricating method for a system including a plurality of processing apparatuses connected to each other by an inter-apparatus transporter. The semiconductor waters are processed in the processing apparatuses and are transported to specified processing apparatuses in different time interval that are set to N times a unit time interval. Since the fabricating system includes processing apparatuses and an inter-apparatus transporter that are periodically controlled at time intervals related to a unit time, intervals related to a unit time, the scheduling of a plurality of works can be made efficiently to enhance the level of optimization, thus improving the productivity.Type: GrantFiled: December 30, 2005Date of Patent: December 18, 2007Assignee: Renesas Technology Corp.Inventors: Natsuki Yokoyama, Yoshifumi Kawamoto, Eiichi Murakami, Fumihiko Uchida, Kenichi Mizuishi, Yoshio Kawamura
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Patent number: 7308328Abstract: A system and method for synchronously processing ear shells for hearing aids comprising: loading data associated with a first and second ear shell; determining whether to perform a rigid or non-rigid registration of the data associated with the first and second ear shells, wherein the rigid registration is performed when shapes of the first and second ear shells are within a predetermined threshold, and the non-rigid registration is performed when the shapes of the first and second ear shells are not within the predetermined threshold; registering the data associated with the first and second ear shells; processing the first and second ear shells, wherein the processing is synchronously performed; and outputting the processed first and second ear shells to a display device.Type: GrantFiled: May 11, 2004Date of Patent: December 11, 2007Assignee: Siemens Medical Solutions USA, Inc.Inventors: Tong Fang, Jason Jenn-Kwei Tyan, Ming Fang
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Patent number: 7305275Abstract: In a small scaled plant intended for flexible manufacturing, a pure water supply system is provided at a low cost without reducing a production efficiency. A pure water system produces a plurality of grades of pure water which are supplied through pipes connected to points of use for cleaning, CMP, lithography, and the like. Upon receipt of a request signal from each point of use for starting to use a certain grade of pure water, a controller determines whether or not a required amount exceeds the capacity of the grade of pure water which can be supplied by the pure water system. If not, the controller sends a use permission signal to the point of use for permitting the same to use the pure water. When a certain use point is using the requested grade of pure water, the controller may not permit the requesting point of use to use the pure water until a use end signal is sent from the use point which is using the pure water.Type: GrantFiled: March 27, 2003Date of Patent: December 4, 2007Assignee: Ebara CorporationInventors: Kunihiro Miyazaki, Soichi Nadahara, Kinya Usuda, Masaji Akahori, Sota Nakagawa, Ken Nakajima
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Patent number: 7295899Abstract: For setting the position of a control element, a controller and method according to the invention provide for impressing a required temporal characteristic of the actuating signal onto a should-be value then using said should-be value as a time-variable signal for forming the actuating signal.Type: GrantFiled: October 28, 2004Date of Patent: November 13, 2007Assignee: Siemens AktiengesellschaftInventor: Gerhard Koptisch
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Patent number: 7295894Abstract: To determine adjusting force comparison values for limiting the actuating force of a power-activated adjusting device by means of control technology, an initialization routine is predefined in a control unit, which allows the adjusting device to run through a specific number of complete adjusting cycles, before the recorded actuating force values are stored in the control unit as adjusting force comparison values.Type: GrantFiled: June 2, 2004Date of Patent: November 13, 2007Assignee: Siemens AktiengesellschaftInventors: Barry Anderson, Ping Ran
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Patent number: 7289863Abstract: In one embodiment according to the invention, there is disclosed a method of identifying a source of a vacuum quality problem in a vacuum environment associated with a tool. The method comprises gathering and storing vacuum environment data; identifying an anomaly within the vacuum environment; determining a tool component operating state when the anomaly likely occurred; and determining the source of the vacuum quality problem based on a state of the vacuum environment when the anomaly likely occurred and the tool component operating state when the anomaly likely occurred.Type: GrantFiled: August 18, 2005Date of Patent: October 30, 2007Assignee: Brooks Automation, Inc.Inventors: Joseph D. Arruda, Kathleen D. Keay, Glen F. R. Gilchrist
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Patent number: 7289874Abstract: A method of designing and producing a mold for manufacturing an article having at least one surface coated by a coating. The method including evaluating the article design to determine the probable flow characteristics of the mold, an optimal flow of the coating composition, and an optimal location for the coating composition injector. A mold is designed and produced based on the evaluation.Type: GrantFiled: December 12, 2003Date of Patent: October 30, 2007Assignee: OMNOVA Solutions Inc.Inventors: Douglas McBain, Elliott Straus, John Thompson
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Patent number: 7286906Abstract: A control system and method selects a switch configuration for a power circuit having N binary switches, based in part on a finite state machine. The control system includes an embedded simulator, and present and next state contemplators. The various switch states of the power circuit are modeled by the finite state machine such that at any time, the power circuit switches are in a Present State and there are a plurality of Next States which are one or more switch transitions away from the Present State. The embedded simulator estimates the operating conditions of the load based on measured operational characteristics and the Present State. The present state contemplator determines, based on the operating conditions, whether a switch state transition should be contemplated. If so, the next state contemplator determines the optimal next state based on performance criteria and sends a state switch command to the power circuit.Type: GrantFiled: August 16, 2006Date of Patent: October 23, 2007Assignee: Zetacon CorporationInventor: Michael J. Richards