Patents Examined by Taeho Jo
  • Patent number: 10539521
    Abstract: In a method and a system for authenticating an object marked with XRF marking, a wavelength spectral profile is provided of a detected portion of an X-Ray signal arriving from an object in response to X-Ray or Gamma-Ray radiation applied to the object and the wavelength spectral profile is filtered to suppress trend and periodic components from the wavelength spectral profile to obtain a filtered profile with improved signal to noise or signal to clutter ratio. The object can be authenticated by processing the filtered profile and identifying one or more peaks therein, which satisfy a predetermined condition, whereby the wavelengths of the identified peaks are indicative of the signatures of materials included in the object.
    Type: Grant
    Filed: March 31, 2016
    Date of Patent: January 21, 2020
    Inventor: Yair Grof
  • Patent number: 10539690
    Abstract: An X-ray detector, an X-ray photographing apparatus including the X-ray detector, and a method of manufacturing the X-ray detector are provided. The X-ray detector includes a photoconversion layer configured to convert an X-ray into light having a wavelength range that is different from a wavelength range of the X-ray, a sensing layer arranged on the photoconversion layer and including a plurality of pixels configured to output the light as an electrical signal, a protective layer arranged on the sensing layer and protecting the sensing layer from physical shocks, and an anti-static layer arranged on the protective layer and preventing an electrostatic charge from being introduced into the sensing layer.
    Type: Grant
    Filed: June 13, 2018
    Date of Patent: January 21, 2020
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Dong-hyuk Kim, Yun-hee Kim, Jea-eun Ryu
  • Patent number: 10539692
    Abstract: A radiation imaging apparatus includes a control unit that controls a radiation image capturing operation performed by a pixel array based on determination of start of radiation irradiation based on comparison between a measured value that is an amount of change with respect to a reference value and acquired using a detection unit for detecting irradiation of the pixel array with radiation and a threshold value in one of positive and negative with respect to the reference value. The control unit changes the threshold value within a predetermined range and according to the measured value in other range of the positive and the negative.
    Type: Grant
    Filed: October 3, 2017
    Date of Patent: January 21, 2020
    Assignee: Canon Kabushiki Kaisha
    Inventor: Asato Kosuge
  • Patent number: 10535692
    Abstract: An imaging panel having a plurality of pixels, for picking up scintillation light obtained by converting X-ray projected from an X-ray source, with use of a scintillator, includes photodiodes, TFTs, and an organic film. The photodiodes are provided at the pixels, respectively, for receiving the scintillation light and converting the same into charges. The TFTs are provided at the pixels, respectively, for reading the charges obtained through the conversion by the photodiodes. In one pixel area of the pixels, an area where the organic film is not provided exists in a layer at an upper position with respect to the TFTs, other than an area where a contact hole CH1 for connecting the photodiode and the drain electrode is provided.
    Type: Grant
    Filed: April 7, 2016
    Date of Patent: January 14, 2020
    Inventors: Takao Saitoh, Yutaka Takamaru, Yohsuke Kanzaki, Seiji Kaneko
  • Patent number: 10524750
    Abstract: A scanning system includes a first base, a bed panel, a bed board, a second base and an X-ray mechanism. The bed panel, movably located on the first base, includes a first image-receiving module. The bed board is movably located on the bed panel. The second base, located aside to the first base, includes a second image-receiving module. The X-ray mechanism, connected with the first base, includes an X-ray tube. While the bed panel and the bed board are moved away from the second base, and the X-ray mechanism is moved toward the second base; then, the X-ray tube would undergo a vertical movement to a position aside to a lateral side of the first base by facing the second base.
    Type: Grant
    Filed: October 3, 2017
    Date of Patent: January 7, 2020
    Inventors: Ho-Hui Hsieh, Sheng-Pin Tseng, Syuan-Ya Huang
  • Patent number: 10519367
    Abstract: A metal organic framework is configured to emit fluorescence and deform by interaction with a target molecule. The metal organic framework includes: a metal ion; a quadridentate ligand bonded to the metal ion; and a bidentate ligand bonded to the metal ion.
    Type: Grant
    Filed: August 31, 2018
    Date of Patent: December 31, 2019
    Assignee: Kabushiki Kaisha Toshiba
    Inventors: Yasushi Shinjo, Hirohisa Miyamoto, Satoshi Takayama
  • Patent number: 10509137
    Abstract: A method is provided for monitoring the exposure to radiation of medical personnel during an X-ray examination of an examination object with an X-ray apparatus. A monitoring unit is activated and continuously scans a first three-dimensional volume that includes a region directly irradiated by the X-ray beam, for objects. When an object is detected, automatic evaluation is performed as to whether the object is a human body part that does not correspond to the examination object and a signal or a display is output if a human body part is determined inside the three-dimensional volume that does not correspond to the examination object.
    Type: Grant
    Filed: August 9, 2018
    Date of Patent: December 17, 2019
    Assignee: Siemens Healthcare GmbH
    Inventors: Nils Pickert, Markus Weingarten
  • Patent number: 10499876
    Abstract: A method includes forming a test key. The formation of the test key includes forming a first plurality of semiconductor strips, and cutting the first plurality of semiconductor strips into an array of a second plurality semiconductor strips, with each row of the array being formed from one strip in the first plurality of semiconductor strips, forming isolation regions in recesses between the second plurality of semiconductor strips, and recessing the isolation regions. The top portions of the second plurality of semiconductor strips protrude higher than the isolation regions form semiconductor fins, which form a fin array. An X-ray beam is projected on the test key. A diffraction pattern is obtained from scattered X-ray beam scattered from the test key.
    Type: Grant
    Filed: October 5, 2017
    Date of Patent: December 10, 2019
    Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
    Inventors: Shyh-Shin Ferng, Chung-Li Huang, Yi-Hung Lin, Chungwei Wang
  • Patent number: 10502682
    Abstract: A device (1) for determining the concentration of a gas component is configured with a radiation source (30) for emitting (31) a light radiation or heat radiation in an infrared wavelength range. A detector array (40) has at least two detector elements (50, 60), configured to detect the radiation generated by the radiation source (30), in an angular arrangement (52, 62) and with filter elements (51, 61). At least one of the two detector elements (50, 60) is oriented in an angular arrangement (52, 62) in relation to a vertical axis (32), so that a range of overlap (65) is obtained due to the angular arrangements (52, 62). The range of overlap (65) causes attenuations in the propagation of light, which attenuations may be due, for example, to gas molecules or moisture (400), affect both detector elements (50, 60) and are thus compensated concerning the concentration determination.
    Type: Grant
    Filed: October 27, 2017
    Date of Patent: December 10, 2019
    Assignee: Drägerwerk AG & Co. KGaA
    Inventors: Peter Dreyer, Günter Steinert, Bernd-Michael Dicks, Ralph-Peter Jacobi
  • Patent number: 10488371
    Abstract: A method for nondestructive vibrothermography inspection of a component, the method includes generating ultrasonic excitations in a component over a range of frequencies; determining a thermal signature in the component from the excitations; registering a model with the thermal signature; determining damage based on the thermal signal and model; and classifying the component based on the determining.
    Type: Grant
    Filed: May 4, 2018
    Date of Patent: November 26, 2019
    Assignee: United Technologies Corporation
    Inventors: Alan Matthew Finn, Amit Surana, Matthew O. Williams, Edgar A. Bernal, Ozgur Erdinc
  • Patent number: 10481095
    Abstract: Multispectral imaging of samples, in particular of biological tissues. A method for acquisition of fluorescence and reflectance images of an object including alternatingly illuminating the object with at least a first light having several spectral regions of high intensity, wherein the first light has at least one region of low intensity that is of longer wavelength to a region of high intensity, and at least a second light having at least one spectral region of high intensity, recording a first image of the object during illumination of the object with the first light and a second image of the object during illumination of the object with the second light using a common sensor array, wherein the light recorded by the sensor array is attenuated in at least one of the spectral regions in which the first light has high intensities.
    Type: Grant
    Filed: June 3, 2015
    Date of Patent: November 19, 2019
    Assignee: Universität Heidelberg
    Inventors: Nikolas Dimitriadis, Nikolaos Deliolanis
  • Patent number: 10481284
    Abstract: One embodiment provides an imaging device, including: an enclosure comprising a casing and a radiation lining arranged within the casing to provide a radiation shield, wherein the enclosure comprises a removable portion; a plurality of modular components being in communication with calibration code, wherein the calibration code calibrates the imaging device based upon information of the plurality of modular components; each of the plurality of modular components comprising a plurality of gamma detectors including semiconductor crystals and being removable from the imaging device; the plurality of modular components being arranged such that the plurality of gamma detectors are configured in an array configuration with each of the plurality of gamma detectors having a predetermined spacing from each other gamma detector; a plurality of electronic communication components, wherein the plurality of electronic communication components facilitate communication from each of the gamma detectors using a hierarchical c
    Type: Grant
    Filed: June 13, 2018
    Date of Patent: November 19, 2019
    Assignee: KROMEK GROUP, PLC
    Inventors: James William Hugg, Brian William Harris, Franklin Dean Walker, Sarah Melissa Thomson, Brian Patrick McVay, Rolf Martin Clajus
  • Patent number: 10473588
    Abstract: The present disclosure provides a device for a water-proofing test, the device including: a terahertz wave oscillator configured to generate and oscillate a terahertz wave; a terahertz wave detector configured to detect the terahertz wave reflected from a predetermined test area of a test target or transmitted through the predetermined test area; and a controller configured to analyze a frequency spectrum of the terahertz wave to determine whether water is penetrated into the predetermined test area.
    Type: Grant
    Filed: October 22, 2018
    Date of Patent: November 12, 2019
    Assignees: Hyundai Motor Company, KIA Motors Corporation
    Inventors: Ha Seung Seong, Jin Seok Kim
  • Patent number: 10462391
    Abstract: An inspection system and methods in which analog image data values (charges) captured by an image sensor are binned (combined) before or while being transmitted as output signals on the image sensor's output sensing nodes (floating diffusions), and in which an ADC is controlled to sequentially generate multiple corresponding digital image data values between each reset of the output sensing nodes. According to an output binning method, the image sensor is driven to sequentially transfer multiple charges onto the output sensing nodes between each reset, and the ADC is controlled to convert the incrementally increasing output signal after each charge is transferred onto the output sensing node. According to a multi-sampling method, multiple charges are vertically or horizontally binned (summed/combined) before being transferred onto the output sensing node, and the ADC samples each corresponding output signal multiple times. The output binning and multi-sampling methods may be combined.
    Type: Grant
    Filed: July 14, 2016
    Date of Patent: October 29, 2019
    Assignee: KLA-Tencor Corporation
    Inventors: Yung-Ho Alex Chuang, David L. Brown, Devis Contarato, John Fielden, Daniel I. Kavaldjiev, Guoheng Zhao, Jehn-Huar Chern, Guowu Zheng, Donald W. Pettibone, Stephen Biellak
  • Patent number: 10451750
    Abstract: The invention concerns a scintillation detector with which high count rates and/or high resolutions are possible. The scintillator of the claimed scintillation detector is formed from pixels (2), which are separated from each other by interstices (4). Alternatively or additionally, the surface of the scintillator is divided by grooves into pixels (2). Such a structure enables not only a particularly high resolution. When multiple detector modules are used, it also allows high count rates in the range of roughly 20 MHz.
    Type: Grant
    Filed: October 20, 2015
    Date of Patent: October 22, 2019
    Assignees: Forschungszentrum Jülich GmbH, Commissariat á l'Energie Atomique et aux Energies (CEA), Integrated Detector Electronics AS, Legal Division European Spallation Source ERIC
    Inventors: Sebastian Jaksch, Henrich Frielinghaus, Ralf Engels, Günter Kemmerling, Kalliopi Kanaki, Richard Hall-Wilton, Sylvain Désert, Codin Gheorghe
  • Patent number: 10451747
    Abstract: Techniques are disclosed for systems and methods to provide a radiation detector module for a radiation detector. A radiation detector module an enclosure, a radiation sensor separated from the enclosure by one or more damping inserts, readout electronics configured to provide radiation detection event signals corresponding to incident ionizing radiation in the radiation sensor, and a cap comprising an internal interface configured to couple to the readout electronics and an external interface configured to couple to a radiation detector, wherein the cap is configured to hermetically seal the radiation sensor within the enclosure. Plated edges of the cap can be soldered to the enclosure to hermetically seal the radiation sensor within the enclosure.
    Type: Grant
    Filed: May 2, 2018
    Date of Patent: October 22, 2019
    Assignee: FLIR Detection, Inc.
    Inventors: Jeffrey Robert Preston, Jeffrey A. Verity, Hartmut Brands, Matthew D. Waggoner, Jason Smith
  • Patent number: 10455684
    Abstract: Described herein are neutron generators that employ direct field ionization of ionizable fusion gases, as well as well-logging tools and methods that utilize such neutron generators. In various embodiments, the neutron generator includes a cylindrical field-ionization structure distributed around the inner surface of a tubular housing, and a cylindrical ion-accelerating grid disposed about the longitudinal axis concentrically to the field-ionization structure. Ions generated by the field-ionization structure may accumulate inside the ion-accelerating grid, from which they can be axially extracted and accelerated towards a fusion target. Additional tools, systems, and methods are disclosed.
    Type: Grant
    Filed: April 16, 2015
    Date of Patent: October 22, 2019
    Assignee: Halliburton Energy Services, Inc.
    Inventors: Juan Navarro-Sorroche, Weijun Guo
  • Patent number: 10444076
    Abstract: An infrared device comprises a substrate (1), and arranged on or in the substrate (1) a configuration (3) for one of selectively emitting and selectively absorbing infrared radiation of a band, the configuration (3) comprising a pattern made from an electrically conducting material on a first level (L1), an electrically conducting film (33) on a second level (L2), and a dielectric layer (24) between the pattern and the film (33). One or more of a heater (4) for heating the configuration (3), and a thermal sensor (5) arranged for sensing the selective infrared radiation of the band absorbed by the configuration (3) on or in the substrate.
    Type: Grant
    Filed: November 26, 2015
    Date of Patent: October 15, 2019
    Assignee: Sensirion AG
    Inventors: Martin Winger, Marc Von Waldkirch, Matthias Streiff, Alexander Lochbaum, Jürg Leuthold
  • Patent number: 10436712
    Abstract: The present invention relates to devices and methods for spectrometric analysis of light-emitting samples. The device comprises a particle beam source, which generates a primary particle beam directed to the sample in such a way that the primary particle beam is incident on the sample and photons are released from the sample due to the interaction between primary particle beam and sample material. Moreover, the device comprises a plurality of light-pickup elements, which are suitable for capturing the photons released from the sample, wherein the light-pickup elements capture the photons emitted in the respectively assigned solid-angle range. Furthermore, the device comprises conduction elements, which are embodied to forward captured photons to an evaluation unit, and an analysis system, which comprises a plurality of evaluation units in such a way that photons captured by each light-pickup element are analyzed spectrally.
    Type: Grant
    Filed: March 1, 2018
    Date of Patent: October 8, 2019
    Assignee: Carl Zeiss Microscopy GmbH
    Inventors: Nico Correns, Michael Rode
  • Patent number: 10418402
    Abstract: In an embodiment, an image sensor includes a semiconductor substrate, an epitaxial layer disposed over the semiconductor substrate, a first heavily doped region disposed in the epitaxial layer, and a shallow trench isolation region disposed in the epitaxial layer and surrounding the first heavily doped region. The semiconductor substrate and the epitaxial layer are of a first doping type and the semiconductor substrate is coupled to a reference potential node. The first heavily doped region is of a second doping type opposite to the first doping type. The epitaxial layer, the first heavily doped region, and the shallow trench isolation region are part of a p-n junction photodiode configured to operate in the near ultraviolet region.
    Type: Grant
    Filed: November 30, 2017
    Date of Patent: September 17, 2019
    Assignee: STMicroelectronics (Research & Development) Limited
    Inventor: Jeffrey M. Raynor