Patents Examined by Tara S Pajoohi Gomez
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Patent number: 8436989Abstract: An inspection apparatus using a chip includes a rotor that holds a chip; a measurement room in which the rotor is provided and a through hole is formed; a light source that emits light for measurement to the chip through the through hole; a light measurement unit that detects the light from the chip, a rotation drive mechanism that rotates the rotor; and a cover member capable of covering or uncovering an opening portion.Type: GrantFiled: October 13, 2010Date of Patent: May 7, 2013Assignee: Ushio Denki Kabushiki KaishaInventors: Yoshimasa Ogawa, Kazuyuki Kaneda
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Patent number: 8432543Abstract: Systems and methods for hyper-resolution beyond the diffraction limit of optical microscopes for applications in spectroscopy, absorption and lithographic photochemical patterning are described. These systems are based on interference of a pump pulse and a Stokes laser pulse which interfere to localize the population of an excited vibrational state in an area that is smaller than the scanning resolution of the microscope. Another (interfering) Stokes pulse has an annular shape at focus and destructively interferes with the the Stokes laser pulse. This destructive interference causes narrowing of the population distribution of the vibrational excited state well below the diffraction limit, which in turn localizes the population of the central electronic excited state by a separate actinic laser pulse having a lower energy than the ground state excitation energy of the molecule. A stepped photolithography system uses two photomasks to produce photoresist images capable of printing features smaller than 10 nm.Type: GrantFiled: September 20, 2011Date of Patent: April 30, 2013Inventor: Robert D Frankel
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Patent number: 8427642Abstract: The present invention provides methods and systems for particle detection and analysis using two-dimensional optical imaging to access enhanced detection sensitivity and expanded sensing functionality relative to conventional point and array detection-based optical particle counters. Methods and systems of the present invention provide a two-dimensional optical imaging-based particle sensing platform wherein system components and specifications are selected to generate reproducible and readily identifiable signals, including particle detection signatures, from optical scattering or emission from particles provided to the system. Systems and methods of the present invention are capable of accurately and sensitively detecting, identifying, and characterizing (e.g., determining the size of) particles in liquid phase or gas phase samples.Type: GrantFiled: February 14, 2012Date of Patent: April 23, 2013Assignee: Particle Measuring Systems, Inc.Inventors: John Mitchell, Dwight A. Sehler, Michael Williamson, David Rice, Karen R. Sandberg
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Patent number: 8422036Abstract: An edge sensing apparatus is disclosed including first and second emitters, first and second detectors and a timer. Beams radiated from the first emitter being emitted in an opposite direction from beams radiated from the second emitter. The first and second detectors being aligned to receive beams from the first and second emitters respectively, where the first detector is offset in a cross-process direction from the first emitter and/or the second detector. The timer receiving signals from both the first and second detectors, wherein a change of the signals determines a position of an edge of a substrate media sheet causing the change of signals. Also, an edge sensing method is disclosed including measuring a mean time associated with a change of signals received from the two detectors and determining a location of a sheet edge causing the change of signals based on the mean time.Type: GrantFiled: December 24, 2009Date of Patent: April 16, 2013Assignee: Xerox CorporationInventors: Thomas J. Wyble, Lloyd A. Williams
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Patent number: 8416427Abstract: There is described a scanner having a frame with a support, two lasers attached to the frame and two optical sensors attached to the frame, the lasers and optical sensors being positioned and oriented to reduce shadowing effects for the cameras and for the laser lines while covering close to 100% of the surface of an object to be imaged and reducing the scanning time.Type: GrantFiled: November 24, 2008Date of Patent: April 9, 2013Assignee: Numeq Inc.Inventors: François Marcil, Christian Matz, Louis Geoffroy, Elmekki Ennajimi
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Patent number: 8400622Abstract: Described herein are systems and methods for enhancing sensitivity of an optical time-domain reflectometer (“OTDR”) using bi-directional analysis techniques. One embodiment of the disclosure of this application is related to a computer readable storage medium including a set of instructions that are executable by a processor. The set of instructions being operable to collect a first set of measurement data at a first resolution to provide a relative backscatter of the fiber, collect a second set of measurement data taken at a second resolution to calculate loss along the length of fiber, and combine the first set of measurement data with the second set of measurement data to calculate the loss along the fiber at the first resolution.Type: GrantFiled: December 17, 2009Date of Patent: March 19, 2013Assignee: AT & T Intellectual Property I, LPInventors: Jonathan Nagel, Sheryl Woodward
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Patent number: 8390798Abstract: A wavelength dispersion measurement method includes generating a plurality of test lights in the first terminal, the wavelengths of which are different from a wavelength of a signal light, multiplexing each test light with the signal light and outputting the multiplexed light to the first transmission path, reconverting each electrical signal after converting each beam into electrical signals, multiplexing each test light with the signal light and outputting the multiplexed light to the second transmission path, reconverting each electrical signal after converting each test light into electrical signals, multiplexing each test light with the signal light and outputting the multiplexed light to the first transmission path, measuring times for each test light to be propagated up to a specified number of go-around, and measuring a change of a wavelength dispersion amount in the paths based on a difference between the measured propagation times of each wavelength.Type: GrantFiled: February 18, 2011Date of Patent: March 5, 2013Assignee: Fujitsu LimitedInventor: Toshihiro Ohtani
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Patent number: 8379206Abstract: A method and apparatus for the photo-acoustic identification and quantification of one or more analyte species present in a gaseous or liquid medium in low concentration utilizing a laser and a resonant optical cavity containing the medium and having within the cavity at least two partially transparent mirrors, one of which is a cavity coupling mirror and one of which is moveably mounted on an assembly responsive to an input signal.Type: GrantFiled: May 11, 2011Date of Patent: February 19, 2013Assignee: LI-COR, Inc.Inventors: Alexander Kachanov, Serguei Koulikov
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Patent number: 8368883Abstract: A sensor for detecting a drug substance (15) from exhaled breath of a subject in-situ. Its collecting surface has a Surface Enhanced Raman Spectroscopy (SERS)-active layer (14) of a SERS-active material. The collecting surface is arranged as an outer surface of a waveguide (12) for contact with exhaled breath, such that at least traces of said drug substance (15) in said exhaled breath can contact said SERS-active layer for read-out of a Raman shift spectrum.Type: GrantFiled: September 9, 2010Date of Patent: February 5, 2013Assignee: Sensa Bues ABInventors: Göran Palmskog, Olof Beck, Per Ola Andersson
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Patent number: 8351027Abstract: A new metric applicable to the characterization and design of multimode fiber (MMF) is described. The metric is derived from a Differential Mode Delay (DMD) measurement and when used in combination with industry-standard metrics such as Effective Modal Bandwidth (EMB) and DMD, yields a more accurate prediction of MMF channel link performance as measured by Bit Error Rate (BER) testing. The metric can also be used in the design of MMF for improved bandwidth performance. When implemented as a test algorithm in production, it can be used to select, sort, or verify fiber performance. This process can yield a multimode fiber design with a greater performance margin for a given length, and/or a greater length for a given performance margin.Type: GrantFiled: June 9, 2010Date of Patent: January 8, 2013Assignee: Panduit Corp.Inventors: Richard Pimpinella, Gaston E. Tudury
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Patent number: 8351030Abstract: A multi-part injection mold (10) for producing a cuvette (1) or a receptacle vessel for liquid or gaseous media for spectroscopic, qualitative and/or quantitative analysis or measurement using a measuring region or measuring gap (2) through which radiation is able to penetrate is provided, with the cuvette being made of plastic through injection molding. To this end, the inner cavity or filling space (9) and the measuring gap (2) are formed and limited on the interior of the injection mold (10) by a contour core (11), the thickness of which is limited to about one millimeter or less in the region (11a) of the measuring gap (2). The contour core (11) is held on the end (11b) thereof having the smallest dimension during the injection molding process, initially by at least one support (14), and retracted during the injection molding process after partial filling of the mold with plastic such that the lower continuation of the walls of the measuring gap (2) is formed.Type: GrantFiled: October 1, 2008Date of Patent: January 8, 2013Inventors: Thomas Sahiri, Werner Schneider
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Patent number: 8351037Abstract: Programmable illuminators in exposure tools are employed to increase the degree of freedom in tool matching. A tool matching methodology is provided that utilizes the fine adjustment of the individual source pixel intensity based on a linear programming (LP) problem subjected to user-specific constraints to minimize the difference of the lithographic wafer data between two tools. The lithographic data can be critical dimension differences from multiple targets and multiple process conditions. This LP problem can be modified to include a binary variable for matching sources using multi-scan exposure. The method can be applied to scenarios that the reference tool is a physical tool or a virtual ideal tool. In addition, this method can match different lithography systems, each including a tool and a mask.Type: GrantFiled: July 12, 2010Date of Patent: January 8, 2013Assignee: International Business Machines CorporationInventors: Jaione Tirapu Azpiroz, Saeed Bagheri, Kafai Lai, David O. Melville, Alan E. Rosenbluth, Kehan Tian
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Patent number: 8351042Abstract: An information acquiring device has a light source which emits light of a predetermined wavelength band; a projection optical system which projects the light emitted from the light source toward the target area with a predetermined dot pattern; and a light receiving element which receives reflected light reflected on the target area for outputting a signal. In this arrangement, the projection optical system projects the light toward the target area in such a manner that a dot of a reference pattern of the light to be received by the light receiving element has a pitch equal to or larger than 2.5 pixels at least in an alignment direction in which the light source and the light receiving element are aligned.Type: GrantFiled: August 30, 2012Date of Patent: January 8, 2013Assignee: Sanyo Electric Co., Ltd.Inventor: Katsumi Umeda
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Patent number: 8345235Abstract: An accessory for a spectrometer for carrying out measurements of specular reflectance of a sample. The accessory is designed so that all components can be located in a housing and the sample can be located horizontally on a top-plate of the housing with the components disposed below the plane of that plate.Type: GrantFiled: September 1, 2009Date of Patent: January 1, 2013Assignee: PerkinElmer Health Sciences, Inc.Inventors: Robert Alan Hoult, Paul Alexander Evetts
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Patent number: 8314934Abstract: Methods and apparatus for analyzing a sample using at least one detector are disclosed.Type: GrantFiled: December 3, 2010Date of Patent: November 20, 2012Assignee: Alltech Associates, Inc.Inventors: James Anderson, Raaidah Saari-Nordhaus, Washington Mendoza, Josef Bystron, Dirk Helgemo
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Patent number: 8310686Abstract: A method and means for determining the thickness, or curvature, of a thin film or stack of thin films disposed on the surface of a substrate having a curvature comprising generating a beam of radiation, focusing the beam through the one or more films onto a surface of the substrate, measuring the intensity across the reflected beam as a function of the angle of incidence of a plurality of rays derived from the focussed beam, determining the path of each of the plurality of rays and determining the thickness, or curvature of the film, or films, from the angular dependent intensity measurement.Type: GrantFiled: March 28, 2008Date of Patent: November 13, 2012Assignee: Nightingale-EOS LtdInventor: Stephen Morris
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Patent number: 8305579Abstract: Methods for probing multiple targets in a biological sample are provided. The methods include the steps of providing a sample containing multiple targets, binding at least one probe having a binder coupled to an enzyme to one or more target present in the sample, and reacting the bound probe with an enzyme substrate coupled to a fluorescent signal generator. The methods include the steps of observing a signal from the fluorescent signal generator and applying to the sample a solution containing an oxidizing agent that substantially inactivates both the fluorescent signal generator and the enzyme. The methods further include the steps of binding at least one probe having a binder coupled to an enzyme to one or more target present in the sample of step, reacting the bound probe with an enzyme substrate coupled to a fluorescent signal generator; and observing a signal from the fluorescent signal generator.Type: GrantFiled: September 28, 2007Date of Patent: November 6, 2012Inventors: Thomas Pirrie Treynor, Anup Sood, Michael J. Gerdes, Zhengyu Pang
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Patent number: 8305582Abstract: Methods and apparatus for analyzing a sample using at least one detector are disclosed.Type: GrantFiled: December 3, 2010Date of Patent: November 6, 2012Assignee: Alltech Associates, Inc.Inventors: James Anderson, Raaidah Saari-Nordhaus, Washington Mendoza, Josef Bystron, Dirk Helgemo, Dennis McCreary
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Patent number: 8305581Abstract: Methods and apparatus for analyzing a sample using at least one detector are disclosed.Type: GrantFiled: December 3, 2010Date of Patent: November 6, 2012Assignee: Alltech Associates, Inc.Inventors: James Anderson, Raaidah Saari-Nordhaus, Washington Mendoza, Josef Bystron, Dirk Helgemo, Dennis McCreary
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Patent number: 8279426Abstract: An testing device for lens module includes an image sensor, a light source assembly, a testing tray, a detecting device, and a processor. The light source assembly is aligned with the image sensor. The testing tray is disposed between the light source assembly and the image sensor, and defines a plurality of through holes for receiving lens modules. The detecting device is configured for detecting whether the lens module to be tested is tilted. The processor controls the moving of the image sensor and the testing tray. The processor is capable of stopping the moving of the image sensor and the testing tray when the detecting device detected the lens module to be tested is tilted.Type: GrantFiled: June 30, 2009Date of Patent: October 2, 2012Assignee: Hon Hai Precision Industry Co., Ltd.Inventor: Mong-Tung Lin