Patents Examined by Tara S Pajoohi Gomez
  • Patent number: 8279440
    Abstract: A hand-held light measuring device includes a device housing (G) with a bottom face incorporating a measuring window (7) through which a measurement optical path extends so that a measurement object can be measured when the device housing (G) is positioned with its bottom face on the measurement object. The measuring device has an integrated, displaceably mounted white reference tile, which can be moved into the measurement optical path and moved back out of it again. The white reference tile is disposed in an end region of an oblong support plate (10) on its side directed towards the housing interior.
    Type: Grant
    Filed: June 22, 2010
    Date of Patent: October 2, 2012
    Assignee: X-Rite Europe GmbH
    Inventors: Beat Frick, Lido Feri, Stefan Knechtle
  • Patent number: 8279425
    Abstract: A system and method for performing lethality assessment utilizes frequency domain reflectometry (FDR) to determine impact point and damage propagation faults in a detection surface. The detection surface has a conductive layer capable of propagating radio frequency (RF) signals. At least one signal transmit/receive port on the detection surface injects a radio frequency (RF) interrogation signal into the detection surface and at least two signal receive-only ports on the detection surface spaced a distance apart from each other and from the signal transmit/receive port receive reflected radio frequency (RF) signals of the interrogation signal. A frequency domain reflectometry measurement system coupled with the transmit/receive port and signal receive-only ports measures frequency responses of the ports compared to predetermined baseline measurements and determines the precise location of an impact point and damage propagation fault in the detection surface by triangulation.
    Type: Grant
    Filed: March 18, 2009
    Date of Patent: October 2, 2012
    Assignee: Invocon, Inc.
    Inventors: Doug Heermann, Karl F. Kiefer
  • Patent number: 8274658
    Abstract: An optical measuring head for a duct gas monitoring system is provided, the measuring head being mounted to an outer wall of a gas duct through which the duct gas flows. The measuring head has a longitudinal chamber which at one end opens into the gas duct and at the other end contains an active optical component. The chamber is flushed with a purge gas which, after flushing the chamber, is discharged into the gas duct. A gas line is installed between the chamber and interior of the gas duct at a point upstream of a discharge point and the purge gas is a branch-off of the duct gas.
    Type: Grant
    Filed: September 15, 2009
    Date of Patent: September 25, 2012
    Assignee: Siemens Aktiengesellschaft
    Inventors: Rikard Larking, Peter Schachinger
  • Patent number: 8264681
    Abstract: An spectrometer including Raman and LIBS spectroscopy capabilities is disclosed. The spectrometer includes a laser source configurable to produce a lased light directable towards a target substance, the laser source having a single wavelength and having sufficient power to cause a portion of the target to emit Raman scattering and sufficient to ablate a portion of the target substance to produce a plasma plume. A separate remote light collector is optically configurable to collect light emitted from the portion of the target emitting Raman scattering and from the portion of the target producing the plasma plume. A filter is optically coupled to the remote light collector to remove reflected light and Rayleigh-scattered light, and a spectroscope is optically coupled to the filter and configured to separate the collected and filtered light into a frequency spectrum comprising a Raman spectrum and a laser-induced breakdown spectrum. Finally, an electronic light sensor is used to record the frequency spectrum.
    Type: Grant
    Filed: December 16, 2009
    Date of Patent: September 11, 2012
    Assignee: University of Hawaii
    Inventors: Anupam Kumar Misra, Shiv Kumar Sharma, Paul Grandmont Lucey
  • Patent number: 8264677
    Abstract: An optical path monitoring device according to the present invention includes: a measurement unit which irradiates optical pulses to an optical path as a monitoring target to cause back scattered lights, the measurement unit generating measurement data based on the back scattered lights; and a processing unit which controls operation of the measurement unit, the processing unit acquiring the measurement data from the measurement unit, the processing unit performing an arithmetic processing of the measurement data to identify an abnormal point of the optical path, and after acquiring the measurement data the processing unit sending the measurement unit instructions to start the next measurement.
    Type: Grant
    Filed: June 22, 2009
    Date of Patent: September 11, 2012
    Assignee: Yokogawa Electric Corporation
    Inventor: Yoshihito Tekawa
  • Patent number: 8253934
    Abstract: A pattern inspection method and apparatus in which a deep ultraviolet light or an ultraviolet light is irradiated onto a specimen on which a pattern is formed, an image of the specimen which is irradiated with the deep ultraviolet light or the ultraviolet light is formed and the formed image is detected with a rear-surface irradiation type image sensor, which is sensitive to wavelengths of no greater than 400 nmm. A signal outputted from the image sensor is processed so as to detect a defect of the specimen by converting an analog image signal outputted from the image sensor to a digital image signal with an A/D converter, and a display displays information of the defect detected.
    Type: Grant
    Filed: December 30, 2009
    Date of Patent: August 28, 2012
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Minoru Yoshida, Shunji Maeda, Atsushi Shimoda, Kaoru Sakai, Takafumi Okabe, Masahiro Watanabe
  • Patent number: 8248601
    Abstract: An optical mask positioned on a scintillator array. The optical mask includes a reflective layer. One or more windows can be positioned on the surface of optical mask.
    Type: Grant
    Filed: September 14, 2009
    Date of Patent: August 21, 2012
    Assignee: Siemens Medical Solutions USA, Inc.
    Inventors: James L. Corbeil, Nan Zhang
  • Patent number: 8233157
    Abstract: A portable imaging-based measurement device is developed to perform 2D projection based measurements on an object that is difficult or dangerous to access. This device is equipped with self calibration capability and built-in operating procedures to ensure proper imaging based measurement.
    Type: Grant
    Filed: September 28, 2010
    Date of Patent: July 31, 2012
    Assignee: OG Technologies, Inc.
    Inventors: Tzyy-Shuh Chang, Hsun-Hau Huang
  • Patent number: 8208134
    Abstract: A rapid visual fiber optic cable tester for visually inspecting optical continuity and attenuation of multiple strand fiber optic cable connectors through an existing fiber optic adapter panel, comprising: an enclosure having a uniform visual light source in a visible spectrum wavelength range to provide a uniform visual light pattern on a transparent screen; an electrical power source for powering the uniform visual light source; a power button for controlling the electrical power source; whereby the rapid visual fiber optic cable tester is positioned toward the existing fiber optic adapter panel at one end of the multiple strand fiber optic cable without a direct contact with the connectors; while observing visually at the other end of the cable through existing fiber optic adapter panel for any difference in light intensity between each fiber optic strand; therefore visually detecting optical continuity and attenuation by light intensity levels instantly and rapidly.
    Type: Grant
    Filed: September 17, 2009
    Date of Patent: June 26, 2012
    Inventor: Erkan Gunal
  • Patent number: 8199319
    Abstract: A fiber instrument for measuring properties of a fiber sample, the fiber instrument having a surface for receiving the fiber sample, a hand for pressing the fiber sample against the surface, an illumination source for selectively illuminating the fiber sample with more than one peak wavelength, where each of the peak wavelengths is independently controllable as to an applied intensity of the peak wavelength, a sensor for capturing images of the fiber sample while it is illuminated, and a controller for controlling at least the sensor and the illumination source. By providing multiple peak wavelengths of illumination that are each independently controllable as to illumination intensity, the fiber instrument as described herein is better able to detect both foreign material within the fiber sample, and color gradations of the fiber sample.
    Type: Grant
    Filed: June 29, 2009
    Date of Patent: June 12, 2012
    Assignee: Uster Technologies AG
    Inventors: Preston S. Baxter, Youe-Tsyr Chu, Hossein M. Ghorashi, Michael E. Galyon