Abstract: A position detection apparatus that illuminates diffraction gratings formed on two objects with light from a light source and receives diffracted light from the diffraction gratings to acquire relative positions of the two objects includes: an optical system configured to cause plus n-th order diffracted light and minus n-th order diffracted light from each of the diffraction gratings to interfere with each other, where n is a natural number; a light receiving unit; and a processing unit, wherein the light receiving unit receives a two-beam interference light from each of the diffraction gratings, and wherein the processing unit acquires the relative positions of the two objects by using the two-beam interference light at an area where two-beam interference lights of the diffracted light from the respective diffraction gratings do not overlap each other among the two-beam interference lights of the diffracted light from each of the diffraction gratings.

Abstract: A projection pattern as an image obtained by compositing the first two-dimensional pattern image and the second two-dimensional pattern image is projected onto an object, and the object onto which the projection pattern has been projected is captured. The three-dimensional shape information of the object is measured based on the projection pattern and the captured image. When a region formed from one or a plurality of pixels is set as the first unit area, and a region having a size larger than that of the first unit area is set as the second unit area, each first unit area of the first two-dimensional pattern image is assigned with one of a plurality of pixel values, and each second unit area of the second two-dimensional pattern image is assigned with one of the plurality of pixel values.

Abstract: A method for configuring an alignment of a plurality of optical segments in a sparse aperture configuration of an optical device includes providing at least one beam of light from at least one light source located on the sparse aperture optical device, directing the at least one beam of light toward at least one segment of the plurality of optical segments, detecting a reflection or transmission of the at least one beam of light off of the at least one segment of the plurality of optical segments, determining a characteristic of the reflected or transmitted light, and based on the characteristic of the reflected or transmitted light, determining an alignment of the at least one segment of the plurality of optical segments.

Abstract: The invention relates to a system (21) for receiving a light beam, comprising an array of light sensors (26). The system also comprises a pixelated light switch array (24), in which each switch is adapted to receive at least one portion of the light beam and direct it to the array of light sensors (26), and the pixelated light switch array (24) comprises a higher number of switches than the number of light sensors comprised in the array of light sensors (26).

Abstract: The disclosure is related systems and method for improved accuracy and precision in Raman spectroscopy. In one embodiment, a device may comprise a Raman spectroscopic apparatus configured to determine a property of a sample by directing photons at the sample and measuring a resulting Raman scattering, a positioning apparatus capable of manipulating a position of the sample, and the device being configured to selectively adjust a focus of the Raman spectroscopic apparatus to adjust an intensity of the Raman scattering. Another embodiment may be a method comprising performing a depth focus Raman spectra screening on a sample to determine a depth focus with a maximum-intensity Raman spectra, wherein the depth focus spectra screening comprises performing Raman spectra scans on the sample at a plurality of depth foci, and modifying a process based on a result of the Raman spectra scan at the depth focus with the maximum-intensity Raman spectra.

Abstract: The invention relates to a differential interferometer module adapted for measuring a direction of displacement between a reference mirror and a measurement mirror. In an embodiment the differential interferometer module is adapted for emitting three reference beams towards a first mirror and three measurement beams towards a second mirror for determining a displacement between said first and second mirror. In a preferred embodiment the same module is adapted for measuring a relative rotation around two perpendicular axes as well. The present invention further relates to a lithography system comprising such a interferometer module and a method for measuring such a displacement and rotations.

Abstract: Aspects of the disclosure relate to systems and techniques for inspecting seals for high altitude balloons. In one example, a system may include a reflective surface, a translucent material on the reflective surface, and a movable light source configured to move along the reflective surface and provide light to the reflective surface. The light is provided such that it is reflected from the reflective surface and through the translucent material in order to backlight a balloon envelope seal for inspection. A method for inspecting a balloon envelope seal may include placing balloon envelope material on a table, forming a seal between portions of the material, moving a light over the seal, shining light onto a reflective portion of the table below the seal to backlight the seal, and inspecting the seal using the backlighting of the seal.

Abstract: An apparatus (10) is provided for inspecting a flexible glass ribbon. In one example, the apparatus includes at least one storage roll (16) for storing a length of the flexible glass ribbon (12). In another example, the apparatus further includes an inspection device (50). In yet another example, the inspection device can inspect a characteristic of an unrolled portion (28) of the flexible glass ribbon (12) spanning along a travel path (14) of the flexible glass ribbon.

Abstract: The invention relates to a method for measuring a light radiation (300) emitted by a light-emitting diode (210). In the method, an end (121) of an optical fiber (120) which is connected to a measuring device (130) is irradiated with the light radiation (300), which is emitted by the light-emitting diode (210), through an optical device (140), so that a portion of the light radiation (300) is coupled into the optical fiber (120) and is guided to the measuring device (130). The optical device (140) causes the light radiation (300) passing through the optical device (140) to be emitted in diffuse form in the direction of the end (121) of the optical fiber (120). The invention also relates to an apparatus (100) for measuring a light radiation (300) emitted by a light-emitting diode (210).

Abstract: Disclosed are a method and apparatus for the surface inspection and detection of defects of long products by means of a combination of images of the same region of the long product. The images are taken under different lighting condition in order to reconstruct the shape of the surface and thus obtain information on the presence of defects.

Abstract: An apparatus and method for detecting a moving object as it passes through a light curtain generated by one or more emitters, by the means for detecting the light of the light curtain reflected by the passing object onto a photoelectric detector. The object sensing area is not constrained by mechanical means and is limited only by the light curtain shape. Velocity of the object is determined primarily by dividing the known distance between two or more parallel light curtains by the time of passage between the light curtains. Additional velocity measurement obtained from the known object length divided by the time of its passage through the light curtain allows verification of the primary velocity measurement. Direction of the object motion across the sensitive area is determined by implementing two or more uniquely identifiable, closely spaced parallel light curtains, and corresponding uniquely identifiable detectors.

Abstract: Methods for fast and accurate mapping of passivation defects in a silicon wafer involve capturing of photoluminescence (PL) images while the wafer is moving, for instance, when the wafer is transported on a belt in a fabrication line. The methods can be applied to in-line diagnostics of silicon wafers in solar cell fabrication. Example embodiments include a procedure for obtaining the whole wafer images of passivation defects from a single image (map) of photoluminescence intensity, and can provide rapid feedback for process control.

Abstract: A fiber light source comprises a laser pump configured to generate a pump laser beam at a predetermined wavelength; a first segment of rare earth doped fiber; a second segment of rare earth doped fiber; and an optical coupler coupled to a first end of the first segment and a first end of the second segment. The optical coupler is configured to split the pump laser beam based on a power coupling ratio. The first segment generates a first stimulated emission having a first mean wavelength sensitivity to pump laser power fluctuations and the second segment generates a second stimulated emission having a second mean wavelength sensitivity to pump laser power fluctuations such that a combined stimulated emission is approximately insensitive to pump laser power fluctuations.

Abstract: Feedback control of an object which moves back and forth in a straight line along a linear guide is performed through PID control. A parameter adjustment unit which determines the control parameters to be used for PID control performs feedback control and determines the optimal value of control parameters by means of an evaluation function based on the error between the measured value of the current velocity and the target velocity, for the control parameters of maximum reverse voltage and at least one from among proportional coefficient (CP), differential coefficient CD), integral coefficient CI), and frictional coefficient (CF).

Abstract: An apparatus and method for determining the diameter of a pipe from a remote location is disclosed. A measuring assembly, including a reference device and an imaging device, is inserted into a pipe from a remote location. The reference device is inflatable to a predetermined and known diameter within the pipe. The imaging device acquires imaging data of the reference device within the pipe and the imaging data is used to determine the diameter of the pipe by comparing the predetermined diameter of the reference device with the diameter of the wall of the pipe. The diameter of the pipe is then used to properly choose a liner assembly of the same diameter to repair the wall of the pipe. The liner tube may include a bladder and liner tube, which is saturated with a curable resin, to repair the wall of the pipe.

Abstract: According to an example, an apparatus for performing spectroscopy includes a substrate on which a plurality of surface-enhanced spectroscopy (SES) elements are positioned substantially along a first plane. The apparatus also includes a first electrode positioned adjacent to the plurality of SES elements substantially along the first plane and a second electrode positioned adjacent to the plurality of SES elements substantially along the first plane and on a side of the plurality of SES elements that is opposite the first electrode. The first electrode and the second electrode are to generate an electric field around the plurality of SES elements when voltages are applied through the first electrode and the second electrode.

Abstract: A method for a localized surface plasmon resonance (LSPR) sensing system is disclosed. The LSPR sensing system has an optical detection system and a test specimen with metal nanoparticles arranged in an anisotropic periodic manner that generates a phase signal of the LSPR sensing system. The method includes: emitting an incident light toward the test specimen to excite the metal nanoparticles, thereby generating an emergent light; using the optical detection system to detect phases of a first polarization state and a second polarization state of the emergent light, where the first polarization state is perpendicular to the second polarization state; and obtaining a phase difference spectrum between the phases of the first and second polarization states, thereby determining a half maximum (FWHM) of the phase difference spectrum.

Abstract: In one embodiment, the optical device for generating an illumination pattern has a beam splitter and a pattern generator mounted in series and optically coupled one with the other. The beam splitter and the pattern generator are configured to cooperate one with the other in formatting an incident light beam into the illumination pattern. The illumination pattern has a plurality of diffraction patterns each resulting from a corresponding portion of the incident light beam being split from other portions of the incident light beam by the beam splitter. Each diffraction pattern has a zero-order beam. Each diffraction pattern overlaps with at least one of the other diffraction patterns and forms at least one overlapping region therewith, wherein the plurality of zero-order beams of the plurality of diffraction patterns are separated from one another in the illumination pattern.

Abstract: In an optical sensor, a light emission system emits an irradiated light of a linear polarization in a first polarization direction toward a surface of a target object having a sheet shape from an incident direction which is inclined with respect to a normal direction of the surface. A first light detection system includes a first light detector arranged on a first light path of a specular reflected light, which is emitted from the light emission system and is specularly reflected from the target object. A second light detection system includes a second light detector arranged on a second light path of a diffuse reflected light which is diffusely reflected from an incident plane on the target object. The second light detector receives second light passed by an optical element which passes a linear polarization component of a second polarization direction perpendicular to the first polarization direction.

Abstract: A flow analyzer includes a flow body having a single-piece construction. The flow body includes a flow path extending through the flow body along a flow direction between opposing inlet and outlet ports and an enclosed wiring conduit extending substantially transverse to the flow direction between a first side of the flow body and a second side of the flow body. The enclosed wiring conduit is isolated from the flow path. An illumination unit is disposed on the first side of the flow body and configured to illuminate fluid within the flow path. An observation unit is disposed on the second side of the flow body and configured to visually observe the fluid within the flow path.