Abstract: Apparatus (100) for measuring particle size distribution by light scattering comprises a blue LED (102) and a 633 nm helium neon laser (104). Light output from the LED and laser is separately passed or reflected by a dichroic element (116) onto a common path through a sample cell (122) containing a sample, the particle size distribution of which is to be measured. Light scattered from the sample cell is detected by one or more detectors (112B-H). Light transmitted by the sample cell is detected by detectors 112A, 112J. Output signals from one or more of the detectors are passed to a computation unit (114) which calculates particle size distribution. A small percentage of light from the blue LED is reflected by the dichroic element to a detector (110). Similarly, a small percentage of light from the laser is passed by the dichroic element to the detector. Output signals from the detector are fed back to control units (106, 108) to stabilize the output power of the LED and laser.

Abstract: Provided herein is an apparatus, including a photon emitter configured for sequentially emitting a first set of photons and a second set of photons onto a surface of an article. In addition, a photon detector array is configured to focus the first set of photons scattered from surface features of the article in a first focal plane. The photon detector array is further configured to focus the second set of photons scattered from surface features of the article in a second focal plane, wherein the first set of photons scattered is different from the second set of photons scattered. The photon detector array is further configured to provide information for distinguishing foreign surface features of the article from native surface features of the article.

Abstract: A vehicle for external inspection of tubing conformed by a body with a magnetic traction arrangement in its lower part and at least one inspection device mounted on the body; In which the magnetic drive arrangement includes two front magnetic wheels, a rear magnetic wheel coupled to two servomotors, one for controlling longitudinal advancement and another rudder servomotor for controlling the spin or rotation of this third wheel, and wherein the magnetic drive arrangement Inspection consists of a laser sensor coupled to a linear actuator.

Abstract: An apparatus for manipulating surface near-field light resulting from light emitted from a light source that passes through a scattering layer is disclosed. Also, a method of finding a phase of incident light to cause constructive interference at a target spot using light scattering to manipulate the surface near-field.

Abstract: A nephelometric turbidimeter for measuring a turbidity of a liquid sample in a sample cuvette. The nephelometric turbidimeter includes a measurement light source configured to emit an axial parallel light beam directed to the sample cuvette, a scattering light detector arranged to receive a scattered light from the sample cuvette, and a diffuser comprising a diffuser body and a diffuser actuator. The diffuser actuator is configured to move the diffuser body between a parking position in which the diffuser body does not interfere with the axial parallel light beam and a test position where the diffuser body is arranged between the measurement light source and the sample cuvette so that the diffuser body interferes with the axial parallel light beam and generates a diffuse test light entering the sample cuvette.

Abstract: A sensor comprising a light component in support of a light source operable to direct a beam of light onto an imaging device having an image sensor, such as a CCD or CMOS or N-type metal-oxide-semiconductor (NMOS or Live MOS) sensor. The sensor can also comprise an imaging device positioned proximate to the light component and operable to receive the beam of light, and to convert this into an electric signal, wherein the light component and the imaging device are movable relative to one another, and wherein relative movement of the light component and the imaging device is determinable in multiple degrees of freedom. The sensor can also comprise a light deflecting module designed to deflect light from a light component onto the imaging device. The light sources and the resulting beams of light therefrom can comprise a number of different types, orientations, configurations to facilitate different measurable and determinable degrees of freedom by the sensor.

Abstract: A system and method for measuring a concentration of a gas in a container having at least one flexible or variable side or wall. The system and method comprising creating a determinable optical path length through the container having a shape. Positioning a light source head and a detector head against at least one of the least one flexible or variable side or wall. Transmitting a light signal between the light source head and the detector head through the determinable optical path length. Determining the concentration of the gas in the container based on detected light and the determinable optical path length.

Abstract: Microspheres are sorted by resonant light pressure effects. An evanescent optical field is generated when light is confined within the interior of an optical element such as a surface waveguide, a tapered microfiber, or a prism. Microspheres brought within vicinity of the surface are subjected to forces that result from a coupling of the evanescent field to whispering gallery modes (WGM) in the microspheres. Alternatively, a focused laser beam is directed close to the edge of the microspheres to exert resonant optical forces on microspheres. Alternatively, standing optical waves are excited in the optical element. Optical forces are resonantly enhanced when light frequencies match WGM frequencies in the microspheres. Those microspheres for which resonance is obtained are more affected by the evanescent field than microspheres for which resonance does not occur. Greater forces are applied to resonating microspheres, which are separated from a heterogeneous mixture according to size.

Abstract: Disclosed is a volume sensor having first, second, and third laser sources emitting first, second, and third laser beams; first, second, and third beam splitters splitting the first, second, and third laser beams into first, second, and third beam pairs; first, second, and third optical assemblies expanding the first, second, and third beam pairs into first, second, and third pairs of parallel beam sheets; fourth, fifth, and sixth optical assemblies focusing the first, second, and third beam sheet pairs into fourth, fifth, and sixth beam pairs; and first, second, and third detector pairs receiving the fourth, fifth, and sixth beam pairs and converting a change in intensity of at least one of the beam pairs resulting from an object passing through at least one of the first, second, and third parallel beam sheets into at least one electrical signal proportional to a three-dimensional representation of the object.

Abstract: A spectrophotometer includes: a sample-chamber lid capable of opening and closing an opening portion of a sample chamber for setting a sample and a reference sample; and sample-chamber lid opening-closing detecting means for detecting an opening-closing state of the sample-chamber lid, and the spectrophotometer is capable of controlling a measurement of a xenon flash tube as a light source, a spectroscope, a detector, an amplifier, an AD converter, a processor, a storage device, and a data display part. In the spectrophotometer, the light source is turned on after a state of the lid changing from an opening state to a closing state is detected in a sample-setting instruction state by the sample-chamber lid opening-closing detecting means; absorbancy, transmissivity, reflectivity, a sample-side energy value, or a reference-side energy value is measured; and a measurement result is displayed on the data display part.

Abstract: The present invention relates to an inspection device and particularly to a device using an array of light sources and photo-detection devices to evaluate threaded workpieces for conformance to spatial form criteria. The invention provides for improved identification of flaws in threaded components to identify the conformance of parts.

Abstract: An optical filter 4 is placed in an optical path between a light source unit 1 using a deep ultraviolet LED as a light source and a sample cell 2. The optical filter 4 is a shortpass filter that allows passage of light of a main peak located within a deep ultraviolet region while blocking light of an unwanted peak located within a visible region. The temporal change in the amount of light of the unwanted peak is considerably greater than that of the main peak. The optical filter 4 blocks the former light whose amount considerably changes with time. As a result, the influence of the noise and drift originating from the LED on the detection signal obtained in a detector 3 is dramatically reduced, so that the analytical accuracy is improved.

Abstract: In a line projector a diode-laser beam having an elliptical cross-section is projected onto a Powell lens which spreads the beam to form a line of light. Distribution of power along the line of light is adjusted by rotating the diode-laser beam with respect to the Powell lens.

Abstract: A cell observation system 1 is a cell observation system 1 for observing a cell held by a microplate 20 having a plurality of wells 21 arranged therein for holding a sample S including the cell and comprises a microplate holder 11 for mounting the microplate 20, an electrical stimulator 16 arranged with a plurality of electrode pairs 17 including positive and negative electrodes 17b, 17a, and a data analyzer 50 for controlling a position of the electrical stimulator 16 so as to place the electrode pairs 17 within the wells 21 of the microplate 20, while a leading end of the negative electrode 17a on the well 21 side extends longer than a leading end of the positive electrode 17b on the well 21 side.

Abstract: A cell observation system 1, for measuring fluorescence emitted from a cell held by a microplate 20 having a plurality of wells 21, comprises a microplate holder 11 for mounting the microplate 20, an electrical stimulator 16 arranged with a plurality of electrode pairs 17 including positive and negative electrodes 17b, 17a, a position controller 30 for controlling a position of the electrical stimulator 16 so as to place the electrode pairs 17 within the wells 21, a moving image acquisition unit 40 for detecting the fluorescence from the sample S within the wells 21, and a data analyzer 50 for setting a part of a region facing the positive electrode 17b on the well 21 as an analysis region and analyzing an optical intensity in the analysis region so as to acquire analysis information concerning the sample S.

Abstract: Provided herein is an apparatus, including two photon emitters and a photon detector array. The two photon emitters are configured to emit photons onto an entire surface of an article. The photon detector array includes a number of photon detectors configured to detect photons scattered from features in the entire surface of the article, wherein the features are less than 500 nm in their largest dimension.

Abstract: Systems and methods for detecting defects on a wafer are provided. One method includes generating test image(s) for at least a portion of an array region in die(s) on a wafer from frame image(s) generated by scanning the wafer with an inspection system. The method also includes generating a reference image for cell(s) in the array region from frame images generated by the scanning of the wafer. In addition, the method includes determining difference image(s) for at least one cell in the at least the portion of the array region in the die(s) by subtracting the reference image from portion(s) of the test image(s) corresponding to the at least one cell. The method further includes detecting defects on the wafer in the at least one cell based on the difference image(s).

Abstract: Systems and methods for detecting defects on a wafer are provided. One method includes generating test image(s) for at least a portion of an array region in die(s) on a wafer from frame image(s) generated by scanning the wafer with an inspection system. The method also includes generating a reference image for cell(s) in the array region from frame images generated by the scanning of the wafer. In addition, the method includes determining difference image(s) for at least one cell in the at least the portion of the array region in the die(s) by subtracting the reference image from portion(s) of the test image(s) corresponding to the at least one cell. The method further includes detecting defects on the wafer in the at least one cell based on the difference image(s).

Abstract: In an inspection apparatus, inspection is carried out by linearly moving a wafer while rotating the wafer with respect to light. In a case where the wafer is rotated, the velocity of flow of air in outer regions of the wafer is increased, and there is a possibility that the flow of the air in the outer regions cause particles contained in an atmosphere in the vicinity of the wafer to be adhered to the wafer. In a case where such particles are adhered to the wafer, the particles are also detected as a defect, and therefore yields and cleanliness in a semiconductor production process cannot be correctly evaluated. Therefore, it is desirable that adhesion of the particles contained in the atmosphere in the vicinity of the wafer to the wafer be reduced as much as possible. Further, it is expected that, when, for example, rotation speed of the wafer is increased or a diameter of the wafer is increased, such particles are adhered further remarkably.

Abstract: A measurement system is configured to measure a surface structure of a sample. The surface of the sample has a thin film and a via, the depth of the via is larger than the thickness of the thin film. The measurement system includes a light source, a first light splitter, a first aperture stop, a lens assembly, a second aperture stop, a spectrum analyzer and an analysis module. The first light splitter disposed in the light emitting direction of the light source. The first aperture stop disposed between the light source and the first light splitter. The lens assembly is disposed between the first light splitter and the sample. The second aperture stop is disposed between the lens assembly and the first light splitter. The spectrum analyzer is disposed to at a side of the first light splitter opposite to the sample.