Abstract: A method and system for remote sensing using optical orbital angular momentum (OAM)-based spectroscopy for lateral motion detection. The method includes applying an OAM mode on a light beam to generate an OAM light beam, the OAM light beam having an optical OAM spectrum, applying an OAM optical beam tilt on the OAM light beam to generate a tilted OAM light beam, transmitting the tilted OAM light beam on a remote object, such that the remote object interacts with the tilted OAM light beam, receiving a reflected OAM spectrum associated with the remote object, the reflected OAM spectrum having power values of OAM modes on opposite sides of an OAM launch mode, and displaying lateral motion of the remote object based on the reflected OAM spectrum by comparing the power values.

Abstract: The present invention relates to a scanning probe (100) for the dimensional acquisition of an object (400) by irradiating the object (400) with light and detecting reflected light comprising: a detection unit (120) comprising an imaging sensor (122) and a sensor lens assembly (124) for detecting the reflected light, a light projecting unit (141) comprising a light source (142) for generating light, and source optics (145) for focusing the light, and light plane generating optics (143) for generating a light plane (149) for irradiating the object, and an adjustment mechanism (155) comprised in the light projecting unit (141), for adjusting the position or orientation of the light plane relative to the detection unit. It further relates to a method for assembly of a scanning probe (100).

Abstract: A method and system for optically inspecting parts are provided wherein the system includes a part transfer subsystem including a transfer mechanism adapted to receive and support a part at a loading station and to transfer the supported part by a split belt conveyor so that the part travels along a first path which extends from the loading station to an inspection station at which the part has a predetermined position and orientation for inspection. An illumination assembly simultaneously illuminates a plurality of exterior side surfaces of the part with a plurality of separate beams of radiation. A telecentric lens and detector assembly forms an optical image of at least a portion of each of the illuminated side surfaces of the part and detects the optical images. A processor processes the detected optical images to obtain a plurality of views of the part which are angularly spaced about the part.

Abstract: The invention relates to a method for aligning tracks of a roadwork machine, characterized by using a track alignment detection unit that is attached to a first track unit for allowing detection of an orientation of the first track unit, and frame orientation detection means that are attached to the machine frame for allowing detection of an orientation of the machine frame, the method comprising determining an initial orientation of the machine frame, and determining an initial orientation of the first track unit, determining whether a difference between a most recently determined orientation of the machine frame and a most recently determined orientation of the first track unit is within a predefined threshold value, initializing a pivoting of the first track unit, determining a changed orientation of the first track unit after the pivoting, and determining an orientation of the machine frame after the pivoting.

Abstract: A container inspection device is used to inspect containers, such as bottles or similar containers in a container filling plant. The container inspection device comprises a guide arrangement that guides characteristic information of one or more regions of a container along a first guide path to a first sensor, and along a separate, second guide path to a second sensor. The guide arrangement comprises at least two essentially identical guide structures, through which the guide paths travel. A guide element is included that is designed to guide the characteristic information to both the first guide path and the second guide path.

Abstract: A system for inspecting a backside surface of a wafer with multi-channel focus control includes a set of inspection sub-systems including a first inspection sub-system positioned and an additional inspection sub-system. The first and additional inspection sub-systems include an optical assembly, an actuation assembly, where the optical assembly is disposed on the actuation assembly, and a positional sensor configured to sense a position characteristic between a portion of the optical assembly and the backside surface of the wafer. The system also includes a controller configured to acquire one or more wafer profile maps of the backside surface of the wafer and adjust a first focus position of the first inspection sub-system or an additional focus position of the additional inspection sub-system based on the received one or more wafer profile maps.

Abstract: A portable apparatus for estimating air quality is provided. The portable apparatus includes a light source unit suitable for emitting incident light having a predetermined wavelength toward air to generate scattered light which is reflected by particles in the air, a light detection unit suitable for collecting information on the scattered light, and an arithmetic unit suitable for analyzing the information on the scattered light which is collected by the light detection unit. The arithmetic unit generates information on a size and a concentration of the particles in the air. Related methods are also provided.

Abstract: A variety of toy polariscopes are simpler in design and less costly than precision instruments used in scientific research and stress analysis of materials and structures. The toy polariscopes are designed for a variety of objects that may exhibit photoelastic properties such as glass, plastic, Plexiglas, gel candle material and other gels, and even edible photoelastic objects. They are specially designed for objects of various sizes with a variety of purposes such as objects to enhance learning in a variety of conditions and experiences. Special objects are designed to go with the toy polariscopes such as edible and inedible photoelastic objects, photoelastic candle material, a variety of photoelastic/photoplastic stands capable of a variety of displays in interaction with other designed photoelastic objects capable of a variety of interaction and displays. Other optical phenomena may also be observed.

Abstract: The disclosure is directed to image intensifier tube designs for field curvature aberration correction and ion damage reduction. In some embodiments, electrodes defining an acceleration path from a photocathode to a scintillating screen are configured to provide higher acceleration for off-axis electrons along at least a portion of the acceleration path. Off-axis electrons and on-axis electrons are accordingly focused on the scintillating screen with substantial uniformity to prevent or reduce field curvature aberration. In some embodiments, the electrodes are configured to generate a repulsive electric field near the scintillating screen to prevent secondary electrons emitted or deflected by the scintillating screen from flowing towards the photocathode and forming damaging ions.

Abstract: The present invention relates to an accuracy traceability method based on precision coordinates control network for workshop Measurement Positioning System, which includes the steps: setting a plurality of SMR (Spherically Mounted Retroreflector) nests and stations in the measurement space; forming a global control point by using SMR; measuring all the 3-d coordinates of global control points in all the laser tracker stations; using the range value measured by the laser tracker as constraints to calculate the 3-d coordinates of global control points by using the dynamic weighting method; arranging a plurality of transmitters and calibrating the transmitters in combination with precision coordinate control network; measuring all global control points and measured points simultaneously by using wMPS, and using the 3-d coordinates of global control points as the constraints for adjustment calculation to obtain the 3-d coordinates of the measured points.

Abstract: An imaging device includes: an imaging element that take an image of a subject; and a plurality of light sources that radiate a light to the subject, wherein optical axes of the plurality of the light sources are inclined outward with respect to an optical axis of the imaging element.

Abstract: An optical system comprising: a light source; a photodetector; a first light-receiving system for causing the photodetector to receive first reflected light with a first angle of reflection from a surface; and a second light-receiving system for causing the photodetector to receive second reflected light with a second angle of reflection, different from the first angle of reflection, from the surface is provided. Here, an incident area on the surface, in which light generating the first reflected light is incident, is spaced apart from an exiting area on the surface, which light, to be incident on the photodetector from the surface via the second light-receiving system, exits.

Abstract: The invention relates to an apparatus (8) for detecting a target position deviation of two bodies (10, 12), with a first measuring unit (14) for placement on the first body (10), a second measuring unit (18) for placement on the second body (12), and an evaluation unit (22). The first measuring unit (14) has means (24) to generate at least one bundle of light beams (28) and a scattering area (34) to scatter light (WV, PV) striking the scattering area, and the second measuring unit (18) has a reflector arrangement (38) to reflect the bundle of light beams (28) onto the scattering area (34). The second measuring unit (18) has a camera (36) to record images of the scattering area (34). The evaluation unit (22) is configured so as to detect from the images a deviation in target position of the bodies (10, 12). The invention additionally relates to a method to detect the deviation in target position.

Abstract: The present invention relates to a method and an automatic analyzer for determining more accurately the concentration of lipids and other interfering substances in body fluids, particularly of interfering substances such as bilirubin and hemoglobin in blood serum and blood plasma samples.

Abstract: A glue thickness inspection system automates a thickness measurement functionality for determining the thickness of both non-transparent and transparent materials including, but not limited to, glue, gel, solder and epoxy. The glue thickness inspection system includes a laser detector, a movable platform for positioning a unit under test, and a controller for controlling movement of the platform, angle of the laser detector, and calculation of the transparent material thickness. The laser detector includes a laser for emitting a laser light onto the unit under test and a sensor for receiving corresponding reflected light. The sensed data is used by the controller to determine the transparent material thickness.

Abstract: A method and system for inspecting a manufactured part at an inspection station are provided. A supported part is rotated about a measurement axis so that the part moves at predetermined angular increments during at least one rotational scan. A backside beam of collimated radiation is directed at and is occluded by the supported part at each of a first plurality of consecutive increments of movement to create a stream of unobstructed portions of the backside beam in rapid succession passing by and not blocked by the supported part. A frontside beam of radiation is directed at and is reflected by the supported part at each of a second plurality of consecutive increments of movement to create a stream of reflected portions of the frontside beam in rapid succession. The streams of reflected and unobstructed portions are detected at the inspection station to obtain electrical signals which are processed.

Abstract: An apparatus for inspecting curvature, including: a radiation unit radiating a plurality of rays of light having different focal lengths onto a surface of an target material; and an inspection unit inspecting the surface of the target material using the rays of light reflected from the target material. The apparatus can inspect the curvature or the bending of the surface of a target material at a high speed and with high accuracy.

Abstract: A fault analysis apparatus is an apparatus for measuring a reaction of a semiconductor device having a wiring extending in two directions orthogonal to each other. The fault analysis apparatus comprises a laser light source that outputs laser light, a control unit that sets a scan direction which is a direction of scanning an irradiation position of the laser light in the semiconductor device, a laser scanner that scans the laser light according to the scan direction, an electric signal detector that measures the reaction of the semiconductor device to the laser light and outputs a measured value, and an image processing unit that creates a two-dimensional map according to the irradiation position and the measured value. The control unit sets the scan direction such that the scan direction intersects the wiring extending directions at an angle greater than 0° but smaller than 90°.

Abstract: The invention discloses a 3D laser measuring scanning apparatus. The apparatus comprises: a measurement scanning body; an -axial laser beam outlet and an X-axial reception lens arranged on a side wall of the measurement scanning body, and a Y-axial laser beam outlet and a Y-axial reception lens arranged on another side wall; a Z-axial laser beam outlet and a Z-axial reception lens arranged on the bottom of the measurement scanning body, wherein a groove being open at the side wall with the X-axial laser beam outlet and at the side wall with the Y-axial laser beam outlet is formed in the bottom; a control device placed inside the measurement scanning body and for controlling the emitting of the laser beams from the laser beam outlets when receiving a measurement instruction through a measurement button on the measurement scanning body. A bar code and 2-dimensional bar code scanning laser head, a laser reception lens and a camera are also placed at the bottom of the measurement scanning body.

Abstract: A method for measuring the concentration of a gas component in a measurement gas using a gas analyzer comprises varying the wavelength of the light of a wavelength-tunable light source within periodically consecutive scan intervals for wavelength-dependent scanning of a gas component absorption line of interest. The method also comprises modulating the wavelength of the light of the wavelength-tunable light source with a frequency, guiding the modulated light through the measurement gas onto a detector and demodulating a measurement signal generated by the detector in the event of a harmonic of the frequency. The method further comprises producing a measurement result by fitting a desired curve to the profile of the demodulated measurement signal. A function orthogonal to the desired curve is provided, and an orthogonal component of the measurement result is produced by fitting the orthogonal function to the profile of the demodulated measurement signal.