Patents Examined by Uzma Alam
  • Patent number: 12345625
    Abstract: A microscopic object detection system includes a collecting kit and a detection device. The collecting kit has a thin film for converting light into heat and is configured to be capable of holding a sample on the thin film. The detection device detects a plurality of microscopic objects in the sample by collecting the plurality of microscopic objects dispersed in the sample with the collecting kit. The detection device includes a laser module, an optical receiver, and a controller. The laser module emits a laser beam with which the collecting kit is irradiated. The optical receiver detects the laser beam from the sample held by the collecting kit and outputs a detection signal thereof. The controller calculates an amount of the plurality of microscopic objects collected in the sample based on a change of the detection signal over time.
    Type: Grant
    Filed: May 7, 2021
    Date of Patent: July 1, 2025
    Assignees: University Public Corporation Osaka, MURATA MANUFACTURING CO., LTD.
    Inventors: Takuya Iida, Shiho Tokonami, Hiroki Ishikawa, Tsutomu Yamasaki, Hirohito Washida
  • Patent number: 12313402
    Abstract: A method for compensating the artifacts generated by moving measurement objects in measurement signals of swept-source OCT systems by moving measurement objects. Signal reconstruction is implemented without the aid of additional reference signals in respect of the movement of the measurement object and only by way of especially adapted algorithms. Example methods relate firstly to the especially adapted, Fourier transform-based algorithms for processing the captured measurement signals and secondly to the measurement signals to be captured, in particular to the optical coherence interferometry-based measurement systems used for the production thereof. Although the proposed method is provided for applications in ophthalmology in particular, it can be used, in principle, wherever signals reflected by curved surfaces or backscattered from structures are analyzed.
    Type: Grant
    Filed: October 1, 2019
    Date of Patent: May 27, 2025
    Assignee: Carl Zeiss Meditec LLP
    Inventors: Rainer Leitgeb, Michael Niederleithner
  • Patent number: 12313554
    Abstract: A change in a substance in a depth direction of an analyte is easily estimated. An analysis and observation device includes: a library holding section that holds a substance library in which a substance is associated with a type of an element constituting the substance and a content of the element; and a component analysis section that estimates a type of an element constituting a substance and a content of the element based on a spectrum, and estimates the substance based on estimated characteristics and the substance library. The component analysis section estimates a type of an element constituting a substance, a content of the element, and the substance at each of a plurality of positions having different analysis depths.
    Type: Grant
    Filed: June 30, 2022
    Date of Patent: May 27, 2025
    Assignee: KEYENCE CORPORATION
    Inventors: Hayato Ohba, Kenichiro Hirose, Ryosuke Kondo
  • Patent number: 12313396
    Abstract: Methods, devices and systems describe compact and simple deflectometry configurations that can measure complex shapes of freeform surfaces. One deflectometry system includes a first panel and a second panel positioned at an offset position from each other to provide illumination for an object. The second panel, positioned closer to the object, is operable as a substantially transparent panel, and as a pixelated panel to provide structured light patterns. The system also includes two or more cameras positioned on the second panel an is operable in a first mode where the first panel provides a first structured illumination and the second panel is configured as a substantially transparent panel that allows the first structured illumination from the first panel to transmit toward the object. The system is also operable in a second mode where the second panel is configured to provide a second structured illumination for illuminating the object.
    Type: Grant
    Filed: June 16, 2021
    Date of Patent: May 27, 2025
    Assignee: Arizona Board of Regents on Behalf of the University of Arizona
    Inventor: Rongguang Liang
  • Patent number: 12313454
    Abstract: A system and method for profiling a focused laser beam of a galvanometer scanner which includes an attenuation optic, wherein the attenuation optic includes a first meniscus lens to face the focused laser beam source, wherein the first meniscus lens is tilted at a fixed angle of incidence relative to an optical axis of the focused laser beam and a second meniscus lens between the first meniscus lens and a pixelated detector, wherein the second meniscus lens is tilted at substantially the same fixed angle of incidence relative to the optical axis of the focused laser beam as the first meniscus lens and is rotated about 90° relative to the first meniscus lens.
    Type: Grant
    Filed: October 17, 2022
    Date of Patent: May 27, 2025
    Assignee: Haas Laser Technologies, Inc.
    Inventor: Michael J. Scaggs
  • Patent number: 12292333
    Abstract: A color measurement apparatus includes an opening portion forming member that is a member in which an opening portion for causing light arriving from a measurement target to enter inside the apparatus is formed, and that is arranged on a bottom surface at a time of measurement performed by the apparatus, an incident light processing portion that processes light incident through the opening portion, a battery that supplies power to the incident light processing portion, and a first circuit substrate on which a wireless communication portion is mounted, in which in a view from a first direction that is a vertical direction intersecting with the bottom surface and an upper surface which is a surface on an opposite side from the bottom surface, the first circuit substrate and the battery have an overlapping part.
    Type: Grant
    Filed: November 9, 2021
    Date of Patent: May 6, 2025
    Assignee: Seiko Epson Corporation
    Inventors: Haruki Miyasaka, Hisayuki Akahane
  • Patent number: 12276782
    Abstract: A method of increasing the interference contrast in interferometric scattering optical microscopy. The method comprises providing a particle detection region comprising a chamber or channel having a boundary defined by one or more interfaces, illuminating a particle in the particle detection region with coherent light using an objective lens such that the light is reflected from the interface and scattered by the particle, capturing the reflected light and the scattered light using the objective lens, and providing the captured reflected and scattered light to an imaging device to image interference between the reflected light and the scattered light. The particle is illuminated by coherent light at an oblique angle to the interface.
    Type: Grant
    Filed: November 22, 2019
    Date of Patent: April 15, 2025
    Assignee: Cambridge Enterprise Limited
    Inventors: Tuomas Pertti Jonathan Knowles, Pavan Kumar Challa, Kadi Liis Saar, Quentin Alexis Peter, Zenon Toprakcioglu
  • Patent number: 12270762
    Abstract: Provided is a Raman-active particle which is a Raman-active particle for surface-enhanced Raman analysis, the particle including: a spherical plasmonic metal core; a plasmonic metal shell having surface unevenness; and a self-assembled monolayer which is bonded to each of the core and the shell and positioned between the core and the shell, and includes a Raman reporter.
    Type: Grant
    Filed: September 18, 2019
    Date of Patent: April 8, 2025
    Assignee: Korea Research Institute of Standards and Science
    Inventors: Eun-Ah You, Wansun Kim, Tae Geol Lee
  • Patent number: 12270706
    Abstract: Improved cavity enhanced absorption spectroscopy is provided using a piecewise tunable laser by using a lookup table for laser tuning that is configured specifically for this application. In preferred embodiments this is done in combination with a laser control strategy that provides precise wavelength determination using cavity modes of the instrument as a reference.
    Type: Grant
    Filed: August 15, 2021
    Date of Patent: April 8, 2025
    Assignee: Picarro, Inc.
    Inventors: Alejandro Dario Farinas, John A. Hoffnagle, Chris W. Rella, Sze Meng Tan
  • Patent number: 12264914
    Abstract: A device for measuring wafers includes an optical coherence tomograph and a scanning device that scans the surface of the wafer successively at a plurality of measuring points. Two measuring points have a distance dmax of 140 mm?dmax?600 mm. An evaluation unit calculates distance values and/or thickness values from the interference signals provided by the optical coherence tomograph.
    Type: Grant
    Filed: May 23, 2024
    Date of Patent: April 1, 2025
    Assignee: PRECITEC OPTRONIK GMBH
    Inventors: Stephan Weiß, Simon Mieth, Corinna Weigelt, Tobias Beck
  • Patent number: 12257644
    Abstract: A method, apparatus, and system are provided to monitor and characterize the dynamics of a phase change region (PCR) created during laser welding, specifically keyhole welding, and other material modification processes, using low-coherence interferometry. By directing a measurement beam to multiple locations within and overlapping with the PCR, the system, apparatus, and method are used to determine, in real time, spatial and temporal characteristics of the weld such as keyhole depth, length, width, shape and whether the keyhole is unstable, closes or collapses. This information is important in determining the quality and material properties of a completed finished weld. It can also be used with feedback to modify the material modification process in real time.
    Type: Grant
    Filed: August 29, 2022
    Date of Patent: March 25, 2025
    Assignee: IPG Photonics Corporation
    Inventor: Paul J. L. Webster
  • Patent number: 12259288
    Abstract: A light emitting apparatus has a visible light emitter, an invisible light emitter, invisible light receiver for receiving invisible light emitted from the invisible light emitter, cover member covering these components, and controller for controlling operation of the visible light emitter. The cover member has flexibility so as to deform when receiving external force, and at least partially reflects invisible light and passes and diffuses visible light. The invisible light emitter emits invisible light toward an inside surface of the cover member, and the invisible light receiver receives invisible light and reflected by the cover member. The controller controls an emission mode of visible light emitted from the visible light emitter in accordance with a reception state of invisible light at the invisible light receiver, which changes in accordance with deformation of the cover member.
    Type: Grant
    Filed: December 17, 2021
    Date of Patent: March 25, 2025
    Assignee: NINTENDO CO., LTD.
    Inventors: Yoshiyasu Ogasawara, Hironori Furuike
  • Patent number: 12261614
    Abstract: A closed-loop coherent oscillator matterwave (COMW) system generates a COMW. Atoms tunnel into a COMW oscillator to populate the COMW generated and emitted by the oscillator. A detuned light-field-based COMW splitter divides the emitted COMW between an output COMW and a regulator COMW. A COMW resonator, including detuned light-field mirrors, receives the regulator COMW and returns a feedback COMW. A COMW sensor evaluates the intensity of the feedback COMW. A controller adjusts the oscillator based on the evaluation to optimize the COMW output of the system.
    Type: Grant
    Filed: March 6, 2022
    Date of Patent: March 25, 2025
    Assignee: ColdQuanta, Inc.
    Inventor: Dana Zachary Anderson
  • Patent number: 12259317
    Abstract: A nonlinear element provides a nonlinear effect to light output from a pulsed laser source. Remaining light component having the oscillation wavelength of the pulsed laser source is attenuated when the light is split by a dichroic mirror. The divided light is subjected to pulse stretching by a fiber, and is combined by a multiplexing element. The light thus combined is irradiated to a target object S. The light transmitted through the target object S is received by a photoreceiver. The output signal of the photoreceiver is converted by a calculation unit into a spectrum.
    Type: Grant
    Filed: July 29, 2020
    Date of Patent: March 25, 2025
    Assignee: Ushio Denki Kabushiki Kaisha
    Inventors: Junki Sahara, Aya Ota
  • Patent number: 12259276
    Abstract: A spectrometer device includes: a substrate including multiple light detector elements; a first filter layer on the substrate, in which the first filter layer includes multiple groups of filter stacks, each filter stack in the first filter layer including multiple dielectric films of alternating refractive index; and a second filter layer on the first filter layer, in which the second filter layer includes multiple groups of filter stacks, each filter stack in the second filter layer including multiple dielectric films of alternating refractive index, in which each filter stack in the second filter layer is aligned with both a corresponding filter stack in the first filter layer and a corresponding light detector element to define a respective photodetector channel, and in which each photodetector channel includes a different optical transmission spectrum.
    Type: Grant
    Filed: July 15, 2020
    Date of Patent: March 25, 2025
    Assignee: AMS INTERNATIONAL AG
    Inventors: Ruitao Zheng, James Archibald
  • Patent number: 12253413
    Abstract: A spectroscopic sensor includes a wiring substrate having a main surface, a light detector disposed on the main surface of the wiring substrate, a Fabry-Perot interference filter, a spacer which is provided on the main surface of the wiring substrate and supports the Fabry-Perot interference filter so that the Fabry-Perot interference filter and the light detector are separated from each other, and a stem connected to a ground potential. A second current path which has a smaller electric resistance than that of an arbitrary first current path which extends from the Fabry-Perot interference filter to the light detector via the spacer and the wiring substrate is formed between the Fabry-Perot interference filter and the stem.
    Type: Grant
    Filed: August 23, 2019
    Date of Patent: March 18, 2025
    Assignee: HAMAMATSU PHOTONICS K.K.
    Inventors: Hiroki Oyama, Katsumi Shibayama, Takashi Kasahara, Masaki Hirose, Toshimitsu Kawai, Yumi Kuramoto
  • Patent number: 12253392
    Abstract: A micro-probe laser frequency modulation interferometric ranging method and system, under the premise of not introducing an absolute laser rangefinder to introduce new uncertainties, continuously and slowly changes the modulated laser wavelength, resulting in a continuous periodic phase change in the interference signal obtained by the detector. The laser modulation absorption spectrum shifts from the initial locked absorption peak to another locked peak, and the wavelength changes of the two locked absorption peaks before and after are obtained by checking the table. Meanwhile, calculating the phase difference demodulated by the phase generated carrier (PGC) before and after, and the initial length of optical dead-path is calculated using wavelength scanning technology. Afterwards, utilizing the advantages of high relative distance measurement accuracy of micro-probe fiber optic laser interferometer, real-time measurement of the measured distance is achieved.
    Type: Grant
    Filed: June 17, 2024
    Date of Patent: March 18, 2025
    Assignee: Harbin Institute of Technology
    Inventors: Yisi Dong, Wenrui Luo, Wenwen Li, Chen Zhang, Jinran Zhang, Pengcheng Hu
  • Patent number: 12241838
    Abstract: It is possible to save time and effort required for imaging of an analysis point and to improve usability of an analysis device. An analysis and observation device as a laser-induced breakdown spectroscope includes: a first camera, an electromagnetic wave emitter that emits laser light to a sample; a reflective object lens that collects plasma light generated in the sample; first and second detectors that generate intensity distribution spectra; and a processor. The processor controls the first camera in response to reception of a start trigger signal to generate a pre-irradiation image that is an image before the sample is irradiated with the laser light, and controls the electromagnetic wave emitter after controlling the first camera to emit the laser light to the sample.
    Type: Grant
    Filed: March 8, 2022
    Date of Patent: March 4, 2025
    Assignee: KEYENCE CORPORATION
    Inventors: Ryosuke Kondo, Kenichiro Hirose
  • Patent number: 12241732
    Abstract: A device for automatically detecting a through-hole rate of a honeycomb sandwich composite-based acoustic liner, including a customized tooling, a data acquisition system, a motion mechanism and a data processing system. The data acquisition system is configured to acquire a surface three-dimensional (3D) point cloud data of an acoustic liner using a two-dimensional (2D) laser profile sensor in a manner of parallel movement shooting, and connected with a graphics workstation. The motion mechanism includes an industrial robot, and the 2D laser profile sensor is fixed at an end of the industrial robot. The motion mechanism is configured to support the data acquisition system to perform translational scanning. The data processing system includes the graphics workstation, and plays a role of path planning and data storage. A method for automatically detecting a through-hole rate of a honeycomb sandwich composite-based acoustic liner is also provided.
    Type: Grant
    Filed: March 23, 2022
    Date of Patent: March 4, 2025
    Assignee: NANJING UNIVERSITY OF AERONAUTICS AND ASTRONAUTICS
    Inventors: Jun Wang, Zhongde Shan, Hao Tang, Yuanpeng Liu
  • Patent number: 12241781
    Abstract: A coherent light source outputs coherent light including high-order harmonics obtained by irradiating short-pulse laser light to a nonlinear medium. A spectrometer includes a grating that diffracts the coherent light and an image sensor that measures an image of the diffracted light. In a first state, a first double slit having a pair of apertures spaced apart in a first direction is arranged at a predetermined position between coherent light source and an incident slit of spectrometer. In a second state, a second double slit that is a replica of first double slit is arranged at the predetermined position as a replacement of first double slit with a sample held in one aperture. A calculation processing device calculates optical constants of the sample based on interference images measured in the first and second states.
    Type: Grant
    Filed: February 15, 2022
    Date of Patent: March 4, 2025
    Assignee: THE UNIVERSITY OF TOKYO
    Inventors: Daisuke Hirano, Makoto Gonokami, Kosuke Yoshioka