Abstract: The device has a processor (20) that applies a magnetic field to a measurement subject (2) and after the magnetic field is discontinued, uses an induced electromotive force detector (17) to measure the magnetic fluxes emitted from multiple locations, calculates time constants of transient change of the plurality of magnetic fluxes, and detects the internal structure of the measurement subject (2) from the distribution of the time constants. The processor (20) prompts the induced electromotive force detector (17) to make first measurements at predetermined locations, prompts the induced electromotive force detector (17) to make second measurements at locations rotated by a predetermined angle from the predetermined locations, and based on the internal structure detected by the first measurements and the internal structure detected by the second measurements, estimates the center location of the nugget and/or the diameter of the nugget which has been formed inside the measurement subject (2).

Abstract: Increase in number of valves complicates the configuration and control. A temperature control apparatus for controlling a temperature of a device, includes; a heat exchange section exchanging heat with the device; a main flow path causing a fluid to flow; a sub flow path causing, to flow, a fluid having a temperature different from a temperature of the fluid flowing through the main flow path; a mixture flow path merging the fluids from the main flow path and the sub flow path and causing the merged fluids to flow to the heat exchange section; and a flow rate adjusting section adjusting an amount of a fluid flowing from the sub flow path to the mixture flow path, in relation to the fluid flowing through the main flow path.

Abstract: Techniques for coupling with devices that convert displacements into differential voltages and improve the sensitivity of such devices. A transducer operates based on changes of inductances between primary and secondary of a transformer to produce a differential signal that includes a noninverted signal and an inverted signal. A switch receives the noninverted signal and the inverted signal. A processor creates a square wave signal for driving the transducer input, and also digitally creates an inverted transducer output. A filter operates to filter the square wave output from the processor to produce a substantially single frequency signal at a specified timing having a specified phase relationship relative to the first phase inversion signal based on instructions that are executed by the processor.

Abstract: Through-silicon vias (TSVs) are tested using a modified integrated circuit test probe array, an electron beam generation device, a beam direction control device and an electron beam detection device. The TSV extends through a silicon substrate with end portions exposed or accessible by contacts disposed on opposing upper and lower surfaces of the substrate. The test probe array includes a test probe that accesses the lower TSV end portion and applies an AC test signal. An electron beam is directed by the beam direction control device onto the upper substrate surface such that a beam portion reflected from the upper TSV end portion is captured by the electron beam detection device. Reflected beam data is then analyzed to verify the TSV is properly formed. Various scan patterns, different test signal frequencies and an optional resistive coating are used to enhance the TSV testing process.

Abstract: An inductive, conductivity sensor comprising a transmitting coil, a receiving coil and, surrounding the transmitting coil and the receiving coil, a housing, which has, for immersion in a measured medium, at least one housing section, whose housing wall surrounds the transmitting coil and the receiving coil. The housing wall of the housing section surrounding the transmitting coil and the receiving coil has a multi-ply construction, which comprises at least a first ply of a first material and a second ply of a second material different of the first material.

Abstract: A method of monitoring the accumulation of matter on an external surface of an aircraft involves applying varying electric fields to the aircraft surface, and a sensor monitor receiving a time-series of measurements of a temperature of the aircraft surface and a phase and a magnitude of a current induced in an electric field sensor unit from the varying electric fields. The electric field sensor unit is mounted proximate the aircraft surface. The time-series of the measurements varies in accordance with the instantaneous accumulation of matter on the aircraft surface. The sensor monitor generates an assessment of the accumulation of matter on the aircraft surface from a correlation of the time-series of the measurements with at least one predetermined matter accumulation profile. Each predetermined matter accumulation profile comprises a corresponding time-series of current phase, current magnitude and temperature measurements.

Abstract: A monolithic integrated circuit device may include a supply voltage glitch detector for detecting improper supply voltage conditions. Advantageously, the detection threshold of the supply voltage glitch detector is adaptively set based on the mode of operation of the device or a particular part of the device, which is internally known to the device based on certain inputs received by the device, such as commands, interrupts, control signals, and so forth.

Abstract: A nest includes a fix part, and a movable part, wherein the fix part and movable part are configured to cooperate so as to define a pocket which can receive at least a part of an electrical component, wherein the movable part is moveable between a first position and a second position, wherein in the first position the pocket is open so that at least part of the electrical component can be moved into the pocket, and in the second position the pocket is closed so that the at least part of the electrical component positioned in the pocket is secured within the pocket, wherein the nest further includes a biasing means which is arranged to bias the movable part towards its second position. There is further provided a nest assembly, a component handling assembly, and a table that includes the nest.

Abstract: An example circuit may include an inductor; a low-frequency sensor connected to the inductor; a high-frequency sensor connected to the inductor; and an integrator connected to the low-frequency sensor and the high frequency sensor, comprising one or more resistive devices and one or more capacitive devices, wherein the integrator is characterized by a time constant that varies as a function of the inductance of the inductor. The inductor may, for example, be part of a switched-mode power supply or an amplifier.

Abstract: Multiple measurements may be obtained via a single pin of an integrated circuit (IC) to set multiple control parameters of a light emitting diode (LED) controller within the IC. For example, a first input signal may be applied from the IC to two or more components via a single IC pin. A first output signal may be obtained from the two or more components via the single IC pin. A second input signal may be applied from the IC to the two or more components via the single IC pin, and a second output signal may be obtained from the two or more components via the single IC pin. A first parameter and a second parameter of the two or more components may be calculated based, at least in part, on the first output signal and the second output signal obtained via the single IC pin.

Abstract: A mode-controlled voltage excursion detector apparatus for monitoring a supply voltage of a power supply applied to a load and a method of operating thereof is described. A voltage monitor is configured to detect an excursion event if the supply voltage exceeds or falls below at least one defined threshold, to generate an excursion event signal upon detection of the excursion event and to provide the generated excursion event signal to the excursion event output for being outputted via an excursion event output. A sensitivity control module is configured to receive a signal indicative of potential voltage excursions. A sensitivity control module is further operatively coupled to the sensitivity control input and configured to disable the outputting of an excursion event signal generated during a defined period of time in response to the reception of the signal, which triggers the disabling of the outputting.

Abstract: An apparatus for probing die electricity includes a substrate, a converting plate, a needle module and a reinforcement structure. The converting plate includes two opposite surfaces respectively having a plurality of first and second conductive elements. The needle module has a plurality of needles respectively and electrically connected to the plurality second conductive elements. The reinforcement structure is made from a polymer gel and disposed between the converting plate and the substrate.

Abstract: An FET RF signal detector circuit comprising two unbalanced differential transistor pair circuits is disclosed. A current mirror output circuit is included for generating an output current derived from currents flowing in the differential transistor pair circuits. The first unbalanced differential transistor pair circuit comprises two branches, each with a respective tail, and a first variable resistor between the branch tails. The first unbalanced differential transistor pair circuit connects to a first current source tail arrangement. The second unbalanced differential transistor pair circuit comprises two branches, each with a respective tail, and a second variable resistor between the branch tails. The second unbalanced differential transistor pair circuit connects to a second current source tail arrangement.

Abstract: Provided is a synthetic test circuit for synthetic-testing a thyristor valve in high voltage direct current (HVDC). A resonant circuit applies forward DC current, a reverse DC voltage, and a forward DC voltage to synthetic-test the thyristor valve. A current generation unit generates DC current that is above a reference current value to supply the generated DC current into the resonant circuit. A voltage generates unit generating a DC voltage that is above a reference voltage value to supply the generated DC voltage into the resonant circuit. The resonant circuit includes a charging auxiliary valve for charging a gate driver of the thyristor valve.

Abstract: A semi-hard magnetic material that is formed with equal to or more than 5.0% but less than 13.0% of Ni by mass, equal to or more than 0.5% but equal to or less than 4.0% of Mn by mass, more than 0% but equal to or less than 3.0% of Al by mass, more than 0% but equal to or less than 1.0% of Ti by mass and a remainder of Fe and an impurity, that has a coercivity of 1000 to 2400 A/m and that has a residual magnetic flux density of 1.3 T or more. A method of manufacturing the above semi-hard magnetic material wherein the material is a thin plate having a thickness of 0.030 to 0.30 mm and, after a cold rolling, performing an aging treatment on the thin plate at a temperature of 520° C. to 680° C.

Abstract: Examples are disclosed for an integrated circuit (IC) device coupled to a battery-operated power supply unit, such as an IC in a mobile computing device or wireless phone, to accurately determine energy usage drawn from the power supply unit under rapidly dynamic circumstances. A current sense signal of a power line from the power supply unit is digitized. The digitized current sense is added to an accumulator at a rate that is approximately proportional to a voltage of the power line from the power supply unit. The accumulator is then outputted and scaled to units relevant to energy measurements. The energy measurement is used to estimate remaining battery life. Triggering the digitization of the current sense signal may be by use of a pulse generation circuit, or by use of an overflow indicator of an accumulator for a digitized voltage sense signal.

Abstract: A mother substrate includes a display substrate cell defined by a scribe line, the display substrate cell including a plurality of gate lines, a gate circuit part driving the gate lines, and a gate pad part connected to the gate circuit part, a gate test pad part in a peripheral area surrounding the display substrate cell, the gate test pad part being configured to receive a gate test signal, a gate test line part connecting the gate test pad part and the gate pad part, and a switching part connected to the gate test line part and configured to control turning on and turning off of the gate test line part.

Abstract: An apparatus and method for measuring geomagnetically induced currents (GIC) is disclosed. The apparatus is configured to measure GICs temporarily flowing in high-voltage, 60 Hz power transmission conductors, and includes a securing means for securing the apparatus to the power transmission conductor. The apparatus further includes a flux concentrator having a toroidal ferrite core and winding wound around the core configured to capture a magnetic field from the power transmission conductor; a hall-effect sensor assembly configured to receive the magnetic field from the flux concentrator and produce a voltage signal corresponding to the magnetic field; and an electronics module configured to receive the voltage signal from the hall-effect sensor assembly, conduct measurements, and transmit the measurements to a local access point.

Abstract: Systems and methods for testing a device under test (DUT) that includes a low power output driver. The methods include providing an input signal to the DUT. The low power output driver is configured to generate a data signal responsive to receipt of the input signal by the DUT and provide the data signal to a signal analyzer via a data signal transmission line. The methods further include determining an expected data signal to be received from the low power output driver and charging at least a portion of the data signal transmission line with a co-drive output signal that is based, at least in part, on the expected data signal. The methods further include receiving a composite data signal with the signal analyzer. The systems include probe heads with a plurality of data signal transmission lines and a plurality of co-drive conductors.

Abstract: A semiconductor device includes a normal pad and a first monitoring unit suitable for monitoring whether a bunker is formed in the normal pad based on an inherent resistance component of the normal pad during a probe test.