Abstract: The present invention provides a self-aligned high finesse optical sensor cell for analyzing a gaseous sample using highly reflective optical mirrors with a light source and a detector coupled on either end of the cell, having flexibility and/or serviceability in self-aligning the highly reflective mirrors to the optical cell without any mechanical manipulations.

Abstract: Embodiments are disclosed relating to a refractively-scanning interferometer comprising an aperture that receives an incident light beam at a receiving angle, a beam splitter configured to split the incident light beam into a first beam and a second beam, a first and a second reflector arranged to reflect the first beam and second beam, respectively, towards a combining optical element, and a refractive Optical Path Difference (rOPD) assembly interposed between the beam splitter and the first reflector, wherein the rOPD Assembly refracts the first light beam an even number of times with induced phase discrepancy being a vector sum of a first phase discrepancy induced by a first refraction and a second phase discrepancy induced by a second refraction, the rOPD Assembly being configured such that the first phase discrepancy is substantially opposite in direction to the second phase discrepancy, a portion of the first and second phase discrepancies cancelling one another out to decrease magnitude of the phase di

Abstract: A concentration measurement device may include a beam splitter. The concentration measurement device may include a first optical path and a second optical path. The concentration measurement device may include a rotatable disk. The first optical path and the second optical path may reach to the rotatable disk. The rotatable disk may include at least one passing portion and at least one reflecting portion. The concentration measurement device may include a light receiver configured to detect a wavelength of the first light ant second light. The concentration measurement device may include a controller comparing the wavelengths of the first and second light. The controller compares the concentration of the object material with a reference concentration of the object material to obtain concentration control information, and the controller compares the concentration of the reference material with a normal concentration of the reference material for a concentration calibration.

Abstract: The present invention relates to an optical nanostructure sensing device and an image analysis method. The image analysis method includes: illuminating a light beam from a predetermined incident angle onto a nanostructure pixel sensor; capturing images of the nanostructure pixel sensor when applying an analyte on the nanostructure pixel sensor; obtaining a relationship of periodic spacing and brightness from each of the images; and obtaining wavelength values from the relationship of periodic spacing and brightness at a predetermined brightness value; and determining a sensing process based on a wavelength shift of the wavelength values. The nanostructure pixel sensor includes a plurality of the nanostructure pixels, each of the nanostructure pixels includes periodic nanostructures, and the relationship of periodic spacing and brightness is based on the brightness of the nanostructure pixels having different periodic spacings.

Abstract: A laser transmission apparatus utilizing multiple laser beams and beam paths with a diverger lens to provide an illumination pattern that can compensate for lateral movement of the platform during shearography is provided. Further, this optical setup requires no moving parts and does not reduce power of the laser beams as they move through the individual components thereof. From the perspective of the surface being scanned or inspected, the present disclosure may provide two laser images of a single surface that appear to be identical despite the fact that they were taken from two different spatial positions of the moving platform.

Abstract: An apparatus adapted to perform spectrometric measurements, said apparatus comprising a tunable laser light source adapted to generate a laser light with an excitation wavelength supplied to an optical sensor which produces a sample specific response light signal; an optical reference filter adapted to measure laser light with the excitation wavelength fed back as a reference signal to provide wavelength calibration of the tunable laser light source; at least one optical measurement filter adapted to measure the sample specific response light signal produced by the optical sensor, wherein the optical reference filter and the at least one optical measurement filter are thermally coupled to maintain a constant wavelength relationship between the filter characteristics of the optical filters.

Abstract: A method for determining an optical constant of a material includes: acquiring ellipsometric parameters; obtaining a optical constant of the material corresponding to the ellipsometric parameters by a machine learning model; the machine learning model including a mapping relationship between the ellipsometric parameters and the material optical constant of the material corresponding to the ellipsometric parameters. The method uses the machine learning model to implement an automatic fitting of ellipsometric parameters. In the method, the optical constant of the material is calculated by a machine learning model, which no longer depends on the experiences of the experimenters, thereby reducing requirements for the operator, accelerating the fitting of the data curve when calculating the optical constants of the material and improving the operation efficiency.

Abstract: An atomic beam is irradiated with a first laser beam, a second laser beam, and a third laser beam. The first laser beam and the third laser beam each have a wavelength corresponding to a transition between a ground state and a first excited state. The second laser beam has a wavelength corresponding to a transition between the ground state and a second excited state. First, atoms each having a smaller velocity component than a predetermined velocity in a direction orthogonal to the traveling direction of the atomic beam are changed from the ground state to the first excited state by the first laser beam. Subsequently, a momentum is provided for individual atoms in the ground state by the second laser beam, which removes the atoms from the atomic beam. Finally, atoms in the first excited state are returned from the first excited state to the ground state by the third laser beam.

Abstract: Various methods, systems and apparatus are provided for imaging and sensing using interferometry. In one example, a system includes an interferometer; a light source that can provide light to the interferometer at multiple wavelengths (?i); and optical path delay (OPD) modifying optics that can enhance contrast in an interferometer output associated with a sample. The light can be directed to the sample by optics of the interferometer. The interferometer output can be captured by a detector (e.g., a camera) at each of the multiple wavelengths (?i). In another example, an apparatus includes an add-on unit containing OPD that can enhance contrast in an interferometer output associated with a sample illuminated by light at a defined wavelength (?i). A detector can be attached to the add-on unit to record the interferometer output at the defined wavelength (?i).

Abstract: A remote sampling sensor for determining characteristics of a sample includes measurement optics and an insertion probe. The measurement optics are configured to emit light and detect returned light. The insertion probe includes a chamber, the chamber being configured to permit the sample to enter the chamber, an insertion tip at a distal end of the insertion probe, and a retro-reflective optic adjacent the insertion tip. The retro-reflective optic is configured to return the light from the measurement optics through the chamber to the measurement optics. The insertion probe is configured to be remotely located from the measurement optics.

Abstract: Described herein are methods and systems for the optical imaging of a physical specimen of interest that is in contact with, or in close proximity to, the backplane of a high refractive index solid-immersion lens (SIL), wherein the specimen comprises features of interest that act as a local high-refractive index regions. The SIL lens preferably comprises fiducial markers.

Abstract: Measurement cavities described herein include a cylindrical chamber having a first open end and a second open end; a first cap covering the first open end of the cylindrical chamber and a second cap covering the second open end of the cylindrical chamber, wherein the first and second caps hermetically seal the cylindrical chamber and wherein the first cap is rigidly coupled to the second cap; and a wafer holder positioned within and coupled to the cylindrical chamber. The measurement cavity has a mass m, a stiffness k, and a damping constant c configured such that the transmissibility ? x F ? of an input force at 60 Hz in the measurement cavity is reduced by a factor of at least 10 and the measurement cavity has a natural frequency of greater than 300 Hz.

Abstract: A device for imaging one dimension nanomaterials is provided. The device includes an optical microscope with a liquid immersion objective, a laser device, and a spectrometer. The laser device is configured to provide an incident light beam with a continuous spectrum. The spectrometer is configured to obtain spectral information of the one dimensional nanomaterials.

Abstract: A method for generating a highly distinctive signature of a certain diamond, the method may include generating, based on one or more images of the certain diamond, a certain diamond signature of the certain diamond; finding, out of a group of reference diamonds, other diamonds having other diamond signatures; wherein the finding comprises calculating similarities between the certain diamond signature and reference diamond signatures of the reference diamonds of the group; and generating a new certain diamond signature that significantly differs from signatures of the other diamonds.

Abstract: The present disclosure relates to a spectrometer comprising a spectral decomposition device and a radiation detector. These components are configured such that the spectral decomposition device can break up an incident electromagnetic measuring radiation into components in a wavelength-dependent manner. The radiation detector can measure the intensity of at least one of these components. The spectrometer is configured such that the spectrometer transmits analysis information from the analysis of a food or of a food component to a food preparation device and/or outputs it to the user via an output device. The present disclosure further relates to a system including a control device as well as to a method. In this way, a reproducible cooking result as well as an output of the nutritional values and the actual energy content of the prepared food can be made possible.

Abstract: A label-free optical device for near real time quantification of the multifractal micro-optical properties of a sample includes a source of broadband light; a tunable filter that receives at least a portion of the broadband light and then transmits narrowband light, whereby a specific band of light is selected to avoid unwanted absorption of light by the sample; where the narrowband light is configured to illuminate a selected area of the sample, and in response elastically-scattered light is dispersed from the sample; a light collection device configured to collect at least some of the elastically-scattered light; where at least some of the collected elastically-scattered light is configured to be transmitted to a detector by the light collection device, and the detector is configured to record a light scattering signal; and where the detector is configured to perform light scattering signal measurements at multiple angles or wavelengths to determine a refractive index multifractality of the sample.

Abstract: A digital speckle pattern interferometer (DSPI) is provided for long-range measurement of displacement of materials within a hazardous environments. A test arm of a portion of coherent beam from a laser is aimed at a selected angle to traverse a distance to a test surface. An input collimator has a lens wide enough to receive a reflected beam from the test surface and is focused at a corresponding distance. The reflected beam is combined with a reference beam split from the coherent radiation onto a camera for measuring displacement of the test surface based on an electronic speckle pattern interferometer (ESPI).

Abstract: A surface-enhanced Raman scattering (SERS) detection method is provided for detecting a target analyte in a sample. The SERS detection method generally includes the steps of: (a). preparing an extract of the sample; (b). introducing the sample extract onto a SERS substrate, causing the target analyte to be absorbed in the SERS substrate; (c). introducing a volatile organic solvent onto the SERS substrate to have the target analyte of the sample extract dissolved and comes out of the SERS substrate; (d). irradiating the SERS substrate with light to evaporate the volatile organic solvent, leaving a more condensed target analyte on the SERS substrate; (e). irradiating the condensed target analyte with laser light to have the target analyte penetrate deeply into the SERS substrate; and (f). performing Raman measurement with a laser beam focusing on the SERS substrate to analyze the target analyte.

Abstract: An optical module includes a base which has a main surface and in which a mounting region and a driving region for moving the mounting region along a first direction parallel to the main surface are provided, a movable mirror which has a mirror surface having a positional relationship of intersecting the main surface and is mounted in the mounting region, a first fixed mirror which has a mirror surface having a positional relationship of intersecting the main surface and of which a position with respect to the base is fixed, and a beam splitter unit which constitutes a first interference optical system for measurement light together with the movable mirror and the first fixed mirror. The mirror surface of the movable mirror and the mirror surface of the first fixed mirror are directed to one side in the first direction.

Abstract: A method is presented for determining path length fluctuations in an interferometer using a reference laser with an arbitrary frequency with respect to the measured light. The method includes: injecting reference light along signal paths of the interferometer; measuring interference between the reference light at an output of the interferometer; determining an optical phase difference between the reference light in the two signal paths of the interferometer by measuring intensity modulation of the interference between the reference light and subtracting an intended frequency modulation from the measured intensity modulation; accumulating an unwrapped phase difference between the reference light in the two signal paths of the interferometer, where the unwrapped phase difference is defined in relation to a reference; and determining path length fluctuation of light in the interferometer using the unwrapped phase difference.