Patents Examined by Violeta A Prieto
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Patent number: 11466987Abstract: The present invention reduces measurement time. A gyroscope of the present invention includes a planar ion trap part, a microwave irradiation part, a laser irradiation part and a measurement part. The planar ion trap part includes two rf electrodes and two DC electrode rows, and forms ion traps that trap one ion on a substrate, a normal direction of the surface of the planar ion trap part corresponds to a z direction. The rf electrodes are disposed in the x direction on the substrate at a predetermined interval. The DC electrode rows are disposed in the x direction on the substrate so as to sandwich the two rf electrodes. The DC electrode rows each include at least five DC electrodes in the x direction. The trapped ions are spaced so as not to interfere with each other. The microwave irradiation part irradiates the ions with ?/2 microwave pulses.Type: GrantFiled: July 25, 2018Date of Patent: October 11, 2022Assignees: TOKYO INSTITUTE OF TECHNOLOGY, OSAKA UNIVERSITY, JAPAN AVIATION ELECTRONICS INDUSTRY, LIMITED, MITSUBISHI HEAVY INDUSTRIES, LTD.Inventors: Mikio Kozuma, Ryotaro Inoue, Takashi Mukaiyama, Utako Tanaka, Seiichi Morimoto, Kazunori Yoshioka, Atsushi Tanaka, Yuichiro Kamino
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Patent number: 11460346Abstract: The present disclosure provides a phase sensitivity calibration method based on a phase generated carrier (PGC) technology, which is characterized in that in the operation process of a PGC algorithm, an additional calibration signal with a phase of known magnitude is applied through a phase modulator. This signal is demodulated through an arctangent algorithm or a differential cross multiplication algorithm, and a demodulated output value corresponding to a unit phase in the algorithm is obtained. The phase of known magnitude can be obtained by converting a carrier modulation depth parameter according to a certain ratio.Type: GrantFiled: August 24, 2021Date of Patent: October 4, 2022Assignee: Anhui UniversityInventors: Xuqiang Wu, Benli Yu, Jinhui Shi, Shenglai Zhen, Dong Guang
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Patent number: 11454493Abstract: A position of a movable object is determined with a capture structure having a profile of an optical property that varies along a surface of the capture structure such that the profile corresponds to a progression of numerical values with local maxima and local minima on an ordered scale of the numerical values, and which is interpretable as a first mathematical function of the location. The optical property varies such that a second mathematical function of the location has an absolute maximum corresponding to a maximum value of the optical property. The optical property has assigned corresponding numerical values such that the progression thereof has the local maxima and the local minima and corresponds to the first mathematical function of the location. The position of the movable object is determined by a frequency analysis of the progression of the numerical values of the second mathematical function of the location.Type: GrantFiled: January 31, 2021Date of Patent: September 27, 2022Assignee: Carl Zeiss Industrielle Messtechnik GmbHInventor: Nils Haverkamp
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Patent number: 11454491Abstract: Embodiments of systems for classifying interference signals are disclosed. In an example, a system for classifying interference signals includes an interferometer including a light source and a detector, and at least one processor. The interferometer is configured to provide a plurality of interference signals each corresponding to a respective one of a plurality of positions on a surface of a semiconductor chip. A spectrum of the light source is greater than a spectrum of white light. The at least one processor is configured to classify the interference signals into a plurality of categories using a model. Each of the categories corresponds to a region having a same material on the surface of the semiconductor chip.Type: GrantFiled: June 24, 2020Date of Patent: September 27, 2022Assignee: YANGTZE MEMORY TECHNOLOGIES CO., LTD.Inventors: Sicong Wang, Xiaoye Ding
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Patent number: 11435456Abstract: In one embodiment, a facility for calibrating sensors of an autonomous vehicle (AV) includes a camera calibration target configured to be measured by and used for calibrating an optical camera of the AV; a light detection and ranging (LiDAR) calibration target configured to be measured by and used for calibrating a LiDAR transceiver of the AV; and a platform configured to allow the AV to drive onto and park on the platform. The camera calibration target and the LiDAR calibration target are positioned to be detectable by the optical camera and the LiDAR transceiver while the AV is parked on the platform. The platform is further configured to modify a lateral position, height, or orientation of the optical camera and the LiDAR transceiver relative to the camera calibration target and the LiDAR calibration target while the AV is parked on the platform.Type: GrantFiled: December 28, 2017Date of Patent: September 6, 2022Assignee: Lyft, Inc.Inventors: Farzad Cyrus Foroughi Abari, Forrest Samuel Briggs, Alexander Thomas Starns
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Patent number: 11428574Abstract: Biomarkers of high blood pressure are measured to identify high blood pressure of the subject based on one or more biomarkers. In many embodiments, the response of the biomarker to blood pressure occurs over the course of at least an hour, such that the high blood pressure identification is based on a cumulative effect of physiology of the subject over a period of time. The methods and apparatus of identifying high blood pressure with biomarkers have the advantage of providing improved treatment of the subject, as the identified biomarker can be related to an effect of the high blood pressure on the subject, such as a biomarker corresponding to central blood pressure. The sample can be subjected to increases in one or more of pressure or temperatures, and changes in the blood sample measured over time.Type: GrantFiled: December 19, 2017Date of Patent: August 30, 2022Assignee: NUEON INC.Inventors: Robert G. Messerschmidt, Howland D. T. Jones
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Patent number: 11422095Abstract: A metrology system may receive a model for measuring one or more selected attributes of a target including features distributed in a selected pattern based on regression of spectroscopic scatterometry data from a scatterometry tool for a range of wavelengths. The metrology system may further generate a weighting function for the model to de-emphasize portions of the spectroscopic scatterometry data associated with wavelengths at which light captured by the scatterometry tool when measuring the target is predicted to include undesired diffraction orders. The metrology system may further direct the spectroscopic scatterometry tool to generate scatterometry data of one or more measurement targets including fabricated features distributed in the selected pattern. The metrology system may further measure the selected attributes for the one or more measurement targets based on regression of the scatterometry data of the one or more measurement targets to the model weighted by the weighting function.Type: GrantFiled: February 26, 2019Date of Patent: August 23, 2022Assignee: KLA CorporationInventors: Phillip Atkins, Liequan Lee, Shankar Krishnan, David C. S. Wu, Emily Chiu
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Patent number: 11410405Abstract: A sensor calibration target configured for sensor calibration relative to a common frame of reference is disclosed. The sensor calibration target comprises a first surface at a first predefined depth bearing a first set of indicia at respective first heights and having respective first predefined shifts, each of the first indicia encoding a corresponding first height. The sensor calibration target further comprises a second surface at a second predefined depth bearing a second set of indicia at respective second heights and having respective second predefined shifts, each of the second indicia encoding a corresponding second height.Type: GrantFiled: March 5, 2018Date of Patent: August 9, 2022Assignee: Symbol Technologies, LLCInventor: Alexandre Obotnine
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Patent number: 11391667Abstract: A method of suppressing retroreflector fringe noise in TDL spectrometers (TDLS) that use a laser and retroreflector. The path between the laser and each retroreflector element is changed mechanically for example by using a movable support for the retroreflector. The phase of light reaching the retroreflectors is very sensitive to the pathlength. A pathlength change of a fraction of the light wavelength will significantly change the phase of the light. In this method the pathlength to each retroreflector is modulated by mechanical means and this modulation is both stronger and faster than atmospheric effects on phase. If mechanical modulation occurs at a sufficiently high frequency retroreflector fringe noise can be averaged by integration of the spectrometer output over a reading period of typically one second.Type: GrantFiled: March 2, 2018Date of Patent: July 19, 2022Assignee: Boreal Laser Inc.Inventor: John Tulip
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Patent number: 11391645Abstract: Certain aspects of the present disclosure generally relate to an optical reference element having a wavelength spectrum comprising a plurality of wavelength functions having wavelength peaks spaced over a range of wavelengths, wherein adjacent wavelength functions are due to two orthogonal birefringence axes in the optical reference element. Aspects of the present disclosure may eliminate the drift issues associated with residual polarization and polarization dependent loss (PDL) with respect to grating-based sensor and reference element measurements.Type: GrantFiled: February 5, 2019Date of Patent: July 19, 2022Assignee: Weatherford Technology Holdings, LLCInventor: Domino Taverner
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Patent number: 11385129Abstract: An Optical Time Domain Reflectomeler (OTDR) tests an optical fiber by generating, transmitting, and receiving light signals from an optical fiber. The OTDR generates light signals having different characteristics and stitches these light signals into an OTDR trace. Backscatter and properties such as dynamic range effect the quality of the OTDR trace.Type: GrantFiled: October 5, 2018Date of Patent: July 12, 2022Assignee: AFL Telecommunications LLCInventor: Fang Xu
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Patent number: 11340118Abstract: A method for high-accuracy wavefront measurement based on grating shearing interferometry, which adopts a grating shearing interferometer system comprising an illuminating system, an optical imaging system under test, an object plane diffraction grating plate, an image plane diffraction grating plate, a two-dimensional photoelectric sensor, and a calculation processing unit. The object plane diffraction grating plate and the image plane diffraction grating plate are respectively arranged on the object plane and the image plane of the optical imaging system under test. The shearing phase of 1st-order diffracted beam and ?1st-order diffracted beam is exactly extracted through phase shifting method, and the original wavefront is obtained by carrying out reconstruction algorithm according to a shear ratio of 2s, such that the accuracy of wavefront measurement of the optical imaging system under test is improved, wherein s is the shear ratio of the grating shearing interferometer.Type: GrantFiled: January 20, 2021Date of Patent: May 24, 2022Assignee: Shanghai Institute of Optics And Fine Mechanics, Chinese Academy of SciencesInventors: Yunjun Lu, Feng Tang, Xiangzhao Wang
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Patent number: 11340171Abstract: A stimulated Raman scattering microscope device is configured to irradiates a sample with a first optical pulse at a first repetition frequency, to irradiate the sample with a second optical pulse of an optical frequency different from an optical frequency of the first optical pulse at a second repetition frequency, and to detect optical pulses of the first repetition frequency that are included in detected light from the sample irradiated with the first optical pulse and the second optical pulse, as a detected optical pulse train. The second optical pulse is generated by dispersing predetermined optical pulses that include lights of a plurality of optical frequencies, regulating to output optical pulses of a predetermined number of different optical frequencies out of the dispersed optical pulses at the second repetition frequency, and coupling the regulated optical pulses.Type: GrantFiled: February 9, 2017Date of Patent: May 24, 2022Assignee: THE UNIVERSITY OF TOKYOInventors: Yasuyuki Ozeki, Yuta Suzuki, Yoshifumi Wakisaka, Keisuke Goda
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Patent number: 11333491Abstract: A contact angle measurement system includes a housing that can hold a volume of a first fluid having a first density, an adjustable rock sample holder positioned within the housing, a fluid dropper attached to the housing, an image capturing a device, and a computer system. The holder can support a rock sample. An orientation of the holder relative to the housing is adjustable such that an outer surface of the rock sample is at a non-zero angle relative to a lower wall of the housing. When the orientation of the holder relative to the housing is such that the outer surface of the rock sample is at the non-zero angle relative to the lower wall, the fluid droplet traverses the outer surface of the rock sample. The image capturing device can capture images of the fluid droplet as the fluid droplet traverses the outer surface of the rock sample.Type: GrantFiled: April 2, 2020Date of Patent: May 17, 2022Assignee: Saudi Arabian Oil CompanyInventors: Amar Alshehri, Abdulkareem AlSofi
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Patent number: 11326982Abstract: A test instrument is operable to test optical components of a fiber optic network. The test instrument includes a laser having a back-facet monitor. The test instrument measures a performance parameter of an optical component being tested based on optical power of the laser measured by the back-facet monitor. The performance parameter is determined based on optical power measurements that account for drift of the laser.Type: GrantFiled: March 8, 2019Date of Patent: May 10, 2022Assignee: VIAVI SOLUTIONS INC.Inventors: Robert Matthew Adams, Joshua Philipson, Darren Bruce
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Optical fiber characteristics measuring apparatus and optical fiber characteristics measuring method
Patent number: 11326981Abstract: An optical fiber characteristics measuring apparatus includes: a light source that outputs frequency-modulated continuous wave of light; a first optical branching unit that branches the continuous light into pump light and reference light; a second optical branching unit that outputs backscattered light generated by making the pump light incident from one end of an optical fiber to be measured, wherein the backscattered light is Brillouin scattering in the optical fiber; a detector that detects interference light of the backscattered light and the reference light; a measuring unit that measures characteristics of the optical fiber by using a detection signal output from the detector; and a controller that controls the light source to change modulation frequency of the continuous light in units of one period or half a period of a modulation period corresponding to the modulation frequency.Type: GrantFiled: December 27, 2018Date of Patent: May 10, 2022Assignee: YOKOGAWA ELECTRIC CORPORATIONInventor: Osamu Furukawa -
Patent number: 11313789Abstract: A measurement system includes a light source configured to emitting a source light, a detection platform configured to support a reference sample and a test sample; a light guiding element on an optical path of the source light; and a detector. The detection platform is configured to synchronously move the reference sample and the test sample on a same surface of the detection platform. The light guiding element is configured to divide the source light into a measurement light and a reference light and guide the measurement light to the test sample, and the reference light to the reference sample. The measurement light reflected by the test sample and the reference light reflected by the reference sample are combined as an interference light. The detector is configured to receive the interference light and obtain optical information of the test sample according to the interference light.Type: GrantFiled: August 25, 2020Date of Patent: April 26, 2022Assignee: HON HAI PRECISION INDUSTRY CO., LTD.Inventor: Li-Shing Hou
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Patent number: 11307148Abstract: A small scale and low cost spectral sensing system designed primarily for multi-component fluids that provides a compact, low cost platform for analyzers or chemical sensors with limited number of optical and mechanical components featuring a light source, an optical interface with the sample, and a custom detector (multi-element). A single detector element has a specific wavelength, defined by a filter that can be used to select and measure specific chemical compounds. Multiple detector elements are combined to create a multi-channel detector capable of measuring a broad range of wavelengths from ultraviolet (UV) to near and mid-infrared wavelengths. The fabricated sensor can be configured for almost any class of material including gases, vapors, and liquids, with extension to solids. This is linked to the use of the custom detectors featuring filters tailored to specific substances in a broad spectral range from the UV to infrared.Type: GrantFiled: December 31, 2019Date of Patent: April 19, 2022Assignee: SAAM, Inc.Inventor: John Coates
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Patent number: 11300682Abstract: A system and method for a bistatic coherent LIDAR system with lasers locked to a reference. Utilizing atomic absorption lines to lock the frequency for the bistatic system provides an absolute reference, as each of the lasers in the bistatic system would have the same frequency to within the linewidth of the frequency reference. Each laser may also be additionally locked to an optical cavity for increased frequency stability. Not only does such a system provide essentially an infinite aperture, it also reduces laser power requirements because the detector platforms could be much closer to the target than the platform that contains the laser.Type: GrantFiled: October 18, 2018Date of Patent: April 12, 2022Assignee: BAE Systems Information and Electronic Systems Integration Inc.Inventors: Aaron W. Bennett, Murray R. Collette, Brant M. Kaylor
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Patent number: 11293872Abstract: A laser ablation probe comprises a tubular element adapted for conducting a carrier fluid in a substantially laminar flow. The tubular element comprises a fluid inlet and a fluid outlet arranged at opposite end portions of the tubular element for enabling the carrier fluid to flow through the tubular element. The tubular element further comprises a central portion having an aperture defined therein for admitting an aerosol generated by laser ablation from a material sample into the carrier fluid flow when this sample is positioned outside the tubular element at a distance in the range of 0 ?m to 100 ?m from the aperture.Type: GrantFiled: September 18, 2015Date of Patent: April 5, 2022Assignee: UNIVERSITEIT GENTInventors: Frank Vanhaecke, Stijn Van Malderen